ES2065961T3 - Procedimiento para el acoplamiento optico de un sistema de analisis elemental y un laser de metal liquido en un recipiente de fundicion. - Google Patents

Procedimiento para el acoplamiento optico de un sistema de analisis elemental y un laser de metal liquido en un recipiente de fundicion.

Info

Publication number
ES2065961T3
ES2065961T3 ES89116842T ES89116842T ES2065961T3 ES 2065961 T3 ES2065961 T3 ES 2065961T3 ES 89116842 T ES89116842 T ES 89116842T ES 89116842 T ES89116842 T ES 89116842T ES 2065961 T3 ES2065961 T3 ES 2065961T3
Authority
ES
Spain
Prior art keywords
procedure
laser
bore
analysis system
elemental analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES89116842T
Other languages
English (en)
Inventor
Christoph Dr Dipl-Phy Carlhoff
Claus-Jurgen Dr Dipl- Lorenzen
Klaus-Peter Dr Dipl-Phys Nick
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fried Krupp AG Hoesch Krupp
Original Assignee
Fried Krupp AG Hoesch Krupp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fried Krupp AG Hoesch Krupp filed Critical Fried Krupp AG Hoesch Krupp
Application granted granted Critical
Publication of ES2065961T3 publication Critical patent/ES2065961T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/443—Emission spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0237—Adjustable, e.g. focussing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal
    • G01N2021/695—Molten metals

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)

Abstract

SE OFRECE UN PROCEDIMIENTO PAARA EL ANALISIS DE ELEMENTOS MEDIANTE EL ANALISIS ESPECTRAL DE EMISION INDUCIA POR LASER DE UN CALDO METALICO EN SU SUPERFICIE EN UNA PERFORACION REALIZADA EN UN RECIPIENTE DE FUNDICION (1). LA PERFORACION VA DOTADA DE UN TUBO (4) QUE ESTA CERRADO EXTERNAMENTE CON UNA VENTANA DE CUARZO (6). POR UN CODO (5) LATERAL AL TUBO FLUYE DENTRO DE LA PERFORACION UN GAS INERTE A UNA TEMPERATURA DE MAS DE 300 C . EL TUBO (4) ESTA CONECTADO CON UNA CARCASA (7) QUE VA ACOPLADA A UN ESPECTROMETRO (15) A TRAVES DE UN TRANSMISOR DE ONDAS DE LUZ (14), LA LUZ LASER DE UN LASER (8) QUE SE ENCUENTRA DENTRO DE LA CARCASA SE ENFOCA, MEDIANTE LENTES AJUSTABLES (9) Y UN ESPEJO (10), SOBRE LA SUPERFICIE DEL METAL (12) Y PRODUCE EN ELLA UN PLASMA (11). LA LUZ PLASMA EMITIDA POR LA SUPERFICIE DEL METAL SE ACOPLA CON UN SISTEMA DE LENTES (13A, 13B) AJUSTABLES DENTRO DEL TRANSISTOR DE ONDAS DE LUZ (14) Y SE CONDUCE AL ESPECTROMETRO (15.
ES89116842T 1988-10-03 1989-09-12 Procedimiento para el acoplamiento optico de un sistema de analisis elemental y un laser de metal liquido en un recipiente de fundicion. Expired - Lifetime ES2065961T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3833621 1988-10-03

Publications (1)

Publication Number Publication Date
ES2065961T3 true ES2065961T3 (es) 1995-03-01

Family

ID=6364293

Family Applications (1)

Application Number Title Priority Date Filing Date
ES89116842T Expired - Lifetime ES2065961T3 (es) 1988-10-03 1989-09-12 Procedimiento para el acoplamiento optico de un sistema de analisis elemental y un laser de metal liquido en un recipiente de fundicion.

Country Status (8)

Country Link
US (1) US4995723A (es)
EP (1) EP0362577B1 (es)
JP (1) JP2891722B2 (es)
KR (1) KR0158676B1 (es)
AT (1) ATE117081T1 (es)
CA (1) CA1329018C (es)
DE (1) DE58908876D1 (es)
ES (1) ES2065961T3 (es)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2121702A1 (es) * 1997-02-17 1998-12-01 Univ Malaga Sensor para monitorizacion on-line y remota de procesos automatizados de soldadura con laser.

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US5147611A (en) * 1989-07-24 1992-09-15 Union Oil Company Of California Optical and pyrolyzate analyzer apparatus
DE4443407C2 (de) * 1993-12-08 1999-07-22 Fraunhofer Ges Forschung Vorrichtung zur qualitativen und/oder quantitativen chemischen Analyse einer Substanz, insbesondere zur Analyse einer Metallschmelze
DE4415381A1 (de) * 1994-05-02 1995-11-09 Nis Ingenieurgesellschaft Mbh Lasergestütztes Verfahren zur Bestimmung von Edelmetallkonzentrationen in Metallen
US5608520A (en) * 1994-07-11 1997-03-04 The United States Of America As Represented By He Department Of Energy Plasma emission spectroscopy method of tumor therapy
TW337553B (en) * 1995-12-20 1998-08-01 Voest Alpine Ind Anlagen Method for determination of electromagnetic waves originating from a melt
US5751416A (en) * 1996-08-29 1998-05-12 Mississippi State University Analytical method using laser-induced breakdown spectroscopy
US6034768A (en) * 1997-09-26 2000-03-07 Physical Sciences Inc. Induced breakdown spectroscopy detector system with controllable delay time
ZA991718B (en) * 1998-03-03 1999-09-08 Baker Hughes Inc Laser spectral analyzer with sample location detector.
US6008896A (en) * 1998-07-01 1999-12-28 National Research Council Of Canada Method and apparatus for spectroscopic analysis of heterogeneous materials
EP1091207A1 (de) * 1999-10-05 2001-04-11 LASERSPEC ANALYTIK GmbH Verfahren und Vorrichtung zur Stoffanalyse
AT410031B (de) * 2000-12-01 2003-01-27 Voest Alpine Ind Anlagen Einrichtung zur aufnahme und weiterleitung elektromagnetischer wellen, die von einer materialprobe ausgesendet werden
EP1134295A1 (en) * 2000-03-17 2001-09-19 Voest Alpine Industries, Inc. Submergible probe for viewing and analyzing properties of a molten metal bath
AT409553B (de) * 2000-09-28 2002-09-25 Voest Alpine Ind Anlagen Vorrichtung zur chemischen analyse von materialproben sowie metallurgisches gefäss hierfür
US6784429B2 (en) * 2002-04-19 2004-08-31 Energy Research Company Apparatus and method for in situ, real time measurements of properties of liquids
US6909505B2 (en) 2002-06-24 2005-06-21 National Research Council Of Canada Method and apparatus for molten material analysis by laser induced breakdown spectroscopy
DE10259830A1 (de) * 2002-12-19 2004-07-01 Specialty Minerals Michigan Inc., Bingham Farms Verfahren zum Freihalten einer Blasdüse, die ein metallurgisches Gefäß durchquert, von Pfannenrest
US7530265B2 (en) * 2005-09-26 2009-05-12 Baker Hughes Incorporated Method and apparatus for elemental analysis of a fluid downhole
ES2575577T3 (es) 2008-11-14 2016-06-29 Primetals Technologies France SAS Método y dispositivo de medida de una composición química de un líquido metálico adaptado para un revestimiento de una banda de acero
US9072169B1 (en) 2010-07-13 2015-06-30 Cascodium Inc. Pulse generator and systems and methods for using same
DE102010035412A1 (de) 2010-08-25 2012-03-01 Sms Siemag Ag Verfahren und Vorrichtung zur spektroskopischen Temperatur- und Analysebestimmung von flüsssigen Metallbädern in metallurgischen Gefäßen, insbesondere Konvertern
JP2013248624A (ja) * 2012-05-30 2013-12-12 Disco Corp レーザー加工装置
DE102013009962B3 (de) * 2013-06-14 2014-11-06 K+S Aktiengesellschaft LIBS-Messtubus
CN104297218B (zh) * 2013-07-15 2016-09-14 中国科学院沈阳自动化研究所 远距离冶金液态金属成分的原位、在线检测装置及方法
CN105510243A (zh) * 2015-12-31 2016-04-20 聚光科技(杭州)股份有限公司 一种光谱分析装置
RU2664485C1 (ru) 2017-07-05 2018-08-17 Александр Николаевич Забродин Способ спектрального анализа химического состава расплавленных металлов и устройство для его осуществления
DE102018128754B4 (de) * 2018-11-15 2021-02-18 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren zur Elementanalyse von Materialien
WO2022221101A1 (en) * 2021-04-13 2022-10-20 Oak Analytics Inc. Optical spectrometer with high-efficiency optical coupling

Family Cites Families (7)

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Publication number Priority date Publication date Assignee Title
DE1165627B (de) * 1953-11-18 1964-03-19 Gutehoffnungshuette Sterkrade Verfahren und Vorrichtung zum Behandeln einer Eisenschmelze
GB1062591A (en) * 1962-07-04 1967-03-22 Internat Meehanite Metal Compa Improvements in or relating to the treatment of metals
JPS57119241A (en) * 1981-01-19 1982-07-24 Nippon Steel Corp Spectroscopic analysis apparatus for direct luminescence of molten metal
JPS59145932A (ja) * 1983-02-08 1984-08-21 Sumitomo Metal Ind Ltd 溶融金属のレ−ザ−発光分光分析装置
GB8403976D0 (en) * 1984-02-15 1984-03-21 British Steel Corp Analysis of materials
DE3413589A1 (de) * 1984-04-11 1985-10-24 Fried. Krupp Gmbh, 4300 Essen Verfahren zur messung der zusammensetzung und der temperatur von fluessigem stahl und fluessiger schlacke in einem schmelzgefaess
DE3617869A1 (de) * 1986-05-27 1987-12-03 Hoesch Stahl Ag Spektralanalysenvorrichtung an einem konverter

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2121702A1 (es) * 1997-02-17 1998-12-01 Univ Malaga Sensor para monitorizacion on-line y remota de procesos automatizados de soldadura con laser.

Also Published As

Publication number Publication date
JP2891722B2 (ja) 1999-05-17
KR900006776A (ko) 1990-05-08
EP0362577A3 (de) 1991-03-20
CA1329018C (en) 1994-05-03
KR0158676B1 (ko) 1999-03-30
EP0362577B1 (de) 1995-01-11
US4995723A (en) 1991-02-26
DE58908876D1 (de) 1995-02-23
JPH02147839A (ja) 1990-06-06
EP0362577A2 (de) 1990-04-11
ATE117081T1 (de) 1995-01-15

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