ES2178554B1 - Metodo y parato para determinar interdependencias entre datos recogidos para aumentar los rendimientos de produccion de semiconductores. - Google Patents

Metodo y parato para determinar interdependencias entre datos recogidos para aumentar los rendimientos de produccion de semiconductores.

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Publication number
ES2178554B1
ES2178554B1 ES200001671A ES200001671A ES2178554B1 ES 2178554 B1 ES2178554 B1 ES 2178554B1 ES 200001671 A ES200001671 A ES 200001671A ES 200001671 A ES200001671 A ES 200001671A ES 2178554 B1 ES2178554 B1 ES 2178554B1
Authority
ES
Spain
Prior art keywords
data collected
dice
performance
parato
interdependences
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES200001671A
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English (en)
Other versions
ES2178554A1 (es
Inventor
Carlos Ortega
Eliseo Ventura Sobrino Patino
Juan Ignacio Alonso Montull
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nokia of America Corp
Original Assignee
Lucent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lucent Technologies Inc filed Critical Lucent Technologies Inc
Publication of ES2178554A1 publication Critical patent/ES2178554A1/es
Application granted granted Critical
Publication of ES2178554B1 publication Critical patent/ES2178554B1/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • General Factory Administration (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

Método y aparato para determinar interdependencias entre datos recogidos para aumentar los rendimientos de producción de semiconductores, que comprenden medios para formar una pluralidad de obleas comprendiendo cada una pluralidad de "dados" (cuerpos de circuitos integrados); recoger datos de características de funcionamiento de los circuitos correspondientes a una característica elegida de funcionamiento de los circuitos correspondientes a una característica elegida de funcionamiento de los circuitos de la pluralidad de "dados"; comparar los datos recogidos de las características de funcionamiento de los circuitos con un umbral para determinar fallos de "dados"; utilizar una red neural para determinar interdependencias entre los datos recogidos de características de funcionamiento de los circuitos para determinar fallos de "dados"; y ajustar por lo menos un proceso de fabricación de los semiconductores tomando como base las interdependencias para reducir fallos de "dados".
ES200001671A 1999-07-06 2000-07-06 Metodo y parato para determinar interdependencias entre datos recogidos para aumentar los rendimientos de produccion de semiconductores. Expired - Lifetime ES2178554B1 (es)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US14264099P 1999-07-06 1999-07-06
US60/142640 1999-07-06
US54361600A 2000-03-24 2000-03-24
US09/543616 2000-03-24

Publications (2)

Publication Number Publication Date
ES2178554A1 ES2178554A1 (es) 2002-12-16
ES2178554B1 true ES2178554B1 (es) 2004-09-16

Family

ID=26840277

Family Applications (1)

Application Number Title Priority Date Filing Date
ES200001671A Expired - Lifetime ES2178554B1 (es) 1999-07-06 2000-07-06 Metodo y parato para determinar interdependencias entre datos recogidos para aumentar los rendimientos de produccion de semiconductores.

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ES (1) ES2178554B1 (es)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9964591B2 (en) 2016-04-19 2018-05-08 International Business Machines Corporation Implementing decreased scan data interdependence in on product multiple input signature register (OPMISR) through PRPG control rotation

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20240019491A1 (en) * 2022-07-13 2024-01-18 Mediatek Inc. Method and apparatus for performing die-level electrical parameter extraction through using estimated mapping relationship between electrical parameters of transistor types and measurement results of logic blocks

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3576335B2 (ja) * 1996-10-31 2004-10-13 松下電器産業株式会社 プロセス加工工程の異常抽出方法及び装置
US6028994A (en) * 1998-05-06 2000-02-22 Advanced Micro Devices Method for predicting performance of microelectronic device based on electrical parameter test data using computer model

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9964591B2 (en) 2016-04-19 2018-05-08 International Business Machines Corporation Implementing decreased scan data interdependence in on product multiple input signature register (OPMISR) through PRPG control rotation

Also Published As

Publication number Publication date
ES2178554A1 (es) 2002-12-16

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