EP3853881A4 - Ablenkungsarray für ein multielektronenstrahlsystem - Google Patents
Ablenkungsarray für ein multielektronenstrahlsystem Download PDFInfo
- Publication number
- EP3853881A4 EP3853881A4 EP19871694.6A EP19871694A EP3853881A4 EP 3853881 A4 EP3853881 A4 EP 3853881A4 EP 19871694 A EP19871694 A EP 19871694A EP 3853881 A4 EP3853881 A4 EP 3853881A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- electron beam
- beam system
- array apparatus
- deflection array
- deflection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
- H01J37/1471—Arrangements for directing or deflecting the discharge along a desired path for centering, aligning or positioning of ray or beam
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/10—Lenses
- H01J37/12—Lenses electrostatic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/045—Beam blanking or chopping, i.e. arrangements for momentarily interrupting exposure to the discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/3002—Details
- H01J37/3005—Observing the objects or the point of impact on the object
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
- H01J37/3177—Multi-beam, e.g. fly's eye, comb probe
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/063—Electron sources
- H01J2237/06308—Thermionic sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/10—Lenses
- H01J2237/12—Lenses electrostatic
- H01J2237/1202—Associated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/10—Lenses
- H01J2237/12—Lenses electrostatic
- H01J2237/1205—Microlenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/15—Means for deflecting or directing discharge
- H01J2237/151—Electrostatic means
- H01J2237/1516—Multipoles
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201862744856P | 2018-10-12 | 2018-10-12 | |
US16/230,325 US10748739B2 (en) | 2018-10-12 | 2018-12-21 | Deflection array apparatus for multi-electron beam system |
PCT/US2019/054373 WO2020076588A1 (en) | 2018-10-12 | 2019-10-03 | Deflection array apparatus for multi-electron beam system |
Publications (2)
Publication Number | Publication Date |
---|---|
EP3853881A1 EP3853881A1 (de) | 2021-07-28 |
EP3853881A4 true EP3853881A4 (de) | 2022-12-14 |
Family
ID=70160368
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP19871694.6A Pending EP3853881A4 (de) | 2018-10-12 | 2019-10-03 | Ablenkungsarray für ein multielektronenstrahlsystem |
Country Status (7)
Country | Link |
---|---|
US (1) | US10748739B2 (de) |
EP (1) | EP3853881A4 (de) |
JP (1) | JP7344285B2 (de) |
KR (1) | KR102530215B1 (de) |
CN (1) | CN112805804B (de) |
TW (1) | TWI802761B (de) |
WO (1) | WO2020076588A1 (de) |
Families Citing this family (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022136064A1 (en) | 2020-12-23 | 2022-06-30 | Asml Netherlands B.V. | Charged particle optical device |
EP4020516A1 (de) | 2020-12-23 | 2022-06-29 | ASML Netherlands B.V. | Optische vorrichtung mit geladenen teilchen, objektivlinsenanordnung, detektor, detektoranordnung und verfahren |
EP4084039A1 (de) | 2021-04-29 | 2022-11-02 | ASML Netherlands B.V. | System und verfahren zur bewertung geladener partikel |
US11869743B2 (en) | 2021-05-11 | 2024-01-09 | Kla Corporation | High throughput multi-electron beam system |
EP4092712A1 (de) | 2021-05-18 | 2022-11-23 | ASML Netherlands B.V. | Optische vorrichtung mit geladenen teilchen und methode |
EP4092614A1 (de) | 2021-05-21 | 2022-11-23 | ASML Netherlands B.V. | Datenverarbeitungsvorrichtung und -verfahren, system und verfahren zur bewertung geladener teilchen |
KR20240012400A (ko) | 2021-05-21 | 2024-01-29 | 에이에스엠엘 네델란즈 비.브이. | 데이터 처리 디바이스 및 방법, 하전 입자 평가 시스템 및 방법 |
EP4117017A1 (de) | 2021-07-05 | 2023-01-11 | ASML Netherlands B.V. | Detektor für geladene teilchen |
EP4117015A1 (de) | 2021-07-05 | 2023-01-11 | ASML Netherlands B.V. | Vorrichtung detektor und verfahren für geladene teilchen |
EP4117016A1 (de) | 2021-07-05 | 2023-01-11 | ASML Netherlands B.V. | Detektor für geladene teilchen |
EP4117014A1 (de) | 2021-07-07 | 2023-01-11 | ASML Netherlands B.V. | Ladungsteilchenvorrichtung und -verfahren |
EP4117012A1 (de) | 2021-07-07 | 2023-01-11 | ASML Netherlands B.V. | Optische vorrichtung für geladene teilchen, gerät und verfahren für geladene teilchen |
