FR2386964A1 - Appareil de controle de plaquettes de circuit - Google Patents
Appareil de controle de plaquettes de circuitInfo
- Publication number
- FR2386964A1 FR2386964A1 FR7809919A FR7809919A FR2386964A1 FR 2386964 A1 FR2386964 A1 FR 2386964A1 FR 7809919 A FR7809919 A FR 7809919A FR 7809919 A FR7809919 A FR 7809919A FR 2386964 A1 FR2386964 A1 FR 2386964A1
- Authority
- FR
- France
- Prior art keywords
- circuit board
- board
- test equipment
- board test
- weights
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually
Abstract
L'invention concerne les appareils de contrôle de circuits électroniques. Un appareil de contrôle de plaquettes de circuit imprimé comprend un mécanisme capable de déplacer une plaquette 42 pour l'amener sous un groupe de poids 130 qui peuvent se déplacer librement dans la direction verticale Les pointes 136 des poids exercent une pression uniforme sur la plaquette 42, ce qui assure un bon contact entre les points de test de la plaquette et les broches de test 44 placées au-dessous. Application au contrôle automatique de circuits imprimés.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/784,266 US4112364A (en) | 1977-04-04 | 1977-04-04 | Circuit board testing apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2386964A1 true FR2386964A1 (fr) | 1978-11-03 |
FR2386964B1 FR2386964B1 (fr) | 1983-10-07 |
Family
ID=25131888
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7809919A Granted FR2386964A1 (fr) | 1977-04-04 | 1978-04-04 | Appareil de controle de plaquettes de circuit |
Country Status (6)
Country | Link |
---|---|
US (1) | US4112364A (fr) |
JP (1) | JPS5832664B2 (fr) |
CA (1) | CA1085926A (fr) |
DE (1) | DE2814510C2 (fr) |
FR (1) | FR2386964A1 (fr) |
GB (1) | GB1594118A (fr) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2062895B (en) * | 1979-05-08 | 1983-06-15 | Tokyo Shibaura Electric Co | Pulse motor driving apparatus for automatic testing system |
GB2108774B (en) * | 1981-10-21 | 1985-01-09 | Marconi Instruments Ltd | Electrical interface arrangements |
JPS59158400U (ja) * | 1983-04-08 | 1984-10-24 | 沖電気工業株式会社 | プレスバ− |
GB2146849B (en) * | 1983-09-17 | 1987-08-05 | Marconi Instruments Ltd | Electrical test probe head assembly |
JPH0213755U (fr) * | 1988-07-11 | 1990-01-29 | ||
DE9214390U1 (fr) * | 1992-10-23 | 1993-02-18 | Hatec Handhabungstechnik Maschinenbau Gmbh, 8206 Bruckmuehl, De | |
ATE205303T1 (de) * | 1995-02-23 | 2001-09-15 | Aesop Inc | Manipulator für einen testkopf einer automatischen testanlage |
US6683466B2 (en) * | 2002-05-17 | 2004-01-27 | International Business Machines Corporation | Piston for module test |
US6759861B2 (en) * | 2002-07-30 | 2004-07-06 | Intel Corporation | Thin film probe card contact drive system |
US7046027B2 (en) * | 2004-10-15 | 2006-05-16 | Teradyne, Inc. | Interface apparatus for semiconductor device tester |
US20080286633A1 (en) * | 2007-05-17 | 2008-11-20 | Kathleen Ritter Olenick | Circuit testing device for solid oxide fuel cell |
US11353375B2 (en) | 2019-06-28 | 2022-06-07 | Teradyne, Inc. | Using vibrations to position devices in a test system |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2918648A (en) * | 1956-06-15 | 1959-12-22 | Philco Corp | Testing apparatus |
FR2015501A1 (fr) * | 1968-08-12 | 1970-04-30 | Bendix Corp |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1800657C3 (de) * | 1968-10-02 | 1975-05-22 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Kontaktvorrichtung, insbesondere zur elektrischen Prüfung der Leitungszüge gedruckter oder geätzter Schaltungsplatten |
GB1508884A (en) * | 1975-05-17 | 1978-04-26 | Int Computers Ltd | Apparatus for testing printed circuit board assemblies |
-
1977
- 1977-04-04 US US05/784,266 patent/US4112364A/en not_active Expired - Lifetime
- 1977-11-28 GB GB49436/77A patent/GB1594118A/en not_active Expired
-
1978
- 1978-02-03 CA CA296,204A patent/CA1085926A/fr not_active Expired
- 1978-03-17 JP JP53030896A patent/JPS5832664B2/ja not_active Expired
- 1978-04-04 DE DE2814510A patent/DE2814510C2/de not_active Expired
- 1978-04-04 FR FR7809919A patent/FR2386964A1/fr active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2918648A (en) * | 1956-06-15 | 1959-12-22 | Philco Corp | Testing apparatus |
FR2015501A1 (fr) * | 1968-08-12 | 1970-04-30 | Bendix Corp |
Also Published As
Publication number | Publication date |
---|---|
DE2814510C2 (de) | 1983-04-21 |
JPS53133764A (en) | 1978-11-21 |
FR2386964B1 (fr) | 1983-10-07 |
CA1085926A (fr) | 1980-09-16 |
US4112364A (en) | 1978-09-05 |
DE2814510A1 (de) | 1978-10-19 |
JPS5832664B2 (ja) | 1983-07-14 |
GB1594118A (en) | 1981-07-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |