NL173668B - Hekwerk. - Google Patents

Hekwerk.

Info

Publication number
NL173668B
NL173668B NLAANVRAGE7412171,A NL173668DA NL173668B NL 173668 B NL173668 B NL 173668B NL 173668D A NL173668D A NL 173668DA NL 173668 B NL173668 B NL 173668B
Authority
NL
Netherlands
Prior art keywords
fences
Prior art date
Application number
NLAANVRAGE7412171,A
Other languages
English (en)
Dutch (nl)
Original Assignee
Yoshida Kogyo Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of NL173668B publication Critical patent/NL173668B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NLAANVRAGE7412171,A 1952-11-08 Hekwerk. NL173668B (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL316826X 1952-11-08

Publications (1)

Publication Number Publication Date
NL173668B true NL173668B (nl)

Family

ID=19783831

Family Applications (2)

Application Number Title Priority Date Filing Date
NLAANVRAGE7412171,A NL173668B (nl) 1952-11-08 Hekwerk.
NL85501D NL85501C (de) 1952-11-08

Family Applications After (1)

Application Number Title Priority Date Filing Date
NL85501D NL85501C (de) 1952-11-08

Country Status (7)

Country Link
US (1) US2783385A (de)
BE (1) BE524089A (de)
CH (1) CH316826A (de)
DE (1) DE1027903B (de)
FR (1) FR1090233A (de)
GB (1) GB741854A (de)
NL (2) NL85501C (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2835820A (en) * 1955-03-07 1958-05-20 Jr La Verne S Birks Curved crystal fluorescent x-ray spectrograph
US3031571A (en) * 1956-05-21 1962-04-24 Well Completions Inc Apparatus and method for conditioning and analyzing earth components
US2898469A (en) * 1956-09-11 1959-08-04 Gen Electric X-ray diffraction apparatus
US3073952A (en) * 1956-09-11 1963-01-15 Gen Electric X-ray diffraction apparatus
GB847265A (en) * 1957-09-11 1960-09-07 Ass Elect Ind Improvements relating to mechanical linkages
US2957079A (en) * 1957-12-27 1960-10-18 Gen Electric Penetrating ray emission coding
US3012443A (en) * 1960-01-11 1961-12-12 Patent Man Inc Mechanical movement for translating rotary motion to linear motion
US4199678A (en) * 1979-01-31 1980-04-22 U.S. Philips Corporation Asymmetric texture sensitive X-ray powder diffractometer
DE3125803A1 (de) * 1981-06-30 1983-01-13 Siemens AG, 1000 Berlin und 8000 München Kristall-roentgen-sequenzspektrometer
JP3531098B2 (ja) * 1998-12-28 2004-05-24 理学電機工業株式会社 蛍光ｘ線分析装置
JP6324060B2 (ja) * 2013-12-24 2018-05-16 株式会社日立ハイテクサイエンス Ｘ線分析装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL152924B (nl) * 1949-04-19 Engelhard Ind Werkwijze voor het reformeren van naftenen en paraffinen bevattende aardoliekoolwaterstoffen in een in serie geplaatste nafteendehydrogeneringszone en een paraffinedehydrocycleringszone.
US2532810A (en) * 1950-01-13 1950-12-05 Gen Electric X-ray diffraction apparatus for use with radioactive materials
US2578722A (en) * 1950-05-18 1951-12-18 United States Steel Corp Apparatus for determining coating thickness

Also Published As

Publication number Publication date
CH316826A (de) 1956-10-31
DE1027903B (de) 1958-04-10
BE524089A (de)
FR1090233A (fr) 1955-03-29
US2783385A (en) 1957-02-26
NL85501C (de)
GB741854A (en) 1955-12-14

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