EP2746790B1 - Method and circuit for measuring own and mutual thermal resistances of a magnetic device - Google Patents

Method and circuit for measuring own and mutual thermal resistances of a magnetic device Download PDF

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Publication number
EP2746790B1
EP2746790B1 EP13460073.3A EP13460073A EP2746790B1 EP 2746790 B1 EP2746790 B1 EP 2746790B1 EP 13460073 A EP13460073 A EP 13460073A EP 2746790 B1 EP2746790 B1 EP 2746790B1
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EP
European Patent Office
Prior art keywords
winding
stage
measurement
resistance
core
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
EP13460073.3A
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German (de)
English (en)
French (fr)
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EP2746790A2 (en
EP2746790A3 (en
Inventor
Krzysztof Górecki
Janusz Zarebski
Kalina Detka
Malgorzata Rogalska
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Uniwersytet Morski W Gdyni
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Uniwersytet Morski W Gdyni
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Priority claimed from PL402223A external-priority patent/PL225429B1/pl
Priority claimed from PL404668A external-priority patent/PL225751B1/pl
Application filed by Uniwersytet Morski W Gdyni filed Critical Uniwersytet Morski W Gdyni
Priority to PL13460073T priority Critical patent/PL2746790T3/pl
Publication of EP2746790A2 publication Critical patent/EP2746790A2/en
Publication of EP2746790A3 publication Critical patent/EP2746790A3/en
Application granted granted Critical
Publication of EP2746790B1 publication Critical patent/EP2746790B1/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/62—Testing of transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/72—Testing of electric windings