WO2023280551A1 (en) | 2021-07-07 | 2023-01-12 | Asml Netherlands B.V. | Charged particle apparatus and method |
EP4123683A1 (de) | 2021-07-20 | 2023-01-25 | ASML Netherlands B.V. | Datenverarbeitungsvorrichtung und -verfahren, system und verfahren zur bewertung geladener teilchen |
EP4156227A1 (de) | 2021-09-27 | 2023-03-29 | ASML Netherlands B.V. | Ladungsteilchenvorrichtung und -verfahren |
US11651934B2 (en) | 2021-09-30 | 2023-05-16 | Kla Corporation | Systems and methods of creating multiple electron beams |
EP4170695A1 (de) | 2021-10-19 | 2023-04-26 | ASML Netherlands B.V. | Detektoranordnung, vorrichtung für geladene teilchen, gerät und verfahren |
WO2023066595A1 (en) | 2021-10-19 | 2023-04-27 | Asml Netherlands B.V. | Detector assembly, charged particle device, apparatus, and methods |
EP4181167A1 (de) | 2021-11-11 | 2023-05-17 | ASML Netherlands B.V. | System und verfahren zur untersuchung mittels geladener partikel |
WO2023083545A1 (en) | 2021-11-11 | 2023-05-19 | Asml Netherlands B.V. | Charged particle assessment system and method |
WO2023110244A1 (en) | 2021-12-15 | 2023-06-22 | Asml Netherlands B.V. | Charged particle assessment system |
WO2023110284A1 (en) | 2021-12-15 | 2023-06-22 | Asml Netherlands B.V. | Method of generating a sample map, computer program product |
EP4213176A1 (de) | 2022-01-13 | 2023-07-19 | ASML Netherlands B.V. | System zur bewertung geladener partikel |
EP4199032A1 (de) | 2021-12-17 | 2023-06-21 | ASML Netherlands B.V. | Detektorinspektionsvorrichtung, detektoranordnung, detektorarray, einrichtung und verfahren |
WO2023110444A1 (en) | 2021-12-17 | 2023-06-22 | Asml Netherlands B.V. | Detector inspection device, detector assembly, detector array, apparatus, and method |
EP4199033A1 (de) | 2021-12-20 | 2023-06-21 | ASML Netherlands B.V. | Verfahren zum bearbeiten einer probe mittels einer teilchenstrahlvorrichtung zur bewertung |
EP4250331A1 (de) | 2022-03-22 | 2023-09-27 | ASML Netherlands B.V. | Ladungsteilchenvorrichtung und -verfahren |
EP4258320A1 (de) | 2022-04-08 | 2023-10-11 | ASML Netherlands B.V. | Sensorsubstrat, gerät und verfahren |
EP4280252A1 (de) | 2022-05-16 | 2023-11-22 | ASML Netherlands B.V. | Optische vorrichtung für geladene teilchen und verfahren |
WO2023202819A1 (en) | 2022-04-18 | 2023-10-26 | Asml Netherlands B.V. | Charged particle optical device and method |
EP4343812A1 (de) | 2022-09-26 | 2024-03-27 | ASML Netherlands B.V. | Datenverarbeitungsvorrichtung und -verfahren, beurteilungssystem für geladene teilchen und verfahren |
WO2023227424A1 (en) | 2022-05-27 | 2023-11-30 | Asml Netherlands B.V. | Data processing device and method, charged particle assessment system and method |
WO2023232474A1 (en) | 2022-05-30 | 2023-12-07 | Asml Netherlands B.V. | Method of processing data derived from a sample |
EP4300087A1 (de) | 2022-06-29 | 2024-01-03 | ASML Netherlands B.V. | Verfahren zum verarbeiten von von einer probe abgeleiteten daten |
EP4354485A1 (de) | 2022-10-13 | 2024-04-17 | ASML Netherlands B.V. | Optische vorrichtung für geladene teilchen |
WO2024013042A1 (en) | 2022-07-15 | 2024-01-18 | Asml Netherlands B.V. | Charged particle-optical apparatus |
WO2024017737A1 (en) | 2022-07-21 | 2024-01-25 | Asml Netherlands B.V. | Charged particle assessment system and method |
EP4333019A1 (de) | 2022-09-02 | 2024-03-06 | ASML Netherlands B.V. | System und verfahren zur bewertung geladener partikel |
WO2024022843A1 (en) | 2022-07-25 | 2024-02-01 | Asml Netherlands B.V. | Training a model to generate predictive data |
EP4345861A1 (de) | 2022-09-28 | 2024-04-03 | ASML Netherlands B.V. | Vorrichtung für geladene teilchen |
WO2024088718A1 (en) | 2022-10-27 | 2024-05-02 | Asml Netherlands B.V. | Charged particle-optical apparatus |
EP4376049A1 (de) | 2022-11-28 | 2024-05-29 | ASML Netherlands B.V. | Verfahren und system zur beurteilung geladener teilchen |
EP4391009A1 (de) | 2022-12-21 | 2024-06-26 | ASML Netherlands B.V. | Vorrichtung mit geladenen teilchen und vorrichtung mit geladenen teilchen |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140103201A1 (en) * | 2012-10-16 | 2014-04-17 | Aleksandra Kramer | Octopole device and method for spot size improvement |
