MX338117B - Sistema y metodo para controlar la calidad de un objeto. - Google Patents

Sistema y metodo para controlar la calidad de un objeto.

Info

Publication number
MX338117B
MX338117B MX2014004569A MX2014004569A MX338117B MX 338117 B MX338117 B MX 338117B MX 2014004569 A MX2014004569 A MX 2014004569A MX 2014004569 A MX2014004569 A MX 2014004569A MX 338117 B MX338117 B MX 338117B
Authority
MX
Mexico
Prior art keywords
inspection zone
chamber
inspected
rays
quality
Prior art date
Application number
MX2014004569A
Other languages
English (en)
Other versions
MX2014004569A (es
Inventor
Hubert Voillaume
Original Assignee
Eads Europ Aeronautic Defence
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eads Europ Aeronautic Defence filed Critical Eads Europ Aeronautic Defence
Publication of MX2014004569A publication Critical patent/MX2014004569A/es
Publication of MX338117B publication Critical patent/MX338117B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M13/00—Testing of machine parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G19/00—Weighing apparatus or methods adapted for special purposes not provided for in the preceding groups
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B15/00—Systems controlled by a computer
    • G05B15/02—Systems controlled by a computer electric
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/645—Specific applications or type of materials quality control

Abstract

La invención se refiere a un sistema para controlar la calidad de un objeto que deja una instalación de producción. De acuerdo con la invención, el sistema comprende: una cámara que incluye un puerto de entrada a través del cual se inserta el objeto que se va a inspeccionar en la cámara y al menos un puerto de salida, dicha cámara tiene una zona de inspección (5); un dispositivo de transporte para llevar el objeto que se va a inspeccionar a la zona de inspección (5) y para liberar el mismo a través de al menos un puerto de salida; un aparato de pesaje (7) para pesar el objeto en la zona de inspección (5); un ensamble para la medición dimensional libre de contacto del objeto en la zona de inspección (5); y un ensamble para analizar la estructura del objeto en la zona de inspección (5) por medio de rayos láser y/o rayos X. La cámara antes mencionada está hecha de un material que es opaco para las longitudes de onda de los rayos láser durante la operación y los rayos X, con el fin de prevenir cualquier fuga de radiación.
MX2014004569A 2011-10-17 2012-10-16 Sistema y metodo para controlar la calidad de un objeto. MX338117B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1159357A FR2981450B1 (fr) 2011-10-17 2011-10-17 Systeme et procede de controle de la qualite d'un objet
PCT/EP2012/070510 WO2013057115A1 (fr) 2011-10-17 2012-10-16 Système et procédé de contrôle de la qualité d'un objet

Publications (2)

Publication Number Publication Date
MX2014004569A MX2014004569A (es) 2014-11-25
MX338117B true MX338117B (es) 2016-04-01

Family

ID=47049154

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2014004569A MX338117B (es) 2011-10-17 2012-10-16 Sistema y metodo para controlar la calidad de un objeto.

Country Status (10)

Country Link
US (1) US20140249663A1 (es)
EP (1) EP2769196A1 (es)
CN (1) CN104114992B (es)
BR (1) BR112014009088A2 (es)
CA (1) CA2852791A1 (es)
FR (1) FR2981450B1 (es)
MX (1) MX338117B (es)
RU (1) RU2620868C2 (es)
SG (1) SG11201400932PA (es)
WO (1) WO2013057115A1 (es)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105445290A (zh) * 2014-09-02 2016-03-30 同方威视技术股份有限公司 X射线产品质量在线检测装置
CN106290416B (zh) * 2016-08-26 2020-01-10 合肥泰禾光电科技股份有限公司 一种x射线食品异物检测系统
FR3073043B1 (fr) * 2017-10-27 2019-11-15 Tiama Procede et installation de controle dimensionnel en ligne d'objets manufactures
CN108088407B (zh) * 2017-12-15 2020-11-10 成都光明光电股份有限公司 光学玻璃制品形貌偏差校正方法及系统
ES2910779T3 (es) * 2017-12-20 2022-05-13 Fundacion Tecnalia Res & Innovation Métodos y sistemas para inspección visual
EP3553508A3 (en) * 2018-04-13 2019-12-04 Malvern Panalytical B.V. X-ray analysis apparatus and method
CA3101489A1 (en) * 2018-06-07 2019-12-12 Wilco Ag Inspection process
US10408606B1 (en) 2018-09-24 2019-09-10 Faro Technologies, Inc. Quality inspection system and method of operation
CA3116716A1 (en) 2018-10-19 2020-07-09 Inkbit, LLC High-speed metrology
AU2019374148A1 (en) 2018-11-02 2021-05-27 Inkbit, LLC Intelligent additive manufacturing
US11354466B1 (en) 2018-11-02 2022-06-07 Inkbit, LLC Machine learning for additive manufacturing
AU2019378044A1 (en) 2018-11-16 2021-05-27 Inkbit, LLC Inkjet 3D printing of multi-component resins
WO2020106944A1 (en) * 2018-11-21 2020-05-28 Aaron Weber High speed pharmaceutical quality control metrology
WO2020146490A1 (en) 2019-01-08 2020-07-16 Inkbit, LLC Depth reconstruction in additive fabrication
US10974460B2 (en) 2019-01-08 2021-04-13 Inkbit, LLC Reconstruction of surfaces for additive manufacturing
EP3709006A1 (fr) * 2019-03-15 2020-09-16 Primetals Technologies France SAS Système de contrôle visuel pour un produit étendu
US10994477B1 (en) 2019-11-01 2021-05-04 Inkbit, LLC Optical scanning for industrial metrology
US11712837B2 (en) 2019-11-01 2023-08-01 Inkbit, LLC Optical scanning for industrial metrology
US10926473B1 (en) 2020-02-20 2021-02-23 Inkbit, LLC Multi-material scanning for additive fabrication
CN111288902B (zh) * 2020-02-21 2021-09-10 苏州大学 一种双视场光相干断层扫描成像系统及材料厚度检测法
EP4127599A1 (en) 2020-07-01 2023-02-08 Hamamatsu Photonics K.K. Slanted optical coherence tomography imaging for high-speed inspection
US10994490B1 (en) 2020-07-31 2021-05-04 Inkbit, LLC Calibration for additive manufacturing by compensating for geometric misalignments and distortions between components of a 3D printer
CN112880787B (zh) * 2021-01-08 2023-03-31 重庆开谨科技有限公司 一种用于车辆称重传感器的波形处理方法
CN114923935A (zh) * 2022-04-02 2022-08-19 上海奕瑞光电子科技股份有限公司 在线3d扫描系统及在线3d扫描方法
DE102022111511A1 (de) 2022-05-09 2023-11-09 Wipotec Gmbh Inspektionsvorrichtung mit darin integrierter Röntgen- und Wägevorrichtung

