EP3320348A1 - Vorrichtung und verfahren zur reversiblen kontaktierung - Google Patents
Vorrichtung und verfahren zur reversiblen kontaktierungInfo
- Publication number
- EP3320348A1 EP3320348A1 EP16744318.3A EP16744318A EP3320348A1 EP 3320348 A1 EP3320348 A1 EP 3320348A1 EP 16744318 A EP16744318 A EP 16744318A EP 3320348 A1 EP3320348 A1 EP 3320348A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- particles
- magnetic field
- μπι
- contacting device
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
- G01R1/06761—Material aspects related to layers
Definitions
- the invention relates to a contacting device with an electrically conductive contact for the reversible contacting of a measuring object. Furthermore, the concerns
- the invention relates to a measuring device equipped with the contacting device and to a method for determining electrical parameters of a measuring object, in which the measuring object has at least one conductive contact
- test pins or contact stamp made of a metal or an alloy From practice it is known to use test pins or contact stamp made of a metal or an alloy and bring them into contact with the measurement object. As a result, a current flow between the conductive contact and the measurement object is made possible, so that, for example, a stream
- the conductive contacts can be lifted off the test object. Ideally, the
- Residue-free removable contacts and the measurement object remains completely unaffected by the measurement.
- a contacting device According to the invention, a contacting device
- the electrically conductive contact in some embodiments of the invention may have a diameter or perimeter of about 1 mm to about 20 mm.
- the contact can be polygonal or round.
- the contact may contain a metal or an alloy.
- the contact may have a surface facing the measurement object, which surface is provided for contacting the measurement object.
- the contact has a further connection possibility for a measuring line in order to connect the contact and thus ultimately the measured object with a measuring device known per se, a current source or a voltage source.
- the contact may have a cuboid or cylindrical basic shape.
- the contact may be made of a sheet, which in addition to the for contacting the Test object provided contact surface has a terminal lug. At this terminal lug a line can be fixed by soldering, crimping or spot welding.
- Conductive contact contains or consists of copper, aluminum, silver, nickel silver and / or gold.
- the contact may optionally have a coating which the
- the electrically conductive contact is not placed directly on the surface of the measurement object. Instead, a very easily deformable, flowable material between the conductive contact and the surface of the test object is to be introduced. This has on the one hand the property to adapt to any existing surface roughness of the measurement object, so that the contact area and thus the number of formed or formable current paths is increased. Furthermore, the relatively soft material avoids the damage of sensitive surfaces, which by direct placement of the metallic
- Material of the conductive contact can arise on the test object.
- the conductive contact and the measurement object contains a dust or a plurality of particles, which on the one hand are mutually displaceable and thereby can penetrate into the valleys of a surface roughness to increase the contact area. Furthermore, the particles can prevent large, leading to damage forces or mechanical stresses on the surface of the test object occur. After the measurement, the particles can be removed without residue from the surface of the test object. For example, by blowing off with a gas stream or by cleaning in an ultrasonic bath.
- the contacting device can comprise a first magnetic field generating device, with which a magnetic field penetrating the conductive contact can be generated, wherein the plurality of particles can be attached to the contact along the field lines of the magnetic field.
- the particles may be ferrimagnetic or paramagnetic or ferromagnetic. This can cause the particles to move along the field lines of the
- Magnetic field can be attached to the contact, i. as long as the magnetic field exists, the particles form elongated, from the surface of the conductive contact outgoing dendrites or threads. Because the particles continue against each other
- the tip of the dendrite can adapt to the surface of the measured object, so that the
- Damage to the object to be measured can be avoided and roughness can be reliably filled by the particles.
- the magnetic field generation device can, in some embodiments of the invention, comprise a permanent magnet. point. This allows a reliable and permanent operation of the contacting device, since no auxiliary energy is needed for the connection of the particles to the conductive contact.
- the first magnetic field generating device may include at least one coil and a solenoid having a coil and a core
- Particles have a diameter of about 0.5 ⁇ to about 50 ⁇ . In other embodiments of the invention, the particles may have a diameter of about 10 ⁇ to about 40 ⁇ . In yet other embodiments of the invention, the particles may have a diameter of about 15 ⁇ to about 30 ⁇ . Such particles have dimensions which are less than typical roughnesses of surfaces, so that the particles can easily penetrate into the valleys of the roughnesses to fill them up. This increases the number of current paths and thereby the effective contact area on rough surfaces.
- Particles contain or consist of a ferrite, a stainless steel and / or a carbonyl iron. These particles are ferromagnetic or ferromagnetic and can therefore be reliably connected by the magnetic field generating device to the
- Particles additionally contain nickel and / or manganese and / or zinc and / or barium and / or strontium. hereby The desired hard or soft magnetic properties can be adjusted depending on the intended application purpose of the contacting device. In some embodiments of the invention, the particles contain
- the particles contain a nickel-containing stainless steel and / or a manganese-containing
- Stainless steel and / or a zinc-containing stainless steel include
- Particles nickel-containing carbonyl iron and / or manganese-containing carbonyl iron and / or zinc-containing carbonyl iron Particles nickel-containing carbonyl iron and / or manganese-containing carbonyl iron and / or zinc-containing carbonyl iron.
- the particles are provided with a coating.
- the coating of the particles is provided with a coating.
- Particles can increase the electrical conductivity, passivate the surface of the particles and / or the
- Schottky contacts can be formed.
- Coating of the particles can be available galvanically or by means of plasma PVD. As a result, the particles are simple and inexpensive to produce with the desired properties.
- Coating the particles contain or consist of silver and / or gold and / or copper and / or nickel.
- the conductivity of the particles can be increased, so that the measurement accuracy increases further.
- this relates to a measuring device for determining electrical parameters of a measured object with at least one of the aforementioned contacting devices.
- Those determined by the meter Electrical parameters may be selected from an electrical resistance, a carrier density, a carrier mobility, a breakdown field strength or other, not mentioned here parameters.
- the measurements may include both the measurement of the sheet resistance, ie the contacting devices are arranged side by side on the same surface of the measurement object.
- the volume resistance of the measurement object can be determined, ie the contacting devices are located on opposite surfaces of the measurement object.
- a measurement of the Hall effect can be made with the contacting device according to the invention.
- the measuring device may have a second magnetic field generating device, which is arranged opposite to the contacting device, wherein the gap formed between the contacting device and the second magnetic field generating device is provided for receiving the measured object.
- the second magnetic field generating device By the second magnetic field generating device, an approximately homogeneous magnetic field can be generated with approximately parallel field lines on the surface of the measurement object. Since the particles are arranged along the field lines, the effective diameter of the contacting device on the surface of the measurement object can be reduced.
- the second magnetic field generating device may also have a permanent magnet or a current-carrying coil, so that the magnetic field can be varied in terms of strength and direction.
- the measuring device may further comprise a positioning device, with which the gap between the contacting device and the measurement object is adjustable.
- the positioning device may be selected from a piezo actuator, a Linear motor, a spindle drive or other, known positioning aids. This allows the
- Measuring device further comprise a control device with which the positioning device can be controlled. By comparing the setpoint with the actual value becomes a
- Particles are present in air or in a gas atmosphere. This allows easy handling of the measuring device or a simple implementation of the method according to the invention.
- the particles may be bound in a ferrofluid. This allows the
- Figure 1 shows a first embodiment of the contacting device according to the invention.
- FIG. 2 shows a micrograph of the particles on the contacting device according to the invention.
- FIG. 3 shows a particle in cross section.
- FIG. 4 shows an electron micrograph of the particles.
- FIG. 5 shows an embodiment of a measuring device according to the invention.
- FIG. 6 shows a second embodiment of the invention
- FIG. 7 shows comparative measurements of the contacting device according to the invention compared with known contacting devices on the basis of a first application example.
