EP3883940B1 - Verbesserte perowskitmaterialien für fotovoltaische vorrichtungen - Google Patents
Verbesserte perowskitmaterialien für fotovoltaische vorrichtungenInfo
- Publication number
- EP3883940B1 EP3883940B1 EP19886969.5A EP19886969A EP3883940B1 EP 3883940 B1 EP3883940 B1 EP 3883940B1 EP 19886969 A EP19886969 A EP 19886969A EP 3883940 B1 EP3883940 B1 EP 3883940B1
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- EP
- European Patent Office
- Prior art keywords
- lead
- perovskite material
- perovskite
- iodide
- salt
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- C07—ORGANIC CHEMISTRY
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- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/24—Lead compounds
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C211/00—Compounds containing amino groups bound to a carbon skeleton
- C07C211/01—Compounds containing amino groups bound to a carbon skeleton having amino groups bound to acyclic carbon atoms
- C07C211/02—Compounds containing amino groups bound to a carbon skeleton having amino groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
- C07C211/09—Diamines
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C211/00—Compounds containing amino groups bound to a carbon skeleton
- C07C211/01—Compounds containing amino groups bound to a carbon skeleton having amino groups bound to acyclic carbon atoms
- C07C211/02—Compounds containing amino groups bound to a carbon skeleton having amino groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
- C07C211/14—Amines containing amino groups bound to at least two aminoalkyl groups, e.g. diethylenetriamines
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C257/00—Compounds containing carboxyl groups, the doubly-bound oxygen atom of a carboxyl group being replaced by a doubly-bound nitrogen atom, this nitrogen atom not being further bound to an oxygen atom, e.g. imino-ethers, amidines
- C07C257/10—Compounds containing carboxyl groups, the doubly-bound oxygen atom of a carboxyl group being replaced by a doubly-bound nitrogen atom, this nitrogen atom not being further bound to an oxygen atom, e.g. imino-ethers, amidines with replacement of the other oxygen atom of the carboxyl group by nitrogen atoms, e.g. amidines
- C07C257/12—Compounds containing carboxyl groups, the doubly-bound oxygen atom of a carboxyl group being replaced by a doubly-bound nitrogen atom, this nitrogen atom not being further bound to an oxygen atom, e.g. imino-ethers, amidines with replacement of the other oxygen atom of the carboxyl group by nitrogen atoms, e.g. amidines having carbon atoms of amidino groups bound to hydrogen atoms
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- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/12—Halides
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
- C30B29/22—Complex oxides
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B7/00—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions
- C30B7/14—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions the crystallising materials being formed by chemical reactions in the solution
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/16—Material structures, e.g. crystalline structures, film structures or crystal plane orientations
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- H—ELECTRICITY
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/16—Material structures, e.g. crystalline structures, film structures or crystal plane orientations
- H10F77/169—Thin semiconductor films on metallic or insulating substrates
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/20—Organic diodes
- H10K10/29—Diodes comprising organic-inorganic heterojunctions
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- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/468—Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
- H10K10/478—Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising a layer of composite material comprising interpenetrating or embedded materials, e.g. TiO2 particles in a polymer matrix
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/50—Photovoltaic [PV] devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/12—Deposition of organic active material using liquid deposition, e.g. spin coating
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/40—Thermal treatment, e.g. annealing in the presence of a solvent vapour
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/50—Organic perovskites; Hybrid organic-inorganic perovskites [HOIP], e.g. CH3NH3PbI3
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
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- H—ELECTRICITY
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6938—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides
- H10P14/69398—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides the material having a perovskite structure, e.g. BaTiO3
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/30—Three-dimensional structures
- C01P2002/34—Three-dimensional structures perovskite-type (ABO3)
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07B—GENERAL METHODS OF ORGANIC CHEMISTRY; APPARATUS THEREFOR
- C07B2200/00—Indexing scheme relating to specific properties of organic compounds
- C07B2200/13—Crystalline forms, e.g. polymorphs
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- H—ELECTRICITY
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/10—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising heterojunctions between organic semiconductors and inorganic semiconductors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/50—Photovoltaic [PV] devices
- H10K30/57—Photovoltaic [PV] devices comprising multiple junctions, e.g. tandem PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
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- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Inorganic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Metallurgy (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Electromagnetism (AREA)
- Composite Materials (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Photovoltaic Devices (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Compositions Of Oxide Ceramics (AREA)
- Electroluminescent Light Sources (AREA)
Claims (14)
- Perowskitmaterial, umfassend:ein Perowskitkristallgitter, das eine Formel von CxMyXz aufweist; und1,4-Diammoniumbutankationen, die innerhalb des Perowskitkristallgitters angeordnet sind; wobei:x, y und z reelle Zahlen zwischen 1 und 20 sind;C Formamidinium umfasst, wobei jedes 1,4-Diammoniumbutankation zwei Formamidiniumionen innerhalb des Perowskitkristallgitters substituiert;M ein oder mehrere Metalle umfasst, die jeweils aus der Gruppe ausgewählt sind, die aus Be, Mg, Ca, Sr, Ba, Fe, Cd, Co, Ni, Cu, Ag, Au, Hg, Sn, Ge, Ga, Pb, In, Tl, Sb, Bi, Ti, Zn, Cd, Hg und Zr und Kombinationen davon besteht; undX ein oder mehrere Anionen umfasst, die jeweils aus der Gruppe ausgewählt sind, die aus Halogeniden, Pseudohalogeniden, Chalkogeniden und Kombinationen davon besteht.
