ES445804A1 - Procedimiento para alinear un modelo de mascarilla microsco-pica con un modelo de oblea semiconductora microscopica. - Google Patents

Procedimiento para alinear un modelo de mascarilla microsco-pica con un modelo de oblea semiconductora microscopica.

Info

Publication number
ES445804A1
ES445804A1 ES445804A ES445804A ES445804A1 ES 445804 A1 ES445804 A1 ES 445804A1 ES 445804 A ES445804 A ES 445804A ES 445804 A ES445804 A ES 445804A ES 445804 A1 ES445804 A1 ES 445804A1
Authority
ES
Spain
Prior art keywords
mask
wafer
microscope
polarized
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES445804A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of ES445804A1 publication Critical patent/ES445804A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7065—Production of alignment light, e.g. light source, control of coherence, polarization, pulse length, wavelength
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/40—Optical focusing aids
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3083—Birefringent or phase retarding elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Microscoopes, Condenser (AREA)
  • Polarising Elements (AREA)
  • Control Of Position Or Direction (AREA)
  • Projection-Type Copiers In General (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
ES445804A 1975-03-07 1976-03-05 Procedimiento para alinear un modelo de mascarilla microsco-pica con un modelo de oblea semiconductora microscopica. Expired ES445804A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/556,224 US3990798A (en) 1975-03-07 1975-03-07 Method and apparatus for aligning mask and wafer

Publications (1)

Publication Number Publication Date
ES445804A1 true ES445804A1 (es) 1977-06-01

Family

ID=24220406

Family Applications (1)

Application Number Title Priority Date Filing Date
ES445804A Expired ES445804A1 (es) 1975-03-07 1976-03-05 Procedimiento para alinear un modelo de mascarilla microsco-pica con un modelo de oblea semiconductora microscopica.

Country Status (11)

Country Link
US (1) US3990798A (es)
JP (1) JPS51112282A (es)
BE (1) BE839099A (es)
CA (1) CA1046823A (es)
DE (1) DE2608483B2 (es)
ES (1) ES445804A1 (es)
FR (1) FR2303315A1 (es)
GB (1) GB1543208A (es)
IT (1) IT1063931B (es)
NL (1) NL7602349A (es)
SE (1) SE416590B (es)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2722397C2 (de) * 1977-05-17 1983-06-23 Siemens AG, 1000 Berlin und 8000 München Verfahren zur Justierung einer Halbleiterscheibe relativ zu einer Belichtungsmaske bei der Röntgenstrahl- Fotolithografie und eine Vorrichtung zur Durchführung dieses Verfahrens
JPS5512271U (es) * 1978-07-12 1980-01-25
US4356223A (en) * 1980-02-28 1982-10-26 Nippon Electric Co., Ltd. Semiconductor device having a registration mark for use in an exposure technique for micro-fine working
JPS56136244U (es) * 1980-03-15 1981-10-15
US4398824A (en) * 1981-04-15 1983-08-16 Bell Telephone Laboratories, Incorporated Wafer tilt compensation in zone plate alignment system
US4595295A (en) * 1982-01-06 1986-06-17 International Business Machines Corporation Alignment system for lithographic proximity printing
JPS5936220A (ja) * 1982-08-25 1984-02-28 Toshiba Corp 固定スリット型光電顕微鏡
JPS5942517A (ja) * 1982-09-02 1984-03-09 Nippon Kogaku Kk <Nikon> 二重焦点光学系
US4636626A (en) * 1983-01-14 1987-01-13 Nippon Kogaku K.K. Apparatus for aligning mask and wafer used in semiconductor circuit element fabrication
JPS60183508A (ja) * 1984-03-02 1985-09-19 Nippon Kogaku Kk <Nikon> 微小間隔検出装置
US4623257A (en) * 1984-12-28 1986-11-18 At&T Bell Laboratories Alignment marks for fine-line device fabrication
JPS6441805A (en) * 1987-08-07 1989-02-14 Sumitomo Heavy Industries Position detecting apparatus of two bodies, which are separated by minute distance
US4981342A (en) * 1987-09-24 1991-01-01 Allergan Inc. Multifocal birefringent lens system
US4941255A (en) * 1989-11-15 1990-07-17 Eastman Kodak Company Method for precision multichip assembly
JP3534363B2 (ja) * 1995-07-31 2004-06-07 パイオニア株式会社 結晶レンズ及びこれを用いた光ピックアップ光学系
KR100269244B1 (ko) * 1998-05-28 2000-12-01 정선종 복굴절 물질로 만들어진 투과형 광학부품을 사용한 리소그래피장비용 광학계의 초점심도 확장 방법 및 장치
JP4671082B2 (ja) * 2000-10-15 2011-04-13 明 石井 定倍率可変焦点結像方法および装置
EP2016456A4 (en) * 2006-04-20 2010-08-25 Xceed Imaging Ltd THROUGH OPTICAL SYSTEM AND METHOD FOR PROVIDING AN ENLARGED SHARPNESS DURING THE FIGURE
US8248605B2 (en) * 2006-09-26 2012-08-21 Hinds Instruments, Inc. Detection system for birefringence measurement
US9228936B2 (en) 2013-12-03 2016-01-05 Hinds Instruments, Inc. Birefringence measurement of polycrystalline silicon samples or the like

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2601175A (en) * 1947-08-05 1952-06-17 Smith Francis Hughes Interference microscope
US3488104A (en) * 1966-09-12 1970-01-06 Fairchild Camera Instr Co Dual focal plane microscope
US3520592A (en) * 1967-09-14 1970-07-14 Grumman Corp Optical focusing system utilizing birefringent lenses
GB1248771A (en) * 1968-08-02 1971-10-06 Vickers Ltd Double-refracting interference microscope
JPS5117297B1 (es) * 1971-03-11 1976-06-01

Also Published As

Publication number Publication date
NL7602349A (nl) 1976-09-09
DE2608483A1 (de) 1976-09-16
IT1063931B (it) 1985-02-18
US3990798A (en) 1976-11-09
FR2303315B1 (es) 1980-01-04
JPS561777B2 (es) 1981-01-16
SE7602373L (sv) 1976-09-08
CA1046823A (en) 1979-01-23
GB1543208A (en) 1979-03-28
DE2608483B2 (de) 1980-08-28
JPS51112282A (en) 1976-10-04
FR2303315A1 (fr) 1976-10-01
SE416590B (sv) 1981-01-19
BE839099A (fr) 1976-07-01

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 19870211