TW232052B - Circuit pattern inspection device - Google Patents

Circuit pattern inspection device

Info

Publication number
TW232052B
TW232052B TW83103711A TW83103711A TW232052B TW 232052 B TW232052 B TW 232052B TW 83103711 A TW83103711 A TW 83103711A TW 83103711 A TW83103711 A TW 83103711A TW 232052 B TW232052 B TW 232052B
Authority
TW
Taiwan
Prior art keywords
circuit pattern
contact
pair
inspection device
pattern inspection
Prior art date
Application number
TW83103711A
Other languages
Chinese (zh)
Inventor
Noriaki Kaneda
Masafumi Tanaka
Original Assignee
Adtec Eng Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Adtec Eng Co Ltd filed Critical Adtec Eng Co Ltd
Application granted granted Critical
Publication of TW232052B publication Critical patent/TW232052B/en

Links

Abstract

A circuit pattern inspection device includes: 1. one pair of no. 1 contact device which can contact arbitrary two points on the same of different circuit pattern; 2. current source connecting to the pair of no. 1 contact device; 3. no. 1 detecting device for displaying the resistance value of two points contacted by the no. 1 contact device; 4. one pair of no. 2 contact device which can contact arbitrary two points on the same of different circuit pattern; 5. current source connecting to the pair of no. 2 contact device; 6. no. 2 detecting device for displaying the resistance value of two points contacted by the no. 2 contact device.
TW83103711A 1992-11-04 1994-04-26 Circuit pattern inspection device TW232052B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4321207A JP2670655B2 (en) 1992-11-04 1992-11-04 Circuit pattern inspection device and inspection method

Publications (1)

Publication Number Publication Date
TW232052B true TW232052B (en) 1994-10-11

Family

ID=18130000

Family Applications (1)

Application Number Title Priority Date Filing Date
TW83103711A TW232052B (en) 1992-11-04 1994-04-26 Circuit pattern inspection device

Country Status (2)

Country Link
JP (1) JP2670655B2 (en)
TW (1) TW232052B (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100604147B1 (en) * 2004-10-07 2006-07-24 주식회사 성일텔레콤 inspection mechanism for a liquid crystal display's integrated circuit
JP4676218B2 (en) * 2005-02-22 2011-04-27 日置電機株式会社 Circuit wiring inspection method and circuit wiring inspection apparatus
JP4629531B2 (en) * 2005-08-03 2011-02-09 日置電機株式会社 Short-circuit inspection apparatus and short-circuit inspection method
JP4825083B2 (en) * 2006-08-28 2011-11-30 株式会社アドテックエンジニアリング Trace type circuit board inspection equipment
JP5012633B2 (en) * 2008-04-16 2012-08-29 セイコーエプソン株式会社 ORGANIC ELECTROLUMINESCENT DEVICE, ITS MANUFACTURING METHOD, AND MANUFACTURING DEVICE
JP6069884B2 (en) 2012-05-08 2017-02-01 日本電産リード株式会社 Insulation inspection method and insulation inspection apparatus
JP6095735B2 (en) * 2014-07-29 2017-03-15 ヤマハファインテック株式会社 Printed circuit board inspection apparatus and inspection method

Also Published As

Publication number Publication date
JPH06148253A (en) 1994-05-27
JP2670655B2 (en) 1997-10-29

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