FI40753B - - Google Patents

Info

Publication number
FI40753B
FI40753B FI0926/68A FI92668A FI40753B FI 40753 B FI40753 B FI 40753B FI 0926/68 A FI0926/68 A FI 0926/68A FI 92668 A FI92668 A FI 92668A FI 40753 B FI40753 B FI 40753B
Authority
FI
Finland
Application number
FI0926/68A
Other languages
Finnish (fi)
Inventor
H Puolakka
Original Assignee
Valmet Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Valmet Oy filed Critical Valmet Oy
Priority to FI0926/68A priority Critical patent/FI40753B/fi
Application granted granted Critical
Publication of FI40753B publication Critical patent/FI40753B/fi
Priority to DE1916180A priority patent/DE1916180C3/de
Priority to GB1228694D priority patent/GB1228694A/en
Priority to FR6909627A priority patent/FR2005433A1/fr
Priority to US811852A priority patent/US3660662A/en
Priority to SE04737/69A priority patent/SE346621B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FI0926/68A 1968-04-03 1968-04-03 FI40753B (ko)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FI0926/68A FI40753B (ko) 1968-04-03 1968-04-03
DE1916180A DE1916180C3 (de) 1968-04-03 1969-03-28 Meßvorrichtung
GB1228694D GB1228694A (ko) 1968-04-03 1969-03-28
FR6909627A FR2005433A1 (ko) 1968-04-03 1969-03-31
US811852A US3660662A (en) 1968-04-03 1969-04-01 X-ray apparatus for measuring paper web moisture and the like
SE04737/69A SE346621B (ko) 1968-04-03 1969-04-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI0926/68A FI40753B (ko) 1968-04-03 1968-04-03

Publications (1)

Publication Number Publication Date
FI40753B true FI40753B (ko) 1969-01-31

Family

ID=8504840

Family Applications (1)

Application Number Title Priority Date Filing Date
FI0926/68A FI40753B (ko) 1968-04-03 1968-04-03

Country Status (6)

Country Link
US (1) US3660662A (ko)
DE (1) DE1916180C3 (ko)
FI (1) FI40753B (ko)
FR (1) FR2005433A1 (ko)
GB (1) GB1228694A (ko)
SE (1) SE346621B (ko)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DK134687B (da) * 1972-11-22 1976-12-20 Isotopcentralen Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler.
US4081676A (en) * 1976-12-17 1978-03-28 Sentrol Systems Ltd. On-line system for monitoring sheet material additives
USRE30884E (en) * 1976-12-17 1982-03-16 Sentrol Systems Ltd. On-line system for monitoring sheet material additives
FI59489C (fi) * 1978-11-21 1981-08-10 Enso Gutzeit Oy Foerfarande foer maetning av belaeggningsmaengder
DE2850819C2 (de) * 1978-11-23 1985-11-14 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Verfahren zur Prüfung eines Stück Papiers als Prüfling, insbesondere einer Banknote oder Wertmarke sowie Vorrichtung zur Durchführung des Verfahrens
DE3110944A1 (de) * 1981-03-20 1982-09-30 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe "einrichtung zur kontinuierlichen messung von elementgehalten in trueben"
DE3111187A1 (de) * 1981-03-21 1982-09-30 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe Einrichtung zur kontinuierlichen messung von elementgehalten in trueben
US4350889A (en) * 1980-09-17 1982-09-21 International Paper Company X-Ray fluorescent analysis with matrix compensation
FI68322C (fi) * 1983-06-28 1985-08-12 Enso Gutzeit Oy Foerfarande och anordning foer maetning av maengden av siliciumbelaeggning vid papper eller kartong
DE10014650A1 (de) * 2000-03-24 2001-10-04 Wacker Siltronic Halbleitermat Halbleiterscheibe aus Silicium und Verfahren zur Herstellung der Halbleiterscheibe
DE102005048644A1 (de) * 2005-05-03 2006-11-16 Mahlo Gmbh & Co. Kg Verfahren zur Bestimmung eines Flächengewichtes und/oder einer chemischen Zusammensetzung einer geförderten Materialprobe
US8101047B2 (en) * 2008-09-29 2012-01-24 Honeywell International Inc. Method of correcting gypsum crystal water effect on infrared moisture measurement

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3121166A (en) * 1960-10-20 1964-02-11 Carl A Vossberg X-ray apparatus for measuring paper web density
BE628322A (ko) * 1962-02-12
GB1110284A (en) * 1965-06-22 1968-04-18 Nat Res Dev Improvements in or relating to the continuous analysis of the solid component of a slurry

Also Published As

Publication number Publication date
DE1916180B2 (de) 1974-08-15
US3660662A (en) 1972-05-02
DE1916180A1 (de) 1969-10-23
FR2005433A1 (ko) 1969-12-12
GB1228694A (ko) 1971-04-15
SE346621B (ko) 1972-07-10
DE1916180C3 (de) 1975-04-24

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