- FIG. 8 shows comparative measurements of the contacting device according to the invention against known contacting devices on the basis of a second example of application.
- the contacting device 1 has a shaft 10, with which the contacting device mechanically
- the mechanical fastening can take place by means of a positioning device 70, as will be explained below with reference to FIG. 5.
- the contacting device 1 has a first magnetic field generating device 21.
- the magnetic field generating device 21 comprises a permanent magnet.
- a current-carrying coil can be used, so that the magnetic field can be varied in direction, strength and time. Since the magnetic field is not switched on permanently, the particles 3 in be easily removed from the contacting device 1, in which the magnetic field is turned off.
- the contacting device has a
- the conductive contact 4 is formed from a metal sheet, which may have a thickness of about 0.1 mm to about 1 mm.
- the conductive contact 4 may be copper,
- the conductive contact 4 can with a
- the conductive contact 4 is not brought into direct material contact with the measurement object.
- particles 3 are provided, which are bound by the magnetic field of the first magnetic field generating device 21 to the conductive contact 4.
- the particles 3 are very small and mutually displaceable, they can on the one hand penetrate into surface roughness of the measurement object and there increase the number of conductive current paths between the contact 4 and the surface of the measurement object. In addition, the allow
- the particles 3 can be removed from the object to be measured without residue in a simple manner if the contacting device 1 is removed from the surface of the object to be measured after completion of the necessary measurements.
- the particles 3 are explained in more detail with reference to FIG.
- the particles 3 Due to the diverging dipole field of the magnetic field generating device 21 and the fact that the particles 3 align along the field lines, they form elongated ones Dendrites or tufts, which extend radially outwards from the surface of the contact 4, for example like a brush or a brush.
- the dendrites of the particles 3 become thinner toward their tip due to the decreasing magnetic field strength.
- the tip of the dendrites there are often only individual particles, so that the tips of the dendrites have a diameter in the size of the particles.
- the tip may therefore have a diameter between about 0.5 ⁇ and about 50 ⁇ or between about 5 ⁇ and about 50 ⁇ or between about 10 ⁇ and about 30 ⁇ .
- FIG. 3 illustrates the structure of a particle 3 by way of example.
- the particle 3 according to FIG. 3 has a core 31 and a coating 32.
- the core 31 may include a ferromagnetic or ferromagnetic material to allow good magnetic coupling to the conductive contact 4 in this manner.
- paramagnetic materials may also be used for the core 31.
- carbonyl iron, stainless steels or ferrites are suitable
- the core 31 is provided with a coating 32, which may consist of a material which has a larger
- the coating 32 may contain or consist of gold, silver and / or copper.
- the coating 32 can be wet-chemically deposited, for example without external current or galvanically.
- the coating 32 may be in a sputtering process or a plasma PVD process
- FIG. 4 shows, by way of example, particles 3 in an electron micrograph.
- the particles shown by way of example in FIG. 4 have a core 31 made of a ferrite and a coating 32 made of silver.
- the measuring device 5 shows a measuring object 5 with a surface 51.
- the measuring object 5 can be, for example, a metallised foil for producing a battery, a capacitor or a fuel cell. In other embodiments of the
- the measurement object 5 may be a semiconductor device or a semiconductor wafer.
- the contacting device 1 should be used to reliably contact the measuring object 5 via its surface 51 and with low contact resistances, so that electrical parameters of the measuring object 5 can be detected.
- the electrical sheet resistance can be determined using a known four-point measurement.
- carrier densities or carrier mobilities can be determined, for example by means of the Hall effect.
- the measurement object 5 is located on a sample holder 50, which can be provided in a manner known per se with a multi-axis manipulation in order to place the measurement object 5 in FIG
- the sample holder 50 also serves as a conductive rear-side contact in order to detect the volume resistance of the measuring object 5.
- the sample holder 50 may also be heated or cooled to allow for measurement at different temperatures.
