Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
  • G01M13/00—Testing of machine parts
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B11/00—Measuring arrangements characterised by the use of optical techniques
  • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01G—WEIGHING
  • G01G19/00—Weighing apparatus or methods adapted for special purposes not provided for in the preceding groups
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
  • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
  • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
  • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
  • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
  • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
  • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
  • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
  • G01S17/88—Lidar systems specially adapted for specific applications
• • G—PHYSICS
  • G05—CONTROLLING; REGULATING
  • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
  • G05B15/00—Systems controlled by a computer
  • G05B15/02—Systems controlled by a computer electric
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N2223/00—Investigating materials by wave or particle radiation
  • G01N2223/10—Different kinds of radiation or particles
  • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
  • G01N2223/1016—X-ray
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N2223/00—Investigating materials by wave or particle radiation
  • G01N2223/60—Specific applications or type of materials
  • G01N2223/643—Specific applications or type of materials object on conveyor
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N2223/00—Investigating materials by wave or particle radiation
  • G01N2223/60—Specific applications or type of materials
  • G01N2223/645—Specific applications or type of materials quality control

Definitions

• the invention relates to a system and a method for evaluating the quality of an object manufactured in particular on a high-speed production line.
• the objective of the present invention is therefore to propose a system and a method for the automatic evaluation of the quality of a product or a part resulting from a production line, simple in their design and in their operating mode. , fast and to group together all control and evaluation operations on a single item to save on recurring labor costs and cycle times.
• the invention aims in particular a system for automatic and flexible evaluation of the quality of a product or a piece capable of absorbing high production rates while protecting the operator or operators present on the production line of any laser light leaks that may occur by reflecting laser beams on the part or product to inspect, especially when they have complex shapes.
• Another object of the present invention is an installation for manufacturing a part or a product or an assembly comprising such a control system placed at the end of the chain.
• the invention relates to a system for controlling the quality of an object.
• this control system comprises: a security enclosure comprising an input port through which said object to be inspected is introduced into said enclosure and at least one output port, said enclosure having an inspection zone,
• a transport device for conveying said object to be inspected into said inspection zone and ensuring its evacuation through said at least one exit port
• said security enclosure is made of an opaque material for the wavelengths of said laser beams in operation, respectively, for the wavelengths of said operating laser beams and said X-rays, to prevent radiation leakage.
• This control system thus advantageously makes it possible to concentrate on a single item all the stages of evaluation of the quality of a part, a product or an assembly. It also ensures the protection of the operator (s) working on the production line of accidental laser light and / or X-ray leakage.
• said transport device comprising a conveyor belt, said weighing device is placed under this band,
• the object structure analysis assembly in said inspection area comprises an X-ray source and a sensor, the object to be inspected being placed in said inspection area between said X-ray source and said X-ray source and said sensor sensor,
• said non-contacting dimensional measurement assembly of the object in said inspection area comprises a laser interferometry dimensional measurement assembly and / or a projection set of a light pattern and detection by a stereovision system, the system comprises a presence detector for stopping said transport device when the object to be inspected is placed in said inspection zone,
• the system comprises a central unit connected to a recording medium comprising at least one information file previously recorded on this recording medium to define the reference parameters of said object , said central unit receiving each of said signals for comparison with said reference parameters, the system comprises a device for marking said object when the evaluation of its quality reveals one or more defects,
• the system further comprises a control unit for the surface appearance of the object and / or an Optical Coherence Tomography (OCT) device.
• OCT Optical Coherence Tomography
• This last device makes it possible, for example, to control the resin flashes in the spokes of the folded curved pieces.
• the invention also relates to an installation for the production of an object, this installation being equipped with a system for controlling the quality of this object as described above.
• the invention also relates to a method for evaluating the quality of an object in which said object is positioned in an inspection zone and then at least the first of the following steps is carried out on this object placed in this inspection zone:
• the result obtained is compared with one or more reference measurements, if they correspond to the uncertainties of measurement, we proceed to the next step, if they are distinct, we put the object to the rebus.
• a first laser beam is sent on said object to generate ultrasonic waves in said object to be inspected, said object is illuminated with a second laser beam so that part of this second beam is reflected by said object and this part of the second reflected beam is measured by interferometry, all of these laser beams passing through the same optical reading head.
• FIG. 1 shows schematically in profile a quality control system of an object according to a particular embodiment of the invention
• FIG. 2 is a partial and enlarged view of the transport device of Figure 1;
• Figures 1 and 2 schematically show a quality control system of an object according to a preferred embodiment of the invention.
• This control system is placed at the end of the production line of products 1, the products being conveyed to the system by a conveying device 2 which is here a conveyor belt.
• the products 1 to be inspected are deposited on this treadmill without very precise positioning.
• Each product 1 enters a security enclosure 3 through an input port 4 of this enclosure, arrives in an inspection zone 5 of this enclosure where it is detected by a presence detector (not shown) which then stops the device. 2 to allow the evaluation of its quality.
• the product 1 to be inspected which is in the inspection zone 5, is ready to be evaluated sequentially by an arrangement of measuring and control devices.
• the conveying device 2 After this evaluation of the quality of the product 1 and if the latter is found to comply with manufacturing tolerances both in terms of dimensions and surface quality and shape, the conveying device 2 restarts and evacuated by a output port 6.
• the defective product is marked with a marking device (not shown) prior to its evacuation through the exit port 6.
• a marking device not shown
• the marking of the product 1 exhibiting one or more defects can be done by projecting a paint on its surface.
• the product 1 to be inspected is weighed by a weighing apparatus 7.
• the weighing apparatus 7 is here a scale placed under the conveyor belt 2 .
• This weighing of the product 1 may allow pre-sorting of the products 1 in the event of a defect.
• Overloading of the product 1 with respect to a reference weight may mean the presence of a foreign body.
• an underload of the product 1 with respect to this reference weight may mean the presence of air bubbles and / or excessive porosity of the latter.
• the weighing apparatus 7 supplies an electric signal in response to the weighing of the product 1, this electrical signal representative of the weight of the product 1 thus determined, being sent to a central unit (not shown) connected to a recording medium (not shown) comprising at least one data file or a library of data files previously recorded on this recording medium to define the reference parameters of the product 1 to be inspected.
• This central unit here comprises a microprocessor configured to perform the comparison between the measurement signals received from the different evaluation devices of the system and the reference parameters.
• the three-dimensional measurements of this product 1 are then determined by means of a non-contact dimensional measurement assembly of the product 1 placed in the inspection zone 5.
• This set of non-contact dimensional measurement comprises here a set of measurement by projection of a luminous pattern such as a band or a cross on the surface of the product 1 and the detection of this luminous pattern by a stereovision system comprising at least two cameras 8, 9 simultaneously taking shots of the projected light pattern on the surface of the product 1.
• These cameras 8, 9 are for example CCD matrix.
• Each of these cameras 8, 9 sends a signal representative of the measurement acquired by the corresponding camera to the central unit which determines from these signals the dimensions of the product 1. These dimensions are then compared to the reference dimensions of the product 1 stored on the recording medium.
• the structure of the product 1 present in the inspection zone 5 is analyzed.
• a set of analysis of the structure of the object in said inspection zone comprising:
• a first laser source 10 intended to generate a first laser beam for creating ultrasonic waves in the product 1,
• a second laser source 1 1 intended to generate a second laser beam for illuminating the product 1 to be inspected
• an interferometer 12 for measuring a part of the second beam reflected by the product 1 placed in the inspection zone 5, this interferometer 12 being able to generate an electrical signal representative of this measurement, which is sent to the central unit for comparison with a reference parameter.
• first and second laser sources 10, 11 and the interferometer 12 are optically coupled to a measuring head 13 placed in the chamber 3, this measuring head 13 comprising an optical scanner for scanning the surface of the product 1 to inspect.
• This optical scanner here includes two mirrors mounted on galvanometer.
• the first laser source 10 which is here a carbon dioxide (CO 2 ) laser, generates a first laser beam of wavelength 10.6 ⁇ having an energy of the order of 200 mJ.
• This first beam is received by the optical scanner of the measuring head 13 which directs it to the product 1 placed in the inspection zone 5 so as to allow the scan of this product 1.
• This first laser beam generates ultrasonic waves in the product 1 to be inspected.
• the second beam emitted by the second laser source 1 1 optically coupled to the same optical measurement head 13, is also sent by this measuring head 13 to the product 1 to inspect. Part of this second beam is then reflected by the product 1 being out of phase by the ultrasonic waves generated by the first beam in this product 1.
• the reflected laser beam is then received by the interferometer 12 capable of generating an electrical signal representative of this reflected beam portion thus measured.
• This electrical signal is sent to the central processing unit for comparison with one or more reference parameters of the product 1.
• the treadmill 2 advances to evacuate this product 1 and place in the inspection zone 5, a new product 1 to inspect.
• the optical scanner may comprise a single scanning mirror along an axis perpendicular to the longitudinal axis of the treadmill 2.
• the treadmill is then used as a second scanning axis so as to allow the scan of each product 1.
• the interferometer 12 is here a Fabry-Perot interferometer and / or a two-wave mixing interferometer (TWM).
• the security enclosure 3 is made of an opaque material for the wavelengths of the laser beams in operation to prevent any leakage of laser light that could harm the health of operators operating on the production line.

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• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Engineering & Computer Science (AREA)
• Electromagnetism (AREA)
• Health & Medical Sciences (AREA)
• Computer Networks & Wireless Communication (AREA)
• Radar, Positioning & Navigation (AREA)
• Remote Sensing (AREA)
• Chemical & Material Sciences (AREA)
• Analytical Chemistry (AREA)
• Life Sciences & Earth Sciences (AREA)
• Multimedia (AREA)
• Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
• Radiology & Medical Imaging (AREA)
• Biochemistry (AREA)
• General Health & Medical Sciences (AREA)
• Immunology (AREA)
• Pathology (AREA)
• Automation & Control Theory (AREA)
• General Engineering & Computer Science (AREA)
• Length Measuring Devices By Optical Means (AREA)
• Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
• Analysing Materials By The Use Of Radiation (AREA)

Applications Claiming Priority (2)

Publications (1)

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ID=47049154

Family Applications (1)

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Citations (2)

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• 2011
  • 2011-10-17 FR FR1159357A patent/FR2981450B1/fr not_active Expired - Fee Related
• 2012
  • 2012-10-16 BR BR112014009088A patent/BR112014009088A2/pt not_active Application Discontinuation
  • 2012-10-16 WO PCT/EP2012/070510 patent/WO2013057115A1/fr active Application Filing
  • 2012-10-16 CN CN201280050168.2A patent/CN104114992B/zh not_active Expired - Fee Related
  • 2012-10-16 SG SG11201400932PA patent/SG11201400932PA/en unknown
  • 2012-10-16 RU RU2014119933A patent/RU2620868C2/ru not_active IP Right Cessation
  • 2012-10-16 US US14/349,187 patent/US20140249663A1/en not_active Abandoned
  • 2012-10-16 EP EP12775479.4A patent/EP2769196A1/fr not_active Withdrawn
  • 2012-10-16 MX MX2014004569A patent/MX338117B/es active IP Right Grant
  • 2012-10-16 CA CA2852791A patent/CA2852791A1/fr not_active Abandoned

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