GB8508590D0 - Determining location of defects present in flat glass - Google Patents

Determining location of defects present in flat glass

Info

Publication number
GB8508590D0
GB8508590D0 GB858508590A GB8508590A GB8508590D0 GB 8508590 D0 GB8508590 D0 GB 8508590D0 GB 858508590 A GB858508590 A GB 858508590A GB 8508590 A GB8508590 A GB 8508590A GB 8508590 D0 GB8508590 D0 GB 8508590D0
Authority
GB
United Kingdom
Prior art keywords
flat glass
determining location
defects present
defects
present
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB858508590A
Other versions
GB2173294A (en
GB2173294B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Glass Europe SA
Original Assignee
Glaverbel Belgium SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Glaverbel Belgium SA filed Critical Glaverbel Belgium SA
Priority to GB08508590A priority Critical patent/GB2173294B/en
Publication of GB8508590D0 publication Critical patent/GB8508590D0/en
Priority to IT67222/86A priority patent/IT1189618B/en
Priority to FR8604334A priority patent/FR2579750B1/en
Priority to BE1/011461A priority patent/BE904465A/en
Priority to NL8600790A priority patent/NL194480C/en
Priority to DE3610484A priority patent/DE3610484C2/en
Priority to LU86375A priority patent/LU86375A1/en
Priority to AT0084086A priority patent/AT399596B/en
Priority to PT82302A priority patent/PT82302B/en
Priority to ES554081A priority patent/ES8707340A1/en
Publication of GB2173294A publication Critical patent/GB2173294A/en
Application granted granted Critical
Publication of GB2173294B publication Critical patent/GB2173294B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/11—Monitoring and controlling the scan
    • G01N2201/117—Indexed, memorised or programmed scan

Landscapes

  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
GB08508590A 1985-04-02 1985-04-02 Method of and apparatus for determining the location of defects present in flat glass Expired GB2173294B (en)

Priority Applications (10)

Application Number Priority Date Filing Date Title
GB08508590A GB2173294B (en) 1985-04-02 1985-04-02 Method of and apparatus for determining the location of defects present in flat glass
IT67222/86A IT1189618B (en) 1985-04-02 1986-03-20 PROCEDURE AND EQUIPMENT FOR LOCALIZING DEFECTS IN FLAT GLASS
FR8604334A FR2579750B1 (en) 1985-04-02 1986-03-24 METHOD AND DEVICE FOR DETERMINING THE LOCATION OF DEFECTS PRESENT IN FLAT GLASS
BE1/011461A BE904465A (en) 1985-04-02 1986-03-24 METHOD AND DEVICE FOR DETERMINING THE LOCATION OF DEFECTS PRESENT IN FLAT GLASS.
NL8600790A NL194480C (en) 1985-04-02 1986-03-27 Method and device for determining the location of errors in flat glass.
DE3610484A DE3610484C2 (en) 1985-04-02 1986-03-27 Method and device for determining the location of defects present in flat glass
LU86375A LU86375A1 (en) 1985-04-02 1986-03-27 METHOD AND DEVICE FOR DETERMINING THE LOCATION OF DEFECTS PRESENT IN FLAT GLASS
AT0084086A AT399596B (en) 1985-04-02 1986-03-28 METHOD AND DEVICE FOR DETERMINING THE LOCATION OF FAULTS PRESENT IN FLAT GLASS
PT82302A PT82302B (en) 1985-04-02 1986-03-31 PROPER METHOD AND APPARATUS FOR DETERMINING THE LOCATION OF DEFECTS IN FLAT GLASS PECAS
ES554081A ES8707340A1 (en) 1985-04-02 1986-04-02 Determining the location of defects present in flat glass

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08508590A GB2173294B (en) 1985-04-02 1985-04-02 Method of and apparatus for determining the location of defects present in flat glass

Publications (3)

Publication Number Publication Date
GB8508590D0 true GB8508590D0 (en) 1985-05-09
GB2173294A GB2173294A (en) 1986-10-08
GB2173294B GB2173294B (en) 1988-10-12

Family

ID=10577080

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08508590A Expired GB2173294B (en) 1985-04-02 1985-04-02 Method of and apparatus for determining the location of defects present in flat glass

Country Status (10)

Country Link
AT (1) AT399596B (en)
BE (1) BE904465A (en)
DE (1) DE3610484C2 (en)
ES (1) ES8707340A1 (en)
FR (1) FR2579750B1 (en)
GB (1) GB2173294B (en)
IT (1) IT1189618B (en)
LU (1) LU86375A1 (en)
NL (1) NL194480C (en)
PT (1) PT82302B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107798376A (en) * 2017-10-16 2018-03-13 福耀集团（上海）汽车玻璃有限公司 Glass intelligent counter and method of counting
CN110187583A (en) * 2010-11-08 2019-08-30 唯景公司 Electrochromic window production method
US11953798B2 (en) 2011-12-12 2024-04-09 View, Inc. Electrochromic laminates

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3641862A1 (en) * 1986-12-08 1988-06-09 Bosch Gmbh Robert DEVICE FOR TESTING ROTATION-SYMMETRICAL WORKPIECES
DE3641863A1 (en) * 1986-12-08 1988-06-09 Bosch Gmbh Robert SURFACE TEST DEVICE
DE3717274A1 (en) * 1987-05-22 1988-12-01 Sick Erwin Gmbh Optical defect inspecting device
JPH07151706A (en) * 1993-09-03 1995-06-16 Minnesota Mining & Mfg Co <3M> Flaw detector for article and using method thereof
GB9812091D0 (en) * 1998-06-05 1998-08-05 Glaverbel Defect detecting unit
DE102004027411A1 (en) * 2004-06-04 2005-12-29 Boraglas Gmbh Method and apparatus for identifying tin and fire side of float glass
JP5248052B2 (en) 2006-10-11 2013-07-31 日東電工株式会社 Defect inspection device for sheet-like product having optical film, inspection data processing device, cutting device and manufacturing system thereof
AT509963B1 (en) 2010-06-07 2012-05-15 Hermann Sonnleitner DEVICE FOR PUNCTUALLY CLEANING AND INSPECTING ERRORS ON FLAT GLASS PANES
AT511055B1 (en) 2011-03-24 2012-09-15 Softsolution Gmbh DEVICE FOR PROJECTION OF PRODUCT OR BZW. PRODUCTION RELEVANT PICTURE AND TEXT DATA AT PLANTS FOR THE PRODUCTION OF INDIVIDUAL OR BIN. INSULATING DISCS
DE102014107542B4 (en) 2014-05-28 2020-02-06 Softsolution Gmbh Process for the manufacture of multi-pane flat glass products
CN104730145B (en) * 2015-03-06 2017-04-26 中国航空工业集团公司北京航空材料研究院 Method for accurately positioning defects of material during ultrasonic detection
DE102015108553B4 (en) * 2015-05-29 2019-02-14 Schott Ag Methods and devices for reducing the saberiness of thin glasses
DE102016104273B4 (en) * 2016-03-09 2021-02-04 Hegla Gmbh & Co. Kg Method and device for treating flat glass units in a glass processing plant and glass processing plant

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL272308A (en) * 1960-12-13
US3445672A (en) * 1966-08-15 1969-05-20 Philco Ford Corp Flaw detection and marking system
GB1315654A (en) * 1969-05-21 1973-05-02 Pilkington Brothers Ltd Detection of faults in transparent material using lasers
FR2078535A5 (en) * 1970-02-16 1971-11-05 British Aircraft Corp Ltd
US3759620A (en) * 1972-05-30 1973-09-18 Philco Ford Corp Flaw detection and marking apparatus
GB1526930A (en) * 1974-12-19 1978-10-04 Bfg Glassgroup Process and apparatus for testing glass
US4038554A (en) * 1976-03-09 1977-07-26 Columbia Research Corporation Detection of flaws in a moving web of transparent material
US4097151A (en) * 1976-03-16 1978-06-27 Ppg Industries, Inc. Method of and apparatus for locating B type and point type defects in a glass ribbon
US4203672A (en) * 1976-11-18 1980-05-20 E. I. Du Pont De Nemours And Company Scanning beam displacement compensation control system
SE8006492L (en) * 1979-09-17 1981-03-18 Intec Corp DEVICE FOR AUTOMATIC HOSPITAL SETTING OF THE SWEAT RAY BY A DEVICE DETECTIVE DEVICE IN A MATERIAL RANGE
US4306808A (en) * 1979-12-14 1981-12-22 Ford Aerospace & Communications Corp. Glass flaw inspection system

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110187583A (en) * 2010-11-08 2019-08-30 唯景公司 Electrochromic window production method
US11772366B2 (en) 2010-11-08 2023-10-03 View, Inc. Electrochromic window fabrication methods
US11953798B2 (en) 2011-12-12 2024-04-09 View, Inc. Electrochromic laminates
CN107798376A (en) * 2017-10-16 2018-03-13 福耀集团（上海）汽车玻璃有限公司 Glass intelligent counter and method of counting

Also Published As

Publication number Publication date
BE904465A (en) 1986-09-24
AT399596B (en) 1995-06-26
IT1189618B (en) 1988-02-04
ES8707340A1 (en) 1987-07-16
FR2579750B1 (en) 1988-11-10
GB2173294A (en) 1986-10-08
NL194480C (en) 2002-05-03
DE3610484A1 (en) 1986-10-09
NL8600790A (en) 1986-11-03
LU86375A1 (en) 1986-06-24
NL194480B (en) 2002-01-02
IT8667222A0 (en) 1986-03-20
ATA84086A (en) 1994-10-15
DE3610484C2 (en) 1998-09-17
GB2173294B (en) 1988-10-12
FR2579750A1 (en) 1986-10-03
PT82302B (en) 1992-06-30
ES554081A0 (en) 1987-07-16
PT82302A (en) 1986-04-01

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee