ES2584153T3 - Procedimiento de funcionamiento de un sistema de inspección radiográfica con una cadena transportadora modular - Google Patents

Procedimiento de funcionamiento de un sistema de inspección radiográfica con una cadena transportadora modular Download PDF

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Publication number
ES2584153T3
ES2584153T3 ES13174101.9T ES13174101T ES2584153T3 ES 2584153 T3 ES2584153 T3 ES 2584153T3 ES 13174101 T ES13174101 T ES 13174101T ES 2584153 T3 ES2584153 T3 ES 2584153T3
Authority
ES
Spain
Prior art keywords
image
conveyor chain
data
modular
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES13174101.9T
Other languages
English (en)
Spanish (es)
Inventor
Xinchi Wang
Nigel John King
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
METTLER-TOLEDO SAFELINE X-RAY Ltd
Mettler Toledo Safeline X Ray Ltd
Original Assignee
METTLER-TOLEDO SAFELINE X-RAY Ltd
Mettler Toledo Safeline X Ray Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by METTLER-TOLEDO SAFELINE X-RAY Ltd, Mettler Toledo Safeline X Ray Ltd filed Critical METTLER-TOLEDO SAFELINE X-RAY Ltd
Application granted granted Critical
Publication of ES2584153T3 publication Critical patent/ES2584153T3/es
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01T7/005—Details of radiation-measuring instruments calibration techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/194—Segmentation; Edge detection involving foreground-background segmentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G06T2207/10121—Fluoroscopy
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30128—Food products
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30136—Metal

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Quality & Reliability (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
ES13174101.9T 2013-06-27 2013-06-27 Procedimiento de funcionamiento de un sistema de inspección radiográfica con una cadena transportadora modular Active ES2584153T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP13174101.9A EP2818898B1 (en) 2013-06-27 2013-06-27 Method of operating a radiographic inspection system with a modular conveyor chain

Publications (1)

Publication Number Publication Date
ES2584153T3 true ES2584153T3 (es) 2016-09-26

Family

ID=48692347

Family Applications (1)

Application Number Title Priority Date Filing Date
ES13174101.9T Active ES2584153T3 (es) 2013-06-27 2013-06-27 Procedimiento de funcionamiento de un sistema de inspección radiográfica con una cadena transportadora modular

Country Status (8)

Country Link
US (1) US9727961B2 (enExample)
EP (1) EP2818898B1 (enExample)
JP (1) JP6386811B2 (enExample)
CN (1) CN104251869B (enExample)
AU (1) AU2014202473B2 (enExample)
CA (1) CA2852521C (enExample)
ES (1) ES2584153T3 (enExample)
IN (1) IN2014MU01928A (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016203330A1 (en) * 2015-06-16 2016-12-22 Dylog Italia S.P.A. A non-destructive x-ray inspection machine, devices provided for such machine and method for operating the same
TWI577973B (zh) * 2015-07-15 2017-04-11 由田新技股份有限公司 往復式線性編碼器及具有往復式線性編碼器的光學檢測平台
TWI582557B (zh) * 2015-07-15 2017-05-11 由田新技股份有限公司 印魚式線性編碼器及包含印魚式線性編碼器的光學檢測平台
JP6774895B2 (ja) * 2017-03-09 2020-10-28 アンリツインフィビス株式会社 Ｘ線検査装置
JP6901294B2 (ja) * 2017-03-16 2021-07-14 アンリツ株式会社 Ｘ線検査装置
DE102017213510A1 (de) * 2017-08-03 2019-02-07 Robert Bosch Gmbh Verfahren und Vorrichtung zum Erzeugen eines maschinellen Lernsystems, und virtuelle Sensorvorrichtung
US10633194B2 (en) 2018-06-21 2020-04-28 Thermal Product Solutions Conveyance system with variable speed rollers
WO2022040511A1 (en) * 2020-08-21 2022-02-24 Elemental LED, Inc. Hinged channel system for linear lighting
WO2023180213A1 (en) * 2022-03-24 2023-09-28 Thermo Fisher Scientific Messtechnik Gmbh Substrate alloy influence compensation
CN119343598A (zh) * 2022-06-08 2025-01-21 克朗斯股份公司 用于通过x射线辐射检测容器的设备和方法
DE102022114371A1 (de) 2022-06-08 2023-12-14 Krones Aktiengesellschaft Vorrichtung und Verfahren zum Inspizieren von Behältnissen mit Röntgenstrahlung
CN116297558A (zh) * 2022-12-21 2023-06-23 上海微现检测设备有限公司 一种提升瓶装物检测精度的方法、装置及异物检测设备

Family Cites Families (17)

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Publication number Priority date Publication date Assignee Title
US3768645A (en) * 1971-02-22 1973-10-30 Sunkist Growers Inc Method and means for automatically detecting and sorting produce according to internal damage
JPH03116299A (ja) * 1989-09-29 1991-05-17 Hitachi Medical Corp Ｘ線荷物検査装置
JP2001091480A (ja) * 1999-09-22 2001-04-06 Shimadzu Corp Ｘ線検査装置および充填量算出方法
DE20217559U1 (de) * 2002-11-12 2003-01-16 Heuft Systemtechnik Gmbh Vorrichtung zur Untersuchung von gefüllten Behältern mittels Röntgenstrahlen
US7215801B2 (en) * 2003-06-05 2007-05-08 General Electric Company Method, system and apparatus for processing radiographic images of scanned objects
JP2007132796A (ja) * 2005-11-10 2007-05-31 Ishida Co Ltd Ｘ線検査装置およびｘ線検査プログラム
JP5041751B2 (ja) * 2006-07-24 2012-10-03 株式会社イシダ Ｘ線検査装置およびｘ線検査プログラム
GB0717520D0 (en) * 2007-09-08 2007-10-17 Mettler Toledo Safeline X Ray Inspection system
WO2009114928A1 (en) * 2008-03-17 2009-09-24 Optosecurity, Inc. Method and apparatus for assessing characteristics of liquids
US8867816B2 (en) * 2008-09-05 2014-10-21 Optosecurity Inc. Method and system for performing X-ray inspection of a liquid product at a security checkpoint
EP2256069A1 (en) * 2009-05-29 2010-12-01 Mettler-Toledo Safeline X-Ray Limited Conveyor chain for a radiographic inspection system and radiographic inspection system
CN101936924B (zh) * 2009-06-30 2012-07-04 同方威视技术股份有限公司 物品检查系统
CN201749091U (zh) * 2010-02-04 2011-02-16 上海英迈吉东影图像设备有限公司 一种煤矿皮带x射线透视检测系统
CN101793845B (zh) * 2010-02-04 2011-12-14 上海英迈吉东影图像设备有限公司 一种煤矿皮带x射线透视检测系统和方法
WO2013025412A2 (en) * 2011-08-12 2013-02-21 Smiths Heimann Gmbh Adaptable screening checkpoint
CN102590240B (zh) * 2012-01-16 2013-11-06 西安交通大学 工业射线检测底片数字化装置
EP2711694A1 (en) 2012-09-21 2014-03-26 Mettler-Toledo Safeline X-Ray Limited Method of operating a radiographic inspection system with a modular conveyor chain

Also Published As

Publication number Publication date
JP2015014598A (ja) 2015-01-22
AU2014202473B2 (en) 2016-10-27
CA2852521C (en) 2021-07-20
CN104251869B (zh) 2019-06-21
EP2818898A1 (en) 2014-12-31
IN2014MU01928A (enExample) 2015-09-04
US9727961B2 (en) 2017-08-08
US20150003583A1 (en) 2015-01-01
EP2818898B1 (en) 2016-04-27
CN104251869A (zh) 2014-12-31
JP6386811B2 (ja) 2018-09-05
CA2852521A1 (en) 2014-12-27
AU2014202473A1 (en) 2015-01-22

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