Definitions

  • the presented invention relates to a method and system for measuring own and mutual thermal resistances of a magnetic device, such as a transformer or choking-coil, applicable to the quality control of magnetic devices for the electronic industry.
  • a magnetic device such as a transformer or choking-coil
  • a method for measuring the thermal resistance and an apparatus for measuring the thermal resistance of such components as LSI circuits are known from an American patent specification US no. 4.840.495 . That known method consists in that the thermal resistance is determined based on a measurement of the temperature difference between both sides of an integrated circuit through which a known heat flux flows.
  • the known measuring system consists of a heat source, a source of cold, the system under test, a temperature difference meter and a control system.
  • a cooling device for reducing the thermal resistance of transformer windings is known from a Taiwan patent specification TW000200828355A .
  • a thin insulating layer which is thermally conductive is placed between each pair of winding layers. Owing to that layer conduction to the outside of heat generated in the winding is facilitated. This ensures reduction of the transformer thermal resistance.
  • Another solution known from a Chinese patent specification CN 000002269589Y , concerns an internally protected high-temperature measuring and recording device. That device is designed for use in measuring instruments operating at high temperatures from 1000°C to 2000°C.
  • the device contains a temperature probe, optical fibers, a multi-range pyrometer and a data analyzer operating in conjunction with special software.
  • the temperature probe containing a metal oxide crystal, is the main component; the probe housing is protected with a special ceramic. Information about the temperature value is converted into light, which is transmitted via an optical fiber to the pyrometer.
  • That known measuring method includes as a first stage calibration of the thermometric characteristics of the p-n junction contained in the structure of an output MOS transistor, at one value of the ambient temperature and a current forced by a source of the measuring current I M , and determination of the slope of that characteristics.
  • the second stage of that solution consists in applying to the integrated circuit examined a power wave and measuring the steady state voltage values at a voltage node for a high power level and low power level.
  • the third stage of that known method consists in determining the thermal resistance value from an analytic formula.
  • the known measuring system contains sources of the measuring and heating currents, two switches, a measuring amplifier, converter and computer. During the measurement appropriate digital signals are applied across the control input of the integrated circuit examined, their sequence depending on that integrated circuit type.
  • a Polish patent specification, no. PL 206218 describes a method and system for measuring the thermal resistance of an integrated pulse controller.
  • a system according to that known solution contains a thermostat, digital oscilloscope, analog-to-digital converter and computer.
  • the input voltage source is connected to the input of the controller under examination through a semiconductor power switch controlled with a digital signal from the computer.
  • a source of negative voltage is also connected, via a resistor and the analog-to-digital converter input, to the input of the controller examined.
  • Inputs of the two-channel digital oscilloscope, a resistor and components of the application system of the controller under examination are connected to terminals of a semiconductor keying element integrated in the controller structure.
  • the digital oscilloscope and the analog-to-digital converter are connected to the control computer.
  • the measurement of the thermal resistance of the integrated pulse controller operating in a BOOST converter configuration is based on using as a thermally sensitive parameter a voltage on a surface mount diode polarized in the direction of current flow.
  • the resistance measurement is accomplished here in three stages, covering determination of the thermometric characteristics slope, measurement of the voltage across the surface mount diode during calibration and in the steady state, and calculation of the thermal resistance value from an analytic formula.
  • the method under consideration is characterized in that the controller examined operates in the second stage of measurement in its application system and generates a pulse power waveform, the value of power P used in the final formula of this method being determined by averaging a product of voltage and current waveforms measured at the terminals of the semiconductor power keying element integrated in the examined controller structure.
  • the thermal resistance value is calculated from a known formula.
  • a measurement of the thermal resistance of a semiconductor device is known from another Japanese patent specification no. JP 59108968 .
  • the measurement is made using as a thermally sensitive parameter the current gain G of an amplifier containing a unipolar transistor.
  • the transistor is fed with a high frequency signal, and the measurement of the thermal resistance is carried out in 6 stages, covering measurements of voltages at transistor terminals under different conditions of its power supply and calculation of the thermal resistance value from an analytic formula.
  • Still another known method of measuring the thermal resistance of a field effect transistor has been presented in a Japanese patent specification no. JP 59092364 . That known method is designed for measurements of microwave unipolar transistors. In that method the threshold voltage of the transistor examined is used as a thermally sensitive parameter. The thermal resistance value is determined from the defining formula, and the transistor examined is supplied with a pulse signal having a pulse-duty factor of 0.99.
  • German patent DD 240461 refers the manner of testing primary windings of inductive voltage transformers. Particularly, it describes the manner of detecting inter turn short-circuits of the primary winding composed of many turns of thin wire.
  • the examined transformer is heated up until the admissible operating temperature of this element is achieved by stimulating the primary winding with the pulses train of current until the thermally steady state is obtained. Afterwards, the primary winding is stimulated by alternating voltage, and on the load the overvoltage is obtained by including and switching off impedance in the exciting circuit.
  • the method of claim 1 for measuring the own thermal resistance of a magnetic device in the form of a choking-coil and the mutual thermal resistance between the core and winding of the choking-coil consists in that the measured winding resistance, whose thermometric characteristics slope describes the temperature coefficient of copper resistivity changes ⁇ Cu , is used as a thermally sensitive parameter.
  • the measurement is carried out in three stages, including in turn measurements and calculations based on analytical formulae.
  • the measuring method according to the invention is characterized in that at the first stage of measurement the winding resistance R 3 is measured at a low value of the current I 3 and the core temperature T a is measured using a radiometric pyrometer.
  • the second stage covers measurement, in a thermal steady state, of the winding resistance R 4 and measurement of the choking-coil core temperature T r with a radiometric pyrometer at a high value of the choking-coil current I 4 .
  • the method of claim 2 for measuring the own thermal resistance of a magnetic device in the form of a transformer, the own thermal resistance of the core and the mutual thermal resistance between the transformer core and winding consists in that the measured winding resistance, whose thermometric characteristics slope describes the temperature coefficient of copper resistivity changes ⁇ Cu , is used as a thermally sensitive parameter.
  • the measurement is carried out in five stages, including in turn measurements and calculations based on analytical formulae.
  • the method according to the invention is characterized in that at the first stage of measurement the primary winding resistance R 1 is measured at a low value of the current I 1 in that winding, the secondary winding resistance R 2 is measured at a low value of the current I 2 in that winding and the core temperature T a is measured using a radiometric pyrometer.
  • the second stage includes a measurement, in a thermal steady state, of the transformer primary winding resistance R 11 and the transformer secondary winding resistance R 22 , and a measurement of the transformer core temperature T r with a pyrometer at a high value of the current in the primary winding I 11 and a low value of the current in the secondary winding I 2 .
  • R thup R 11 ⁇ R 1 R 1 ⁇ ⁇ Cu ⁇ I 11 2 ⁇ R 11
  • R thupw R 22 ⁇ R 2 R 2 ⁇ ⁇ Cu ⁇ I 11 2 ⁇ R 11
  • R thur T r ⁇ T a I 11 2 ⁇ R 11
  • the circuit of claim 3 for measuring own and mutual thermal resistances of a magnetic device comprises voltmeters, ammeters, an oscilloscope, DC voltage sources, double-throw switches and a radiometric pyrometer.
  • the circuit also contains a source of sinusoidal signal, resistors and a capacitor.
  • the circuit is characterized in that the voltmeter is connected in parallel with the input terminals Z1 and Z2 of the magnetic device winding, while a resistor Rw, the first ammeter and a double-throw switch are connected in series with that winding of the magnetic device.
  • the source of sinusoidal signal is connected between the first ammeter and the B terminal of the double-throw switch S 1 , whereas the first source of DC voltage is connected between the first ammeter and the A terminal of the double-throw switch S 1 .
  • Z3 and Z4 terminals of the magnetic device are connected in series with the double-throw switch S 2 , while between the D terminal of the double-throw switch S 2 and the ground a resistor R and capacitor C are connected in series.
  • a second voltmeter is connected, and a second ammeter in a series connection with a second DC voltage source are connected in parallel with that second voltmeter.
  • the input of the oscilloscope X channel is connected to the common point of the sinusoidal signal source, first source of DC voltage and first ammeter, whereas the input of the oscilloscope Y channel is connected to the common point of the capacitor and resistor.
  • the magnetic device is provided with Kelvin contacts, whereas the radiometric pyrometer input is located opposite to the magnetic device core.
  • a choking-coil whose winding is connected between Z1 and Z2 terminals has been foreseen as the magnetic device in the circuit according to the invention.
  • a transformer may be the magnetic device under consideration, its primary winding having been connected between Z1 and Z2 terminals, while the secondary winding may be connected between Z3 and Z4 terminals.
  • the possibility of determining the own thermal resistance of the magnetic device is a favorable result of adopting the method according to the invention.
  • a magnetic device in the form of a transformer the primary winding thermal resistance, own thermal resistance of the core, mutual thermal resistances between the primary and secondary windings and mutual thermal resistances between the primary winding and the core are concerned.
  • the method according to the invention is easily implemented using uncomplicated procedures and measuring instruments. The results of measurements make it possible to determine the maximum value of the winding current and frequency of the signal processed, for which the permissible value of the transformer windings and core temperature is not exceeded.
  • the possibility of measuring the own thermal resistance of a magnetic device including the thermal resistances of the transformer primary and secondary windings and core, the mutual thermal resistances between the primary and secondary windings, and the primary windings and transformer core, which determine the permissible values of the winding current and frequency during the transformer operation is a favorable effect brought about by use of the circuit according to the invention.
  • the object of the invention is presented below in embodiments showing examples of implementation of the method for measuring own and mutual thermal resistances of a magnetic device and a circuit for measuring own and mutual thermal resistances of a magnetic device.
  • the method for measuring the thermal resistance of the winding and the mutual thermal resistance between the core and the winding of a magnetic device in the form of a choking-coil is presented.
  • the measurement is carried out in three stages.
  • the switch S 1 14 is at the A position.
  • the resistance R 1 of the choking-coil winding corresponding to the ambient temperature and the core temperature are measured at the first stage.
  • the output of the DC source 1 is set so that a low value current flows in the circuit. That value is selected so that no winding temperature rise be caused, and simultaneously the current be much higher than that drawn by the first voltmeter 5.
  • the recommended value of this current is 10 mA.
  • the ammeter 3 measures the choking-coil current, and the voltmeter 5 - the voltage across its winding.
  • the value of the resistance R 1 is calculated as a quotient of the values measured by voltmeter 5 and ammeter 3.
  • the core temperature T a is measured with the radiometric pyrometer 12.
  • Kelvin contacts are used for connection to the choking-coil examined, voltage terminals being connected to the voltmeter 5 and current terminals being connected to the ammeter 3 and the ground.
  • the DC voltage source 1 forces a flow of the heating current I 2 in the choking-coil winding, the current intensity being sufficient to increase the winding temperature by at least 20°C.
  • the current value is measured with the ammeter 3 and the voltage across the choking-coil is measured with the voltmeter 5.
  • the quotient of the voltmeter 5 and ammeter 3 readings is equal to the winding resistance.
  • This resistance increases with time until a steady state is reached.
  • the steady state is achieved when the instantaneous value of the winding resistance does not change in 1 minute by more than 1%.
