EP3047501A4 - X-ray sources using linear accumulation - Google Patents
X-ray sources using linear accumulation Download PDFInfo
- Publication number
- EP3047501A4 EP3047501A4 EP14868433.5A EP14868433A EP3047501A4 EP 3047501 A4 EP3047501 A4 EP 3047501A4 EP 14868433 A EP14868433 A EP 14868433A EP 3047501 A4 EP3047501 A4 EP 3047501A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- ray sources
- linear accumulation
- accumulation
- linear
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/10—Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes
- H01J35/105—Cooling of rotating anodes, e.g. heat emitting layers or structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/08—Targets (anodes) and X-ray converters
- H01J2235/083—Bonding or fixing with the support or substrate
- H01J2235/084—Target-substrate interlayers or structures, e.g. to control or prevent diffusion or improve adhesion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/08—Targets (anodes) and X-ray converters
- H01J2235/086—Target geometry
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP16200793.4A EP3168856B1 (en) | 2013-09-19 | 2014-09-19 | X-ray sources using linear accumulation |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201361880151P | 2013-09-19 | 2013-09-19 | |
US201361894073P | 2013-10-22 | 2013-10-22 | |
US201461931519P | 2014-01-24 | 2014-01-24 | |
US201462008856P | 2014-06-06 | 2014-06-06 | |
US14/465,816 US20150092924A1 (en) | 2013-09-04 | 2014-08-21 | Structured targets for x-ray generation |
PCT/US2014/056688 WO2015084466A2 (en) | 2013-09-19 | 2014-09-19 | X-ray sources using linear accumulation |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP16200793.4A Division EP3168856B1 (en) | 2013-09-19 | 2014-09-19 | X-ray sources using linear accumulation |
EP16200793.4A Division-Into EP3168856B1 (en) | 2013-09-19 | 2014-09-19 | X-ray sources using linear accumulation |
Publications (2)
Publication Number | Publication Date |
---|---|
EP3047501A2 EP3047501A2 (en) | 2016-07-27 |
EP3047501A4 true EP3047501A4 (en) | 2017-06-21 |
Family
ID=53274258
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP16200793.4A Active EP3168856B1 (en) | 2013-09-19 | 2014-09-19 | X-ray sources using linear accumulation |
EP14868433.5A Withdrawn EP3047501A4 (en) | 2013-09-19 | 2014-09-19 | X-ray sources using linear accumulation |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP16200793.4A Active EP3168856B1 (en) | 2013-09-19 | 2014-09-19 | X-ray sources using linear accumulation |
Country Status (4)
Country | Link |
---|---|
EP (2) | EP3168856B1 (ja) |
JP (2) | JP2016537797A (ja) |
CN (1) | CN105556637B (ja) |
WO (1) | WO2015084466A2 (ja) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
KR101724213B1 (ko) * | 2015-12-04 | 2017-04-18 | 전남대학교산학협력단 | 엑스선 하베스팅 장치 |
US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
JP6937380B2 (ja) | 2017-03-22 | 2021-09-22 | シグレイ、インコーポレイテッド | X線分光を実施するための方法およびx線吸収分光システム |
GB2565138A (en) * | 2017-08-04 | 2019-02-06 | Adaptix Ltd | X-ray generator |
US10847336B2 (en) * | 2017-08-17 | 2020-11-24 | Bruker AXS, GmbH | Analytical X-ray tube with high thermal performance |
CN107887243B (zh) * | 2017-09-19 | 2019-11-08 | 中国电子科技集团公司第三十八研究所 | 一种用于电子束扫描ct的x射线源的阵列靶及制作方法 |
US10624195B2 (en) * | 2017-10-26 | 2020-04-14 | Moxtek, Inc. | Tri-axis x-ray tube |
CN108269725A (zh) * | 2018-01-24 | 2018-07-10 | 宁波英飞迈材料科技有限公司 | 一种脉冲式x射线发生装置及产生方法 |
JP6857400B2 (ja) | 2018-03-01 | 2021-04-14 | 株式会社リガク | X線発生装置、及びx線分析装置 |
US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
US10989822B2 (en) | 2018-06-04 | 2021-04-27 | Sigray, Inc. | Wavelength dispersive x-ray spectrometer |
GB2591630B (en) | 2018-07-26 | 2023-05-24 | Sigray Inc | High brightness x-ray reflection source |
US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
US10962491B2 (en) | 2018-09-04 | 2021-03-30 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
DE112019004478T5 (de) | 2018-09-07 | 2021-07-08 | Sigray, Inc. | System und verfahren zur röntgenanalyse mit wählbarer tiefe |
WO2021011209A1 (en) | 2019-07-15 | 2021-01-21 | Sigray, Inc. | X-ray source with rotating anode at atmospheric pressure |
WO2021046059A1 (en) * | 2019-09-03 | 2021-03-11 | Sigray, Inc. | System and method for computed laminography x-ray fluorescence imaging |
CN111479377A (zh) * | 2020-04-22 | 2020-07-31 | 吉林大学 | 一种d-d中子管靶膜保护层 |
US11215572B2 (en) * | 2020-05-18 | 2022-01-04 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements |
US11686692B2 (en) | 2020-12-07 | 2023-06-27 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
JP2022105848A (ja) | 2021-01-05 | 2022-07-15 | 浜松ホトニクス株式会社 | X線発生装置及びx線撮像システム |
JP2022105846A (ja) | 2021-01-05 | 2022-07-15 | 浜松ホトニクス株式会社 | X線発生用ターゲット、x線発生装置及びx線撮像システム |
GB2604137A (en) * | 2021-02-25 | 2022-08-31 | Modular Energy Tech Ltd | Experimentation and electricity generation apparatus |
US11885755B2 (en) | 2022-05-02 | 2024-01-30 | Sigray, Inc. | X-ray sequential array wavelength dispersive spectrometer |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2548447A1 (fr) * | 1983-06-28 | 1985-01-04 | Thomson Csf | Tube a rayons x a foyer de forte intensite |
US5148462A (en) * | 1991-04-08 | 1992-09-15 | Moltech Corporation | High efficiency X-ray anode sources |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US1211092A (en) | 1915-06-05 | 1917-01-02 | Gen Electric | X-ray tube. |
BE355009A (ja) | 1927-10-18 | |||
US1917099A (en) | 1929-10-18 | 1933-07-04 | Gen Electric | x-ray tube |
US4972449A (en) | 1990-03-19 | 1990-11-20 | General Electric Company | X-ray tube target |
US5602899A (en) | 1996-01-31 | 1997-02-11 | Physical Electronics Inc. | Anode assembly for generating x-rays and instrument with such anode assembly |
JPH11304728A (ja) * | 1998-04-23 | 1999-11-05 | Hitachi Ltd | X線計測装置 |
US6125167A (en) * | 1998-11-25 | 2000-09-26 | Picker International, Inc. | Rotating anode x-ray tube with multiple simultaneously emitting focal spots |
DE19934987B4 (de) | 1999-07-26 | 2004-11-11 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Röntgenanode und ihre Verwendung |
JP2003149392A (ja) * | 2001-11-09 | 2003-05-21 | Tohken Co Ltd | X線増強反射板及びx線検査装置 |
US8094784B2 (en) | 2003-04-25 | 2012-01-10 | Rapiscan Systems, Inc. | X-ray sources |
US7003077B2 (en) * | 2003-10-03 | 2006-02-21 | General Electric Company | Method and apparatus for x-ray anode with increased coverage |
JP4189770B2 (ja) * | 2004-04-08 | 2008-12-03 | 独立行政法人科学技術振興機構 | X線用ターゲット及びそれを用いた装置 |
US6870172B1 (en) | 2004-05-21 | 2005-03-22 | Kla-Tencor Technologies Corporation | Maskless reflection electron beam projection lithography |
DE102005034687B3 (de) * | 2005-07-25 | 2007-01-04 | Siemens Ag | Drehkolbenstrahler |
JP4878311B2 (ja) * | 2006-03-03 | 2012-02-15 | キヤノン株式会社 | マルチx線発生装置 |
