DE69625727T2 - Optische Abstandsmessung - Google Patents

Optische Abstandsmessung

Info

Publication number
DE69625727T2
DE69625727T2 DE69625727T DE69625727T DE69625727T2 DE 69625727 T2 DE69625727 T2 DE 69625727T2 DE 69625727 T DE69625727 T DE 69625727T DE 69625727 T DE69625727 T DE 69625727T DE 69625727 T2 DE69625727 T2 DE 69625727T2
Authority
DE
Germany
Prior art keywords
distance measurement
optical distance
optical
measurement
distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69625727T
Other languages
English (en)
Other versions
DE69625727D1 (de
Inventor
Wayne V Sorin
Douglas M Baney
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of DE69625727D1 publication Critical patent/DE69625727D1/de
Publication of DE69625727T2 publication Critical patent/DE69625727T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
DE69625727T 1995-02-15 1996-02-08 Optische Abstandsmessung Expired - Fee Related DE69625727T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/389,222 US5557400A (en) 1995-02-15 1995-02-15 Multiplexed sensing using optical coherence reflectrometry

Publications (2)

Publication Number Publication Date
DE69625727D1 DE69625727D1 (de) 2003-02-20
DE69625727T2 true DE69625727T2 (de) 2003-11-13

Family

ID=23537366

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69625727T Expired - Fee Related DE69625727T2 (de) 1995-02-15 1996-02-08 Optische Abstandsmessung

Country Status (4)

Country Link
US (1) US5557400A (de)
EP (1) EP0727640B1 (de)
JP (1) JP3722533B2 (de)
DE (1) DE69625727T2 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3411436B2 (ja) * 1996-01-12 2003-06-03 Kddi株式会社 光通信線路の監視方法
GB2317008B (en) * 1996-09-06 2000-02-02 British Aerospace A fibre optic interferometric strain gauge assembly
US6738144B1 (en) 1999-12-17 2004-05-18 University Of Central Florida Non-invasive method and low-coherence apparatus system analysis and process control
US6404526B2 (en) 2000-08-03 2002-06-11 Massachusetts Institute Of Technology WDM system that uses nonlinear temporal gratings
US6384945B1 (en) 2000-08-03 2002-05-07 Massachusetts Institute Of Technology Nonlinear temporal grating as a new optical solitary wave
AU2002337756A1 (en) * 2001-11-14 2003-05-26 Fox-Tek Fiber optic sensor
US6870975B1 (en) 2001-11-14 2005-03-22 Fiber Optic Systems Technology, Inc. Fiber optic sensor usable over wide range of gage lengths
US6804008B1 (en) * 2001-11-14 2004-10-12 Fiber Optic Systems Technology, Inc. Fiber optic sensing instrument and system with fiber of adjustable optical path length and method of using it
US20040046109A1 (en) * 2002-09-05 2004-03-11 Chen Peter C. Method and apparatus for high speed interrogation of fiber optic detector arrays
GB0302434D0 (en) * 2003-02-03 2003-03-05 Sensor Highway Ltd Interferometric method and apparatus for measuring physical parameters
US7127132B1 (en) 2004-03-08 2006-10-24 Ifos, Inc. Cascade fiber-optic grating-based sensor apparatus and method
US20070277619A1 (en) * 2005-05-02 2007-12-06 Grishaber Randy-David B Method for measuring deformations in test specimens and a system for marking the test specimens
DE102006046693A1 (de) * 2006-09-29 2008-04-03 Siemens Ag Faseroptische Sensorvorrichtung
JP5274862B2 (ja) * 2008-03-10 2013-08-28 東京エレクトロン株式会社 温度測定装置及び温度測定方法
CN101995265B (zh) * 2010-09-29 2012-05-09 哈尔滨工程大学 非平衡Mach-Zehnder光学自相关器的低相干多路复用光纤干涉仪
JP5587509B2 (ja) * 2010-10-08 2014-09-10 ハルビン エンジニアリング ユニバーシティ 光ファイバリングに基づくセンサ用マルチ光路自己相関器
DE102012106806B4 (de) * 2012-07-26 2022-07-28 J-Fiber Gmbh Sensorfaser zur Temperatur-, Dehnungs- und/oder Torsionsdetektion in Form eines Mehrkern-Lichtwellenleiters mit einer Fiber-Bragg-Gitterstruktur
CN104501731B (zh) * 2014-12-15 2019-03-05 哈尔滨工程大学 一种低相干多路复用准分布光纤应变测量系统
US20170124367A1 (en) * 2015-10-29 2017-05-04 Empire Technology Development Llc Alignment markers to facilitate detection of object orientation and deformation
CN105954004B (zh) * 2016-04-01 2018-10-26 哈尔滨工程大学 一种后向散射随机匹配相干噪声测试仪
GB201700266D0 (en) 2017-01-06 2017-02-22 Silixa Ltd Method and apparatus for optical sensing

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2165118B (en) * 1984-09-29 1988-01-20 Plessey Co Plc Otdr for sensing distortions in optical fibres
DE3771865D1 (de) * 1987-02-13 1991-09-05 G2 Systems Corp Faseroptisches bau-ueberwachungssystem.
GB2209212A (en) * 1987-09-01 1989-05-04 Plessey Co Plc Optical sensing systems
GB8828408D0 (en) * 1988-12-06 1989-01-05 British Telecomm Loss detector
GB2248498B (en) * 1990-10-04 1994-04-13 Marconi Gec Ltd Variable gain optical sensing system
US5341205A (en) * 1991-01-15 1994-08-23 The United States Of America As Represented By The Secretary Of The Navy Method for characterization of optical waveguide devices using partial coherence interferometry
US5268738A (en) * 1992-06-30 1993-12-07 Hewlett-Packard Company Extended distance range optical low-coherence reflectometer
GB2268581A (en) * 1992-07-03 1994-01-12 Marconi Gec Ltd Optical fibre diffraction grating sensor
US5383015A (en) * 1992-12-22 1995-01-17 At&T Corp. Optical time domain reflectometry measurements on a multi-branch optical network using multiwavelength pass filters
GB9324333D0 (en) * 1993-11-26 1994-01-12 Sensor Dynamics Ltd Measurement of one or more physical parameters

Also Published As

Publication number Publication date
JP3722533B2 (ja) 2005-11-30
EP0727640A3 (de) 1997-05-28
US5557400A (en) 1996-09-17
EP0727640B1 (de) 2003-01-15
JPH08247716A (ja) 1996-09-27
EP0727640A2 (de) 1996-08-21
DE69625727D1 (de) 2003-02-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee