IT8667222A0 - PROCEDURE AND EQUIPMENT FOR LOCALIZING DEFECTS IN FLAT GLASS - Google Patents

PROCEDURE AND EQUIPMENT FOR LOCALIZING DEFECTS IN FLAT GLASS

Info

Publication number
IT8667222A0
IT8667222A0 IT8667222A IT6722286A IT8667222A0 IT 8667222 A0 IT8667222 A0 IT 8667222A0 IT 8667222 A IT8667222 A IT 8667222A IT 6722286 A IT6722286 A IT 6722286A IT 8667222 A0 IT8667222 A0 IT 8667222A0
Authority
IT
Italy
Prior art keywords
procedure
equipment
flat glass
localizing defects
localizing
Prior art date
Application number
IT8667222A
Other languages
Italian (it)
Other versions
IT1189618B (en
Inventor
Guy Renard
Philippe Stappaerts
Original Assignee
Glaverbel
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Glaverbel filed Critical Glaverbel
Publication of IT8667222A0 publication Critical patent/IT8667222A0/en
Application granted granted Critical
Publication of IT1189618B publication Critical patent/IT1189618B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8861Determining coordinates of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/10Scanning
    • G01N2201/11Monitoring and controlling the scan
    • G01N2201/117Indexed, memorised or programmed scan
IT67222/86A 1985-04-02 1986-03-20 PROCEDURE AND EQUIPMENT FOR LOCALIZING DEFECTS IN FLAT GLASS IT1189618B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08508590A GB2173294B (en) 1985-04-02 1985-04-02 Method of and apparatus for determining the location of defects present in flat glass

Publications (2)

Publication Number Publication Date
IT8667222A0 true IT8667222A0 (en) 1986-03-20
IT1189618B IT1189618B (en) 1988-02-04

Family

ID=10577080

Family Applications (1)

Application Number Title Priority Date Filing Date
IT67222/86A IT1189618B (en) 1985-04-02 1986-03-20 PROCEDURE AND EQUIPMENT FOR LOCALIZING DEFECTS IN FLAT GLASS

Country Status (10)

Country Link
AT (1) AT399596B (en)
BE (1) BE904465A (en)
DE (1) DE3610484C2 (en)
ES (1) ES8707340A1 (en)
FR (1) FR2579750B1 (en)
GB (1) GB2173294B (en)
IT (1) IT1189618B (en)
LU (1) LU86375A1 (en)
NL (1) NL194480C (en)
PT (1) PT82302B (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3641862A1 (en) * 1986-12-08 1988-06-09 Bosch Gmbh Robert DEVICE FOR TESTING ROTATION-SYMMETRICAL WORKPIECES
DE3641863A1 (en) * 1986-12-08 1988-06-09 Bosch Gmbh Robert SURFACE TEST DEVICE
DE3717274A1 (en) * 1987-05-22 1988-12-01 Sick Erwin Gmbh Optical defect inspecting device
JPH07151706A (en) * 1993-09-03 1995-06-16 Minnesota Mining & Mfg Co <3M> Flaw detector for article and using method thereof
GB9812091D0 (en) * 1998-06-05 1998-08-05 Glaverbel Defect detecting unit
DE102004027411A1 (en) * 2004-06-04 2005-12-29 Boraglas Gmbh Method and apparatus for identifying tin and fire side of float glass
JP5248052B2 (en) * 2006-10-11 2013-07-31 日東電工株式会社 Defect inspection device for sheet-like product having optical film, inspection data processing device, cutting device and manufacturing system thereof
AT509963B1 (en) 2010-06-07 2012-05-15 Hermann Sonnleitner DEVICE FOR PUNCTUALLY CLEANING AND INSPECTING ERRORS ON FLAT GLASS PANES
US8164818B2 (en) * 2010-11-08 2012-04-24 Soladigm, Inc. Electrochromic window fabrication methods
AT511055B1 (en) 2011-03-24 2012-09-15 Softsolution Gmbh DEVICE FOR PROJECTION OF PRODUCT OR BZW. PRODUCTION RELEVANT PICTURE AND TEXT DATA AT PLANTS FOR THE PRODUCTION OF INDIVIDUAL OR BIN. INSULATING DISCS
US10739658B2 (en) 2011-12-12 2020-08-11 View, Inc. Electrochromic laminates
DE102014107542B4 (en) 2014-05-28 2020-02-06 Softsolution Gmbh Process for the manufacture of multi-pane flat glass products
CN104730145B (en) * 2015-03-06 2017-04-26 中国航空工业集团公司北京航空材料研究院 Method for accurately positioning defects of material during ultrasonic detection
DE102015108553B4 (en) * 2015-05-29 2019-02-14 Schott Ag Methods and devices for reducing the saberiness of thin glasses
DE102016104273B4 (en) * 2016-03-09 2021-02-04 Hegla Gmbh & Co. Kg Method and device for treating flat glass units in a glass processing plant and glass processing plant
CN107798376A (en) * 2017-10-16 2018-03-13 福耀集团(上海)汽车玻璃有限公司 Glass intelligent counter and method of counting

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL272308A (en) * 1960-12-13
US3445672A (en) * 1966-08-15 1969-05-20 Philco Ford Corp Flaw detection and marking system
GB1315654A (en) * 1969-05-21 1973-05-02 Pilkington Brothers Ltd Detection of faults in transparent material using lasers
FR2078535A5 (en) * 1970-02-16 1971-11-05 British Aircraft Corp Ltd
US3759620A (en) * 1972-05-30 1973-09-18 Philco Ford Corp Flaw detection and marking apparatus
GB1526930A (en) * 1974-12-19 1978-10-04 Bfg Glassgroup Process and apparatus for testing glass
US4038554A (en) * 1976-03-09 1977-07-26 Columbia Research Corporation Detection of flaws in a moving web of transparent material
US4097151A (en) * 1976-03-16 1978-06-27 Ppg Industries, Inc. Method of and apparatus for locating B type and point type defects in a glass ribbon
US4203672A (en) * 1976-11-18 1980-05-20 E. I. Du Pont De Nemours And Company Scanning beam displacement compensation control system
DE3034901A1 (en) * 1979-09-17 1981-04-30 Intec Corp., Trumbull, Conn. Defect detector system automatic scanning beam positioner - has beam sensor next edge of moving web detecting laser beam position w.r.t. its scanning path
US4306808A (en) * 1979-12-14 1981-12-22 Ford Aerospace & Communications Corp. Glass flaw inspection system

Also Published As

Publication number Publication date
GB2173294B (en) 1988-10-12
BE904465A (en) 1986-09-24
LU86375A1 (en) 1986-06-24
DE3610484C2 (en) 1998-09-17
NL8600790A (en) 1986-11-03
NL194480B (en) 2002-01-02
PT82302A (en) 1986-04-01
ES554081A0 (en) 1987-07-16
PT82302B (en) 1992-06-30
IT1189618B (en) 1988-02-04
ES8707340A1 (en) 1987-07-16
GB8508590D0 (en) 1985-05-09
FR2579750A1 (en) 1986-10-03
GB2173294A (en) 1986-10-08
ATA84086A (en) 1994-10-15
FR2579750B1 (en) 1988-11-10
DE3610484A1 (en) 1986-10-09
AT399596B (en) 1995-06-26
NL194480C (en) 2002-05-03

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TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19990126