NL7413345A - Etsmiddel voor het etsen van oxyden. - Google Patents

Etsmiddel voor het etsen van oxyden.

Info

Publication number
NL7413345A
NL7413345A NL7413345A NL7413345A NL7413345A NL 7413345 A NL7413345 A NL 7413345A NL 7413345 A NL7413345 A NL 7413345A NL 7413345 A NL7413345 A NL 7413345A NL 7413345 A NL7413345 A NL 7413345A
Authority
NL
Netherlands
Prior art keywords
oxydes
etchant
etching
etching oxydes
Prior art date
Application number
NL7413345A
Other languages
English (en)
Other versions
NL162124B (nl
NL162124C (nl
Original Assignee
Western Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co filed Critical Western Electric Co
Publication of NL7413345A publication Critical patent/NL7413345A/nl
Publication of NL162124B publication Critical patent/NL162124B/nl
Application granted granted Critical
Publication of NL162124C publication Critical patent/NL162124C/nl

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105After-treatment
    • H01L21/311Etching the insulating layers by chemical or physical means
    • H01L21/31105Etching inorganic layers
    • H01L21/31111Etching inorganic layers by chemical means
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23FNON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F11/00Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent
    • C23F11/04Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent in markedly acid liquids
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Inorganic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • ing And Chemical Polishing (AREA)
  • Weting (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Silicon Compounds (AREA)
  • Preventing Corrosion Or Incrustation Of Metals (AREA)
NL7413345.A 1973-10-11 1974-10-10 Werkwijze voor het door etsen selectief verwijderen van een anorganisch oxyde van een substraat. NL162124C (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US405564A US3860464A (en) 1973-10-11 1973-10-11 Oxide etchant

Publications (3)

Publication Number Publication Date
NL7413345A true NL7413345A (nl) 1975-04-15
NL162124B NL162124B (nl) 1979-11-15
NL162124C NL162124C (nl) 1980-04-15

Family

ID=23604211

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7413345.A NL162124C (nl) 1973-10-11 1974-10-10 Werkwijze voor het door etsen selectief verwijderen van een anorganisch oxyde van een substraat.

Country Status (10)

Country Link
US (1) US3860464A (nl)
JP (1) JPS528676B2 (nl)
BE (1) BE820808A (nl)
CA (1) CA1035258A (nl)
DE (1) DE2447670C3 (nl)
FR (1) FR2247280B1 (nl)
GB (1) GB1474294A (nl)
IT (1) IT1020975B (nl)
NL (1) NL162124C (nl)
SE (1) SE401526B (nl)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3992235A (en) * 1975-05-21 1976-11-16 Bell Telephone Laboratories, Incorporated Etching of thin layers of reactive metals
JP2581268B2 (ja) * 1990-05-22 1997-02-12 日本電気株式会社 半導体基板の処理方法
US5695661A (en) * 1995-06-07 1997-12-09 Micron Display Technology, Inc. Silicon dioxide etch process which protects metal
KR0175009B1 (ko) * 1995-07-28 1999-04-01 김광호 식각용액 및 이를 이용한 반도체 장치의 식각방법
KR100234541B1 (ko) * 1997-03-07 1999-12-15 윤종용 반도체장치 제조용 웨이퍼의 세정을 위한 세정조성물 및 그를 이용한 세정방법
US5838055A (en) * 1997-05-29 1998-11-17 International Business Machines Corporation Trench sidewall patterned by vapor phase etching
US6074951A (en) * 1997-05-29 2000-06-13 International Business Machines Corporation Vapor phase etching of oxide masked by resist or masking material
US5876879A (en) * 1997-05-29 1999-03-02 International Business Machines Corporation Oxide layer patterned by vapor phase etching
US6117796A (en) * 1998-08-13 2000-09-12 International Business Machines Corporation Removal of silicon oxide
US6379587B1 (en) 1999-05-03 2002-04-30 Betzdearborn Inc. Inhibition of corrosion in aqueous systems
US6585933B1 (en) 1999-05-03 2003-07-01 Betzdearborn, Inc. Method and composition for inhibiting corrosion in aqueous systems
US6187262B1 (en) 1998-08-19 2001-02-13 Betzdearborn Inc. Inhibition of corrosion in aqueous systems
CN103980216A (zh) * 2014-06-05 2014-08-13 湖北百诺捷生物科技有限公司 一种氯化-2,3,5-三苯基四氮唑的合成方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3421985A (en) * 1965-10-19 1969-01-14 Sylvania Electric Prod Method of producing semiconductor devices having connecting leads attached thereto
US3560280A (en) * 1965-11-17 1971-02-02 Hitachi Ltd Method of selective removal of oxide coatings in the manufacture of semiconductor devices

Also Published As

Publication number Publication date
DE2447670C3 (de) 1978-06-08
JPS5067581A (nl) 1975-06-06
JPS528676B2 (nl) 1977-03-10
DE2447670B2 (de) 1977-09-22
SE7412194L (nl) 1975-04-14
BE820808A (fr) 1975-02-03
US3860464A (en) 1975-01-14
NL162124B (nl) 1979-11-15
IT1020975B (it) 1977-12-30
FR2247280A1 (nl) 1975-05-09
FR2247280B1 (nl) 1979-02-09
DE2447670A1 (de) 1975-04-24
CA1035258A (en) 1978-07-25
NL162124C (nl) 1980-04-15
GB1474294A (en) 1977-05-18
SE401526B (sv) 1978-05-16

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Legal Events

Date Code Title Description
V1 Lapsed because of non-payment of the annual fee