DE102011000456B4 - Messkopf, optisches System, Verfahren sowie Software-Produkt zur Messungdes Brechungsindex eines Mediums - Google Patents

Messkopf, optisches System, Verfahren sowie Software-Produkt zur Messungdes Brechungsindex eines Mediums Download PDF

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DE102011000456B4
DE102011000456B4 DE102011000456.4A DE102011000456A DE102011000456B4 DE 102011000456 B4 DE102011000456 B4 DE 102011000456B4 DE 102011000456 A DE102011000456 A DE 102011000456A DE 102011000456 B4 DE102011000456 B4 DE 102011000456B4
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measuring head
light
partial beam
measuring
partial
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DE102011000456A1 (de
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Jan Kahre
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N21/431—Dip refractometers, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE102011000456.4A 2010-02-05 2011-02-02 Messkopf, optisches System, Verfahren sowie Software-Produkt zur Messungdes Brechungsindex eines Mediums Active DE102011000456B4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20105110 2010-02-05
FI20105110A FI124951B (fi) 2010-02-05 2010-02-05 Optinen järjestelmä

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DE102011000456A1 DE102011000456A1 (de) 2011-08-11
DE102011000456B4 true DE102011000456B4 (de) 2022-01-27

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US (1) US8760640B2 (enExample)
JP (1) JP5910805B2 (enExample)
DE (1) DE102011000456B4 (enExample)
FI (1) FI124951B (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9194798B2 (en) * 2012-03-13 2015-11-24 Ut-Battelle, Llc Imaging based refractometer for hyperspectral refractive index detection
US9194799B2 (en) * 2012-03-13 2015-11-24 Ut-Battelle, Llc Imaging based refractometers
DE102012102983A1 (de) 2012-04-05 2013-10-10 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zum Bestimmen eines kritischen Winkels eines Anregungslichtstrahls
US8692985B1 (en) * 2012-11-19 2014-04-08 J.A. Woollam Co., Inc. Method of determining refractive index of prism shaped material
RU2563310C2 (ru) * 2014-01-09 2015-09-20 Акционерное общество "Швабе-Технологическая лаборатория" (АО "Швабе - Технологическая лаборатория") Способ измерения средней дисперсии света и устройство для его осуществления
DE102015106795A1 (de) * 2015-04-30 2016-11-03 Anton Paar Optotec Gmbh Wellenlängenkalibration für Refraktometer
JP6791081B2 (ja) * 2017-09-26 2020-11-25 株式会社島津製作所 屈折率測定装置及び屈折率測定方法
US10571334B2 (en) * 2017-12-15 2020-02-25 Horiba Instruments Incorporated System and method for selective resolution for concave grating spectrometer
CN111007037A (zh) * 2019-11-23 2020-04-14 成都佳鑫德科技有限公司 一种基于光学器件的液体浓度测量装置、计算机设备及计算机可读存储介质
FI20206374A1 (en) * 2020-12-28 2022-06-29 Kxs Tech Oy Refractometer
DE102021116991A1 (de) 2021-07-01 2023-01-05 Hochschule Düsseldorf Körperschaft des öffentlichen Rechts Verfahren und Vorrichtung zum Bestimmen frequenzabhängiger Brechungsindizes

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1970695A1 (en) 2007-03-08 2008-09-17 Kurashiki Boseki Kabushiki Kaisha Attenuated total reflection probe and spectrometer therewith
WO2009137122A2 (en) 2008-02-01 2009-11-12 Rare Light, Inc. Methods, devices and kits for peri-critical reflectance spectroscopy
US20090279074A1 (en) 2008-05-12 2009-11-12 Sealite Engineering Optically amplified critical wavelength refractometer

Family Cites Families (15)

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US4306805A (en) * 1979-06-04 1981-12-22 Arrington James R Refractometric device
JPS6111637A (ja) * 1984-06-27 1986-01-20 Nec Corp 液体センサ
JPH0652238B2 (ja) * 1988-02-03 1994-07-06 株式会社フジクラ 流体屈折計およびこれを用いた流体密度計
DE3831346A1 (de) * 1988-09-15 1990-04-05 Zeiss Carl Fa Refraktometer mit brechzahlabhaengiger aperturteilung
US5042893A (en) * 1990-11-09 1991-08-27 Hewlett-Packard Company Direct mount coupling to a spectrophotometer
FI96451C (fi) * 1993-09-07 1996-06-25 Janesko Oy Refraktometri
JPH10318919A (ja) * 1997-05-19 1998-12-04 Nippon Soken Inc 屈折率測定装置
US6496636B1 (en) * 1997-06-13 2002-12-17 Mark Stephen Braiman Support planar and tapered quasi-planar germanium waveguides for infrared evanescent-wave sensing
US6070093A (en) * 1997-12-02 2000-05-30 Abbott Laboratories Multiplex sensor and method of use
US6538727B2 (en) * 2000-04-17 2003-03-25 Paul H. Nicholas Electronic device for distinguishing sugar sweetened beverages from artificially sweetened ones
JP2003315268A (ja) * 2002-04-19 2003-11-06 Mitsubishi Electric Corp 粉塵検出装置
JP4213441B2 (ja) * 2002-09-20 2009-01-21 シャープ株式会社 トナー飛散量検出装置および画像形成装置
US20050151975A1 (en) * 2004-01-14 2005-07-14 Ivan Melnyk Fabry-perot fiber optic sensing device and method
WO2006004061A1 (ja) * 2004-07-02 2006-01-12 The Furukawa Electric Co., Ltd. 光給電型センシングシステム
GB2460305B (en) 2008-11-11 2010-06-16 Univ Montfort Determining the particle size distribution of a suspension

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1970695A1 (en) 2007-03-08 2008-09-17 Kurashiki Boseki Kabushiki Kaisha Attenuated total reflection probe and spectrometer therewith
WO2009137122A2 (en) 2008-02-01 2009-11-12 Rare Light, Inc. Methods, devices and kits for peri-critical reflectance spectroscopy
US20090279074A1 (en) 2008-05-12 2009-11-12 Sealite Engineering Optically amplified critical wavelength refractometer

Also Published As

Publication number Publication date
JP5910805B2 (ja) 2016-04-27
JP2011164102A (ja) 2011-08-25
FI124951B (fi) 2015-04-15
US8760640B2 (en) 2014-06-24
FI20105110A7 (fi) 2011-08-06
FI20105110A0 (fi) 2010-02-05
US20110194109A1 (en) 2011-08-11
DE102011000456A1 (de) 2011-08-11

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