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4589141A (en) * 1984-03-12 1986-05-13 Texas Instruments Incorporated Apparatus for automatically inspecting printed labels
US4819783A (en) * 1986-07-29 1989-04-11 Cochlea Corporation Automated inspection system and method
US4906098A (en) * 1988-05-09 1990-03-06 Glass Technology Development Corporation Optical profile measuring apparatus
JP2714277B2 (ja) * 1991-07-25 1998-02-16 株式会社東芝 リード形状計測装置
DE4232201A1 (de) * 1992-09-25 1994-03-31 Sp Reifenwerke Gmbh Vorrichtung zur Querschnittsvermessung von Fahrzeugreifen
US5414512A (en) * 1993-03-10 1995-05-09 Grant Engineering, Inc. Method and apparatus for viewing a shearographic image
US6175415B1 (en) * 1997-02-19 2001-01-16 United Technologies Corporation Optical profile sensor
US6633384B1 (en) * 1998-06-30 2003-10-14 Lockheed Martin Corporation Method and apparatus for ultrasonic laser testing
JP3926055B2 (ja) * 1999-03-03 2007-06-06 株式会社ブリヂストン タイヤの内部検査方法及び装置
US6967716B1 (en) * 1999-04-23 2005-11-22 Pressco Technology Inc. Apparatus and method for inspecting multi-layer plastic containers
US6894775B1 (en) * 1999-04-29 2005-05-17 Pressco Technology Inc. System and method for inspecting the structural integrity of visibly clear objects
US8023724B2 (en) * 1999-07-22 2011-09-20 Photon-X, Inc. Apparatus and method of information extraction from electromagnetic energy based upon multi-characteristic spatial geometry processing
US6804629B2 (en) * 2000-05-12 2004-10-12 Ishida Co., Ltd. Production management system and system for checking operating conditions of product processing apparatuses
US6378387B1 (en) * 2000-08-25 2002-04-30 Aerobotics, Inc. Non-destructive inspection, testing and evaluation system for intact aircraft and components and method therefore
US7344082B2 (en) * 2002-01-02 2008-03-18 Metrologic Instruments, Inc. Automated method of and system for dimensioning objects over a conveyor belt structure by applying contouring tracing, vertice detection, corner point detection, and corner point reduction methods to two-dimensional range data maps of the space above the conveyor belt captured by an amplitude modulated laser scanning beam
US7089131B2 (en) * 2002-03-22 2006-08-08 Lear Corporation Inspection and verification system and method
US20030229463A1 (en) * 2002-06-05 2003-12-11 Chun-Chen Chen Systematic method and system for quality control
DE10333802B4 (de) * 2003-07-24 2005-09-08 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zum Prüfen von Reifen
US7355709B1 (en) * 2004-02-23 2008-04-08 Kla-Tencor Technologies Corp. Methods and systems for optical and non-optical measurements of a substrate
DE102004026357B4 (de) * 2004-05-26 2022-11-17 Werth Messtechnik Gmbh Vorrichtung und Verfahren zum Messen eines Objektes
EP1749190B1 (de) * 2004-05-26 2015-05-06 Werth Messtechnik GmbH Verfahren zum Messen eines Objekts mit einem Koordinatenmessgerät, das einen Computer-Tomographen enthält
EP1626271A1 (de) * 2004-08-14 2006-02-15 Collmann GmbH & Co. Spezialmaschinenbau KG Röntgenprüfverfahren für Fahrzeugreifen
US8294809B2 (en) * 2005-05-10 2012-10-23 Advanced Scientific Concepts, Inc. Dimensioning system
US7838858B2 (en) * 2005-05-31 2010-11-23 Nikon Corporation Evaluation system and method of a search operation that detects a detection subject on an object
WO2007058212A1 (ja) * 2005-11-16 2007-05-24 Ishida Co., Ltd. Ｘ線検査装置
FR2897303B1 (fr) * 2006-02-15 2009-11-13 Michelin Soc Tech Ensemble de roue et de pneumatique et procede de mesure en dynamique de parametres topologiques de la surface interne de la partie pertinente de pneumatique
EP1975603A1 (en) * 2007-03-27 2008-10-01 Visys NV Method and system for use in inspecting and/or removing unsuitable objects from a stream of products and a sorting apparatus implementing the same
US7917241B2 (en) * 2007-08-01 2011-03-29 Tel Epion Inc. Method and system for increasing throughput during location specific processing of a plurality of substrates
CA2672378A1 (en) * 2007-12-06 2009-06-11 Lockheed Martin Corporation Non-destructive inspection using laser-ultrasound and infrared thermography
US8054470B2 (en) * 2008-05-15 2011-11-08 Lockheed Martin Corporation Method and apparatus for spectroscopic characterization of samples using a laser-ultrasound system
JP5352144B2 (ja) * 2008-07-22 2013-11-27 株式会社荏原製作所 荷電粒子ビーム検査方法及び装置
DE102008037356C5 (de) * 2008-08-12 2020-09-17 Bernward Mähner Stapelmodul und Zentriermodul für eine Prüfanlage zum Prüfen von Reifen
CN101685073B (zh) * 2008-09-26 2011-07-20 软控股份有限公司 载重轮胎x光机测试装置及其方法
JP5340717B2 (ja) * 2008-12-16 2013-11-13 株式会社イシダ Ｘ線検査装置
US8765493B2 (en) * 2012-11-20 2014-07-01 Ultratech, Inc. Methods of characterizing semiconductor light-emitting devices based on product wafer characteristics