JP4912743B2 (ja) * | 2006-05-18 | 2012-04-11 | 浜松ホトニクス株式会社 | X線管及びそれを用いたx線照射装置 |
WO2010018502A1 (en) * | 2008-08-14 | 2010-02-18 | Philips Intellectual Property & Standards Gmbh | Multi-segment anode target for an x-ray tube of the rotary anode type with each anode disk segment having its own anode inclination angle with respect to a plane normal to the rotational axis of the rotary anode and x-ray tube comprising a rotary anode with such a multi-segment anode target |
DE112010002512B4 (de) * | 2009-03-27 | 2024-03-14 | Rigaku Corp. | Röntgenstrahlerzeugungsvorrichtung und Untersuchungsvorrichtung, die diese verwendet |
JP5801286B2 (ja) * | 2009-05-12 | 2015-10-28 | コーニンクレッカ フィリップス エヌ ヴェ | X線ソース及びx線生成方法 |
JP2011029072A (ja) * | 2009-07-28 | 2011-02-10 | Canon Inc | X線発生装置及びそれを備えたx線撮像装置。 |
CN101644689A (zh) * | 2009-08-21 | 2010-02-10 | 江苏天瑞仪器股份有限公司 | 一种多靶材x光管 |
JP5984403B2 (ja) * | 2012-01-31 | 2016-09-06 | キヤノン株式会社 | ターゲット構造体及びそれを備える放射線発生装置 |
-
2014
- 2014-09-19 CN CN201480051973.6A patent/CN105556637B/zh active Active
- 2014-09-19 WO PCT/US2014/056688 patent/WO2015084466A2/en active Application Filing
- 2014-09-19 EP EP16200793.4A patent/EP3168856B1/en active Active
- 2014-09-19 JP JP2016544039A patent/JP2016537797A/ja active Pending
- 2014-09-19 EP EP14868433.5A patent/EP3047501A4/en not_active Withdrawn
-
2018
- 2018-09-26 JP JP2018179789A patent/JP6659025B2/ja active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2548447A1 (fr) * | 1983-06-28 | 1985-01-04 | Thomson Csf | Tube a rayons x a foyer de forte intensite |
US5148462A (en) * | 1991-04-08 | 1992-09-15 | Moltech Corporation | High efficiency X-ray anode sources |
Non-Patent Citations (1)
Title |
---|
See also references of WO2015084466A2 * |
Also Published As
Publication number | Publication date |
---|---|
CN105556637B (zh) | 2019-12-10 |
JP6659025B2 (ja) | 2020-03-04 |
JP2016537797A (ja) | 2016-12-01 |
WO2015084466A2 (en) | 2015-06-11 |
EP3168856A2 (en) | 2017-05-17 |
WO2015084466A3 (en) | 2015-07-30 |
JP2019012695A (ja) | 2019-01-24 |
CN105556637A (zh) | 2016-05-04 |
EP3168856A3 (en) | 2017-08-23 |
EP3168856B1 (en) | 2019-07-03 |
EP3047501A2 (en) | 2016-07-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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17P | Request for examination filed |
Effective date: 20160411 |
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AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
|
AX | Request for extension of the european patent |
Extension state: BA ME |
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DAX | Request for extension of the european patent (deleted) | ||
A4 | Supplementary search report drawn up and despatched |
Effective date: 20170518 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01J 35/08 20060101AFI20170512BHEP |
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17Q | First examination report despatched |
Effective date: 20180828 |
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GRAP | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOSNIGR1 |
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INTG | Intention to grant announced |
Effective date: 20191011 |
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STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
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18D | Application deemed to be withdrawn |
Effective date: 20200222 |