- Perowskitmaterial, umfassend:ein Formamidinium-Blei-Iodid-Perowskitmaterial; und1,4-Diammoniumbutankationen, die innerhalb des Formamidinium-Blei-Iodid-Perowskitmaterials dispergiert sind, wobei jedes 1,4-Diammoniumbutankation zwei Formamidiniumionen innerhalb des Kristallgitters des Formamidinium-Blei-Iodid-Perowskitmaterials substituiert.
- Perowskitmaterial nach Anspruch 1 oder 2, wobei die 1,4-Diammoniumbutankationen eine Konzentration:i) zwischen 1 Mol-% und 20 Mol-% in dem Perowskitmaterial;ii) zwischen 1 Mol-% und 5 Mol-% in dem Perowskitmaterial;iii) ungefähr 5 Mol-% in dem Perowskitmaterial aufweisen.
- Perowskitmaterial nach Anspruch 1, wobei C Formamidinium umfasst, M Blei umfasst und X Iodid umfasst.
- Perowskitmaterial nach Anspruch 4, wobei das Perowskitmaterialkristallgitter eine kubische Struktur aufweist, oder Perowskitmaterial nach Anspruch 2, wobei das Formamidinium-Blei-Iodid-Perovskitmaterial eine kubische Kristallstruktur aufweist.
- Verfahren zum Ablagern des Perowskitmaterials nach Anspruch 1, umfassend:Ablagern eines Bleisalz-Vorläufers auf einem Substrat, um einen Bleisalzdünnfilm zu bilden, wobei der Bleisalz-Vorläufer ein Bleisalz und ein 1,4-Diammoniumbutansalz umfasst;Ablagern eines zweiten Salz-Vorläufers auf dem Bleisalzdünnfilm, um einen Perowskit-Vorläuferdünnfilm zu bilden; undGlühen des Substrats und des Perowskit-Vorläuferdünnfilms, um ein Perowskitmaterial zu bilden.
- Verfahren zum Ablagern des Perowskitmaterials nach Anspruch 1, umfassend:Ablagern eines Bleisalz-Vorläufers auf einem Substrat, um einen Bleisalzdünnfilm zu bilden;Ablagern eines 1,4-Diammoniumbutansalz-Vorläufers auf dem Bleisalzdünnfilm;Ablagern eines dritten Salz-Vorläufers auf dem Bleisalzdünnfilm, um einen Perowskit-Vorläuferdünnfilm zu bilden; undGlühen des Substrats und des Perowskit-Vorläuferdünnfilms, um ein Perowskitmaterial zu bilden.
- Verfahren nach Anspruch 6, wobei der Bleisalz-Vorläufer eine 1,4-Diammoniumbutankonzentration:i) zwischen 1 Mol-% und 20 Mol-%;ii) zwischen 1 Mol-% und 5 Mol-%; oderiii) von ungefähr 5 Mol-% aufweist.
- Verfahren nach Anspruch 6, wobei das Bleisalz aus der Gruppe ausgewählt ist, die aus Blei(II)-iodid, Blei(II)-thiocyanat, Blei(II)-chlorid, Blei(II)-bromid und Kombinationen davon besteht; und/oder
wobei der zweite Salz-Vorläufer ein Salz umfasst, das aus der Gruppe ausgewählt ist, die aus Formamidiniumiodid, Formamidiniumthiocyanat, Guanidiniumthiocyanat und Kombinationen davon besteht. - Verfahren nach Anspruch 6, wobei das Bleisalz Blei(II)-iodid umfasst und/oder wobei der zweite Salz-Vorläufer Formamidiniumiodid umfasst.
- Verfahren nach Anspruch 6, wobei der Bleisalz-Vorläufer einen oder mehrere Zusatzstoffe enthält, die aus der Gruppe ausgewählt sind, die aus einer Aminosäure, 5-Aminovaleriansäurehydroiodid, 1,8-Diiodooctan, 1,8-Dithiooctan, Formamidiniumhalogenid, Essigsäure, Trifluoressigsäure, einem Methylammoniumhalogenid, Wasser und Kombinationen davon besteht.
- Verfahren nach Anspruch 6, wobei der Bleisalz-Vorläufer ein Molverhältnis von PbI2 zu PbCl2 von 90:10, aufgelöst in wasserfreiem Dimethylformamid, umfasst.
