FR2336770B1 - - Google Patents

Info

Publication number
FR2336770B1
FR2336770B1 FR7634827A FR7634827A FR2336770B1 FR 2336770 B1 FR2336770 B1 FR 2336770B1 FR 7634827 A FR7634827 A FR 7634827A FR 7634827 A FR7634827 A FR 7634827A FR 2336770 B1 FR2336770 B1 FR 2336770B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7634827A
Other versions
FR2336770A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of FR2336770A1 publication Critical patent/FR2336770A1/fr
Application granted granted Critical
Publication of FR2336770B1 publication Critical patent/FR2336770B1/fr
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/762Charge transfer devices
    • H01L29/765Charge-coupled devices
    • H01L29/768Charge-coupled devices with field effect produced by an insulated gate
    • H01L29/76808Input structures
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C19/00Digital stores in which the information is moved stepwise, e.g. shift registers
    • G11C19/28Digital stores in which the information is moved stepwise, e.g. shift registers using semiconductor elements
    • G11C19/282Digital stores in which the information is moved stepwise, e.g. shift registers using semiconductor elements with charge storage in a depletion layer, i.e. charge coupled devices [CCD]
    • G11C19/285Peripheral circuits, e.g. for writing into the first stage; for reading-out of the last stage
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C27/00Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/04Shift registers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/762Charge transfer devices
    • H01L29/765Charge-coupled devices
    • H01L29/768Charge-coupled devices with field effect produced by an insulated gate
    • H01L29/76816Output structures

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Filters That Use Time-Delay Elements (AREA)
  • Networks Using Active Elements (AREA)
FR7634827A 1975-12-23 1976-11-12 Circuit de fonctionnement pour dispositifs semi-conducteurs a charges couplees Granted FR2336770A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/643,999 US4156818A (en) 1975-12-23 1975-12-23 Operating circuitry for semiconductor charge coupled devices

Publications (2)

Publication Number Publication Date
FR2336770A1 FR2336770A1 (fr) 1977-07-22
FR2336770B1 true FR2336770B1 (fr) 1978-06-30

Family

ID=24583029

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7634827A Granted FR2336770A1 (fr) 1975-12-23 1976-11-12 Circuit de fonctionnement pour dispositifs semi-conducteurs a charges couplees

Country Status (7)

Country Link
US (1) US4156818A (fr)
JP (1) JPS5279739A (fr)
CA (1) CA1089986A (fr)
DE (1) DE2653688A1 (fr)
FR (1) FR2336770A1 (fr)
GB (1) GB1555349A (fr)
IT (1) IT1068030B (fr)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4287441A (en) * 1979-03-30 1981-09-01 The United States Of America As Represented By The Secretary Of The Army Correlated double sampling CCD video preprocessor-amplifier
JPS5625297A (en) * 1979-08-06 1981-03-11 Nec Corp Charge transfer type delay line and its driving method
DE3032332A1 (de) * 1980-08-27 1982-04-08 Siemens AG, 1000 Berlin und 8000 München Ausgangsstufe einer monolithisch integrierten ladu ngsverschiebeanordnung
NL8102100A (nl) * 1981-04-29 1982-11-16 Philips Nv Kompensatie van 1e orde effect van transportverlies in een c.t.d.
JPS5921059A (ja) * 1982-07-28 1984-02-02 Hitachi Ltd 電荷転送回路
JPS59132669A (ja) * 1983-01-20 1984-07-30 Sony Corp 電荷転送装置
US4625322A (en) * 1983-11-18 1986-11-25 Hitachi, Ltd. Charge coupled device provided with automatic bias-voltage setting means
US5177772A (en) * 1984-12-06 1993-01-05 Sony Corporation Charge coupled device with enhanced input structure
US5086440A (en) * 1989-04-18 1992-02-04 Sony Corporation Charge coupled device with enhanced input structure
US4896340A (en) * 1985-11-01 1990-01-23 Hughes Aircraft Company Partial direct injection for signal processing system
US5247554A (en) * 1987-01-16 1993-09-21 Kabushiki Kaisha Toshiba Charge detection circuit
NL8701528A (nl) * 1987-06-30 1989-01-16 Philips Nv Halfgeleiderinrichting voozien van een ladingsoverdrachtinrichting.
JPH084137B2 (ja) * 1988-01-12 1996-01-17 日本電気株式会社 電荷転送装置の出力回路
NL8800851A (nl) * 1988-04-05 1989-11-01 Philips Nv Halfgeleidergeheugeninrichting.
NL8900540A (nl) * 1989-03-06 1990-10-01 Philips Nv Halfgeleiderinrichting.
US5210777A (en) * 1989-04-17 1993-05-11 Sony Corporation Charge coupled device having switched inverting and non-inverting input signal paths, input biassing circuit and temperature compensation
JPH0821712B2 (ja) * 1990-06-12 1996-03-04 株式会社東芝 電荷転送素子の入力バイアス回路
US5260592A (en) * 1991-02-19 1993-11-09 Synaptics, Incorporated Integrating photosensor and imaging system having wide dynamic range with varactors
US5097305A (en) * 1991-02-19 1992-03-17 Synaptics Corporation Integrating photosensor and imaging system having wide dynamic range
US5324958A (en) * 1991-02-19 1994-06-28 Synaptics, Incorporated Integrating imaging systgem having wide dynamic range with sample/hold circuits
US5748035A (en) * 1994-05-27 1998-05-05 Arithmos, Inc. Channel coupled feedback circuits
US6940551B2 (en) 2000-09-25 2005-09-06 Foveon, Inc. Active pixel sensor with noise cancellation
JP4195859B2 (ja) * 2001-11-16 2008-12-17 株式会社バイオエックス Fet型センサと、そのセンサを用いたイオン濃度検出方法及び塩基配列検出方法
JP5629134B2 (ja) * 2010-06-14 2014-11-19 パナソニック株式会社 電荷結合素子の駆動装置、空間情報検出装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3700932A (en) * 1970-02-16 1972-10-24 Bell Telephone Labor Inc Charge coupled devices
US3623132A (en) * 1970-12-14 1971-11-23 North American Rockwell Charge sensing circuit
AU461729B2 (en) * 1971-01-14 1975-06-05 Rca Corporation Charge coupled circuits
NL7202070A (fr) * 1972-02-17 1973-08-21
NL7306902A (fr) * 1972-05-26 1973-11-28
USB299480I5 (fr) * 1972-10-20
US3934161A (en) * 1974-04-29 1976-01-20 Texas Instruments Incorporated Electronic shutter for a charge-coupled imager
US3969636A (en) * 1975-06-30 1976-07-13 General Electric Company Charge sensing circuit for charge transfer devices
US4004157A (en) * 1975-09-02 1977-01-18 General Electric Company Output circuit for charge transfer transversal filter
US4048525A (en) * 1975-09-02 1977-09-13 General Electric Company Output circuit for charge transfer transversal filter

Also Published As

Publication number Publication date
GB1555349A (en) 1979-11-07
US4156818A (en) 1979-05-29
IT1068030B (it) 1985-03-21
JPS5630640B2 (fr) 1981-07-16
CA1089986A (fr) 1980-11-18
FR2336770A1 (fr) 1977-07-22
JPS5279739A (en) 1977-07-05
DE2653688A1 (de) 1977-07-14

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Legal Events

Date Code Title Description
ST Notification of lapse