ES8407576A1 - "procedimiento y dispositivo para determinar el espesor de un material de revestimiento conductor de flujo magnetico sobre un material base conductor de flujo magnetico, de diferente permeabilidad". - Google Patents
"procedimiento y dispositivo para determinar el espesor de un material de revestimiento conductor de flujo magnetico sobre un material base conductor de flujo magnetico, de diferente permeabilidad".Info
- Publication number
- ES8407576A1 ES8407576A1 ES516322A ES516322A ES8407576A1 ES 8407576 A1 ES8407576 A1 ES 8407576A1 ES 516322 A ES516322 A ES 516322A ES 516322 A ES516322 A ES 516322A ES 8407576 A1 ES8407576 A1 ES 8407576A1
- Authority
- ES
- Spain
- Prior art keywords
- voltage
- clad
- thickness
- clad material
- secondary winding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
PROCEDIMIENTO Y DISPOSITIVO PARA DETERMINAR EL ESPESOR DE UN MATERIAL DE REVESTIMIENTO, CONDUCTOR DE FLUJO MAGNETICO, SOBRE UN MATERIAL BASE CONDUCTOR DE FLUJO MAGNETICO DE DIFERENTE PERMEABILIDAD.EL PROCEDIMIENTO COMPRENDE LAS SIGUIENTES OPERACIONES: PRIMERA, SE APLICA UN VOLTAJE CONSTANTE DE CORRIENTE ALTERNA AL DEVANADO PRIMARIO DE UN NUCLEO INCOMPLETO DE TRANSFORMADOR; SEGUNDA, SE COLOCA EL MATERIAL CUYO ESPESOR SE VA A MEDIR EN CONTACTO CON EL NUCLEO INCOMPLETO DE TRANSFORMADOR, CON LO CUAL SE COMPLETA LA TRAYECTORIA DEL FLUJO A TRAVES DEL MATERIAL; Y POR ULTIMO,SE DETERMINA EL VOLTAJE INDUCIDO EN EL DEVANADO SECUNDARIO, INDICADO POR EL APARATO MEDIDOR DE VOLTAJE.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US1981/001388 WO1983001505A1 (en) | 1981-10-14 | 1981-10-14 | Clad thickness measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
ES8407576A1 true ES8407576A1 (es) | 1984-09-16 |
ES516322A0 ES516322A0 (es) | 1984-09-16 |
Family
ID=22161475
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES516322A Granted ES516322A0 (es) | 1981-10-14 | 1982-10-07 | "procedimiento y dispositivo para determinar el espesor de un material de revestimiento conductor de flujo magnetico sobre un material base conductor de flujo magnetico, de diferente permeabilidad". |
Country Status (8)
Country | Link |
---|---|
US (1) | US4507609A (es) |
EP (1) | EP0091429B1 (es) |
JP (1) | JPS58501551A (es) |
AU (1) | AU7802481A (es) |
CA (1) | CA1221739A (es) |
DE (1) | DE3176014D1 (es) |
ES (1) | ES516322A0 (es) |
WO (1) | WO1983001505A1 (es) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5967405A (ja) * | 1982-09-30 | 1984-04-17 | Sumitomo Metal Ind Ltd | ライナ厚測定方法 |
US4634976A (en) * | 1983-05-05 | 1987-01-06 | American Stress Technologies, Inc. | Barkhausen noise method for stress and defect detecting in hard steel |
US4829251A (en) * | 1983-08-31 | 1989-05-09 | Helmut Fischer | Electromagnetic probe for measuring the thickness of thin coatings on magnetic substrates |
JPS6138503A (ja) * | 1984-07-31 | 1986-02-24 | Ketsuto Kagaku Kenkyusho:Kk | 膜厚計 |
US4618825A (en) * | 1984-10-11 | 1986-10-21 | Helmut Fischer | Electro-magnetic thickness measuring probe |
CH667727A5 (de) * | 1985-05-28 | 1988-10-31 | Zellweger Uster Ag | Messkopf zur induktiven messung der dicke einer isolierenden schicht auf einem elektrischen leiter. |
US5115192A (en) * | 1990-11-06 | 1992-05-19 | Nova Corporation Of Alberta | Magnetic displacement transducer with saturation compensation |
GB2257528A (en) * | 1991-06-18 | 1993-01-13 | Colebrand Ltd | Locating the position of ferrous reinforcement in a structure |
US5218296A (en) * | 1992-02-07 | 1993-06-08 | International Business Machines Corporation | Method and apparatus for determining at least one characteristic of a superconductive film |
US5341678A (en) * | 1993-05-12 | 1994-08-30 | General Electric Company | Method for determining thickness of ferromagnetic material deposition on nuclear fuel rods |
JPH07110203A (ja) * | 1993-10-08 | 1995-04-25 | Japan Atom Energy Res Inst | 原子炉圧力容器の肉盛り溶接部の厚さを計測する方法及び装置 |
US5623427A (en) * | 1994-09-02 | 1997-04-22 | Defelsko Corporation | Nondestructive anodic capacity gauge |