- Verfahren nach Anspruch 6, wobei:i) das Glühen bei einer Temperatur auftritt, die größer als oder gleich 50 °C und kleiner als oder gleich 300 °C ist;ii) das Glühen bei einer absoluten Feuchtigkeit auftritt, die größer als oder gleich 0 g H2O/m3 Luft und kleiner als oder gleich 20 g H2O/m3 Luft ist;iii) wobei das Glühen bei einer absoluten Feuchtigkeit auftritt, die zwischen ungefähr 4 und 7 g H2O/m3 Luft beträgt.
- Verfahren nach Anspruch 7, wobei:der Bleisalz-Vorläufer ein Molverhältnis von PbI2 zu PbCl2 von 90:10, aufgelöst in wasserfreiem Dimethylformamid, umfasst;der Bleisalz-Vorläufer so viel wie 10 Mol-% Cäsium umfasst; unddas Glühen bei einer Temperatur auftritt, die größer als oder gleich 50 °C und kleiner als oder gleich 300 °C ist.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201862770313P | 2018-11-21 | 2018-11-21 | |
| US16/665,831 US11631582B2 (en) | 2018-11-21 | 2019-10-28 | Enhanced perovskite materials for photovoltaic devices |
| PCT/US2019/060410 WO2020106469A1 (en) | 2018-11-21 | 2019-11-08 | Enhanced perovskite materials for photovoltaic devices |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| EP3883940A1 EP3883940A1 (de) | 2021-09-29 |
| EP3883940A4 EP3883940A4 (de) | 2022-09-07 |
| EP3883940B1 true EP3883940B1 (de) | 2026-04-22 |
Family
ID=70726999
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP19886670.9A Active EP3883939B1 (de) | 2018-11-21 | 2019-11-08 | Verbesserte perowskitmaterialien für fotovoltaische vorrichtungen |
| EP19886969.5A Active EP3883940B1 (de) | 2018-11-21 | 2019-11-08 | Verbesserte perowskitmaterialien für fotovoltaische vorrichtungen |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP19886670.9A Active EP3883939B1 (de) | 2018-11-21 | 2019-11-08 | Verbesserte perowskitmaterialien für fotovoltaische vorrichtungen |
Country Status (11)
| Country | Link |
|---|---|
| US (4) | US12243740B2 (de) |
| EP (2) | EP3883939B1 (de) |
| JP (3) | JP7597451B2 (de) |
| KR (3) | KR102926720B1 (de) |
| CN (3) | CN119136633A (de) |
| AU (2) | AU2019383351A1 (de) |
| CA (2) | CA3120251A1 (de) |
| ES (1) | ES3055785T3 (de) |
| MX (2) | MX2021005893A (de) |
| PL (1) | PL3883939T3 (de) |
| WO (2) | WO2020106469A1 (de) |
Families Citing this family (42)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102527306B1 (ko) | 2016-01-18 | 2023-04-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 금속 산화물막, 반도체 장치, 및 표시 장치 |
| US11195967B2 (en) * | 2017-09-07 | 2021-12-07 | Northwestern University | High radiation detection performance from photoactive semiconductor single crystals |
| KR101919100B1 (ko) * | 2018-10-17 | 2018-11-19 | 한국과학기술정보연구원 | Lhp 합성 시뮬레이션 방법 및 장치 |
| US12243740B2 (en) * | 2018-11-21 | 2025-03-04 | Cubicpv Inc. | Enhanced perovskite materials for photovoltaic devices |
| GB201903085D0 (en) * | 2019-03-07 | 2019-04-24 | Univ Oxford Innovation Ltd | Passivation method |
| GB201908334D0 (en) * | 2019-06-11 | 2019-07-24 | Univ Oxford Innovation Ltd | Optoelectronic device |
| WO2021250499A1 (en) * | 2020-06-08 | 2021-12-16 | Okinawa Institute Of Science And Technology School Corporation | Rapid hybrid chemical vapor deposition for perovskite solar modules |
| CN111834533B (zh) * | 2020-07-21 | 2021-09-24 | 西北工业大学 | 含芘全氟化合物钝化钙钛矿薄膜的太阳能电池制备方法 |
| CN114122259B (zh) * | 2020-08-29 | 2024-10-18 | 杭州纤纳光电科技有限公司 | 一种钙钛矿薄膜太阳能电池及其制备方法 |
| CN112071982B (zh) * | 2020-09-03 | 2021-09-10 | 云南农业大学 | 高稳定性甲脒钙钛矿材料及其制备方法、用途 |
| CN112466964A (zh) * | 2020-10-28 | 2021-03-09 | 天津爱旭太阳能科技有限公司 | 一种异质结钙钛矿太阳能叠层电池及其制备方法 |
| KR102568090B1 (ko) * | 2020-11-27 | 2023-08-17 | 가천대학교 산학협력단 | 넓은 밴드갭을 가진 페로브스카이트 구조 나노물질을 이용한 uvc 센서 및 이의 제조방법 |
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| CN114284439B (zh) * | 2021-01-28 | 2025-02-28 | 南京工业大学 | 一种在高湿度环境下制备CsPbI3钙钛矿薄膜及其高效太阳能电池的方法及应用 |
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