FR2417100A1 - Perfectionnements aux procedes de radiographie - Google Patents

Perfectionnements aux procedes de radiographie

Info

Publication number
FR2417100A1
FR2417100A1 FR7903747A FR7903747A FR2417100A1 FR 2417100 A1 FR2417100 A1 FR 2417100A1 FR 7903747 A FR7903747 A FR 7903747A FR 7903747 A FR7903747 A FR 7903747A FR 2417100 A1 FR2417100 A1 FR 2417100A1
Authority
FR
France
Prior art keywords
diamond
medium
ray
radiography
processes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7903747A
Other languages
English (en)
Other versions
FR2417100B1 (fr
Inventor
Andrew Richard Lang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
De Beers Consolidated Mines Ltd
Original Assignee
De Beers Consolidated Mines Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by De Beers Consolidated Mines Ltd filed Critical De Beers Consolidated Mines Ltd
Publication of FR2417100A1 publication Critical patent/FR2417100A1/fr
Application granted granted Critical
Publication of FR2417100B1 publication Critical patent/FR2417100B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/389—Precious stones; Pearls
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/87—Investigating jewels

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

Procédé pour examiner un diamant ou tout autre objet solide. Il consiste à placer l'objet dans un milieu, à exposer l'objet à des rayons X de telle manière que l'absorption totale des rayons X dudit milieu et de l'objet sur le trajet de rayons X soit approximativement uniforme et, éventuellement à enregistrer l'image de rayons X transmise. On compense ainsi les différences d'absorption des rayons X par les différents points de l'objet, de sorte qu'on obtient, en une seule exposition, une radiographie présentant un bon contraste/figure. Application : radiographie, notamment de diamants.
FR7903747A 1978-02-14 1979-02-14 Perfectionnements aux procedes de radiographie Granted FR2417100A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB589878 1978-02-14
GB2355178 1978-05-26

Publications (2)

Publication Number Publication Date
FR2417100A1 true FR2417100A1 (fr) 1979-09-07
FR2417100B1 FR2417100B1 (fr) 1985-02-22

Family

ID=26240242

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7903747A Granted FR2417100A1 (fr) 1978-02-14 1979-02-14 Perfectionnements aux procedes de radiographie

Country Status (5)

Country Link
CH (1) CH638048A5 (fr)
DE (1) DE2905367A1 (fr)
FR (1) FR2417100A1 (fr)
NL (1) NL7901179A (fr)
ZA (1) ZA79531B (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1126477A3 (fr) * 2000-02-14 2003-06-18 Leica Microsystems Lithography GmbH Procédé d'examen de structures dans un substrat sémiconducteur

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010033761A1 (de) * 2010-08-09 2012-02-09 Rolls-Royce Deutschland Ltd & Co Kg Verfahren zur Durchstrahlungsprüfung von Bauteilen

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2128365C3 (de) * 1971-06-08 1974-05-22 Optische Werke G. Rodenstock, 8000 Muenchen Einrichtung zur vergrößerten Darstellung des Querschnittes von unzerstörten Contactlinsen oder dgl
DE2444644A1 (de) * 1974-09-18 1976-04-08 Dihaco Diamanten Handels Co Verfahren und vorrichtung zur ermittlung und groessenbestimmung von einschluessen in edelsteinen
DE2604410A1 (de) * 1974-09-18 1977-08-11 Dihaco Diamanten Handels Co Verfahren und vorrichtung zur ermittlung und groessenbestimmung von einschluessen in edelsteinen

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1126477A3 (fr) * 2000-02-14 2003-06-18 Leica Microsystems Lithography GmbH Procédé d'examen de structures dans un substrat sémiconducteur

Also Published As

Publication number Publication date
DE2905367C2 (fr) 1988-07-28
ZA79531B (en) 1980-02-27
FR2417100B1 (fr) 1985-02-22
NL7901179A (nl) 1979-08-16
DE2905367A1 (de) 1979-08-23
CH638048A5 (en) 1983-08-31

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Legal Events

Date Code Title Description
ST Notification of lapse