FI773651A - One-line-system foer kontroll av additiver i ett arkmaterial - Google Patents

One-line-system foer kontroll av additiver i ett arkmaterial

Info

Publication number
FI773651A
FI773651A FI773651A FI773651A FI773651A FI 773651 A FI773651 A FI 773651A FI 773651 A FI773651 A FI 773651A FI 773651 A FI773651 A FI 773651A FI 773651 A FI773651 A FI 773651A
Authority
FI
Finland
Prior art keywords
arkmaterial
additiver
ett
line
control
Prior art date
Application number
FI773651A
Other languages
English (en)
Other versions
FI70750C (fi
FI70750B (fi
Inventor
Alexander Buchnea
Original Assignee
Sentrol Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sentrol Systems Ltd filed Critical Sentrol Systems Ltd
Publication of FI773651A publication Critical patent/FI773651A/fi
Application granted granted Critical
Publication of FI70750B publication Critical patent/FI70750B/fi
Publication of FI70750C publication Critical patent/FI70750C/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FI773651A 1976-12-17 1977-12-01 Anordning foer maetning av koncentrationen foer ett foersta oc andra tillsatsaemne FI70750C (fi)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US75131276 1976-12-17
US05/751,312 US4081676A (en) 1976-12-17 1976-12-17 On-line system for monitoring sheet material additives

Publications (3)

Publication Number Publication Date
FI773651A true FI773651A (fi) 1978-06-18
FI70750B FI70750B (fi) 1986-06-26
FI70750C FI70750C (fi) 1986-10-06

Family

ID=25021441

Family Applications (1)

Application Number Title Priority Date Filing Date
FI773651A FI70750C (fi) 1976-12-17 1977-12-01 Anordning foer maetning av koncentrationen foer ett foersta oc andra tillsatsaemne

Country Status (5)

Country Link
US (1) US4081676A (fi)
JP (1) JPS5376093A (fi)
CA (1) CA1079415A (fi)
FI (1) FI70750C (fi)
GB (1) GB1560970A (fi)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2850819C2 (de) * 1978-11-23 1985-11-14 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Verfahren zur Prüfung eines Stück Papiers als Prüfling, insbesondere einer Banknote oder Wertmarke sowie Vorrichtung zur Durchführung des Verfahrens
JPS5636044A (en) * 1979-08-31 1981-04-09 Sumitomo Metal Ind Ltd Measuring method for ion density by fluorescent x-rays
JPS5750059U (fi) * 1980-09-05 1982-03-20
US4350889A (en) * 1980-09-17 1982-09-21 International Paper Company X-Ray fluorescent analysis with matrix compensation
FI62420C (fi) * 1981-05-29 1982-12-10 Enso Gutzeit Oy Foerfarande foer att maeta belaeggningsmaengd
US4815116A (en) * 1981-09-17 1989-03-21 Process Automation Business, Inc. Method and apparatus for x-ray analysis of rapidly moving multicomponent materials
FI68321C (fi) * 1982-12-01 1985-08-12 Valtion Teknillinen Foerfarande foer att medelst straolning utsaend av ett roentgenroer utan att foerstoera provet maeta foerdelningen av fyll- och/eller belaeggningsmedel i tjockleksriktningen av papper kartong eller liknande och halten av dessa medel anordningar foer tillaempande av foerfarandet samt anvaendningar av foerfarandet och anordningarna
FI68320C (fi) * 1982-12-01 1985-08-12 Valtion Teknillinen Foerfarande foer att medelst straolning fraon en radioisotopkaella utan att foerstoera provet maeta foerdelningen av fyll-och/eller belaeggningsmedel i tjockleksriktningen av papp erartong eller liknande och halten av dessa medel anordnin rgafoer tillaempande av foerfarandet samt anvaendningar av erfoarandet och anordningarna
US5778041A (en) * 1983-10-13 1998-07-07 Honeywell-Measurex Corporation System and process for measuring ash in paper
JPH02226056A (ja) * 1989-02-27 1990-09-07 Yokogawa Electric Corp 灰分計
US5428657A (en) * 1994-03-22 1995-06-27 Georgia Tech Research Corporation X-ray monitoring system
US6421415B1 (en) * 1999-05-21 2002-07-16 Metso Paper Automation Oy On-line system for quantitative analysis of multi-component additives and coatings in sheet material
US7376215B2 (en) * 2005-12-27 2008-05-20 Honeywell International Inc. Measurement of ash composition using scanning high voltage X-ray sensor
FR2951036A1 (fr) * 2009-10-01 2011-04-08 Commissariat Energie Atomique Dispositif de traitement d'un signal delivre par un detecteur de rayonnement
DE102012021709B4 (de) * 2011-11-22 2014-09-11 Technische Universität Dresden Verfahren zur qualitativen und quantitativen Bestimmung von Zuschlagstoffen in Papier und papierähnlichen Materialien mit Zellulosematerial
WO2016134469A1 (en) * 2015-02-26 2016-09-01 Astenjohnson, Inc. Apparatus for measurement of optical transmission using fluorescence radiation
CN106124396B (zh) * 2016-06-06 2019-04-19 大连理工大学 金属材料电化学测试原位衍射及成像实验方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI40753B (fi) * 1968-04-03 1969-01-31 Valmet Oy
US3749910A (en) * 1970-09-28 1973-07-31 Nat Res Dev Determination of the mean size of solid particles contained in a fluid by scattering of x-radiation
DK134687B (da) * 1972-11-22 1976-12-20 Isotopcentralen Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler.

Also Published As

Publication number Publication date
JPS6235054B2 (fi) 1987-07-30
GB1560970A (en) 1980-02-13
FI70750C (fi) 1986-10-06
US4081676A (en) 1978-03-28
FI70750B (fi) 1986-06-26
CA1079415A (en) 1980-06-10
JPS5376093A (en) 1978-07-06

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Legal Events

Date Code Title Description
MA Patent expired
MA Patent expired

Owner name: VALMET AUTOMATION (CANADA) LTD.