- For measuring the sheet resistance of the sample holder 50 may also be made insulating, wherein for measuring one or several contacting device (s) 1 in addition
- the contacting device 1 has a shaft 10 and a first magnetic field generating device 21, as already described above.
- the conductive contact 4 protrudes on at least one side beyond the magnetic field generating device 21 and forms there a contact lug, with which the conductive contact 4 with a measuring device, a power source or a voltage source is connectable.
- the area of the conductive contact 4 underlying the magnetic field generating device 21 is occupied by particles 3 which are fixed by the magnetic field generating device 21 on the contact 4.
- the particles are on the one hand designed such that they are held by the magnetic forces of the magnetic field generating device 21 at the contact and on the other hand have a good electrical conductivity to allow sufficiently good electrical contacts to the measuring object 5.
- this gap 55 there is a gap 55 between the particles 3 and the surface 51 of the measurement object 5.
- the size of this gap 55 can be varied by a linear drive 70, which increases or decreases the distance of the contacting device 1 to the surface 51 of the measurement object 5.
- the particles 3 in a measuring position of the contacting device 1 In a measuring position of the contacting device 1, the particles 3 in
- the control of the gap 55 and thus the control of the linear drive 70 can be effected by a control device 6.
- the control device 6 may have a known PID controller. This has the advantage that it does not come to an overshoot when approaching the setpoint of the measuring position, i. the conductive contact 4 does not set on the surface 51 when approaching the measuring position.
- Gap 55 can be continuously detected by a sensor and fed to the control device 6. in the
- Photoelectric sensor or a camera 74 used, which detects the position of the contacting device 1 without contact.
- FIG. 1 An optional second magnetic field generating device 22 is shown in FIG.
- the second magnetic field generating device 22 is used for field shaping of the generated by the first magnetic field generating device 21
- the particles 3 can be arranged more uniformly on the contacting device 1, so that, for example, a cuboid or cylindrical cross-section instead of the meniscus-shaped cross section shown in FIG. 5 results during operation of the second magnetic field generating device 22.
- the effective contact area can be increased, so that measured values with
- FIG. 6 shows a second embodiment of the contacting device according to the present invention. Identical components of the invention are provided with the same reference numerals, so that the following description is limited to the essential differences.
- this embodiment of the invention includes two first magnetic field generating devices 211 and 212. Each magnetic field generating device is associated with a conductive contact 41 and 42. At the end of the conductive contacts 41 and 42 are each a plurality of particles 310 and 320.
- Thetechnischtechnischsvor- device 1 according to the second embodiment is thus adapted to two contact points in a defined distance on the surface 51 of the measurement object 5 to produce. Since both contacts with a single shaft 10 at a
- the contacting device has a
- Position sensor 75 which continuously detects the distance to the surface 51 of a measurement object 5 and a
- the position sensor 75 shown in FIG. 6 may be, for example, an ultrasound sensor, a capacitive sensor or a laser sensor, or may contain such a sensor
- Position sensor 75 also have a spring-mounted pin, which acts on a sliding resistance, so that the distance of the particles 310 and 320 from the surface can be determined by the measured resistance value.
- Position sensor 75 may be formed as a force transducer, which determines the contact closure from the applied force.
- FIG. 7 shows comparative measurements which show the advantageous effect of the contacting device according to the invention. Shown are volume resistances of about 3 ⁇ thick preparation layers on aluminum foil. Both layers were produced by different production methods, which are designated in FIG. 7 in each case with “primer 1" and “primer” 2 ".
- Figure 7A shows the result of measuring the volume resistivity with a cylindrical test pin having a diameter of 3 mm.
- the test pin has a flat
- FIG. 7A shows the arithmetic mean value of the volume resistance and that during the measurement
- Test pin no significant differences in the volume resistivity can be determined. The measurement is thus not suitable for detecting different properties of the different preparation layers produced.
- Figure 7B shows measurements made in the same way with a known contact stamp.
- the contact stamp also consists of a metallic material with a flat support with a diameter of 10 mm.
