FI124951B - Optinen järjestelmä - Google Patents

Optinen järjestelmä Download PDF

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Publication number
FI124951B
FI124951B FI20105110A FI20105110A FI124951B FI 124951 B FI124951 B FI 124951B FI 20105110 A FI20105110 A FI 20105110A FI 20105110 A FI20105110 A FI 20105110A FI 124951 B FI124951 B FI 124951B
Authority
FI
Finland
Prior art keywords
measuring head
light
component
wavelength
measuring
Prior art date
Application number
FI20105110A
Other languages
English (en)
Finnish (fi)
Swedish (sv)
Other versions
FI20105110A7 (fi
FI20105110A0 (fi
Inventor
Jan Kåhre
Original Assignee
Jan Kåhre
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jan Kåhre filed Critical Jan Kåhre
Priority to FI20105110A priority Critical patent/FI124951B/fi
Publication of FI20105110A0 publication Critical patent/FI20105110A0/fi
Priority to JP2011018053A priority patent/JP5910805B2/ja
Priority to DE102011000456.4A priority patent/DE102011000456B4/de
Priority to US13/021,234 priority patent/US8760640B2/en
Publication of FI20105110A7 publication Critical patent/FI20105110A7/fi
Application granted granted Critical
Publication of FI124951B publication Critical patent/FI124951B/fi

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N21/431Dip refractometers, e.g. using optical fibres
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI20105110A 2010-02-05 2010-02-05 Optinen järjestelmä FI124951B (fi)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI20105110A FI124951B (fi) 2010-02-05 2010-02-05 Optinen järjestelmä
JP2011018053A JP5910805B2 (ja) 2010-02-05 2011-01-31 光学システム
DE102011000456.4A DE102011000456B4 (de) 2010-02-05 2011-02-02 Messkopf, optisches System, Verfahren sowie Software-Produkt zur Messungdes Brechungsindex eines Mediums
US13/021,234 US8760640B2 (en) 2010-02-05 2011-02-04 Optical system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20105110 2010-02-05
FI20105110A FI124951B (fi) 2010-02-05 2010-02-05 Optinen järjestelmä

Publications (3)

Publication Number Publication Date
FI20105110A0 FI20105110A0 (fi) 2010-02-05
FI20105110A7 FI20105110A7 (fi) 2011-08-06
FI124951B true FI124951B (fi) 2015-04-15

Family

ID=41727659

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20105110A FI124951B (fi) 2010-02-05 2010-02-05 Optinen järjestelmä

Country Status (4)

Country Link
US (1) US8760640B2 (enExample)
JP (1) JP5910805B2 (enExample)
DE (1) DE102011000456B4 (enExample)
FI (1) FI124951B (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9194798B2 (en) * 2012-03-13 2015-11-24 Ut-Battelle, Llc Imaging based refractometer for hyperspectral refractive index detection
US9194799B2 (en) * 2012-03-13 2015-11-24 Ut-Battelle, Llc Imaging based refractometers
DE102012102983A1 (de) 2012-04-05 2013-10-10 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zum Bestimmen eines kritischen Winkels eines Anregungslichtstrahls
US8692985B1 (en) * 2012-11-19 2014-04-08 J.A. Woollam Co., Inc. Method of determining refractive index of prism shaped material
RU2563310C2 (ru) * 2014-01-09 2015-09-20 Акционерное общество "Швабе-Технологическая лаборатория" (АО "Швабе - Технологическая лаборатория") Способ измерения средней дисперсии света и устройство для его осуществления
DE102015106795A1 (de) * 2015-04-30 2016-11-03 Anton Paar Optotec Gmbh Wellenlängenkalibration für Refraktometer
JP6791081B2 (ja) * 2017-09-26 2020-11-25 株式会社島津製作所 屈折率測定装置及び屈折率測定方法
US10571334B2 (en) * 2017-12-15 2020-02-25 Horiba Instruments Incorporated System and method for selective resolution for concave grating spectrometer
CN111007037A (zh) * 2019-11-23 2020-04-14 成都佳鑫德科技有限公司 一种基于光学器件的液体浓度测量装置、计算机设备及计算机可读存储介质
FI20206374A1 (en) * 2020-12-28 2022-06-29 Kxs Tech Oy Refractometer
DE102021116991A1 (de) 2021-07-01 2023-01-05 Hochschule Düsseldorf Körperschaft des öffentlichen Rechts Verfahren und Vorrichtung zum Bestimmen frequenzabhängiger Brechungsindizes

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4306805A (en) * 1979-06-04 1981-12-22 Arrington James R Refractometric device
JPS6111637A (ja) * 1984-06-27 1986-01-20 Nec Corp 液体センサ
JPH0652238B2 (ja) * 1988-02-03 1994-07-06 株式会社フジクラ 流体屈折計およびこれを用いた流体密度計
DE3831346A1 (de) * 1988-09-15 1990-04-05 Zeiss Carl Fa Refraktometer mit brechzahlabhaengiger aperturteilung
US5042893A (en) * 1990-11-09 1991-08-27 Hewlett-Packard Company Direct mount coupling to a spectrophotometer
FI96451C (fi) * 1993-09-07 1996-06-25 Janesko Oy Refraktometri
JPH10318919A (ja) * 1997-05-19 1998-12-04 Nippon Soken Inc 屈折率測定装置
US6496636B1 (en) * 1997-06-13 2002-12-17 Mark Stephen Braiman Support planar and tapered quasi-planar germanium waveguides for infrared evanescent-wave sensing
US6070093A (en) * 1997-12-02 2000-05-30 Abbott Laboratories Multiplex sensor and method of use
US6538727B2 (en) * 2000-04-17 2003-03-25 Paul H. Nicholas Electronic device for distinguishing sugar sweetened beverages from artificially sweetened ones
JP2003315268A (ja) * 2002-04-19 2003-11-06 Mitsubishi Electric Corp 粉塵検出装置
JP4213441B2 (ja) * 2002-09-20 2009-01-21 シャープ株式会社 トナー飛散量検出装置および画像形成装置
US20050151975A1 (en) * 2004-01-14 2005-07-14 Ivan Melnyk Fabry-perot fiber optic sensing device and method
WO2006004061A1 (ja) * 2004-07-02 2006-01-12 The Furukawa Electric Co., Ltd. 光給電型センシングシステム
JP4911606B2 (ja) 2007-03-08 2012-04-04 倉敷紡績株式会社 全反射減衰型光学プローブおよびそれを用いた水溶液分光測定装置
US8730468B2 (en) 2008-02-01 2014-05-20 Rare Light, Inc. Methods, devices and kits for peri-critical reflectance spectroscopy
US7619725B1 (en) 2008-05-12 2009-11-17 Sealite Engineering, Inc. Optically amplified critical wavelength refractometer
GB2460305B (en) 2008-11-11 2010-06-16 Univ Montfort Determining the particle size distribution of a suspension

Also Published As

Publication number Publication date
DE102011000456B4 (de) 2022-01-27
JP5910805B2 (ja) 2016-04-27
JP2011164102A (ja) 2011-08-25
US8760640B2 (en) 2014-06-24
FI20105110A7 (fi) 2011-08-06
FI20105110A0 (fi) 2010-02-05
US20110194109A1 (en) 2011-08-11
DE102011000456A1 (de) 2011-08-11

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