US5661241A (en) * | 1995-09-11 | 1997-08-26 | The Babcock & Wilcox Company | Ultrasonic technique for measuring the thickness of cladding on the inside surface of vessels from the outside diameter surface |
KR100368247B1 (ko) * | 1995-12-30 | 2003-03-28 | 주식회사 포스코 | 자속변화를이용한철판의매수감지장치 |
KR100376494B1 (ko) * | 1995-12-30 | 2003-05-22 | 주식회사 포스코 | 전자석철심의투자율변화를이용한철판의매수감지장치및방법 |
KR100428845B1 (ko) * | 1999-08-20 | 2004-04-28 | 주식회사 포스코 | 포터블용 강판 표면의 스케일층 측정장치 및 방법 |
EP1851671A2 (en) * | 2005-01-28 | 2007-11-07 | Nxp B.V. | Voltage integrator and transformer provided with such an integrator |
JP5648663B2 (ja) * | 2012-09-20 | 2015-01-07 | センサ・システム株式会社 | 焼入れ硬化層厚さの検査装置及びニッケルめっき皮膜厚さの検査装置 |
CN103499272A (zh) * | 2013-10-10 | 2014-01-08 | 南昌航空大学 | 铁磁构件非磁性覆层的大量程磁性测厚装置及其检测方法 |
CZ2014742A3 (cs) | 2014-11-03 | 2016-04-20 | Vysoké Učení Technické V Brně | Způsob pro vyhodnocení rozložení, hustoty a orientace feromagnetických elektricky vodivých vláken v kompozitním materiálu a detekční zařízení k jeho provádění |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB460991A (en) * | 1934-05-03 | 1937-02-08 | Octavius Knight | Improvements in or relating to electromagnetic gauging and testing of materials |
GB501333A (en) * | 1938-03-16 | 1939-02-24 | William Henry Tait | Apparatus for electrically testing the thickness of coatings or of other thin layers |
US2320761A (en) * | 1939-10-26 | 1943-06-01 | Tait William Henry | Apparatus for electrically testing the thickness of thin layers |
US2226275A (en) * | 1939-11-16 | 1940-12-24 | Gen Electric | Magnetic thickness gauge |
FR888093A (fr) * | 1942-03-31 | 1943-12-02 | Gen Mecanique Appliquee Soc In | Perfectionnements apportés à des dispositifs de contrôle magnétique, notamment pour mesurer l'épaisseur d'une couche non-magnétique sur un support en métal magnétique |
US2595380A (en) * | 1948-01-19 | 1952-05-06 | Geotechnical Corp | Pipe thickness testing apparatus |
GB645777A (en) * | 1948-08-04 | 1950-11-08 | Gen Electric Co Ltd | Improvements in or relating to apparatus for measuring the thickness of non-magneticcoatings on magnetic materials |
US2935680A (en) * | 1953-09-10 | 1960-05-03 | Continental Can Co | Means of gauging sheet metal and the like |
US3340467A (en) * | 1964-06-23 | 1967-09-05 | Beckman Instruments Inc | Magnetic metal detector utilizing a magnetic bridge formed with permanent magnets and a hall effect sensor |
SE353791B (es) * | 1968-10-10 | 1973-02-12 | Hajtomu Es Felvonogyar | |
DE2049976B2 (de) * | 1970-10-12 | 1972-09-21 | Elektro-Physik Hans Nix & Dr.-Ing. E. Steingroever KG, 5000 Köln | Verfahren zur messung der dicke von schichten im bauwesen und vorrichtung zur durchfuehrung des verfahren |
US3747085A (en) * | 1971-11-03 | 1973-07-17 | Itek Corp | Tool monitoring apparatus |
US3878457A (en) * | 1973-11-16 | 1975-04-15 | Wayne E Rodgers | Thin film thickness measuring apparatus using an unbalanced inductive bridge |
JPS5122461A (ja) * | 1974-08-19 | 1976-02-23 | Naito Densei Kogyo Co Ltd | Jikimakuatsukei |
-
1981
- 1981-10-14 US US06/322,304 patent/US4507609A/en not_active Expired - Fee Related
- 1981-10-14 JP JP50348381A patent/JPS58501551A/ja active Pending
- 1981-10-14 AU AU78024/81A patent/AU7802481A/en not_active Abandoned
- 1981-10-14 EP EP81902914A patent/EP0091429B1/en not_active Expired
- 1981-10-14 DE DE8181902914T patent/DE3176014D1/de not_active Expired
- 1981-10-14 WO PCT/US1981/001388 patent/WO1983001505A1/en active IP Right Grant
-
1982
- 1982-07-26 CA CA000408082A patent/CA1221739A/en not_active Expired
- 1982-10-07 ES ES516322A patent/ES516322A0/es active Granted
Also Published As
Publication number | Publication date |
---|---|
DE3176014D1 (en) | 1987-04-23 |
EP0091429B1 (en) | 1987-03-18 |
CA1221739A (en) | 1987-05-12 |
EP0091429A1 (en) | 1983-10-19 |
ES516322A0 (es) | 1984-09-16 |
EP0091429A4 (en) | 1984-05-17 |
WO1983001505A1 (en) | 1983-04-28 |
AU7802481A (en) | 1983-05-05 |
US4507609A (en) | 1985-03-26 |
JPS58501551A (ja) | 1983-09-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FD1A | Patent lapsed |
Effective date: 19970612 |