Also Published As

Publication number Publication date
MX2014004569A (es) 2014-11-25
EP2769196A1 (fr) 2014-08-27
BR112014009088A2 (pt) 2017-04-18
CA2852791A1 (fr) 2013-04-25
CN104114992B (zh) 2019-02-05
RU2620868C2 (ru) 2017-05-30
WO2013057115A1 (fr) 2013-04-25
FR2981450B1 (fr) 2014-06-06
CN104114992A (zh) 2014-10-22
FR2981450A1 (fr) 2013-04-19
RU2014119933A (ru) 2015-11-27
SG11201400932PA (en) 2014-09-26
US20140249663A1 (en) 2014-09-04

Similar Documents

Publication Publication Date Title
MX338117B (es) Sistema y metodo para controlar la calidad de un objeto.
TW201614227A (en) X-ray thin film inspection apparatus
EP3627145C0 (en) DATA PROCESSING DEVICE AND DATA PROCESSING METHOD FOR X-RAY INSPECTIONS AND X-RAY INSPECTION DEVICE WITH SAID DEVICE MOUNTED THEREIN
TW200739652A (en) Sample surface inspecting method and inspecting apparatus
IL262210B (en) Hhg source, inspection apparatus and method for performing a measurement
MY182409A (en) Surface inspection method and surface inspection apparatus
TW201614250A (en) Wafer inspection apparatus
MY154268A (en) Top-down x-ray inspection trailer
GB201213827D0 (en) Method and apparatus for imaging
MX2016005836A (es) Aparato de inspeccion.
TW201614191A (en) Surface profilometry device and method for monitoring wafers during processing
EA201792238A1 (ru) Способ и система быстрого осмотра транспортного средства
SG194699A1 (en) Uv diode laser excitation in flow cytometry
WO2012001414A3 (en) Inspection
WO2009028506A1 (ja) プラズマ処理装置、プラズマ処理方法および終点検出方法
MY196976A (en) System and method for measuring a flow property of a fluid in a porous medium
TW201614222A (en) Measuring method, measurement apparatus, lithographic apparatus and device manufacturing method
FI20125624A (fi) Menetelmä pneumaattisen materiaalinkäsittelyjärjestelmän putkiston puhdistamiseksi ja puhdistuslaitteisto sekä järjestelmä
IN2014MU01928A (es)
GB2539150A (en) Methods for inspecting channel regions in absorbent structures in absorbent articles
GB2486617A (en) Method and apparatus for determining a fluid density
MY188305A (en) Backscatter-imaging based inspecting system and method
EP3305949A4 (en) CRYSTAL MATERIAL, CRYSTAL MANUFACTURING METHOD, RADIATION DETECTOR, NON-DESTRUCTIVE INSPECTION AND IMAGING DEVICE
WO2014075792A3 (en) Apparatus and method for inspecting seals of items
MX2017000068A (es) Montaje y sistema de citometria de flujo, dispositivo de analisis que comprende el montaje de citometria, y montaje que comprende el sistema de citometria.

Legal Events

Date Code Title Description
FG Grant or registration