ES8707340A1 - Determining the location of defects present in flat glass - Google Patents

Determining the location of defects present in flat glass

Info

Publication number
ES8707340A1
ES8707340A1 ES554081A ES554081A ES8707340A1 ES 8707340 A1 ES8707340 A1 ES 8707340A1 ES 554081 A ES554081 A ES 554081A ES 554081 A ES554081 A ES 554081A ES 8707340 A1 ES8707340 A1 ES 8707340A1
Authority
ES
Spain
Prior art keywords
glass
defects
detector
photodetectors
irradiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES554081A
Other languages
Spanish (es)
Other versions
ES554081A0 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Glass Europe SA
Original Assignee
Glaverbel Belgium SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Glaverbel Belgium SA filed Critical Glaverbel Belgium SA
Publication of ES554081A0 publication Critical patent/ES554081A0/en
Publication of ES8707340A1 publication Critical patent/ES8707340A1/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/11—Monitoring and controlling the scan
    • G01N2201/117—Indexed, memorised or programmed scan

Abstract

The locations of defects in flat glass (1) are detected during conveyance through a detection station where the glass is scanned by a radiation beam (11). The beam sweeps transversely across the path of the glass through a distance in excess of the glass width so that the beam sweeps through both side edges. Beam deflection occurs when the beam encounters a side edge boundary of the glass (1) and beam deflection or attenuation occurs when the beam encounters a defect. Photodetectors (22,23) are located so that their irradiation or non- irradiation by the beam after it has passed through the glass depends on beam defections or attenuations by the glass, in particular detector 23 receives the beam when undeflected and detector 22 when deflected. Pulses of light are received by a detector 15 from a striped mirror 13 to indicate the position of the beam. The photodetectors are connected to a signal processor from which output signals are obtained indicative of the locations of the defects in the lengthwise direction of the glass and indicative of the transverse distances between such defects and a side edge of the glass.
ES554081A 1985-04-02 1986-04-02 Determining the location of defects present in flat glass Expired ES8707340A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08508590A GB2173294B (en) 1985-04-02 1985-04-02 Method of and apparatus for determining the location of defects present in flat glass

Publications (2)

Publication Number Publication Date
ES554081A0 ES554081A0 (en) 1987-07-16
ES8707340A1 true ES8707340A1 (en) 1987-07-16

Family

ID=10577080

Family Applications (1)

Application Number Title Priority Date Filing Date
ES554081A Expired ES8707340A1 (en) 1985-04-02 1986-04-02 Determining the location of defects present in flat glass

Country Status (10)

