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  • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
  • B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
  • B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
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  • B41J2/01—Ink jet
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  • B41J2/14—Structure thereof only for on-demand ink jet heads
  • B41J2/14201—Structure of print heads with piezoelectric elements
• • B—PERFORMING OPERATIONS; TRANSPORTING
  • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
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  • B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
  • B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
  • B41J2/01—Ink jet
  • B41J2/135—Nozzles
  • B41J2/14—Structure thereof only for on-demand ink jet heads
  • B41J2/14201—Structure of print heads with piezoelectric elements
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  • C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
  • C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
  • C04B2235/70—Aspects relating to sintered or melt-casted ceramic products
  • C04B2235/74—Physical characteristics
  • C04B2235/78—Grain sizes and shapes, product microstructures, e.g. acicular grains, equiaxed grains, platelet-structures
  • C04B2235/786—Micrometer sized grains, i.e. from 1 to 100 micron
• • C—CHEMISTRY; METALLURGY
  • C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
  • C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
  • C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
  • C04B2235/70—Aspects relating to sintered or melt-casted ceramic products
  • C04B2235/74—Physical characteristics
  • C04B2235/79—Non-stoichiometric products, e.g. perovskites (ABO3) with an A/B-ratio other than 1

Definitions

• the present invention relates to a piezoelectric material, in particular, a lead-free piezoelectric material.
• the present invention also relates to a piezoelectric element and multilayered piezoelectric element including the piezoelectric material, a method of producing the
• multilayered piezoelectric element a liquid discharge head, a liquid discharge device, an ultrasonic motor, an optical apparatus, a vibratory device, a dust removing device, an image pickup device, and an electronic apparatus.
• piezoelectric materials are AB0 3 perovskite-type metal oxides such as lead zirconate titanate
• PZT contains lead as an A site element, its influence on
• perovskite-type metal oxide perovskite-type metal oxide.
• Barium titanate is known as a piezoelectric material of a lead-free perovskite-type metal oxide.
• a material of which base composition is barium titanate has been developed.
• PTL 1 and NPL 1 disclose materials having improved piezoelectric properties by replacing a part of the A site of barium titanate with Ca and a part of the B site with Zr. These materials, however, have low Curie temperatures, such as 80°C or less, and thereby cause depolarization under a high-temperature environment, e.g., in a car in summer, to reduce the
• PTL 2 and NPL 2 disclose materials in which a part of the A site of barium titanate is replaced with Ca and to which Mn, Fe, or Cu is added. Though these materials have excellent mechanical quality factors compared to barium titanate, unfortunately, their piezoelectric properties are low .
• the present invention provides a lead-free
• piezoelectric material having a high piezoelectric constant and a high mechanical quality factor in a wide operating temperature range.
• the piezoelectric material according to the present invention includes a perovskite-type metal oxide represented by Formula ( 1 ) :
• the metal oxide contains Mn in a content of 0.12 parts by weight or more and 0.40 parts by weight or less based on 100 parts by weight of the metal oxide on a metal basis.
• the present invention can provide a lead-free piezoelectric material having a high piezoelectric constant and a high mechanical quality factor in a wide operating temperature range.
• Fig. 1 is a graph showing a relationship between the x-values and the y-values of piezoelectric materials in Examples 1 to 22 of the present invention and in Comparative Examples 1 to 9, where the area surrounded by the dotted line is a range of the x-values and the y-values of the present invention.
• Fig. 2 is a schematic diagram illustrating an
• Figs. 3A and 3B are schematic cross-sectional diagrams illustrating an embodiment of the configuration of a
• Figs. 4A and 4B are schematic diagrams illustrating an embodiment of the configuration of a liquid discharge head.
• Fig. 5 is a schematic diagram illustrating an
• Fig. 6 is a schematic diagram illustrating an
• Figs. 7A and 7B are schematic diagrams illustrating an embodiment of the configuration of an ultrasonic motor.
• Figs. 8A and 8B are schematic diagrams illustrating an embodiment of an optical apparatus.
• Fig. 9 is a schematic diagram illustrating an
• FIGs. 10A and 10B are schematic diagrams illustrating an embodiment when a vibratory device is used in a dust removing device.
• Figs. 11A to 11C are schematic diagrams illustrating the configuration of a piezoelectric element in a dust removing device.
• Figs. 12A and 12B are schematic diagrams illustrating the vibration principle of a dust removing device.
• Fig. 13 is a schematic diagram illustrating an
• Fig. 14 is a schematic diagram illustrating an
• Fig. 15 is a schematic diagram illustrating an
• the piezoelectric material according to the present invention includes a perovskite-type metal oxide represented by Formula ( 1 ) :
• the metal oxide contains Mn in a content of 0.12 parts by weight or more and 0.40 parts by weight or less based on 100 parts by weight of the metal oxide on a metal basis.
• the "perovskite-type metal oxide represented by Formula (1) is contained as a main component" means that the main component for expressing the piezoelectric properties is the perovskite-type metal oxide represented by Formula (1) .
• the main component for expressing the piezoelectric properties is the perovskite-type metal oxide represented by Formula (1) .
• piezoelectric material may contain a component for adjusting properties thereof, such as manganese mentioned above, or impurities introduced during the manufacturing.
• the perovskite-type metal oxide in the present invention refers to a metal oxide having a perovskite structure, which is ideally a tetragonal structure, as described in Iwanami Dictionary of Physics and Chemistry, 5th Edition (Iwanami Shoten, Published on Feb. 20, 1998) .
• the metal oxide having a perovskite structure is generally expressed by a chemical formula: AB0 3 .
• elements A and B occupy specific unit cell positions called A site and B site, respectively, in the ion forms. For example, in a cubic unit cell, the element A is placed at the vertexes of the cubic, and the element B is placed at the body-centered position of the cubic.
• the element ⁇ occupies the face-centered positions as anions of oxygen .
• the metal elements positioned at the A site are Ba and Ca, and the metal elements positioned at the B site are Ti and Zr.
• a part of the Ba and Ca atoms may be positioned at the B site.
• a part of the Ti and Zr atoms may be positioned at the A site.
• the molar ratio of the elements at the B site to the element 0 in Formula (1) is basically 1 : 3, but the molar ratio may be shift slightly (e.g., in a range of
• the "perovskite structure is the primary phase” means that the peak showing the maximum diffraction
• the primary phase can be a "single phase" in which the crystals having a perovskite structure
• the perovskite structure of the metal oxide can be confirmed by structural analysis, such as X-ray diffraction or electron beam diffraction.
• the piezoelectric material according to the present invention may be in any form, such as a ceramic, powder, single crystal, film, or slurry, and, in particular, can be a ceramic.
• ceramic refers to aggregate (also referred to as bulk body) of crystal grains, of which base component is a metal oxide, fired by heat treatment, a so-called polycrystal, and
• a represents the ratio of the molar quantity of Ba and Ca at the A site to the molar quantity of Ti and Zr at the B site and is in the range of 1.00 ⁇ a ⁇ 1.01. If the value of a is smaller than 1.00, grains tend to abnormally grow to reduce the mechanical strength of the material. In contrast, if the value of a is larger than 1.01, the temperature necessary for grain growth is too high, which makes sintering in a common sintering furnace impossible.
• x represents the molar ratio of Ca at the A site and is in the range of 0.125 ⁇ x ⁇ 0.155. If the value of x is smaller than 0.125, the phase
• the value of x can be in the range of 0.125 ⁇ x ⁇ 0.145.
• "y" represents the molar ratio of Zr at the B site and is in the range of 0.041 ⁇ y ⁇ 0.074. If the value of y is smaller than 0.041, the piezoelectric properties are insufficient. In contrast, if the value of y is larger than 0.074, the Curie temperature (T c ) is low, less than 100°C, to lose the piezoelectric properties at high temperature. From the viewpoint of providing better piezoelectric properties, the value of y can be in the range of 0.051 ⁇ y ⁇ " 0.074.
• the piezoelectric properties of a piezoelectric material are also lost at a temperature of not lower than the Curie temperature.
• the Curie temperature can be directly measured by changing the measurement temperature to determine the temperature at which the ferroelectricity is lost or can be determined from the temperature showing the maximum relative dielectric constant determined using a small AC electric field with changing the measurement temperature.
• composition of the piezoelectric material in a piezoelectric element according to the present invention may be measured by any method, such as X-ray fluorescence analysis, ICP emission spectrochemical analysis, or atomic absorption spectrometry. Every method can calculate the weight ratio and the composition ratio of each element contained in the piezoelectric material.
• the content of Mn contained in the piezoelectric material of the present invention is 0.12 parts by weight or more and 0.40 parts by weight or less based on 100 parts by weight of the metal oxide on a metal basis.
• piezoelectric material of the present invention contains Mn in the above-mentioned range and thereby has improved
• the mechanical quality factor is a factor representing the elastic loss resulting from vibration when a piezoelectric material is evaluated as an oscillator, and the value of the mechanical quality factor is observed as the sharpness of a resonance curve in impedance measurement. That is, the mechanical quality factor represents the sharpness of
• Improvements in insulation properties and mechanical quality factor ensure long-term reliability when the piezoelectric material is driven as a piezoelectric element with application of a voltage.
• the term "on a metal basis” showing the value determined by measuring the contents of metals, Ba, Ca, Ti, Zr, and Mn, of the piezoelectric material by, for
• X-ray fluorescence analysis X-ray fluorescence analysis
• ICP emission spectrochemical analysis ICP emission spectrochemical analysis
• atomic absorption spectrometry converting the contents of the elements constituting the metal oxide represented by Formula (1) to those of oxides, and calculating the ratio of the Mn weight to the total weight when the total weight is assumed to be 100. If the content of Mn is less than 0.12 parts by weight, the mechanical quality factor at 25°C is low, less than 300. A low mechanical quality factor increases the electricity consumption for driving a resonance device using a
• the mechanical quality factor at 25°C can be 700 or more, such as 800 or more. In this range, no significant increase in electricity consumption occurs in practical driving. In contrast, if the content of Mn is higher than 0.40 parts by weight, the piezoelectric properties are insufficient, and hexagonal crystals, which do not
• Mn can be present only at the B site.
• the ratio (A/B) of the total molar amount (A) of Ba and Ca at the A site to the total molar amount (B) of Ti, Zr, and Mn at the B site is in the range of 0.992 ⁇ A/B ⁇ 0.999.
• the piezoelectric material can have particularly excellent piezoelectric constant and mechanical quality factor. Accordingly, a device having excellent durability can be produced from the piezoelectric material of the present invention.
• the valence of Mn can be 4+ .
• the valence of Mn can be 4+, 2+, or 3+.
• a crystal contains a conduction electron (e.g., a case of a crystal having an oxygen defect or a case of the A site including a donor element)
• the conduction electron is trapped by decreasing the valence of Mn from 4+ to 3+ or 2+ to enhance the insulation resistance.
• Mn having a valence of 4+ can easily replace Ti, which is the main component of the B site.
• Mn serves as an acceptor. If Mn is present in a perovskite structure crystal as an acceptor, a hole is generated in the crystal, or oxygen vacancy is formed in the crystal .
• the holes are not completely compensated by the introduction of oxygen vacancy only, resulting in a reduction of the insulation resistance. Accordingly, the majority of Mn atoms have a valence of 4+. However, a significantly small amount of Mn atoms having a valence of lower than 4+ may be present as an acceptor at the B site of the perovskite structure to form oxygen vacancy. It is obvious that the Mn having a valence of 2+ or 3+ and the oxygen vacancy form a defect dipole to enhance the mechanical quality factor of the piezoelectric material .
• the piezoelectric material according to the present invention may contain any component (hereinafter, referred to as accessory component) , in addition to the components represented by Formula (1) and Mn, in a range that does not change the properties of the material.
• the total amount of the accessory components can be 1.2 parts by weight or less based on 100 parts by weight of the metal oxide represented by Formula (1) . If the content of the accessory components exceeds 1.2 parts by weight, the piezoelectric properties and the insulation properties of the piezoelectric material may decrease.
• the components can be 1.0 part by weight or less on an oxide basis or 0.9 parts by weight or less on a metal basis with respect to the piezoelectric material.
• the term "metal element” includes semimetal elements such as Si, Ge, and Sb. If the content of the metal elements, other than Ba, Ca, Ti, Zr, and Mn, as the accessory components exceeds 1.0 part by weight on an oxide basis or 0.9 parts by weight on a metal basis with respect to the piezoelectric material, the piezoelectric properties and the insulation properties of the piezoelectric material may decrease.
• the total content of Li, Na, and Al elements as the accessory components can be 0.5 parts by weight or less on a metal basis with respect to the piezoelectric material.
• a total content of Li, Na, and Al elements as the accessory components exceeding 0.5 parts by weight on a metal basis with respect to the piezoelectric material may make the sintering insufficient. If the piezoelectric material contains Y element as an accessory component, the content of the Y element can be 0.5 parts by weight or less on a metal basis with respect to the piezoelectric material. A content of the Y element exceeding 0.5 parts by weight on a metal basis with respect to the piezoelectric material may make the polarization treatment difficult.
• accessory component examples include sintering aids such as Si and Cu.
• sintering aids such as Si and Cu.
• piezoelectric material of the present invention may contain Sr in an amount comparable to that contained in commercially available raw materials of Ba and Ca as an inevitable component.
• the piezoelectric material of the present invention may contain Nb in an amount comparable to that contained in a commercially available Ti raw material as an inevitable component and Hf in an amount comparable to that contained in a commercially available Zr raw material as an inevitable component.
• the content (part(s) by weight) of the accessory component may be measured by any method, and examples of the method include X-RAY fluorescence analysis, ICP emission spectrochemical analysis, and atomic absorption spectrometry.
• the piezoelectric material according to the present invention has a Curie temperature of 100°C or more and
• the crystal grains constituting the piezoelectric material can have an average equivalent
• the piezoelectric material of the present invention can have satisfactory piezoelectric properties and mechanical
• An average equivalent circular diameter of less than 1 um may make the piezoelectric properties insufficient. In contrast, an average equivalent circular diameter of larger than 10 um may decrease the mechanical strength.
• the average equivalent circular diameter can be in a range of 2 um or more and 8 um or less.
• equivalent circular diameter represents "projected area equivalent circular diameter" usually used in microscopic observation and represents the diameter of a perfect circle having the same area as that of the projected area of a crystal grain.
• the equivalent circular diameter may be measured by any method.
• the equivalent circular diameter can be determined by image processing of an image of the piezoelectric material surface photographed with a polarizing microscope or a scanning electron
• the equivalent circular diameter may be determined from an image of a polished surface or a cross section instead of the surface of a material.
• the piezoelectric material of the present invention can have a relative density of 97.0% or more and 100% or less .
• a relative density of less than 97.0% may provide insufficient piezoelectric properties and mechanical quality factor or may reduce the mechanical strength.
• relative density indicates the ratio of the measured density to the theoretical density calculated from the lattice constant of the piezoelectric material and the atomic weight of the constituent elements of the
• the lattice constant can be measured by, for example, X-ray diffraction analysis.
• the density can be measured by, for example, an Archimedes ' s method.
• the piezoelectric material according to the present invention may be produced by any method.
• the piezoelectric material can be produced by a common process of sintering a solid powder of, for example, oxides, carbonates, nitrates, or oxalates containing
• the raw material is constituted of metal compounds such as a Ba compound, a Ca compound, a Ti compound, a Zr compound, and a Mn compound.
• Ba compound examples include barium oxide, barium carbonate, barium oxalate, barium acetate, barium nitrate, barium titanate, barium zirconate, and barium zirconate titanate.
• Ca compound examples include calcium oxide, calcium carbonate, calcium oxalate, calcium acetate, calcium titanate, and calcium zirconate.
• Ti compound examples include titanium oxide, barium titanate, barium zirconate titanate, and calcium titanate.
• zirconium oxide barium zirconate, barium zirconate titanate, and calcium zirconate.
• Mn compound examples include manganese carbonate, manganese oxide, manganese dioxide, manganomanganic oxide, and manganese acetate.
• the ratio "a" of the molar quantity of Ba and Ca at the A site to the molar quantity of Ti and Zr at the B site may be adjusted by any raw material. Any of the Ba compounds, the Ca compounds, the Ti compounds, and the Zr compounds shows the same effect.
• the raw material powder of the piezoelectric material according to the present invention may be any suitable material powder of the piezoelectric material according to the present invention.
• spray- dry can be employed.
• PVA polyvinyl alcohol
• PVB polyvinyl butylal
• acrylic resins acrylic resins.
• the binder is used in an amount of 1 part by weight to 10 parts by weight, in
• the piezoelectric material according to the present invention may be sintered by any method.
• Examples of the sintering include sintering in an electric furnace, sintering in a gas furnace, electrical heating, microwave sintering, millimeter-wave sintering, and hot isostatic pressing (HIP) .
• the electric furnace and the gas furnace may be continuous furnaces or batch furnaces.
• the sintering of the piezoelectric material may be performed at any temperature and can be performed at a temperature allowing each compound to react and crystals to sufficiently grow.
• the sintering temperature can be 1200°C or more and 1550°C or less, such as 1300°C or more and 1480°C or less.
• the piezoelectric material sintered in such a temperature range shows satisfactory piezoelectric
• the sintering is performed at a constant temperature within the above- mentioned range for 2 to 24 hours. Though sintering such as two-stage sintering may be employed, a rapid decrease in temperature should be avoided in light of productivity.
• processing may be heat-treated at a temperature of 1000°C or more.
• Mechanical polishing generates a residual stress inside the piezoelectric material.
• the heat treatment at 1000°C or more relieves the residual stress to further enhance the piezoelectric properties of the piezoelectric material.
• the heat treatment also has an effect of
• the heat treatment may be performed for any period of time, such as 1 hour or more.
• Fig. 2 is a schematic diagram illustrating an embodiment of the configuration of a piezoelectric element.
• the piezoelectric properties of the piezoelectric material 2 according to the present invention can be evaluated by being produced into a piezoelectric element having at least a first electrode 1 and a second electrode 3.
• the first and the second electrodes are each a conductive layer having a thickness of about 5 to 2000 nm.
• the electrodes may be made of any material that is usually used in piezoelectric elements. Examples of the material include metals such as Ti, Pt, Ta, Ir, Sr, In, Sn, Au, Al, Fe, Cr, Ni, Pd, Ag, and Cu; and compounds thereof.
• the first and the second electrodes may be each made of any of these materials or may be each a multilayer made of two or more of these materials.
• the first and the second electrodes may be made of different materials.
• the first and the second electrodes may be produced by any method and may be formed by, for example, baking of a metal paste, sputtering, or vapor deposition.
• the first and the second electrodes may be each patterned into a desired shape .
• the spontaneous polarization axes may be unidirectionally aligned.
• the unidirectionally aligned spontaneous polarization axes increase the piezoelectric constant of the piezoelectric element.
• the piezoelectric element may be polarized by any method.
• the polarization treatment may be performed in the atmosphere or in a silicone oil.
• the polarization may be performed at a temperature of 60°C to 100°C.
• the optimum conditions for the polarization slightly depend on the composition of the piezoelectric material constituting the element.
• the electric field applied in the polarization treatment may be from 800 V/mm to 2.0 kV/mm.
• the piezoelectric constant and the mechanical quality factor of the piezoelectric element can be any piezoelectric constant and the mechanical quality factor of the piezoelectric element.
• Figs. 3A and 3B are schematic cross-sectional diagrams illustrating an embodiment of the configuration of a multilayered piezoelectric element.
• the multilayered piezoelectric element is constituted of piezoelectric material layers 54 and electrode layers including an
• the piezoelectric material layers 54 are made of the above-described piezoelectric material.
• the electrode layers may include a first electrode 51 and a second
• Fig. 3A shows a configuration of a multilayered piezoelectric element where two piezoelectric material layers 54 and one internal electrode 55 are alternately stacked and the layered structure is disposed between the first electrode 51 and the second electrode 53.
• the numbers of the piezoelectric material layer and the internal electrode may be increased, and the numbers are not limited.
• nine piezoelectric material layers 504 and eight internal electrodes 505 are alternately stacked, and the layered structure is disposed between the first
• multilayered piezoelectric element includes an external electrode 506a and an external electrode 506b for short- circuiting the alternately disposed internal electrodes.
• the internal electrodes 55 and 505 and the external electrodes 506a and 506b may have sizes and shapes different from those of the piezoelectric material layers 504 and may be divided into two or more pieces.
• the internal electrodes 55 and 505 and the external electrodes 506a and 506b are each a conductive layer having a thickness of about 5 to 2000 nm and may be made of any material that is usually used in piezoelectric elements.
• the material examples include metals such as Ti, Pt, Ta, Ir, Sr, In, Sn, Au, Al, Fe, Cr, Ni, Pd, Ag, and Cu; and compounds thereof.
• the internal electrodes 55 and 505 and the external electrodes 506a and 506b may be each made of any one of these materials or a mixture or alloy of two or more of these materials or may be each a multilayer made of two or more of these materials. Two or more of these electrodes may be made of different materials.
• the internal electrodes 55 and 505 each contain Ag and Pd, the weight ratio M1/M2 of the content Ml of the Ag to the content M2 of the Pd can be 0.25 ⁇ M1/M2 ⁇ 4.0, such as 0.3 ⁇ M1/M2 ⁇ 3.0.
• a weight ratio M1/M2 of less than 0.25 disadvantageously raises the sintering temperature of the internal electrode.
• a weight ratio M1/M2 of higher than 4.0 forms an island-like internal electrode to make the surface uneven.
• the internal electrodes 55 and 505 can contain at least one of Ni and Cu.
• the multilayered piezoelectric element having the internal electrode 55 or 505 containing at least one of Ni and Cu can be sintered in a reducing atmosphere as an example of production.
• a plurality of electrodes including the internal electrode 505 may be short-circuited to each other for adjusting the phase of the driving voltage.
• the internal electrodes 505 the first
• Electrodes is not particularly limited.
• An electrode or wiring for short circuit may be disposed on the side surface of the multilayered piezoelectric element.
• electrodes may be short-circuited with a conductive material disposed inside a through-hole formed so as to pass through the piezoelectric material layers 504.
• Figs. 4A and 4B are schematic diagrams illustrating an embodiment of the configuration of a liquid discharge head.
• the liquid discharge head as an example of production has a piezoelectric element 101 including the piezoelectric material of the present invention.
• the piezoelectric element 101 includes at least a first electrode 1011, a piezoelectric material 1012, and a second electrode 1013.
• the piezoelectric material 1012 is optionally patterned as shown in Fig. 4B.
• Fig. 4B is a schematic diagram of a liquid discharge head.
• the liquid discharge head includes
• piezoelectric element 101 shown in the figure has a
• the shape may be, for example,
• the piezoelectric material 1012 has a shape along the shape of the individual liquid chamber 102.
• Fig. 4A is a cross-sectional view of the piezoelectric element shown in Fig. 4B in the width direction of the liquid discharge head.
• the cross section of the piezoelectric element shown in Fig. 4B in the width direction of the liquid discharge head.
• piezoelectric element 101 shown in Fig. 4A is rectangular, but may be trapezoidal or reverse trapezoidal.
• a buffer layer 108 may be disposed between the diaphragm 103 and the lower electrode.
• the diaphragm 103 vibrates up and down by the expansion and contraction of the piezoelectric material 1012 and applies a pressure to the liquid in the individual liquid chamber 102. As a result, the liquid is discharged from the discharge port 105.
• the liquid discharge head as an example of production can be used in printing or can be applied to an electronic device.
• the diaphragm 103 can have a thickness of 1.0 ⁇ or more and 15 ⁇ or less, such as 1.5 ⁇ or more and 8 ⁇ or less.
• the diaphragm may be made of any material.
• the diaphragm may be made of Si, and Si of the diaphragm may be doped with B or P.
• the buffer layer or the electrode layer on the diaphragm may be a part of the diaphragm.
• the buffer layer 108 may have a thickness of 5 nm or more and 300 nm or less, such as 10 nm or more and 200 nm or less.
• the discharge port 105 has a size of 5 ⁇ or more and 40 ⁇ or less as the equivalent circular diameter.
• the shape of the discharge ports 105 may be circular or a star, square, or triangle shape.
• the liquid discharge device as an example of production is an ink-jet recording apparatus.
• Fig. 6 shows the liquid discharge device (ink- jet recording apparatus) 881 shown in Fig. 5 in a state where the exteriors 882 to 885 and 887 are removed.
• the ink-jet recording apparatus 881 includes an automatic feeder 897 for automatically feeding recoding paper as a recording medium to the device main body 896.
• the ink- jet recording apparatus 881 includes a conveying portion 899 for conveying the recording paper fed from the automatic feeder 897 to a predetermined recording position and then conveying the recording paper from the recording position to the ejection port 898; a recording portion 891 for
• the recording portion 891 is provided with a carriage 892 that receives the liquid discharge head including the
• piezoelectric material of the present invention and moves on a rail in a reciprocating motion.
• carriage 892 slides on the rail according to the electric signals sent from a computer, and the piezoelectric material is displaced by application of a driving voltage to the electrodes between which the piezoelectric material is disposed.
• the displacement of the piezoelectric material applies a pressure to the individual liquid chamber 102 via the diaphragm 103 shown in Fig. 4B and thereby an ink is discharged from the discharge port 105 to perform printing.
• liquid discharge device including the piezoelectric material of the present invention, it is possible to uniformly discharge a liquid at high speed and to reduce the size of the device.
• liquid discharge device is a printer, but the liquid discharge device can be used as not only an ink-jet recording apparatus, such as a facsimile machine, a multifunction machine, or a copier, but also a liquid discharge device in industrial use.
• Figs. 7A and 7B are schematic diagrams illustrating an embodiment of the configuration of an ultrasonic motor.
• Fig. 7A shows an ultrasonic motor having a piezoelectric element of a single plate.
• the ultrasonic motor includes an oscillator 201, a rotor 202 which is a rotor being in contact with the sliding surface of the oscillator 201 by means of a pressure applied by a spring (not shown) , and an output shaft 203 disposed integrally with the rotor 202.
• the oscillator 201 is composed of a metal elastic ring 2011, a piezoelectric element 2012 including the piezoelectric material of the present invention, and an organic adhesive
• the piezoelectric element 2012 including the piezoelectric material of the present invention is constituted of a first electrode, a second electrode (both are not shown) , and the piezoelectric material disposed therebetween.
• flexural traveling waves are generated in the oscillator 201, and each point on the sliding surface of the oscillator 201 moves in an elliptic motion.
• the rotor 202 is pressed to the sliding surface of the oscillator 201 and is thereby receives a frictional force from the oscillator 201 to rotate in the direction opposite the flexural
• the object (not shown) to be driven is connected to the output shaft 203 and is driven by the turning force of the rotor 202.
• a piezoelectric material applied with vo «ltage expands and contracts by the transverse piezoelectric effect.
• an elastic material such as a metal
• the elastic material is bent by the expansion and contraction of the piezoelectric material.
• the ultrasonic motor described here utilizes this principle.
• Fig. 7B shows an example of an ultrasonic motor including a piezoelectric element having a layered structure.
• the oscillator 204 is composed of a tubular metal elastic bodies 2041 and a multilayered piezoelectric element 2042 disposed between the elastic bodies.
• the multilayered piezoelectric element 2042 is constituted of a plurality of stacked piezoelectric materials (not shown) and includes first and second electrodes on the outer surfaces of the stacked piezoelectric materials and an internal electrode between the stacked piezoelectric materials.
• the metal elastic bodies 2041 are connected to each other with a bolt to fix the multilayered piezoelectric element 2042
• the oscillator 204 When alternating voltage different in phase is applied to the multilayered piezoelectric element 2042, the oscillator 204 generates two vibrations rectangular to each other. The two vibrations are combined to create a circular vibration for driving the end portion of the oscillator 204.
• the oscillator 204 is provided with a circumferential groove at the upper portion to enlarge the vibration for driving.
• the rotor 205 is in pressurized contact with the oscillator 204 by means of the pressurizing spring 206 to create a frictional force for driving.
• the rotor 205 is rotatably supported by bearing.
• the optical apparatus as an example of production includes the ultrasonic motor in the driving unit.
• Figs. 8A and 8B are main cross-sectional views of an interchangeable lens barrel of a single lens reflex camera as an example of image pickup devices.
• Fig. 9 is an exploded perspective view of an interchangeable lens barrel of a single lens reflex camera as an example of image pickup devices.
• a fixing barrel 712, a linear guide barrel 713, and a front lens group barrel 714 are fixed to the quick- detaching mount 711 with a camera. These barrels are fixing members of the interchangeable lens barrel.
• the linear guide barrel 713 is provided with a forward guide groove 713a for the focus lens 702 in the optical axis direction.
• Cam rollers 717a and 717b are provided with a forward guide groove 713a for the focus lens 702 in the optical axis direction.
• a cam ring 715 turnably fits in the inner
• a rotation transmitting ring 720 is disposed on the outer circumference side of the fixing barrel 712 and is held by a ball race 727 so as to be turnable at a fixed position with respect to the fixing barrel 712.
• rotation transmitting ring 720 has a shaft 720f radially extending from the rotation transmitting ring 720, and a driven roller 722 is turnably held by the shaft 720f.
• the large-diameter portion 722a of the driven roller 722 is in contact with the mount side end face 724b of the manual focus ring 724.
• the small-diameter portion 722b of the driven roller 722 is in contact with a connecting member 729.
• Six driven rollers 722 are disposed on the outer
• each driven roller is disposed as described above.
• Low friction sheet (washer member) 733 is disposed at the inner diameter portion of the manual focus ring 724 so as to be held between the mount side end face 712a of the fixing barrel 712 and the front side end face 724a of the manual focus ring 724.
• the outer diameter surface of the low friction sheet 733 is in a ring shape and fits in the inner diameter portion 724c of the manual focus ring 724, and the inner diameter portion 724c of the manual focus ring 724 further fits in the outer diameter portion 712b of the fixing barrel 712.
• the low friction sheet 733 reduces the friction in the turning ring mechanism for relatively turning the manual focus ring 724 with respect to the fixing barrel 712 around the optical axis.
• the large-diameter portion 722a of the driven roller 722 and the mount side end face 724a of the manual focus ring are in contact with each other with the pressure applied by the force of a wave washer 726 for pressing the ultrasonic motor 725 toward the front of the lens.
• the small-diameter portion 722b of the driven roller 722 and the connecting member 729 are in contact with each other by the force of the wave washer 726 for pressing the ultrasonic motor 725 toward the front of the lens.
• the wave washer 726 is restricted in the movement toward the mount direction by a washer 732 bayonet-connected to the fixing barrel 712.
• the wave washer 726 is transferred to the ultrasonic motor 725 and further to the driven roller 722 and thereby also serves as a pressing force against the mount side end face 712a of the fixing barrel 712 by the manual focus ring 724. That is, the manual focus ring 724 is incorporated so as to be pressed to the mount side end face 712a of the fixing barrel 712 via the low friction sheet 733. [0097] Consequently, when the ultrasonic motor 725 is driven so as to turn with respect to the fixing barrel 712 by controller (not shown) , since the connecting member 729 is in a frictional contact with the small-diameter portion 722b of the driven roller 722, the driven roller 722 turns around the shaft 720f. The turning of the driven roller 722 around the shaft 720f results in turning of the rotation transmitting ring 720 around the optical axis (autofocus operation) .
• the driven roller 722 turns around the shaft 720f by the frictional force.
• the turning of the large-diameter portion 722a of the driven roller 722 around the shaft 720f turns the rotation transmitting ring 720 around the optical axis.
• the friction holding power of a rotor 725c and a stator 725b prevents the ultrasonic motor 725 from being turned (manual focus
• the rotation transmitting ring 720 is provided with two focus keys 728 at positions to oppose each other.
• the focus keys 728 fit in the notches 715b formed at the end portion of the cam ring 715. Consequently, turning of the rotation transmitting ring 720 around the optical axis by the autofocus operation or the manual focus operation is transferred to the cam ring 715 via the focus keys 728 to turn the cum ring around the optical axis.
• the rear lens group barrel 716 that is restricted in turning by the cam roller 717b and the forward guide groove 713a moves along the cam groove 715a of the cam ring 715 by the cam roller 717b.
• the focus lens 702 is driven to perform focus operation.
• an interchangeable lens barrel of a single lens reflex camera has been described as an example of production of the optical apparatus.
• the present invention can be applied to any optical apparatus having an ultrasonic motor in the driving unit, such as a compact camera or an electronic still camera, regardless of the types of cameras.
• Vibratory devices for, for example, conveying or removing particles, powder, or a liquid are widely used in electronic apparatuses.
• a dust removing device including the piezoelectric material of the present invention will now be described as an example of production of a vibratory device .
• production includes at least a vibrating member provided with the piezoelectric element or the multilayered piezoelectric element.
• FIGs. 10A and 10B are schematic diagrams
• the dust removing device 310 is constituted of a tabular
• piezoelectric element 330 may be a multilayered
• the diaphragm 320 may be made of any material.
• a transparent material or a light-reflective material can be used as the diaphragm 320.
• Figs. 11A to 11C are schematic diagrams
• the piezoelectric element 330 is composed of a piezoelectric material 331, a first electrode 332, and a second electrode 333, and the first electrode 332 and the second electrode 333 are respectively arranged on the surfaces of the tabular piezoelectric material 331.
• the piezoelectric element 330 may be a multilayered piezoelectric element. In such a case, the piezoelectric material 331 has a structure having
• the face of the first electrode 332 of the piezoelectric element 330 shown in Fig. 11C is a first electrode face 336, and the face of the second electrode 333 of the
• piezoelectric element 330 shown in Fig. 11A is a second electrode face 337.
• the production indicates the face of the piezoelectric element on which the electrode is disposed.
• the first electrode 332 may go around to the second electrode face 337.
• the first electrode face 336 of the piezoelectric element 330 is fixed to the plate face of the diaphragm 320. Stress is generated between the piezoelectric element 330 and the diaphragm 320 by driving the piezoelectric element 330 to generate out-of- plane vibration in the diaphragm.
• the dust removing device 310 is a device for removing foreign substance such as dust adhered to the surface of the diaphragm 320 by the out-of- plane vibration of the diaphragm 320.
• the term "out-of- plane vibration” refers to elastic vibration that displace the diaphragm in the optical axis direction, i.e., in the thickness direction of the diaphragm.
• Figs. 12A and 12B are schematic diagrams
• Fig. 12A shows a state of generating out-of- plane vibration in the diaphragm 320 by applying in-phase alternating electric fields to a pair of piezoelectric elements 330.
• piezoelectric elements 330 is the thickness direction of the piezoelectric elements 330.
• the dust removing device 310 is driven by a seventh vibration mode.
• Fig. 12B shows a state of generating out-of-plane vibration in the diaphragm 320 by applying reverse-phase alternating voltages having phases opposite by 180° to a pair of piezoelectric elements 330.
• the dust removing device 310 is driven by a sixth vibration mode.
• the dust removing device 310 as an example of
• the image pickup device includes at least the dust removing device and an image pickup element unit.
• the vibrating member of the dust removing device is disposed on the light-receiving surface side of the image pickup element unit.
• Figs. 13 and 14 are diagrams illustrating a digital single lens reflex camera as an example of production of the image pickup device.
• Fig. 13 is a front perspective view of a camera body 601 viewed from the object side, in a state in which the image pickup lens unit is removed.
• Fig. 14 is an exploded perspective view illustrating the schematic structure of the inside of the camera for describing a dust removing device as an example of production and the
• a mirror box 605 into which image pickup light beams that passed through the image pickup lens are guided is disposed inside the camera body 601.
• Main mirror (quick return mirror) 606 is disposed inside the mirror box 605.
• the main mirror 606 can take a state in which the main mirror 606 is held at an angle of 45° with respect to the image pickup optical axis for guiding image pickup light beams to the direction of the penta roof mirror (not shown) and a state in which the main mirror 606 is held at a position evacuated from image pickup light beams for guiding the image pickup light beams to the direction of the image pickup element (not shown) .
• the mirror box 605 and a shutter unit 200 are disposed on the object side of the body chassis 300 serving as the skeleton of the camera body in this order from the object side. Furthermore, an image pickup unit 400 is disposed on the photographer side of the body chassis 300. The image pickup unit 400 is set to the clamp face of the mount portion 602 serving as the basis for setting the image pickup lens unit such that the image pickup face of the image pickup element is parallel to the clamp face with a predetermined distance therebetween.
• the image pickup device may be, for example, an image pickup lens interchangeable camera such as a
• the present invention can also be applied to any apparatus required to remove dust adhering to the surface of, in particular, the optical part among various image pickup devices such as image pickup unit interchangeable video cameras, copiers, facsimile machines, and scanners and electronic electric apparatuses having image pickup devices.
• image pickup unit interchangeable video cameras copiers, facsimile machines, and scanners and electronic electric apparatuses having image pickup devices.
• example of production includes a piezoelectric acoustic component having the piezoelectric element or the
• piezoelectric acoustic component include loudspeakers, buzzers, microphones, and surface acoustic wave (SAW)
• FIG. 15 is a perspective general view of a digital camera body 931, an example of production of the electronic apparatus, viewed from the front.
• An optical device 901, a microphone 914, a stroboscope light emitting unit 909, and an assist light unit 916 are disposed on the front of the body 931.
• the microphone 914 is incorporated in the inside of the body and is therefore indicated by a dashed line.
• a hole is provided in the body on the front of the microphone 914 for picking up sounds from the outside.
• a power button 933 On the upper face of the body 931, a power button 933, a loudspeaker 912, a zoom lever 932, and a release button 908 for performing the focusing operation are buttons 933, a power button 933, a loudspeaker 912, a zoom lever 932, and a release button 908 for performing the focusing operation are buttons 933, a power button 933, a loudspeaker 912, a zoom lever 932, and a release button 908 for performing the focusing operation are buttons 934 and a release button 908 for performing the focusing operation.
• the loudspeaker 912 is incorporated in the inside of the body 931 and is therefore indicated by a dashed line. Holes are provided in the body on the front of the
• loudspeaker 912 for transmitting sounds to the outside.
• the piezoelectric acoustic component is used in at least one of the microphone 914, the loudspeaker 912, and the surface acoustic wave element.
• the piezoelectric element including the piezoelectric material of the present
• invention can be suitably used in liquid discharge heads, liquid discharge devices, ultrasonic motors, optical
• the use of the piezoelectric material of the present invention can provide a liquid discharge head having a nozzle density and a discharge rate that are equivalent to or higher than those in the case of using a piezoelectric material containing lead.
• the use of the piezoelectric material of the present invention can provide a liquid discharge device having a discharge rate and a discharge precision that are equivalent to or higher than those in the case of using a piezoelectric element containing lead.
• the use of the piezoelectric material of the present invention can provide an ultrasonic motor having a driving power and durability that are equivalent to or higher than those in the case of using a piezoelectric material containing lead.
• the use of the piezoelectric material of the present invention can provide an optical apparatus having durability and an operation precision that are equivalent to or higher than those in the case of using a piezoelectric element containing lead.
• the use of the piezoelectric material of the present invention can provide a vibratory device having a vibration ability and durability that are equivalent to or higher than those in the case of using a piezoelectric element containing lead.
• the use of the piezoelectric material of the present invention can provide a dust removing device having a dust removing efficiency and durability that are
• the use of the piezoelectric material of the present invention can provide an image pickup device having a dust removing function that is equivalent to or higher than that in the case of using a piezoelectric element containing lead.
• invention can provide an electronic apparatus having a sound-producing ability that is equivalent to or higher than that in the case of using a piezoelectric element containing lead .
• the piezoelectric material of the present invention can be used not only in liquid discharge heads and motors but also in devices such as ultrasonic vibrators, piezoelectric actuators, piezoelectric sensors, and ferroelectric memories.
• a piezoelectric material of the present invention was produced by the following procedure.
• Fig. 1 is a graph showing a relationship between the x-values and the y-values of piezoelectric materials in Examples 1 to 22 of the present invention and in Comparative Examples 1 to 9, which will be described below.
• the resulting mixed powder was granulated by spraying manganese ( II ) acetate in an amount of 0.18 parts by weight of n to the mixed powder on a metal basis and a PVA binder in an amount of 3 parts by weight to the mixed powder to the mixed powder using a spray dryer such that the manganese ( II ) acetate and the PVA binder adhere to the mixed powder surfaces.
• a mold was filled with the resulting granulated powder, and the granulated powder was formed into a disk- shaped compact by applying a molding pressure of 200 MPa to the mold with a press molding machine.
• the compact may be further pressed with a cold isostatic pressing molding machine .
• the resulting compact was put in an electric furnace, was held at a maximum temperature of 1380°C for 5 hours, and was sintered in the atmosphere over 24 hours in total .
• the crystal grains were mainly
• the resulting ceramic was ground so as to have a thickness of 0.5 mm, and the crystal structure was analyzed by X-ray diffraction. Only a peak corresponding to a
• the composition was evaluated by X-ray fluorescence analysis. The result demonstrates that 0.18 parts by weight of Mn was incorporated in a composition represented by a chemical formula: (Bao.s75Cao.125) 1.005 (Tio.92eZro.074) 0 3 . This means that the composition after sintering coincides with the weighed composition. The amounts of elements other than Ba, Ca, Ti, Zr, and Mn were each lower than the detection limit, i.e., less than 1 part by weight. Subsequently, the valence of Mn in the sample was evaluated. The magnetic susceptibility at 2 to 60 K was measured with a
• SQUID superconducting quantum interference device
• Example 21 Y was further added to the mixed powder in an amount of 1.0 part by weight on a metal basis.
• resulting mixed powders were each granulated by spraying manganese (II) acetate in amounts of Mn shown Table 1 to the mixed powder on a metal basis and a PVA binder in an amount of 3 parts by weight to the mixed powder using a spray dryer such that the manganese ( II ) acetate and the PVA binder adhere to the mixed powder surfaces.
• a mold was filled with the resulting granulated powder, and the granulated powder was formed into a disk- shaped compact by applying a molding pressure of 200 MPa with a press molding machine.
• the compact may be further pressed with a cold isostatic pressing molding machine.
• the resulting ceramic was ground so as to have a thickness of 0.5 mm, and the crystal structure was analyzed by X-ray diffraction. Only a peak corresponding to a
• perovskite structure was observed in each sample.
• the composition was evaluated by X-ray fluorescence analysis. The results are shown in Table 3.
• the "accessory component” in the table indicates elements other than Ba, Ca, Ti, Zr, and Mn, and "0.00" means that the amount is lower than the detection limit.
• the results demonstrate that the composition after sintering coincides with the weighed composition. Subsequently, the valence of Mn in each sample was evaluated. The magnetic susceptibility at 2 to 60 K was measured with a superconducting quantum interference device
• Examples 1 to 25 were weighed at molar ratios shown in Table 1 and were mixed by dry blending with a ball mill for 24 hours.
• Y was mixed with the mixed powder as an accessory component in an amount of 1.2 parts by weight on a metal basis.
• the resulting mixed powders were granulated by spraying manganese ( II ) acetate in amounts of Mn shown Table 1 to the mixed powder on a metal basis and a PVA binder in an amount of 3 parts by weight to the mixed powder using a spray dryer such that the manganese ( II ) acetate and the PVA binder adhere to the mixed powder
• the resulting ceramics were each ground so as to have a thickness of 0.5 mm, and the crystal structure was analyzed by X-ray diffraction. Only a peak corresponding to a perovskite structure was observed in each sample of
• composition was evaluated by X-ray fluorescence analysis. The results are shown in Table 3. The results demonstrate that the composition after sintering coincides with the weighed composition in every sample.
• a gold electrode having a thickness of 400 nm was formed on each surface of the disk-shaped ceramic by DC sputtering.
• a titanium adhesive layer having a thickness of 30 nm was formed between the electrode and the ceramic.
• the resulting ceramic provided with electrodes was cut into a strip-like piezoelectric element of 10 x 2.5 x 0.5 mm.
• the resulting piezoelectric element was polarized by applying an electric field of 1 kV/mm to the
• piezoelectric element on a hot plate set to a surface temperature of 60°C to 100°C for 30 minutes.
• the piezoelectric elements including the
• piezoelectric materials of the present invention and the piezoelectric elements including the piezoelectric materials of Comparative Examples were evaluated for the static characteristics, i.e., the Curie temperature, piezoelectric constant d3i, and mechanical quality factor after
• the Curie temperature shown in the table was determined from the temperature showing the maximum dielectric constant by measuring dielectric constants with changing the measurement temperature using a small AC electric field having a
• the piezoelectric constant d 3 i was determined by a resonance-antiresonance method, and its absolute value is shown in the table. The measurement was performed at room temperature (25°C) .
