EP3521891A4 - Dispositif et procédé d'observation, et programme de commande de dispositif d'observation - Google Patents

Dispositif et procédé d'observation, et programme de commande de dispositif d'observation Download PDF

Info

Publication number
EP3521891A4
EP3521891A4 EP17855713.8A EP17855713A EP3521891A4 EP 3521891 A4 EP3521891 A4 EP 3521891A4 EP 17855713 A EP17855713 A EP 17855713A EP 3521891 A4 EP3521891 A4 EP 3521891A4
Authority
EP
European Patent Office
Prior art keywords
observation device
control program
device control
observation
program
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP17855713.8A
Other languages
German (de)
English (en)
Other versions
EP3521891A1 (fr
EP3521891B1 (fr
Inventor
Yasushi Shiraishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Publication of EP3521891A1 publication Critical patent/EP3521891A1/fr
Publication of EP3521891A4 publication Critical patent/EP3521891A4/fr
Application granted granted Critical
Publication of EP3521891B1 publication Critical patent/EP3521891B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/285—Systems for automatic generation of focusing signals including two or more different focus detection devices, e.g. both an active and a passive focus detecting device
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/245—Devices for focusing using auxiliary sources, detectors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/30—Systems for automatic generation of focusing signals using parallactic triangle with a base line
    • G02B7/32—Systems for automatic generation of focusing signals using parallactic triangle with a base line using active means, e.g. light emitter

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
EP17855713.8A 2016-09-28 2017-09-12 Dispositif et procédé d'observation, et programme de commande de dispositif d'observation Active EP3521891B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016189794A JP6619315B2 (ja) 2016-09-28 2016-09-28 観察装置および方法並びに観察装置制御プログラム
PCT/JP2017/032930 WO2018061756A1 (fr) 2016-09-28 2017-09-12 Dispositif et procédé d'observation, et programme de commande de dispositif d'observation

Publications (3)

Publication Number Publication Date
EP3521891A1 EP3521891A1 (fr) 2019-08-07
EP3521891A4 true EP3521891A4 (fr) 2019-10-23
EP3521891B1 EP3521891B1 (fr) 2022-08-03

Family

ID=61759602

Family Applications (1)

Application Number Title Priority Date Filing Date
EP17855713.8A Active EP3521891B1 (fr) 2016-09-28 2017-09-12 Dispositif et procédé d'observation, et programme de commande de dispositif d'observation

Country Status (5)

Country Link
US (1) US11163145B2 (fr)
EP (1) EP3521891B1 (fr)
JP (1) JP6619315B2 (fr)
KR (1) KR102227337B1 (fr)
WO (1) WO2018061756A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6704530B2 (ja) * 2017-08-29 2020-06-03 富士フイルム株式会社 撮影制御装置、方法およびプログラム
JP6982198B2 (ja) * 2018-09-27 2021-12-17 富士フイルム株式会社 観察装置および方法並びに観察装置制御プログラム
JP2021083408A (ja) * 2019-11-29 2021-06-03 株式会社島津製作所 検査方法および検査装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003295065A (ja) * 2002-03-29 2003-10-15 Natl Inst Of Radiological Sciences 顕微鏡装置
EP2402811A2 (fr) * 2010-07-01 2012-01-04 Sony Corporation Appareil de traitement d'informations, procédé de correction de l'ondulation d'une platine et programme associé

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3290606B2 (ja) * 1997-02-19 2002-06-10 株式会社三協精機製作所 顕微鏡用オートフォーカス装置
JP2000266995A (ja) * 1999-03-18 2000-09-29 Hitachi Denshi Ltd 顕微鏡合焦点検出方法
JP2003294419A (ja) * 2002-03-29 2003-10-15 Hitachi Kokusai Electric Inc 微小寸法測定装置
US6924929B2 (en) 2002-03-29 2005-08-02 National Institute Of Radiological Sciences Microscope apparatus
US7456377B2 (en) * 2004-08-31 2008-11-25 Carl Zeiss Microimaging Ais, Inc. System and method for creating magnified images of a microscope slide
JP2007218846A (ja) * 2006-02-20 2007-08-30 Omron Corp 寸法計測方法、撮像装置、制御装置および寸法計測装置
JP5043629B2 (ja) * 2007-12-17 2012-10-10 オリンパス株式会社 レーザ走査型顕微鏡及びその表面形状の測定方法
JP5207213B2 (ja) * 2008-09-16 2013-06-12 横河電機株式会社 オートフォーカス装置
US20110091125A1 (en) * 2009-10-15 2011-04-21 General Electric Company System and method for imaging with enhanced depth of field
CN103180769B (zh) * 2010-10-29 2016-02-24 佳能株式会社 显微镜、图像获取装置和图像获取系统
US9041791B2 (en) * 2011-02-01 2015-05-26 Roche Diagnostics Hematology, Inc. Fast auto-focus in imaging
CA2844989C (fr) * 2011-09-09 2016-10-11 Ventana Medical Systems, Inc. Systeme et techniques de focalisation et d'imagerie utilisant un signal d'erreur
DE102012223533A1 (de) * 2012-12-18 2014-06-18 Carl Zeiss Microscopy Gmbh Digitales Mikroskopsystem
CN103852878B (zh) * 2014-01-08 2016-05-25 麦克奥迪实业集团有限公司 一种具有实时聚焦的显微切片快速数字扫描装置及其方法
JP6134348B2 (ja) * 2015-03-31 2017-05-24 シスメックス株式会社 細胞撮像装置及び細胞撮像方法
JP6675279B2 (ja) * 2016-07-01 2020-04-01 富士フイルム株式会社 撮影装置および方法並びに撮影制御プログラム
EP3712669A4 (fr) * 2017-11-17 2021-04-07 FUJIFILM Corporation Dispositif et procédé d'observation, et programme de commande de dispositif d'observation

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003295065A (ja) * 2002-03-29 2003-10-15 Natl Inst Of Radiological Sciences 顕微鏡装置
EP2402811A2 (fr) * 2010-07-01 2012-01-04 Sony Corporation Appareil de traitement d'informations, procédé de correction de l'ondulation d'une platine et programme associé

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2018061756A1 *

Also Published As

Publication number Publication date
KR102227337B1 (ko) 2021-03-11
JP2018054817A (ja) 2018-04-05
WO2018061756A1 (fr) 2018-04-05
EP3521891A1 (fr) 2019-08-07
JP6619315B2 (ja) 2019-12-11
US11163145B2 (en) 2021-11-02
US20190212539A1 (en) 2019-07-11
KR20190039808A (ko) 2019-04-15
EP3521891B1 (fr) 2022-08-03

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