FI965147A0 - Optinen laite heijastuvan tähtäysmerkin aseman määrittämiseksi - Google Patents

Optinen laite heijastuvan tähtäysmerkin aseman määrittämiseksi

Info

Publication number
FI965147A0
FI965147A0 FI965147A FI965147A FI965147A0 FI 965147 A0 FI965147 A0 FI 965147A0 FI 965147 A FI965147 A FI 965147A FI 965147 A FI965147 A FI 965147A FI 965147 A0 FI965147 A0 FI 965147A0
Authority
FI
Finland
Prior art keywords
determining
optical device
reflective sight
sight
reflective
Prior art date
Application number
FI965147A
Other languages
English (en)
Swedish (sv)
Other versions
FI113401B (fi
FI965147A (fi
Inventor
Hartmut Ehbets
Original Assignee
Leica Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leica Ag filed Critical Leica Ag
Publication of FI965147A0 publication Critical patent/FI965147A0/fi
Publication of FI965147A publication Critical patent/FI965147A/fi
Application granted granted Critical
Publication of FI113401B publication Critical patent/FI113401B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/02—Means for marking measuring points

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FI965147A 1994-06-22 1996-12-20 Optinen laite heijastuvan tähtäysmerkin aseman määrittämiseksi FI113401B (fi)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE4421783 1994-06-22
DE4421783A DE4421783C2 (de) 1994-06-22 1994-06-22 Optische Einrichtung und Verfahren zum Bestimmen der Lage einer reflektierenden Zielmarke
PCT/EP1995/001781 WO1995035480A1 (de) 1994-06-22 1995-05-11 Optische einrichtung zum bestimmen der lage einer reflektierenden zielmarke
EP9501781 1995-05-11

Publications (3)

Publication Number Publication Date
FI965147A0 true FI965147A0 (fi) 1996-12-20
FI965147A FI965147A (fi) 1996-12-20
FI113401B FI113401B (fi) 2004-04-15

Family

ID=6521188

Family Applications (1)

Application Number Title Priority Date Filing Date
FI965147A FI113401B (fi) 1994-06-22 1996-12-20 Optinen laite heijastuvan tähtäysmerkin aseman määrittämiseksi

Country Status (6)

Country Link
US (1) US5771099A (fi)
EP (1) EP0766810B1 (fi)
JP (1) JP3631756B2 (fi)
DE (2) DE4421783C2 (fi)
FI (1) FI113401B (fi)
WO (1) WO1995035480A1 (fi)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19602327C2 (de) * 1996-01-24 1999-08-12 Leica Geosystems Ag Meßkugel-Reflektor
US5861956A (en) * 1997-05-27 1999-01-19 Spatialmetrix Corporation Retroreflector for use with tooling ball
EP0962746B1 (de) 1998-05-20 2010-03-24 Prüftechnik Dieter Busch Ag Verfahren und Vorrichtung, ob zwei hintereinander angeordnete Wellen fluchten
FR2795827B1 (fr) * 1999-06-30 2001-10-12 Regie Autonome Transports Dispositif repere-cible metrologique retroreflechissant
US6299122B1 (en) * 1999-09-28 2001-10-09 Northrup Grumman Corporation Spherically mounted retroreflector edge adapter
DE19963794B4 (de) * 1999-12-30 2004-07-08 Astrium Gmbh Anordnung und Verfahren zur hochgenauen Winkelmessung
US6750822B2 (en) 1999-12-30 2004-06-15 Astrium Gmbh Mobile system and method for characterizing radiation fields outdoors in an extensive and precise manner
US6473980B2 (en) * 2000-11-30 2002-11-05 Cubic Defense Systems, Inc. Infrared laser transmitter alignment verifier and targeting system
US7193209B2 (en) * 2003-04-17 2007-03-20 Eaton Corporation Method for distinguishing objects in a video image by using infrared reflective material
US20060279745A1 (en) * 2005-06-13 2006-12-14 Wenstrand John S Color imaging system for locating retroreflectors
JP4682326B2 (ja) * 2005-07-05 2011-05-11 独立行政法人情報通信研究機構 光学式モーションキャプチャにおけるマーカー認識方法及び装置
JP4224487B2 (ja) * 2005-11-09 2009-02-12 東芝テック株式会社 位置検出システム
US8360051B2 (en) * 2007-11-12 2013-01-29 Brightsource Industries (Israel) Ltd. Solar receiver with energy flux measurement and control
JP5054643B2 (ja) * 2008-09-12 2012-10-24 俊男 和気 レーザ位置決め反射装置
CN101738161B (zh) * 2008-11-14 2012-11-07 中国科学院沈阳自动化研究所 一种测量运动物体六维位姿的设备和方法
CN102022979A (zh) 2009-09-21 2011-04-20 鸿富锦精密工业（深圳）有限公司 三维光学感测系统
WO2011112277A1 (en) * 2010-01-18 2011-09-15 Faro Technologies, Inc. Retroreflector probe adaptor for tracking hidden points
JP2011191175A (ja) * 2010-03-15 2011-09-29 Mitsutoyo Corp レーザ反射体
DE102010019656B4 (de) * 2010-05-03 2016-09-01 Etalon Ag Messgerät
US9443311B2 (en) 2014-06-12 2016-09-13 Topcon Positioning Systems, Inc. Method and system to identify a position of a measurement pole
EP3408610A4 (en) 2016-01-25 2020-01-01 Topcon Positioning Systems, Inc. METHOD AND DEVICE FOR OPTICAL SINGLE CAMERA MEASUREMENTS
GB2565029A (en) * 2017-01-10 2019-02-06 Jt Networks Ltd Surveying target assembly
CN107395929B (zh) * 2017-08-15 2020-02-18 宜科(天津)电子有限公司 基于面阵ccd/cmos的360°检测传感器及检测方法
DE102019116280B3 (de) * 2019-06-14 2020-12-17 Etalon Ag Verfahren und Vorrichtung zum Bestimmen einer Länge

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3188739A (en) * 1962-10-05 1965-06-15 Lockheed Aircraft Corp Multi-directional optical target
US4964218A (en) * 1989-07-10 1990-10-23 General Dynamics Corporation, Convair Division Optical or laser ball target assemblies for precision location measurements
JP2564963B2 (ja) * 1990-03-29 1996-12-18 三菱電機株式会社 ターゲット及びこれを用いた三次元位置姿勢計測システム
DE4013576A1 (de) * 1990-04-27 1992-01-16 Leica Aarau Ag Zielmarke zur bestimmung von messpunkten mit optischen zielgeraeten

Also Published As

Publication number Publication date
DE4421783C2 (de) 1996-05-15
FI113401B (fi) 2004-04-15
US5771099A (en) 1998-06-23
JPH10501890A (ja) 1998-02-17
DE59507848D1 (de) 2000-03-30
WO1995035480A1 (de) 1995-12-28
JP3631756B2 (ja) 2005-03-23
EP0766810A1 (de) 1997-04-09
FI965147A (fi) 1996-12-20
DE4421783A1 (de) 1996-01-11
EP0766810B1 (de) 2000-02-23

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Legal Events

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MA Patent expired