Country Link
AT (1) AT399596B (en)
BE (1) BE904465A (en)
DE (1) DE3610484C2 (en)
ES (1) ES8707340A1 (en)
FR (1) FR2579750B1 (en)
GB (1) GB2173294B (en)
IT (1) IT1189618B (en)
LU (1) LU86375A1 (en)
NL (1) NL194480C (en)
PT (1) PT82302B (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3641863A1 (en) * 1986-12-08 1988-06-09 Bosch Gmbh Robert SURFACE TEST DEVICE
DE3641862A1 (en) * 1986-12-08 1988-06-09 Bosch Gmbh Robert DEVICE FOR TESTING ROTATION-SYMMETRICAL WORKPIECES
DE3717274A1 (en) * 1987-05-22 1988-12-01 Sick Erwin Gmbh Optical defect inspecting device
JPH07151706A (en) * 1993-09-03 1995-06-16 Minnesota Mining & Mfg Co <3M> Flaw detector for article and using method thereof
GB9812091D0 (en) * 1998-06-05 1998-08-05 Glaverbel Defect detecting unit
DE102004027411A1 (en) * 2004-06-04 2005-12-29 Boraglas Gmbh Method and apparatus for identifying tin and fire side of float glass
JP5248052B2 (en) 2006-10-11 2013-07-31 日東電工株式会社 Defect inspection device for sheet-like product having optical film, inspection data processing device, cutting device and manufacturing system thereof
AT509963B1 (en) 2010-06-07 2012-05-15 Hermann Sonnleitner DEVICE FOR PUNCTUALLY CLEANING AND INSPECTING ERRORS ON FLAT GLASS PANES
US8164818B2 (en) 2010-11-08 2012-04-24 Soladigm, Inc. Electrochromic window fabrication methods
AT511055B1 (en) 2011-03-24 2012-09-15 Softsolution Gmbh DEVICE FOR PROJECTION OF PRODUCT OR BZW. PRODUCTION RELEVANT PICTURE AND TEXT DATA AT PLANTS FOR THE PRODUCTION OF INDIVIDUAL OR BIN. INSULATING DISCS
US10739658B2 (en) 2011-12-12 2020-08-11 View, Inc. Electrochromic laminates
DE102014107542B4 (en) 2014-05-28 2020-02-06 Softsolution Gmbh Process for the manufacture of multi-pane flat glass products
CN104730145B (en) * 2015-03-06 2017-04-26 中国航空工业集团公司北京航空材料研究院 Method for accurately positioning defects of material during ultrasonic detection
DE102015108553B4 (en) * 2015-05-29 2019-02-14 Schott Ag Methods and devices for reducing the saberiness of thin glasses
DE102016104273B4 (en) * 2016-03-09 2021-02-04 Hegla Gmbh & Co. Kg Method and device for treating flat glass units in a glass processing plant and glass processing plant
CN107798376A (en) * 2017-10-16 2018-03-13 福耀集团（上海）汽车玻璃有限公司 Glass intelligent counter and method of counting

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL272308A (en) * 1960-12-13
US3445672A (en) * 1966-08-15 1969-05-20 Philco Ford Corp Flaw detection and marking system
GB1315654A (en) * 1969-05-21 1973-05-02 Pilkington Brothers Ltd Detection of faults in transparent material using lasers
FR2078535A5 (en) * 1970-02-16 1971-11-05 British Aircraft Corp Ltd
US3759620A (en) * 1972-05-30 1973-09-18 Philco Ford Corp Flaw detection and marking apparatus
GB1526930A (en) * 1974-12-19 1978-10-04 Bfg Glassgroup Process and apparatus for testing glass
US4038554A (en) * 1976-03-09 1977-07-26 Columbia Research Corporation Detection of flaws in a moving web of transparent material
US4097151A (en) * 1976-03-16 1978-06-27 Ppg Industries, Inc. Method of and apparatus for locating B type and point type defects in a glass ribbon
US4203672A (en) * 1976-11-18 1980-05-20 E. I. Du Pont De Nemours And Company Scanning beam displacement compensation control system
DE3034901A1 (en) * 1979-09-17 1981-04-30 Intec Corp., Trumbull, Conn. Defect detector system automatic scanning beam positioner - has beam sensor next edge of moving web detecting laser beam position w.r.t. its scanning path
US4306808A (en) * 1979-12-14 1981-12-22 Ford Aerospace & Communications Corp. Glass flaw inspection system

Also Published As

Publication number Publication date
AT399596B (en) 1995-06-26
FR2579750A1 (en) 1986-10-03
ES554081A0 (en) 1987-07-16
PT82302B (en) 1992-06-30
NL194480B (en) 2002-01-02
IT1189618B (en) 1988-02-04
NL8600790A (en) 1986-11-03
DE3610484A1 (en) 1986-10-09
NL194480C (en) 2002-05-03
FR2579750B1 (en) 1988-11-10
PT82302A (en) 1986-04-01
BE904465A (en) 1986-09-24
ATA84086A (en) 1994-10-15
GB2173294B (en) 1988-10-12
DE3610484C2 (en) 1998-09-17
LU86375A1 (en) 1986-06-24
GB8508590D0 (en) 1985-05-09
IT8667222A0 (en) 1986-03-20
GB2173294A (en) 1986-10-08

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 20040507