Classifications

• • H—ELECTRICITY
  • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
  • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
  • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
  • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
  • Y02E10/00—Energy generation through renewable energy sources
  • Y02E10/50—Photovoltaic [PV] energy

Definitions

• the present invention relates to a method for fault diagnosis on a solar module in which electric parameters are measured within the solar module and in the materials constituting a solar power system (wires, soldering etc.) to provide the possibility for carrying out the fault diagnosis even when the solar module is not exposed to sun light.
• solar cell modules are excited by both a DC BIAS and an AC voltage over a wide frequency range, and the impedance of the modules is measured as a function of the frequency response and the DC BIAS.
• Impedance spectroscopy is a tool in many areas of materials science and electrical device technology, and it has been applied to small area silicon solar cells as well as other solar cell types, in research laboratories.
• the IS technique is based on analysing the electrical response of a material, to an oscillating electromagnetic (EM) field.
• the EM field is applied as an alternating current (AC) or voltage at two electrical terminals in contact with the material.
• AC alternating current
• IS is widely applied in a broad class of materials systems and devices, including inorganic, organic and biological systems. In solar cell science and technology the most commonly applied frequency technique is admittance spectroscopy.
• admittance spectroscopy denominates a special method that operates at reverse voltage and evaluates the energy levels of the majority of carrier traps (in general, all those that cross the Fermi level) as well as trap densities of states.
• electrochemistry one is usually more interested in injecting electronic charge into the electrode, and the term generally adopted is electrochemical impedance spectroscopy (EIS).
• EIS electrochemical impedance spectroscopy
• TDR is often used to diagnose conventional transmission lines (mostly coaxial lines). This method consist of transmitting an electrical signal (usually a voltage pulse or voltage step) in a transmission line, and analyze the reflections that occur along the line. Indeed, if the signal experiences a fault on the line, a part of the signal will be reflected to the line input.
• an electrical signal usually a voltage pulse or voltage step
• An echometer is a device that generates electrical pulses and fitted with a screen showing the different reflections occurring.
• TDR time domain reflectometry
• a corresponding model for each component of this line should be defined. I n the field of photovoltaics, single conductor cables are commonly used, whereas in the case of transmission lines on which time domain reflectometry is generally applied (coaxial cables, parallel wire lines, etc.) which are composed of two conductors.
• TDR raises some difficulties in relation to photovoltaic modules strings. Issues related to methods of installation of plants on site (problems of parallelism between photovoltaic cables and the ground, etc.) and the multiple reflections occurring on a string make it difficult to interpret the results that could provide TDR. There is also a lack of sensitivity of the method: As the equivalent impedances of different parts of the string (cable and modules) are very high, it is almost impossible to detect a fault in the string, which would result in practice in a very low impedance variation. However when using a DC BIAS the impedance in the solar modules is lowered dramatically and hence the sensitivity achieved by the invention, i.e. the combined TDR apparatus and the DC potentiostat, allows for useful measurements.
• WO 2011/032993 A1 describes a method for characterising at least one solar cell module and monitoring changes over time, including changes attributable to faults.
• the method comprises applying an AC voltage with an amplitude of 10 V to 2 kV to the solar cells in a broad frequency range from 1 kHz to 2 MHz, and measuring the impedance as a function of the frequency. Changes in the impedance spectrum with respect to earlier recorded impedance spectra are detected. Computing means calculates measuring values from the detected changes, and measuring results from different points in time are stored.
• WO 201 1/032993 A1 does not envisage the use of a DC bias and evaluate the measurements in terms of fitting a physical model to the measured data.
• the present invention provides a method for the detection of material-specific changes in interconnected solar modules that temporally evolves in the processed materials of the modules and their interconnections, effected by outside and inner causes, before the occurrence of larger damages are recognizable.
• This is not possible with the system in WO 2011/032993 A1 , wherein even small variations in daylight that would otherwise seem invisible to the eye, are captured by the string of solar cells resulting in a continuous variation in photo-voltage.
• the present invention constitutes an improvement over WO 201 1/032993 A1 , wherein the reliability of the fault diagnosis in solar cell systems having multiple solar cell modules is improved. It is an object of the present invention to provide a more reliable method for fault diagnosis of solar cell modules.
• the present invention provides a method for diagnosing failure modes within a solar cell system including one or more solar cell modules, said method comprising the steps:
• a power potentiostat a constant electric potential or current in the form of a DC signal across/through the solar cell modules, said potential being in the range of -1000 to +1000 Volts DC (potentiostatic mode) or a DC current typically in the range of 5-10 Amperes (galvanostatic mode);
