SG11201400932PA - System and method for controlling the quality of an object - Google Patents

System and method for controlling the quality of an object

Info

Publication number
SG11201400932PA
SG11201400932PA SG11201400932PA SG11201400932PA SG11201400932PA SG 11201400932P A SG11201400932P A SG 11201400932PA SG 11201400932P A SG11201400932P A SG 11201400932PA SG 11201400932P A SG11201400932P A SG 11201400932PA SG 11201400932P A SG11201400932P A SG 11201400932PA
Authority
SG
Singapore
Prior art keywords
quality
controlling
Prior art date
Application number
SG11201400932PA
Other languages
English (en)
Inventor
Hubert Voillaume
Original Assignee
Eads Europ Aeronautic Defence
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eads Europ Aeronautic Defence filed Critical Eads Europ Aeronautic Defence
Publication of SG11201400932PA publication Critical patent/SG11201400932PA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M13/00—Testing of machine parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G19/00—Weighing apparatus or methods adapted for special purposes not provided for in the preceding groups
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B15/00—Systems controlled by a computer
    • G05B15/02—Systems controlled by a computer electric
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/645—Specific applications or type of materials quality control

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SG11201400932PA 2011-10-17 2012-10-16 System and method for controlling the quality of an object SG11201400932PA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1159357A FR2981450B1 (fr) 2011-10-17 2011-10-17 Systeme et procede de controle de la qualite d'un objet
PCT/EP2012/070510 WO2013057115A1 (fr) 2011-10-17 2012-10-16 Système et procédé de contrôle de la qualité d'un objet

Publications (1)

Publication Number Publication Date
SG11201400932PA true SG11201400932PA (en) 2014-09-26

Family

ID=47049154

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201400932PA SG11201400932PA (en) 2011-10-17 2012-10-16 System and method for controlling the quality of an object

Country Status (10)

Country Link
US (1) US20140249663A1 (es)
EP (1) EP2769196A1 (es)
CN (1) CN104114992B (es)
BR (1) BR112014009088A2 (es)
CA (1) CA2852791A1 (es)
FR (1) FR2981450B1 (es)
MX (1) MX338117B (es)
RU (1) RU2620868C2 (es)
SG (1) SG11201400932PA (es)
WO (1) WO2013057115A1 (es)

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CN106290416B (zh) * 2016-08-26 2020-01-10 合肥泰禾光电科技股份有限公司 一种x射线食品异物检测系统
FR3073043B1 (fr) * 2017-10-27 2019-11-15 Tiama Procede et installation de controle dimensionnel en ligne d'objets manufactures
CN108088407B (zh) * 2017-12-15 2020-11-10 成都光明光电股份有限公司 光学玻璃制品形貌偏差校正方法及系统
ES2910779T3 (es) * 2017-12-20 2022-05-13 Fundacion Tecnalia Res & Innovation Métodos y sistemas para inspección visual
EP3553508A3 (en) * 2018-04-13 2019-12-04 Malvern Panalytical B.V. X-ray analysis apparatus and method
EP3801932B1 (en) * 2018-06-07 2023-07-19 Wilco AG Inspection process and system
US10408606B1 (en) 2018-09-24 2019-09-10 Faro Technologies, Inc. Quality inspection system and method of operation
EP3850300A2 (en) 2018-10-19 2021-07-21 Inkbit, LLC High-speed metrology
EP3856494A1 (en) 2018-11-02 2021-08-04 Inkbit, LLC Intelligent additive manufacturing
US11354466B1 (en) 2018-11-02 2022-06-07 Inkbit, LLC Machine learning for additive manufacturing
CA3118309A1 (en) 2018-11-16 2020-05-22 Inkbit, LLC Inkjet 3d printing of multi-component resins
WO2020106944A1 (en) * 2018-11-21 2020-05-28 Aaron Weber High speed pharmaceutical quality control metrology
CA3124883A1 (en) 2019-01-08 2020-07-16 Inkbit, LLC Reconstruction of surfaces for additive manufacturing
WO2020146490A1 (en) 2019-01-08 2020-07-16 Inkbit, LLC Depth reconstruction in additive fabrication
EP3709006A1 (fr) * 2019-03-15 2020-09-16 Primetals Technologies France SAS Système de contrôle visuel pour un produit étendu
US10994477B1 (en) 2019-11-01 2021-05-04 Inkbit, LLC Optical scanning for industrial metrology
US11712837B2 (en) 2019-11-01 2023-08-01 Inkbit, LLC Optical scanning for industrial metrology
US10926473B1 (en) 2020-02-20 2021-02-23 Inkbit, LLC Multi-material scanning for additive fabrication
CN111288902B (zh) * 2020-02-21 2021-09-10 苏州大学 一种双视场光相干断层扫描成像系统及材料厚度检测法
WO2022003867A1 (en) 2020-07-01 2022-01-06 Hamamatsu Photonics K.K. Slanted optical coherence tomography imaging for high-speed inspection
US10994490B1 (en) 2020-07-31 2021-05-04 Inkbit, LLC Calibration for additive manufacturing by compensating for geometric misalignments and distortions between components of a 3D printer
CN112880787B (zh) * 2021-01-08 2023-03-31 重庆开谨科技有限公司 一种用于车辆称重传感器的波形处理方法
CN114923935A (zh) * 2022-04-02 2022-08-19 上海奕瑞光电子科技股份有限公司 在线3d扫描系统及在线3d扫描方法
DE102022111511A1 (de) 2022-05-09 2023-11-09 Wipotec Gmbh Inspektionsvorrichtung mit darin integrierter Röntgen- und Wägevorrichtung

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Also Published As

Publication number Publication date
CA2852791A1 (fr) 2013-04-25
CN104114992A (zh) 2014-10-22
MX2014004569A (es) 2014-11-25
RU2014119933A (ru) 2015-11-27
RU2620868C2 (ru) 2017-05-30
BR112014009088A2 (pt) 2017-04-18
US20140249663A1 (en) 2014-09-04
WO2013057115A1 (fr) 2013-04-25
MX338117B (es) 2016-04-01
EP2769196A1 (fr) 2014-08-27
FR2981450A1 (fr) 2013-04-19
FR2981450B1 (fr) 2014-06-06
CN104114992B (zh) 2019-02-05

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