US20150155134A1 (en) * | 2013-12-02 | 2015-06-04 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik GmbH | Multi-beam system for high throughput ebi |
US20170117114A1 (en) * | 2015-10-22 | 2017-04-27 | Carl Zeiss Microscopy Gmbh | Method for operating a multi-beam particle microscope |
US20180068825A1 (en) * | 2016-09-08 | 2018-03-08 | Kla-Tencor Corporation | Apparatus and Method for Correcting Arrayed Astigmatism in a Multi-Column Scanning Electron Microscopy System |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09139184A (ja) * | 1995-11-15 | 1997-05-27 | Nikon Corp | 静電偏向器の製造方法 |
EP1150327B1 (de) * | 2000-04-27 | 2018-02-14 | ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Mehrstrahl Ladungsträgerstrahlvorrichtung |
EP1463087B1 (de) * | 2003-03-24 | 2010-06-02 | ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik Mbh | Ladungsträgerstrahlvorrichtung |
US8536538B2 (en) * | 2011-02-16 | 2013-09-17 | Kla-Tencor Corporation | Multiple-pole electrostatic deflector for improving throughput of focused electron beam instruments |
CA2828967C (en) | 2011-03-04 | 2018-07-10 | Perkinelmer Health Sciences, Inc. | Electrostatic lenses and systems including the same |
US9053900B2 (en) | 2012-04-03 | 2015-06-09 | Kla-Tencor Corporation | Apparatus and methods for high-resolution electron beam imaging |
US9460886B2 (en) * | 2014-07-22 | 2016-10-04 | Kla-Tencor Corporation | High resolution high quantum efficiency electron bombarded CCD or CMOS imaging sensor |
US9691588B2 (en) * | 2015-03-10 | 2017-06-27 | Hermes Microvision, Inc. | Apparatus of plural charged-particle beams |
KR102387776B1 (ko) | 2015-05-08 | 2022-04-15 | 케이엘에이 코포레이션 | 전자빔 시스템의 수차 보정 방법 및 시스템 |
US9754759B2 (en) * | 2015-11-20 | 2017-09-05 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Electrostatic multipole device, electrostatic multipole arrangement, and method of manufacturing an electrostatic multipole device |
US9620329B1 (en) | 2015-11-20 | 2017-04-11 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of manufacturing an electrostatic multipole device |
EP3268979A4 (de) * | 2016-04-13 | 2019-05-08 | Hermes Microvision Inc. | Vorrichtung mit mehreren geladenen teilchenstrahlen |
US10453645B2 (en) * | 2016-12-01 | 2019-10-22 | Applied Materials Israel Ltd. | Method for inspecting a specimen and charged particle multi-beam device |
-
2018
- 2018-12-21 US US16/230,325 patent/US10748739B2/en active Active
-
2019
- 2019-10-03 JP JP2021519722A patent/JP7344285B2/ja active Active
- 2019-10-03 EP EP19871694.6A patent/EP3853881A4/de active Pending
- 2019-10-03 CN CN201980066267.1A patent/CN112805804B/zh active Active
- 2019-10-03 KR KR1020217014039A patent/KR102530215B1/ko active IP Right Grant
- 2019-10-03 WO PCT/US2019/054373 patent/WO2020076588A1/en unknown
- 2019-10-09 TW TW108136516A patent/TWI802761B/zh active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140103201A1 (en) * | 2012-10-16 | 2014-04-17 | Aleksandra Kramer | Octopole device and method for spot size improvement |
US20150155134A1 (en) * | 2013-12-02 | 2015-06-04 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik GmbH | Multi-beam system for high throughput ebi |
US20170117114A1 (en) * | 2015-10-22 | 2017-04-27 | Carl Zeiss Microscopy Gmbh | Method for operating a multi-beam particle microscope |
US20180068825A1 (en) * | 2016-09-08 | 2018-03-08 | Kla-Tencor Corporation | Apparatus and Method for Correcting Arrayed Astigmatism in a Multi-Column Scanning Electron Microscopy System |
Also Published As
Publication number | Publication date |
---|---|
KR20210060626A (ko) | 2021-05-26 |
WO2020076588A1 (en) | 2020-04-16 |
TWI802761B (zh) | 2023-05-21 |
JP7344285B2 (ja) | 2023-09-13 |
KR102530215B1 (ko) | 2023-05-08 |
JP2022504617A (ja) | 2022-01-13 |
US20200118784A1 (en) | 2020-04-16 |
CN112805804B (zh) | 2022-06-14 |
US10748739B2 (en) | 2020-08-18 |
TW202044306A (zh) | 2020-12-01 |
EP3853881A1 (de) | 2021-07-28 |
CN112805804A (zh) | 2021-05-14 |
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Ipc: H01J 37/30 20060101ALI20221107BHEP Ipc: H01J 37/317 20060101ALI20221107BHEP Ipc: H01J 37/04 20060101ALI20221107BHEP Ipc: H01J 37/304 20060101AFI20221107BHEP |
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