• system for diagnosing a fault within solar cell system including multiple solar cell modules, said system comprising: i) a power potentiostat for applying an electric BIAS in the form of a DC signal over the solar cell modules;
• an AC source for applying in addition to the DC voltage of i) an AC voltage, said AC source capable of scanning a frequency range from 1 Hz to 10MHz with a an AC amplitude up to 1000 Volts AC thereby generating an impedance spectrum;
• iii) means for comparing the impedance spectrum with a control impedance spectrum recorded from an intact solar cell system or recorded previously at the solar system in where the invention is installed;
• the present invention in a particularly preferred embodiment includes the use of time domain reflectometry (TDR) to specifically identify the type and physical position of a failure mode; a failure mode that is either present at installation, slowly developing or abruptly induced.
• TDR time domain reflectometry
• TDR time domain reflectometry
• DC BIAS DC voltage based fault diagnosis
• a particularly useful method and system for diagnosing failure modes within a solar cell system is achieved.
• the physical position is understood as the subsystem in the electrical circuit of solar cell modules and components.
• the system is a string of 7-10 modules in a series connection, and hence the failure mode will be identified in a single or a specific plural of modules in the string or its connections.
• a remarkable feature with respect to the impedance spectrum of semiconductor solar cells is that it depends totally on the operating point (l,V).
• V MPP , I MPP maximum power point
• , ⁇ , ) or to convert the data format: (real part, imaginary part, frequency) (Z reg Z jmg , ).
• a data point in this set is then typically considered as a vector in the complex plane.
• the impedance is thus characterized as a function of specific physical parameters P, as well as the actual age, t PV of the solar cell installation, so the impedance function is noted as Z(P t pv )
• the result will be a list of parameters.
• the model is a mathematical function, and this function (equation) is deduced when the applied equivalent circuit is analysed.
• Complex solar module connections will have a complex equivalent circuit and less complex systems, e.g. simple strings of modules, will have a less complex equivalent circuit.
• the specific model used for analysis is therefore tailored to the specific system, or group of systems.
• the result of the automated fitting procedure is stored and used for comparison when a new spectrum is recorded at a later time.
• the physical model will depend on the system, but typically equivalent circuit models based on transmission lines will be employed for analysis of impedance spectra.
• the result of the automated fitting procedure is stored and used for comparison when a new spectrum is recorded at a later time.
• the impedance spectrum and hence the model parameters that can be deduced, will have a characteristic frequency and a strong DC potential dependence.
• Normally features in the impedance spectrum arising from leeds, wires, soldering, and other metallic (ohmic) materials wi l l show at the highest freq uencies wh i le features arising from the semiconductor materials in the solar cells will show at medium frequencies.
• impedance features observed as curve/peak shapes in either a Nyquist or a Bode type plot
• the aim is to characterize the solar installation at different times, t PV , throughout the entire lifetime and search for faults.
• the present invention provides a method for the detection of material-specific changes in interconnected solar modules that temporally evolves in the processed materials of the modules and their interconnections, effected by outside and inner causes, before the occurrence of larger damages are recognizable. Also a regular quality control of the produced modules and their installation in a solar generator must be possible.
• a group of interconnected solar cell modules are subjected to both DC and AC voltage over a great frequency range and the impedance is recorded as a function of the frequency response measured. These measurements can be repeated at even intervals. From one measurement to the next the change of the measurement data is an indication for changes in the used materials or interconnection of the solar generator.
• the DC power potentiostat may also serve to keep the energy yield high by boosting the voltage of a number of solar cells.
• I n response of the inner and outside inductances, capacitances and resistances the ageing condition produce a characteristic frequency response of the impedance (impedance spectrum), for a given design of the devices.
• These outside and inner infl uences are e. g . the UV irradiation, temperature, temperature changes, the concentration of humidity and duration thereof.
• the course of the impedance as function of an AC and DC BIAS in series or parallel
• the impedance for the characterization of resultant changes and for the early recognition of malfunctions such as corrosion, contact problems, and de-lamination all of which decrease the efficiency and potentially the lifetime of the entire system .
• the method allows to distinguish between performance degradation that stems from interior faults suchs as described above or external faults caused by shading, dirt etc.
• the system consisting (the invention) of a central database and measurement device (C and B in figure 1) may be installed in existing systems before or after the DC to AC power inverter.
• Fig. 1 shows the system for analysis in a schematic form.
• Fig. 2 shows the device that is used to characterise a series of solar units.
• FIG. 1 there is shown the system for analysis in a schematic form.
• A, A ' and A " is a sequence of subunits of a larger photovoltaic power system (typically A will be a so called string consisting of typically 7-10 modules)
• B is the characterization device containing a DC potentiostat capable of operating both in potentiostatic or galvanostatic mode, an AC frequency generator, a frequency response analyser (FRA) and a computer with network access to other computers in the system