• Table 4 also shows the ratio of the abundance of Ba and Ca to the abundance of Ti, Zr, and Mn,
• the piezoelectric elements in Examples 8 and 9 having the same values of x and y and the same Mn contents, but having different values of a, were compared to each other.
• Examples 9 and 14 were excellent in both piezoelectric constant and mechanical quality factor.
• the ratios of the abundance of Ba and Ca to the abundance of Ti, Zr, and Mn, (Ba+Ca) / (Ti+Zr+Mn) were 0.992 or more and 0.999 or less.
• piezoelectric elements produced by baking a silver paste showed characteristics equivalent to those produced by baking a gold paste.
• the ceramic in Comparative Example 5 contained a small amount of Mn, 0.08 parts by weight, and had a small value of a, 0.994, i.e., lower than 1, and thereby caused abnormal growth of grains during the sintering to give a large average equivalent circular diameter of 13.5 ⁇ , resulting in a small piezoelectric constant and also a small mechanical quality factor of 150.
• Example 10 contained 0% of Zr and thereby had a further smaller piezoelectric constant d 3i of 48 [pm/V] than that of the ceramic in Comparative Example 9.
• the resulting mixed powder was granulated by spraying manganese ( II ) acetate in amount of 0.24 parts by weight of Mn to the mixed powder on a metal basis and a PVA binder in an amount of 3 parts by weight to the mixed powder using a spray dryer such that the manganese ( II ) acetate and the PVA binder adhere to the mixed powder surfaces.
• the resulting ceramic was ground so as to have a thickness of 0.5 mm, and the crystal structure was analyzed by X-ray diffraction. Only a peak corresponding to a perovskite structure was observed. [0165] The composition was evaluated by X-ray fluorescence analysis. The results demonstrate that the composition after sintering coincides with the weighed composition in every sample.
• a gold electrode having a thickness of 400 nm was formed on each surface of the disk-shaped ceramic by DC sputtering.
• a titanium adhesive layer having a thickness of 30 nm was formed between the electrode and the ceramic.
• the resulting ceramic provided with electrodes was cut into a strip-like piezoelectric element of 10 x 2.5 x 0.5 mm.
• piezoelectric element on a hot plate set to a surface temperature of 80°C for 30 minutes.
• the piezoelectric elements prepared in Example 23 and Comparative Example 11 were placed in a thermostatic chamber and were subjected to a thermal cycle test of repeating a thermal cycle consisting of 25°C ⁇ -20°C ⁇ 50°C —> 25°C 100 times.
• the piezoelectric constants d 3i before and after the thermal cycle test were evaluated.
• piezoelectric constant That is, a piezoelectric ceramic having a crystal phase transition temperature in the range of -25°C to 100°C does not have sufficient durability as an element .
• Barium titanate particles (BT-01, manufactured by Sakai Chemical Industry Co., Ltd.) having an average
• Example 1 zirconate particles (CZ-03, manufactured by Sakai Chemical Industry Co., Ltd.) having an average particle diameter of 300 nm, barium oxalate, and trimanganese tetraoxide (Mn 3 0 ) . were weighed so as to give the composition of Example 1 shown in Table 1. The weighed raw material powders were mixed with a ball mill overnight to give a mixed powder.
• CZ-03 manufactured by Sakai Chemical Industry Co., Ltd.
• Mn 3 0 trimanganese tetraoxide
• the resulting mixed powder was mixed with PVB, and the mixture was formed into a sheet shape by a doctor blade method to give a green sheet having a thickness of 50 ⁇ .
• a conductive paste for an internal electrode was printed on the green sheet.
• An Ag30%-Pd70% alloy paste was used as the conductive paste.
• Nine green sheets each provided with the conductive paste were stacked to give a layered product. The layered product was placed in an electric furnace, was held at 1380°C for 5 hours, and was sintered in the atmosphere over 24 hours in total.
• the resulting layered product was cut into a size of 10 x 2.5 mm.
• the side faces were ground, and a pair of external electrodes (a first gold electrode and a second gold electrode) for alternately short-circuiting the internal electrodes was formed by DC sputtering to produce a multilayered piezoelectric element as shown in Fig. 3B.
• a titanium adhesive layer having a thickness of 30 nm was formed between each electrode and the layered product.
• the sample was subjected to polarization treatment for evaluating the piezoelectric constant thereof.
• an electric field of 1 kV/mm was applied to the sample on a hot plate set to a surface temperature of 100°C for 30 minutes.
• the piezoelectric properties of the resulting multilayered piezoelectric element were evaluated.
• the multilayered piezoelectric element had sufficient insulation properties and satisfactory piezoelectric properties that are equivalent to those of the piezoelectric ceramic in Example 1.
• a liquid discharge head shown in Figs. 4A and 4B was produced using the same piezoelectric element as in Example 1. Discharge of an ink according to input electric signals was confirmed.
• a liquid discharge device shown in Fig. 5 was produced using the same piezoelectric element as in Example
• a dust removing device shown in Figs. 10A and 10B was produced using the same piezoelectric element as in
• Example 5 A satisfactory dust removing efficiency was confirmed when plastic beads were dispersed and an
• a liquid discharge head shown in Figs. 4A and 4B was produced using the same multilayered piezoelectric element as in Example 7. Discharge of an ink according to input electric signals was confirmed. Liquid discharge device according to Example 8
• a liquid discharge device shown in Fig. 5 was produced using the same multilayered piezoelectric element as in Example 8. Discharge of an ink onto a recoding medium according to input electric signals was confirmed.
• a dust removing device shown in Figs. 10A and 10B was produced using the same multilayered piezoelectric element as in Example 11. A satisfactory dust removing efficiency was confirmed when plastic beads were dispersed and an alternating voltage was applied thereto.
• An image pickup device shown in Fig. 13 was produced using the same multilayered piezoelectric element as in Example 12. In the operation of the device, dust on the surface of the image pickup unit was satisfactorily removed to provide a dust defect-free image.
• FIG. 15 An electronic apparatus shown in Fig. 15 was produced using the sane multilayered piezoelectric element as in Example 13. Loudspeaker operation according to application of an alternating voltage was confirmed.
• the piezoelectric material of the present invention has high piezoelectric constant and mechanical quality factor, causes no load to the environment, and can be used in an apparatus including many piezoelectric materials, for example, a large number of piezoelectric elements, such as an ultrasonic motor, without any problem.

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