TW232052B - Circuit pattern inspection device - Google Patents
Circuit pattern inspection deviceInfo
- Publication number
- TW232052B TW232052B TW83103711A TW83103711A TW232052B TW 232052 B TW232052 B TW 232052B TW 83103711 A TW83103711 A TW 83103711A TW 83103711 A TW83103711 A TW 83103711A TW 232052 B TW232052 B TW 232052B
- Authority
- TW
- Taiwan
- Prior art keywords
- circuit pattern
- contact
- pair
- inspection device
- pattern inspection
- Prior art date
Links
Abstract
A circuit pattern inspection device includes: 1. one pair of no. 1 contact device which can contact arbitrary two points on the same of different circuit pattern; 2. current source connecting to the pair of no. 1 contact device; 3. no. 1 detecting device for displaying the resistance value of two points contacted by the no. 1 contact device; 4. one pair of no. 2 contact device which can contact arbitrary two points on the same of different circuit pattern; 5. current source connecting to the pair of no. 2 contact device; 6. no. 2 detecting device for displaying the resistance value of two points contacted by the no. 2 contact device.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4321207A JP2670655B2 (en) | 1992-11-04 | 1992-11-04 | Circuit pattern inspection device and inspection method |
Publications (1)
Publication Number | Publication Date |
---|---|
TW232052B true TW232052B (en) | 1994-10-11 |
Family
ID=18130000
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW83103711A TW232052B (en) | 1992-11-04 | 1994-04-26 | Circuit pattern inspection device |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2670655B2 (en) |
TW (1) | TW232052B (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100604147B1 (en) * | 2004-10-07 | 2006-07-24 | 주식회사 성일텔레콤 | inspection mechanism for a liquid crystal display's integrated circuit |
JP4676218B2 (en) * | 2005-02-22 | 2011-04-27 | 日置電機株式会社 | Circuit wiring inspection method and circuit wiring inspection apparatus |
JP4629531B2 (en) * | 2005-08-03 | 2011-02-09 | 日置電機株式会社 | Short-circuit inspection apparatus and short-circuit inspection method |
JP4825083B2 (en) * | 2006-08-28 | 2011-11-30 | 株式会社アドテックエンジニアリング | Trace type circuit board inspection equipment |
JP5012633B2 (en) * | 2008-04-16 | 2012-08-29 | セイコーエプソン株式会社 | ORGANIC ELECTROLUMINESCENT DEVICE, ITS MANUFACTURING METHOD, AND MANUFACTURING DEVICE |
JP6069884B2 (en) | 2012-05-08 | 2017-02-01 | 日本電産リード株式会社 | Insulation inspection method and insulation inspection apparatus |
JP6095735B2 (en) * | 2014-07-29 | 2017-03-15 | ヤマハファインテック株式会社 | Printed circuit board inspection apparatus and inspection method |
-
1992
- 1992-11-04 JP JP4321207A patent/JP2670655B2/en not_active Expired - Fee Related
-
1994
- 1994-04-26 TW TW83103711A patent/TW232052B/en active
Also Published As
Publication number | Publication date |
---|---|
JPH06148253A (en) | 1994-05-27 |
JP2670655B2 (en) | 1997-10-29 |
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