• C is a central database (CDB) that can store and analyse data.
• the units A, B and C are meant to automatically interact based on a computer control carried out in CDB computer system. Connections between A and B (including switches) shows that one B device may characterise a series of subunits by using a switch.
• Fig. 2 shows the main characterization device which consist of a) a DC power potentiostat, b) an AC frequency generator, c) a frequency response analyser and d) an integrated control computer that can control the measurement, store data and communicate with mainly central data base (see figure 1).
• the method of the present invention preferably involves the following aspects: 1) Scanning routine at a certain electric potential set either by the power potentiostat or by illumination, on a subunit of the the solar power system (typically a string) which is an electrically isolated subunit of the whole photovoltaic system.
• the instruction to perform a scan can be a part of a planned routine or it can be based on the event where the analysis procedure identifies a significant difference between collected data sets. The latter will automatically initiate further data collection, in depth analysis and potentially and alarm will be generated.
• Instructions from the CDB to perform a scan or initiate some other action is based on previously collected data as well as special control algorithms installed on the CDB main computer.
• the measurement device (B in figure 1) will help right after installation of solar modules, in finding subunits that does not perform as expected and help to clarify what needs to be done in order to restore the photovoltaic power plant.
• the system is able to monitor and evaluate photovoltaic power systems, and hence the system is furthermore intended as a financial forecasting tool that can be used for evaluating new types of solar cells with unknown life cycles.
• TDR Time domain reflectometry
• the TDR method is used to further characterise the failure mode and hence act as a supplement to the impedance method.
• the signal reflection profile depends on the impedance in the transmission line and therefore the TDR measurement is sensitive to the BIAS settings on the DC potentiostat.
• the TDR measurement can be carried out at any BIAS set by the DC potentiostat.
• the TDR measurement hardware is be based on extensions of the main impedance measurement hardware. This means that the frequency generator is constructed so that it can deliver continous AC voltage or current in a wide frequency interval as well as voltage or current pulses.
• the pulse rise time (duration) is in the range below nanosecond to 1 ms.
• the amplitude of the pulse is in the range from microvolts to about 100 V.
• the detection of the reflected pulse is based on an extended frequency response analyzer (FRA) device.
• FRA extended frequency response analyzer
• the actual measurement of the initial pulse and the reflected pulse is a time based measurement where either the voltage or current is detected as a function time.
• Data is recorded and stored in the FRA, and subsequently transferred to the central database. TDR data is thus recorded and stored on a daily basis. Any deviation in signal reflection profile can hence be detected by comparing two or more measurements.
• the hardware governing the invention must be connected to the two electrical terminals of some connection of solar modules.
• the realisation involves that the invention is either considered as a stand-alone system or as an integrated part of the DC to AC inverter.
• the entire fault detection system may be installed in different types of inverters such as string inverters, central inverters, micro inverters and parallel inverters.
• the hardware used according to this embodiment of the invention comprises a DC potentiostat, a frequency generator, and a frequency response analyser (FRA). These hardware parts may also serve other purposes if integrated in the inverter.
• the DC potentiostat can be used as an electronic load for keeping energy yields as high as possible. Especially the potentiostat is able to keep the assembly of connected solar modules at the maximum power point (MPP) thereby ensuring maximum yield by keeping the product of photovoltage and photocurrent optimized for maximum power extraction. If a failure mode is identified by the system it is in some cases relevant to draw less current in the solar module system to minimize heating effects, and in this case the DC potentiostat is used specifically for keeping the system at the maximum allowed power point.
• MPP maximum power point
• a well known and dangerous failure mode is the occurrence of light arcs between the conducting parts of the module and components.
• Light arcs are static ion channels that will establish transport of sufficiently high electrical currents, i.e. charge transport takes place through a plasma.
• the plasma is very hot and naturally all combustible materials in the vicinity of the arc will catch on fire and burn.
• the light arc is observed as a dramatic change in system impedance and hence it can be identified.
• the invention discloses the automatic detection of light arcs by the impedance method or by the TDR method, and the disruption of DC current via the inverter, short circuiting via the inverter or setting up a DC current with the potentiostat that exactly opposes and cancels out the current causing the light arc.

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• 2012
  • 2012-05-08 EP EP12782685.7A patent/EP2707739A4/de not_active Withdrawn
  • 2012-05-08 WO PCT/DK2012/050154 patent/WO2012152284A1/en active Application Filing
  • 2012-05-08 CN CN201280029904.6A patent/CN103733510A/zh active Pending
  • 2012-05-08 US US14/116,551 patent/US20140111220A1/en not_active Abandoned
  • 2012-05-08 JP JP2014509606A patent/JP2014514582A/ja active Pending

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