  • the steady state value of this resistance is the winding resistance R 2 at the second stage of measurement.
  • the core temperature T r is measured in the steady state, the radiometric pyrometer 12 being used for that purpose.
  • Example I was concerned with the method for measuring own and mutual thermal resistances of a choking-coil in three stages.
  • the present example deals with the method for measuring own and mutual thermal resistances of the primary and secondary windings and the core of a magnetic device in the form of a transformer.
  • the measurement in a circuit as shown in the drawing enclosed is accomplished in five stages, including in turn measurements and calculations from analytic formulae.
  • the primary winding resistance R 1 is measured at a low value of the current I 1 in that winding
  • the secondary winding resistance R 2 is measured at a low value of the current I 2 in that winding
  • the core temperature T a is measured using radiometric pyrometer.
  • the switches S 1 14 and S 2 15 are switched to the position 1.
  • Outputs of the first DC voltage source 1 and the second DC voltage source 11 are set to a low current value, selected so that no winding temperature rise is caused, while at the same time the current is much higher than that drawn by the voltmeter.
  • the recommended value of this current is 10 mA.
  • the first ammeter 3 measures the current in the primary winding and the first voltmeter 5 measures the voltage across that winding.
  • the second voltmeter 9 measures the voltage across the secondary winding, whereas the second ammeter 10 measures the current in that winding.
  • the value of the resistance R 1 is calculated as a quotient of the voltage measured with the first voltmeter 5 divided by the current measured with the first ammeter 3, while the value of the resistance R 2 is calculated as a quotient of the voltage measured with the second voltmeter 9 divided by the current measured with the second ammeter 10.
  • the core temperature T a is measured with a radiometric pyrometer 12. In order to eliminate the influence of leads on the measurement results Kelvin contacts are used for connection to the transformer examined, voltage terminals being connected to the voltmeters and current terminals being connected to the ammeters and the ground.
  • the first switch 14 is at the A position, and the second switch 15 is at the C position.
  • the DC voltage source 1 forces a flow of the heating current in the transformer primary winding, the current intensity being sufficient to increase the winding temperature by at least 20°C.
  • the value of that current I 11 is measured with the first ammeter 3 and the voltage across the primary winding is measured with the voltmeter 5.
  • the quotient of the voltmeter 5 and ammeter 3 readings is equal to the primary winding resistance.
  • the second DC voltage source 11 is used to force a low value DC current in the secondary winding of the transformer 6.
  • the value of that current I 2 is measured with the second ammeter 10 and the voltage across the secondary winding is measured with the second voltmeter 9.
  • the quotient of the second voltmeter 9 and the second ammeter 10 readings is equal to the secondary winding resistance. These resistances increase with time until a steady state is reached. The steady state is achieved when the instantaneous value of the winding resistance does not change by more than 1% in 1 minute.
  • the steady state value of the primary winding resistance is the resistance R 11 of that winding at the second stage of measurement
  • the steady state value of the secondary winding resistance is the resistance R 22 of that winding at the second stage of measurement.
  • the core temperature T r is measured in the steady state, the radiometric pyrometer 12 being used for that purpose.
  • the first switch S 1 14 is positioned at B and the second switch S 2 is positioned at D. Then across the primary winding a signal is applied from the sinusoidal signal source 2, its frequency and phase selected so that the transformer core does not operate in the saturation range, while at the same time the power dissipated in the core causes a substantial rise of the core temperature.
  • An integrating circuit consisting of a resistor 8 and capacitor 7 is connected to the secondary winding. With such excitation the primary winding current waveform i 1 (t) and voltage waveform u C (t) at the output of the integrating circuit are recorded with the oscilloscope 13. Also the core temperature T r1 (t) is recorded using a radiometric pyrometer.
  • R and C denote the resistance and capacitance, respectively, of the resistor 8 and capacitor 7
  • z 2 is the number of secondary winding turns
  • S Fe is the core cross section area
  • I Fe is the length of the magnetic path in the core.
  • the drawing enclosed shows a block diagram of a circuit for measuring the thermal resistance of a magnetic device, taking as an example a choking-coil and a transformer.
  • the thermal resistance of windings and core of the transformer and the mutual thermal resistance between the windings as well as the mutual thermal resistance between the primary winding and the transformer core are subject to the measurements.
  • the circuit according to that embodiment contains terminals for connecting the magnetic device under test 6, such as a choking-coil or transformer or another magnetic device, two voltmeters 5,9, two ammeters 3,10, a radiometric pyrometer 12, two DC voltage sources 1,11, a sinusoidal voltage source 2, two double-throw switches 14,15, an oscilloscope 13, two resistors 4,8 and a capacitor 7.
  • the voltmeter 5 is connected in parallel with the winding of the magnetic device 6, while the resistor R W 4, the first ammeter 3 and the double-throw switch 14 are connected in series with this winding.
  • the source of sinusoidal signal 2 is connected between the first ammeter 3 and the B terminal of the double-throw switch S 1 14, whereas the first DC voltage source 1 is connected between the first ammeter 3 and the A terminal of that double-throw switch S 1 14.
  • the secondary winding of the transformer is connected in series with the double-throw switch S 2 15.
  • the resistor R 8 and the capacitor C 7 are connected in series between the D terminal of that switch and the ground.
  • the second voltmeter 9 is connected, while the second ammeter 10 and the second DC voltage source 11 in a series connection are connected in parallel with that voltmeter.
  • the X channel of the oscilloscope 13 is connected to the connection point of the sinusoidal signal source 2, DC voltage source and first ammeter 3.
  • the Y channel of the oscilloscope 13 is connected with the connection point of the capacitor 7 and the resistor 8.
  • the magnetic device 6 in the form of a transformer is provided with Kelvin contacts, and the infrared radiation emitted by the transformer core is detected by the radiometric pyrometer 12.
  • the circuit according to the invention When the circuit according to the invention is used for measurements of the thermal resistance of a magnetic device 6 in the form of a choking-coil, the choking-coil windings is connected between the Z1 and Z2 terminals of the circuit as shown in the enclosed drawing.

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
EP13460073.3A 2012-12-24 2013-11-13 Method and circuit for measuring own and mutual thermal resistances of a magnetic device Active EP2746790B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PL13460073T PL2746790T3 (pl) 2012-12-24 2013-11-13 Sposób i układ do pomiaru własnych i wzajemnych rezystancji termicznych elementu indukcyjnego

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PL402223A PL225429B1 (pl) 2012-12-24 2012-12-24 Sposób i układ do pomiaru własnych i wzajemnych rezystancji termicznych dławika
PL404668A PL225751B1 (pl) 2013-07-12 2013-07-12 Sposób i układ do pomiaru własnych i wzajemnych rezystancji termicznych transformatora

Publications (3)

Publication Number Publication Date
EP2746790A2 EP2746790A2 (en) 2014-06-25
EP2746790A3 EP2746790A3 (en) 2017-04-19
EP2746790B1 true EP2746790B1 (en) 2019-12-04

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EP13460073.3A Active EP2746790B1 (en) 2012-12-24 2013-11-13 Method and circuit for measuring own and mutual thermal resistances of a magnetic device

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PL (1) PL2746790T3 (pl)

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Publication number Priority date Publication date Assignee Title
US10371739B2 (en) * 2015-10-30 2019-08-06 Landis+Gyr Llc Arrangement for detecting a meter maintenance condition using winding resistance
US10132697B2 (en) * 2015-12-23 2018-11-20 Schneider Electric USA, Inc. Current transformer with enhanced temperature measurement functions
CN109738845A (zh) * 2018-12-20 2019-05-10 国网北京市电力公司 电压互感器的质量检测方法及系统

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GB1515611A (en) 1976-03-11 1978-06-28 Rosemount Eng Co Ltd Electric circuits
NL7704348A (nl) 1977-04-21 1978-10-24 Philips Nv Werkwijze voor het bereiden van een geattenueer- de transmissible gastroenteritis(tge)-virusstam voor toepassing in levende vaccins.
JPS5992364A (ja) 1982-11-19 1984-05-28 Nec Corp 電界効果トランジスタの熱抵抗測定方法
JPS59108968A (ja) 1982-12-14 1984-06-23 Fujitsu Ltd 半導体装置の熱抵抗測定方法
DD240461B3 (de) * 1985-08-26 1993-04-22 Tro Transformatoren Und Schalt Verfahren zur pruefung von primaerwicklungen von induktiven spannungswandlern
FR2592489B1 (fr) 1985-12-27 1988-02-12 Bull Sa Procede et dispositif de mesure de la resistance thermique d'un element tel qu'un equipement de circuits integres de haute densite.
JPH0735813A (ja) * 1993-07-22 1995-02-07 Omron Corp 熱抵抗測定装置
CN2269589Y (zh) 1996-08-15 1997-12-03 中国工程物理研究院流体物理研究所 熔质内部高温跟踪测量装置
PL187668B1 (pl) 1998-11-25 2004-08-31 Akademia Morska W Gdyni Sposób i układ do pomiaru rezystancji termicznej inteligentnego unipolarnego obwodu scalonego mocy
JP2004317432A (ja) 2003-04-18 2004-11-11 Juki Corp 半導体デバイスの温度調節装置及び半導体デバイスの検査装置
TW200828355A (en) 2006-12-25 2008-07-01 Digipower Mfg Inc Heat sink device for reducing the thermal resistance of winding coil inside the transformer
CA2698428C (en) * 2007-08-16 2017-05-30 Radian Research, Inc. Instrument transformer test equipment and method

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EP2746790A2 (en) 2014-06-25
PL2746790T3 (pl) 2020-05-18
EP2746790A3 (en) 2017-04-19

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