FR1090233A - Appareil pour la spectrométrie par rayons x - Google Patents
Appareil pour la spectrométrie par rayons xInfo
- Publication number
- FR1090233A FR1090233A FR1090233DA FR1090233A FR 1090233 A FR1090233 A FR 1090233A FR 1090233D A FR1090233D A FR 1090233DA FR 1090233 A FR1090233 A FR 1090233A
- Authority
- FR
- France
- Prior art keywords
- ray spectrometry
- spectrometry apparatus
- ray
- spectrometry
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL316826X | 1952-11-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
FR1090233A true FR1090233A (fr) | 1955-03-29 |
Family
ID=19783831
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1090233D Expired FR1090233A (fr) | 1952-11-08 | 1953-11-06 | Appareil pour la spectrométrie par rayons x |
Country Status (7)
Country | Link |
---|---|
US (1) | US2783385A (de) |
BE (1) | BE524089A (de) |
CH (1) | CH316826A (de) |
DE (1) | DE1027903B (de) |
FR (1) | FR1090233A (de) |
GB (1) | GB741854A (de) |
NL (2) | NL173668B (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0014500A1 (de) * | 1979-01-31 | 1980-08-20 | Koninklijke Philips Electronics N.V. | Röntgenstrahlen-Diffraktometer für Pulver |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2835820A (en) * | 1955-03-07 | 1958-05-20 | Jr La Verne S Birks | Curved crystal fluorescent x-ray spectrograph |
US3031571A (en) * | 1956-05-21 | 1962-04-24 | Well Completions Inc | Apparatus and method for conditioning and analyzing earth components |
US2898469A (en) * | 1956-09-11 | 1959-08-04 | Gen Electric | X-ray diffraction apparatus |
US3073952A (en) * | 1956-09-11 | 1963-01-15 | Gen Electric | X-ray diffraction apparatus |
GB847265A (en) * | 1957-09-11 | 1960-09-07 | Ass Elect Ind | Improvements relating to mechanical linkages |
US2957079A (en) * | 1957-12-27 | 1960-10-18 | Gen Electric | Penetrating ray emission coding |
US3012443A (en) * | 1960-01-11 | 1961-12-12 | Patent Man Inc | Mechanical movement for translating rotary motion to linear motion |
DE3125803A1 (de) * | 1981-06-30 | 1983-01-13 | Siemens AG, 1000 Berlin und 8000 München | Kristall-roentgen-sequenzspektrometer |
JP3531098B2 (ja) * | 1998-12-28 | 2004-05-24 | 理学電機工業株式会社 | 蛍光x線分析装置 |
JP6324060B2 (ja) * | 2013-12-24 | 2018-05-16 | 株式会社日立ハイテクサイエンス | X線分析装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL152924B (nl) * | 1949-04-19 | Engelhard Ind | Werkwijze voor het reformeren van naftenen en paraffinen bevattende aardoliekoolwaterstoffen in een in serie geplaatste nafteendehydrogeneringszone en een paraffinedehydrocycleringszone. | |
US2532810A (en) * | 1950-01-13 | 1950-12-05 | Gen Electric | X-ray diffraction apparatus for use with radioactive materials |
US2578722A (en) * | 1950-05-18 | 1951-12-18 | United States Steel Corp | Apparatus for determining coating thickness |
-
0
- NL NL85501D patent/NL85501C/xx active
- NL NLAANVRAGE7412171,A patent/NL173668B/xx unknown
- BE BE524089D patent/BE524089A/xx unknown
-
1953
- 1953-10-30 US US389448A patent/US2783385A/en not_active Expired - Lifetime
- 1953-11-05 DE DEN7979A patent/DE1027903B/de active Pending
- 1953-11-05 GB GB30616/53A patent/GB741854A/en not_active Expired
- 1953-11-06 FR FR1090233D patent/FR1090233A/fr not_active Expired
- 1953-11-06 CH CH316826D patent/CH316826A/de unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0014500A1 (de) * | 1979-01-31 | 1980-08-20 | Koninklijke Philips Electronics N.V. | Röntgenstrahlen-Diffraktometer für Pulver |
Also Published As
Publication number | Publication date |
---|---|
NL85501C (de) | |
BE524089A (de) | |
US2783385A (en) | 1957-02-26 |
CH316826A (de) | 1956-10-31 |
NL173668B (nl) | |
GB741854A (en) | 1955-12-14 |
DE1027903B (de) | 1958-04-10 |
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