FR2356341B1 - - Google Patents

Info

Publication number
FR2356341B1
FR2356341B1 FR7719099A FR7719099A FR2356341B1 FR 2356341 B1 FR2356341 B1 FR 2356341B1 FR 7719099 A FR7719099 A FR 7719099A FR 7719099 A FR7719099 A FR 7719099A FR 2356341 B1 FR2356341 B1 FR 2356341B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7719099A
Other versions
FR2356341A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of FR2356341A1 publication Critical patent/FR2356341A1/fr
Application granted granted Critical
Publication of FR2356341B1 publication Critical patent/FR2356341B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07392—Multiple probes manipulating each probe element or tip individually

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
FR7719099A 1976-06-24 1977-06-22 Adaptateur destine a relier des points de connexion et/ou de controle d'un module a un circuit de mesure Granted FR2356341A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2628428A DE2628428C3 (de) 1976-06-24 1976-06-24 Adapter zum Verbinden von Anschluß- und/oder Prüfpunkten einer Baugruppe mit einer Mefischaltung

Publications (2)

Publication Number Publication Date
FR2356341A1 FR2356341A1 (fr) 1978-01-20
FR2356341B1 true FR2356341B1 (fr) 1980-03-07

Family

ID=5981364

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7719099A Granted FR2356341A1 (fr) 1976-06-24 1977-06-22 Adaptateur destine a relier des points de connexion et/ou de controle d'un module a un circuit de mesure

Country Status (4)

Country Link
US (1) US4092593A (fr)
DE (1) DE2628428C3 (fr)
FR (1) FR2356341A1 (fr)
GB (1) GB1532618A (fr)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2800775A1 (de) * 1978-01-09 1979-07-12 Luther & Maelzer Gmbh Verfahrensanordnung und vorrichtung zur aufnahme und funktionsmessueberpruefung von unbestueckten leiterplatten
FR2418466A1 (fr) * 1978-02-24 1979-09-21 Telecommunications Sa Appareil pour etablir des prises de contact temporaires sur des circuits electriques
US4232262A (en) * 1978-10-12 1980-11-04 Emo George C Connector contact terminal contamination probe
US4266191A (en) * 1979-04-18 1981-05-05 Spano John D Test probe alignment apparatus
DE2953597C1 (de) * 1979-05-08 1985-06-20 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Vorrichtung zur Ansteuerung von Schrittmotoren bei einer automatischen Pruefvorrichtung
US4797610A (en) * 1986-05-08 1989-01-10 Miguel Fombellida Electronic test fixture
US4833590A (en) * 1986-07-15 1989-05-23 Siemens Aktiengesellschaft Method and apparatus for the fine adjustment of an object on a sub-surface of a plane
JPS63305263A (ja) * 1987-06-06 1988-12-13 Takaya Kk プリント基板測定検査装置
US5107206A (en) * 1990-05-25 1992-04-21 Tescon Co., Ltd. Printed circuit board inspection apparatus
DE4406538A1 (de) † 1994-02-28 1995-08-31 Mania Gmbh Leiterplatten-Prüfeinrichtung mit Prüfadapter und Verfahren zum Einstellen desselben
DE4441347C2 (de) * 1994-11-21 1998-10-29 Peter Fritzsche Verfahren zum Prüfen von elektronischen Schaltungen auf Leiterplatten und Vorrichtung zum Durchführen des Verfahrens
NZ315085A (en) * 1995-12-22 2007-12-21 New System Srl Testing printed circuit boards, two coplanar boards containing test needles movable with respect to each other
KR100257625B1 (ko) * 1997-01-27 2000-06-01 강정근 Pcb 검사장치
DE19957286A1 (de) * 1999-11-29 2001-07-05 Atg Test Systems Gmbh Verfahren und Vorrichtung zum Testen von Leiterplatten
WO2014079913A1 (fr) * 2012-11-21 2014-05-30 Konrad Gmbh Procédé et dispositif de contrôle d'une pièce
CN106680548B (zh) * 2016-12-30 2019-08-30 深圳市矽电半导体设备有限公司 定位机构
CN112285536B (zh) * 2020-10-23 2022-11-01 鉴丰电子科技有限公司 用于风扇线路板的统一测试设备及使用方法
CN117110826A (zh) * 2022-05-12 2023-11-24 中兴智能科技南京有限公司 一种测试设备和测试方法
CN115684676B (zh) * 2022-12-28 2023-04-07 昆山迈致治具科技有限公司 基于多种类型的电路板的测试装置及测试方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3437929A (en) * 1965-08-05 1969-04-08 Electroglas Inc Automatically indexed probe assembly for testing semiconductor wafers and the like
US3590372A (en) * 1968-12-26 1971-06-29 Ibm Spreading resistance method and apparatus for determining the resistivity of a material

Also Published As

Publication number Publication date
US4092593A (en) 1978-05-30
DE2628428B2 (de) 1978-06-22
DE2628428C3 (de) 1979-02-15
FR2356341A1 (fr) 1978-01-20
GB1532618A (en) 1978-11-15
DE2628428A1 (de) 1977-12-29

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Legal Events

Date Code Title Description
ST Notification of lapse