FR2247280B1 - - Google Patents

Info

Publication number
FR2247280B1
FR2247280B1 FR747433660A FR7433660A FR2247280B1 FR 2247280 B1 FR2247280 B1 FR 2247280B1 FR 747433660 A FR747433660 A FR 747433660A FR 7433660 A FR7433660 A FR 7433660A FR 2247280 B1 FR2247280 B1 FR 2247280B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR747433660A
Other versions
FR2247280A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of FR2247280A1 publication Critical patent/FR2247280A1/fr
Application granted granted Critical
Publication of FR2247280B1 publication Critical patent/FR2247280B1/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/311—Etching the insulating layers by chemical or physical means
    • H01L21/31105—Etching inorganic layers
    • H01L21/31111—Etching inorganic layers by chemical means
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F11/00—Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent
    • C23F11/04—Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent in markedly acid liquids
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Inorganic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • ing And Chemical Polishing (AREA)
  • Weting (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Silicon Compounds (AREA)
  • Preventing Corrosion Or Incrustation Of Metals (AREA)
FR747433660A 1973-10-11 1974-10-07 Expired FR2247280B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US405564A US3860464A (en) 1973-10-11 1973-10-11 Oxide etchant

Publications (2)

Publication Number Publication Date
FR2247280A1 FR2247280A1 (fr) 1975-05-09
FR2247280B1 true FR2247280B1 (fr) 1979-02-09

Family

ID=23604211

Family Applications (1)

Application Number Title Priority Date Filing Date
FR747433660A Expired FR2247280B1 (fr) 1973-10-11 1974-10-07

Country Status (10)

Country Link
US (1) US3860464A (fr)
JP (1) JPS528676B2 (fr)
BE (1) BE820808A (fr)
CA (1) CA1035258A (fr)
DE (1) DE2447670C3 (fr)
FR (1) FR2247280B1 (fr)
GB (1) GB1474294A (fr)
IT (1) IT1020975B (fr)
NL (1) NL162124C (fr)
SE (1) SE401526B (fr)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3992235A (en) * 1975-05-21 1976-11-16 Bell Telephone Laboratories, Incorporated Etching of thin layers of reactive metals
JP2581268B2 (ja) * 1990-05-22 1997-02-12 日本電気株式会社 半導体基板の処理方法
US5695661A (en) 1995-06-07 1997-12-09 Micron Display Technology, Inc. Silicon dioxide etch process which protects metal
KR0175009B1 (ko) * 1995-07-28 1999-04-01 김광호 식각용액 및 이를 이용한 반도체 장치의 식각방법
KR100234541B1 (ko) * 1997-03-07 1999-12-15 윤종용 반도체장치 제조용 웨이퍼의 세정을 위한 세정조성물 및 그를 이용한 세정방법
US5876879A (en) * 1997-05-29 1999-03-02 International Business Machines Corporation Oxide layer patterned by vapor phase etching
US6074951A (en) * 1997-05-29 2000-06-13 International Business Machines Corporation Vapor phase etching of oxide masked by resist or masking material
US5838055A (en) * 1997-05-29 1998-11-17 International Business Machines Corporation Trench sidewall patterned by vapor phase etching
US6117796A (en) * 1998-08-13 2000-09-12 International Business Machines Corporation Removal of silicon oxide
US6585933B1 (en) 1999-05-03 2003-07-01 Betzdearborn, Inc. Method and composition for inhibiting corrosion in aqueous systems
US6187262B1 (en) 1998-08-19 2001-02-13 Betzdearborn Inc. Inhibition of corrosion in aqueous systems
US6379587B1 (en) 1999-05-03 2002-04-30 Betzdearborn Inc. Inhibition of corrosion in aqueous systems
CN103980216A (zh) * 2014-06-05 2014-08-13 湖北百诺捷生物科技有限公司 一种氯化-2,3,5-三苯基四氮唑的合成方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3421985A (en) * 1965-10-19 1969-01-14 Sylvania Electric Prod Method of producing semiconductor devices having connecting leads attached thereto
US3560280A (en) * 1965-11-17 1971-02-02 Hitachi Ltd Method of selective removal of oxide coatings in the manufacture of semiconductor devices

Also Published As

Publication number Publication date
BE820808A (fr) 1975-02-03
SE401526B (sv) 1978-05-16
GB1474294A (en) 1977-05-18
SE7412194L (fr) 1975-04-14
JPS5067581A (fr) 1975-06-06
NL162124C (nl) 1980-04-15
NL7413345A (nl) 1975-04-15
JPS528676B2 (fr) 1977-03-10
NL162124B (nl) 1979-11-15
IT1020975B (it) 1977-12-30
FR2247280A1 (fr) 1975-05-09
DE2447670C3 (de) 1978-06-08
CA1035258A (fr) 1978-07-25
US3860464A (en) 1975-01-14
DE2447670B2 (de) 1977-09-22
DE2447670A1 (de) 1975-04-24

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Legal Events

Date Code Title Description
ST Notification of lapse