FR2375577A1 - Interferometre destine a la mesure de deplacements - Google Patents
Interferometre destine a la mesure de deplacementsInfo
- Publication number
- FR2375577A1 FR2375577A1 FR7638917A FR7638917A FR2375577A1 FR 2375577 A1 FR2375577 A1 FR 2375577A1 FR 7638917 A FR7638917 A FR 7638917A FR 7638917 A FR7638917 A FR 7638917A FR 2375577 A1 FR2375577 A1 FR 2375577A1
- Authority
- FR
- France
- Prior art keywords
- measurement
- beams
- utilises
- interferometer
- displacement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 title abstract 4
- 238000006073 displacement reaction Methods 0.000 title abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
- G01B9/02078—Caused by ambiguity
- G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/45—Multiple detectors for detecting interferometer signals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7638917A FR2375577A1 (fr) | 1976-12-23 | 1976-12-23 | Interferometre destine a la mesure de deplacements |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7638917A FR2375577A1 (fr) | 1976-12-23 | 1976-12-23 | Interferometre destine a la mesure de deplacements |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2375577A1 true FR2375577A1 (fr) | 1978-07-21 |
FR2375577B1 FR2375577B1 (enrdf_load_stackoverflow) | 1982-03-05 |
Family
ID=9181475
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7638917A Granted FR2375577A1 (fr) | 1976-12-23 | 1976-12-23 | Interferometre destine a la mesure de deplacements |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2375577A1 (enrdf_load_stackoverflow) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1979000506A1 (en) * | 1978-01-13 | 1979-08-09 | Nat Res Dev | Interferometer systems |
EP0099940A1 (de) * | 1982-07-28 | 1984-02-08 | H. Maihak Ag | Verfahren und Vorrichtung zur interferometrischen Messung der geradlinigen Bewegungslänge eines Gegenstands mit Erkennung seiner Bewegungsrichtung |
US4583855A (en) * | 1984-02-17 | 1986-04-22 | Lockheed Missiles & Space Company, Inc. | Optical phase measuring apparatus |
US5172186A (en) * | 1990-07-03 | 1992-12-15 | Konica Corporation | Laser interferometry length measuring an apparatus employing a beam slitter |
-
1976
- 1976-12-23 FR FR7638917A patent/FR2375577A1/fr active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1979000506A1 (en) * | 1978-01-13 | 1979-08-09 | Nat Res Dev | Interferometer systems |
EP0099940A1 (de) * | 1982-07-28 | 1984-02-08 | H. Maihak Ag | Verfahren und Vorrichtung zur interferometrischen Messung der geradlinigen Bewegungslänge eines Gegenstands mit Erkennung seiner Bewegungsrichtung |
US4558950A (en) * | 1982-07-28 | 1985-12-17 | H. Maihak Ag | Interferometric distance and direction measurement |
US4583855A (en) * | 1984-02-17 | 1986-04-22 | Lockheed Missiles & Space Company, Inc. | Optical phase measuring apparatus |
US5172186A (en) * | 1990-07-03 | 1992-12-15 | Konica Corporation | Laser interferometry length measuring an apparatus employing a beam slitter |
Also Published As
Publication number | Publication date |
---|---|
FR2375577B1 (enrdf_load_stackoverflow) | 1982-03-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |