FR1090233A - Appareil pour la spectrométrie par rayons x - Google Patents

Appareil pour la spectrométrie par rayons x

Info

Publication number
FR1090233A
FR1090233A FR1090233DA FR1090233A FR 1090233 A FR1090233 A FR 1090233A FR 1090233D A FR1090233D A FR 1090233DA FR 1090233 A FR1090233 A FR 1090233A
Authority
FR
France
Prior art keywords
ray spectrometry
spectrometry apparatus
ray
spectrometry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of FR1090233A publication Critical patent/FR1090233A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR1090233D 1952-11-08 1953-11-06 Appareil pour la spectrométrie par rayons x Expired FR1090233A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL316826X 1952-11-08

Publications (1)

Publication Number Publication Date
FR1090233A true FR1090233A (fr) 1955-03-29

Family

ID=19783831

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1090233D Expired FR1090233A (fr) 1952-11-08 1953-11-06 Appareil pour la spectrométrie par rayons x

Country Status (7)

Country Link
US (1) US2783385A (de)
BE (1) BE524089A (de)
CH (1) CH316826A (de)
DE (1) DE1027903B (de)
FR (1) FR1090233A (de)
GB (1) GB741854A (de)
NL (2) NL173668B (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0014500A1 (de) * 1979-01-31 1980-08-20 Koninklijke Philips Electronics N.V. Röntgenstrahlen-Diffraktometer für Pulver

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2835820A (en) * 1955-03-07 1958-05-20 Jr La Verne S Birks Curved crystal fluorescent x-ray spectrograph
US3031571A (en) * 1956-05-21 1962-04-24 Well Completions Inc Apparatus and method for conditioning and analyzing earth components
US2898469A (en) * 1956-09-11 1959-08-04 Gen Electric X-ray diffraction apparatus
US3073952A (en) * 1956-09-11 1963-01-15 Gen Electric X-ray diffraction apparatus
GB847265A (en) * 1957-09-11 1960-09-07 Ass Elect Ind Improvements relating to mechanical linkages
US2957079A (en) * 1957-12-27 1960-10-18 Gen Electric Penetrating ray emission coding
US3012443A (en) * 1960-01-11 1961-12-12 Patent Man Inc Mechanical movement for translating rotary motion to linear motion
DE3125803A1 (de) * 1981-06-30 1983-01-13 Siemens AG, 1000 Berlin und 8000 München Kristall-roentgen-sequenzspektrometer
JP3531098B2 (ja) * 1998-12-28 2004-05-24 理学電機工業株式会社 蛍光ｘ線分析装置
JP6324060B2 (ja) * 2013-12-24 2018-05-16 株式会社日立ハイテクサイエンス Ｘ線分析装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL152924B (nl) * 1949-04-19 Engelhard Ind Werkwijze voor het reformeren van naftenen en paraffinen bevattende aardoliekoolwaterstoffen in een in serie geplaatste nafteendehydrogeneringszone en een paraffinedehydrocycleringszone.
US2532810A (en) * 1950-01-13 1950-12-05 Gen Electric X-ray diffraction apparatus for use with radioactive materials
US2578722A (en) * 1950-05-18 1951-12-18 United States Steel Corp Apparatus for determining coating thickness

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0014500A1 (de) * 1979-01-31 1980-08-20 Koninklijke Philips Electronics N.V. Röntgenstrahlen-Diffraktometer für Pulver

Also Published As

Publication number Publication date
NL85501C (de)
BE524089A (de)
US2783385A (en) 1957-02-26
CH316826A (de) 1956-10-31
NL173668B (nl)
GB741854A (en) 1955-12-14
DE1027903B (de) 1958-04-10

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