- FIG. 7C shows measurements which were carried out in the same way with the contacting device according to the invention. Shown again is the arithmetic mean of the volume resistances. It can be seen from FIG. 7c that the differently produced layers have significantly different resistance values. Also the
- Error bar is so small that a distinctness of the layers is given in each single measurement.
- Aluminum foil contains (bar A). By contrast, functionalized aluminum foil is present in the second sample (bar B). Conventional aluminum foil exhibits
Landscapes
- Physics & Mathematics (AREA)
- Geometry (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102015212565.3A DE102015212565A1 (de) | 2015-07-06 | 2015-07-06 | Vorrichtung und Verfahren zur reversiblen Kontaktierung |
PCT/EP2016/066023 WO2017005809A1 (de) | 2015-07-06 | 2016-07-06 | Vorrichtung und verfahren zur reversiblen kontaktierung |
Publications (1)
Publication Number | Publication Date |
---|---|
EP3320348A1 true EP3320348A1 (de) | 2018-05-16 |
Family
ID=56550843
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP16744318.3A Pending EP3320348A1 (de) | 2015-07-06 | 2016-07-06 | Vorrichtung und verfahren zur reversiblen kontaktierung |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP3320348A1 (de) |
DE (1) | DE102015212565A1 (de) |
WO (1) | WO2017005809A1 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112213239A (zh) * | 2020-09-15 | 2021-01-12 | 中车株洲电力机车有限公司 | 一种受颗粒物污染的电接触表面接触电阻的模拟测试方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4456900A (en) * | 1980-05-23 | 1984-06-26 | Tdk Electronics Co., Ltd. | High frequency coil |
JP3038859B2 (ja) * | 1989-09-29 | 2000-05-08 | ジェイエスアール株式会社 | 異方導電性シート |
US5235743A (en) * | 1990-07-11 | 1993-08-17 | Yazaki Corporation | Method of manufacturing a pair of terminals having a low friction material on a mating surface to facilitate connection of the terminals |
KR0140034B1 (ko) * | 1993-12-16 | 1998-07-15 | 모리시다 요이치 | 반도체 웨이퍼 수납기, 반도체 웨이퍼의 검사용 집적회로 단자와 프로브 단자와의 접속방법 및 그 장치, 반도체 집적회로의 검사방법, 프로브카드 및 그 제조방법 |
DE69526287T2 (de) * | 1994-01-27 | 2002-10-31 | Loctite (Ireland) Ltd., Dublin | Zusammenstellungen und methoden zur anordnung anisotropisch leitender bahnen und verbindungen zwischen zwei sätzen von leitern |
JP4734706B2 (ja) * | 2000-11-01 | 2011-07-27 | Jsr株式会社 | 電気抵抗測定用コネクター並びに回路基板の電気抵抗測定装置および測定方法 |
CN202522177U (zh) * | 2012-03-23 | 2012-11-07 | 施耐德东芝换流器欧洲公司 | 测试指 |
-
2015
- 2015-07-06 DE DE102015212565.3A patent/DE102015212565A1/de active Pending
-
2016
- 2016-07-06 WO PCT/EP2016/066023 patent/WO2017005809A1/de active Application Filing
- 2016-07-06 EP EP16744318.3A patent/EP3320348A1/de active Pending
Also Published As
Publication number | Publication date |
---|---|
DE102015212565A1 (de) | 2017-01-12 |
WO2017005809A1 (de) | 2017-01-12 |
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Inventor name: MAINUSCH, NILS Inventor name: SIEDENBURG, THAMMO Inventor name: PAULUS, JULIAN Inventor name: CHRIST, TORGE Inventor name: FLADE, ENRICO Inventor name: VIOEL, WOLFGANG |
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Owner name: HOCHSCHULE FUER ANGEWANDTE WISSENSCHAFT UND KUNST HILDESHEIM/HOLZMINDEN/GOETTINGEN Owner name: FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. |