EP2645529A1 - Agencement de circuit et procédé de test d'une branche de diodes lumineuses d'un agencement de circuit - Google Patents

Agencement de circuit et procédé de test d'une branche de diodes lumineuses d'un agencement de circuit Download PDF

Info

Publication number
EP2645529A1
EP2645529A1 EP13161845.6A EP13161845A EP2645529A1 EP 2645529 A1 EP2645529 A1 EP 2645529A1 EP 13161845 A EP13161845 A EP 13161845A EP 2645529 A1 EP2645529 A1 EP 2645529A1
Authority
EP
European Patent Office
Prior art keywords
light
emitting diode
current
branch
diode branch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP13161845.6A
Other languages
German (de)
English (en)
Other versions
EP2645529B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DIN Dietmar Nocker Facilitymanagement GmbH
Original Assignee
DIN Dietmar Nocker Facilitymanagement GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DIN Dietmar Nocker Facilitymanagement GmbH filed Critical DIN Dietmar Nocker Facilitymanagement GmbH
Publication of EP2645529A1 publication Critical patent/EP2645529A1/fr
Application granted granted Critical
Publication of EP2645529B1 publication Critical patent/EP2645529B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/50—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits
    • H05B45/52—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits in a parallel array of LEDs
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/50—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits

Definitions

  • the invention relates to a circuit arrangement and a method for testing a light diode branch of a circuit arrangement, in particular emergency lighting, on functionality of its LEDs, wherein the light emitting diode branch comprises a plurality of light-emitting diodes and at least one resistor in series, in which method the light-emitting diode branch of its operating state under the influence of a constant electrical current is converted with at least a first current in a test state under impressing an electric current with a different current, wherein, taking into account at least one direct or indirect measurement of at least one electrical variable of the circuit arrangement of the LED branch is tested.
  • a short circuit of one or more light-emitting diodes can disadvantageously lead to considerable currents in the circuit arrangement, whereby damage to other circuit parts is to be feared.
  • the storage of standard current values for the purpose of a current comparison is relatively complex and also represents a relatively unreliable approach to fault detection - among other reasons, because currents are also due to aging phenomena the LEDs can change.
  • a method for detecting a function failure of a light-emitting diode which is based on the comparison with the standard current value and does not take these circumstances into consideration, can thus fail.
  • the invention achieves the stated object with regard to the method in that the light-emitting diode branch, which has at least two parallel light-emitting diodes, each with a resistor in series, a constant electric current is impressed in the test state and that in the operating and test state as electrical variable depending on a voltage at least is measured over the light-emitting diode branch, wherein the light-emitting diode branch is tested for functionality of its light-emitting diode or light-emitting diodes, taking into account the voltages measured in the operating and test states.
  • the light-emitting diode branch has at least two parallel light-emitting diodes, each with a resistor in series, it may be possible for the functional state of the light-emitting diode branch to be checked reliably and reliably. If, for example, a constant electric current is impressed on the light-emitting diode branch in the test state, it is possible inter alia to prevent inadmissible high current strengths from forming in the circuit arrangement in the event of a possible short circuit of a light-emitting diode. Thus, damage to the circuitry during the test condition can be easily avoided, which can ensure a safe method of testing functionality.
  • a voltage is measured at least across the light-emitting diode branch, the light-emitting diode branch being tested for functionality of its light-emitting diode or light-emitting diodes, taking into account the voltages measured in the operating and test states, in contrast to the prior art stored standard values for the purpose of a
  • Verification of the functionality of the light emitting diode path or the LED branch are omitted. Namely, only the voltage levels measured in the operating and test states can be sufficient to ensure a reliable and reliable testing of preferably all LEDs of the light-emitting diode branch. With this functional test of the light-emitting diode or light-emitting diodes according to the invention, greater certainty can now be gained as to whether the light-emitting diode branch functions within the planned framework conditions or whether certain properties are present or not.
  • the non-linearity of the voltage-current characteristic of a light emitting diode no longer applies, whereby the resistors contribute to increased voltage shifts.
  • This can result in particular from the parallel connection of the light-emitting diodes with their series resistance.
  • a comparatively simple method for checking the operation of a light-emitting diode can be provided.
  • the method according to the invention is also comparatively robust.
  • aging of the light-emitting diode also has only a slight effect on the method result, because even aged light-emitting diodes lead to a non-linear voltage-current characteristic and thus enable testing of the light-emitting diode or the light-emitting diodes according to the invention.
  • the method by the voltage tap on the LED branch almost no dependence on the structural design, so that can result in a very versatile application or a wide range of applications.
  • the method can also be used where the light-emitting diode branch has a plurality of light-emitting diodes connected in series and in parallel, each with a resistor in series.
  • the light-emitting diode branch has a plurality of light-emitting diodes connected in series and in parallel, each with a resistor in series.
  • a comparatively simple procedure can result if the test takes into account a ratio of the voltages measured in the operating and test states. In particular, however, the quotient of the voltage values can contribute to a meaningful result and thus to a reliable test of the light-emitting diode.
  • the risk of electrical damage to the light-emitting diode branch due to overloading can be kept low in the test state. This even if there is already an electrical defect in the light-emitting diode branch.
  • the invention achieves the stated object with regard to the circuit arrangement in that the light-emitting diode branch has at least two parallel light-emitting diodes each with a resistor in series, and in that the constant current source in the producible current intensity is variable with regard to its constant current, the test device for a test state of the light diode branch is connected to the constant current source for generating a constant current of a current different from the constant current and wherein the test device has a voltage measuring circuit with a Meßabgriff at least the light-emitting diode branch for measuring each voltage in its operating and test state as a measuring circuit.
  • Constructive simplicity may result when using a constant current source that is variably variable in the current that can be generated with respect to its constant current to operate the light emitting diode branch in different current states, which light emitting diode branch has at least two parallel light emitting diodes each in series.
  • the test device may be connected to the constant current source for generating a constant current of a different current to the constant current.
  • the determination of defects in the light-emitting diode branch can be made particularly reliable if the test device has a voltage measuring circuit with a measuring tap as measuring circuit over at least the light-emitting diode branch for measuring a respective voltage in its operating and test state. Since relatively simple construction can be measured over the entire light-emitting diode branch, thus also simplify the design requirements.
  • the circuit arrangement can check the operation of the light-emitting diode branch with particular certainty or can also be used there when the light-emitting diode branch has a plurality of light-emitting diodes connected in series and in parallel, each with a resistor in series.
  • test device has a ratio circuit for forming a ratio of the voltages to one another in the operating and test state of the light-emitting diode branch, a comparatively high degree of constructive simplicity can be achieved in the circuit arrangement.
  • the circuit arrangement can be protected against overloads in the test state in that the other current intensity of the constant current is lower than the first current intensity of the constant electrical current.
  • a light-emitting diode branch 2 with six parallel LEDs (LED) 3 is shown, each of which a resistor 4 is connected in series.
  • This parallel circuit 5 is connected in series with a further parallel circuit 6, which also has six parallel LEDs 3, each with a resistor 4 in series.
  • the resistors 4 are used to balance the brightness of the light-emitting diodes 3, and are designed the same impedance in their impedance.
  • the light-emitting diode branch 2 is supplied with a constant electric current I 1 or impressed on this light-emitting diode branch in order to supply it with electrical power.
  • a constant current source 7 is used.
  • the constant current intensity for generating the current I 1 can be adjusted, for example, according to the brightness requirements and this constant current intensity can certainly also be adapted to a changing brightness requirement - for example: by dimming.
  • Such a setting of the desired current intensity can also be carried out by a test device 8, which measures the voltage across this resistor 9 via a resistor 9 known in the impedance and regulates the constant current source 7 with regard to the desired constant current intensity.
  • This LED branch 2 is tested or checked for the functionality of its LEDs 3 by the LED branch 2 is transferred from its operating state in a test state.
  • the light-emitting diode branch 2 is charged with an electric current I 2 having a current intensity which differs from the current intensity of the constant current I 1 in the operating state, which is lower here, which protects the light-emitting diode branch 2 against electrical overloading.
  • a constant electric current I 2 is likewise impressed in the test state.
  • the constant current source 7 is made variable in the generatable current with respect to its constant current I 1 and I 2 .
  • a test device 8 switches the constant current source 7 from a constant current I 1 to a constant current I 2 in that the test device 8, which is connected to the constant current source 7 in the control network, actuates a control line 10.
  • the light emitting diodes 3 are now tested for their functionality. As in of the Fig. 1 shown, these voltages U 1 and U 2 are measured at the measuring tap 11 on the light-emitting diode branch 2 in the operating and test condition.
  • Fig. 2 exemplifies the effects of various defects of a circuit arrangement illustrated. If there is no defect of a light-emitting diode 3, the voltage-current characteristic 12 results. If one of the light-emitting diodes 3 is defective in that it leads to a short circuit, a voltage-current characteristic 13 can be observed. If three light-emitting diodes 3 of the light-emitting diode branch 2 are defective in that they have a line break (open), the voltage-current characteristic 14 results.
  • the test device 8 has a voltage measuring circuit 15 with a measuring tap 11 on the light-emitting diode branch 2.
  • the voltage measuring circuit 15 is expanded with a ratio circuit 16.
  • the ratio circuit 16 stores-for example with the aid of a memory-the voltage U 1 measured in the operating state so that it can be compared with the voltage U 2 measured in the test state, for example with the aid of a comparator, which automates the test of the light-emitting diodes 2 facilitated.
  • the cases 13 and 14 differ in their ratios significantly compared to the damage-free case 12.
  • a flawless light-emitting branch 2 is due to the intact non-linear voltage-current characteristics of the light-emitting diodes 3, the ratio against 1.
  • the significant differences can be quickly detected, analyzed and reproducible from it a test result for the functioning of the LED branch 2 are formed.
  • Fig. 3 shows the general principles of the invention. A parallel circuit each of a light-emitting diode 3 in series with a resistor 4 is checked for proper functioning here.

Landscapes

  • Led Devices (AREA)
EP13161845.6A 2012-03-29 2013-03-29 Agencement de circuit et procédé de test d'une branche de diodes lumineuses d'un agencement de circuit Active EP2645529B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ATA50111/2012A AT512751B1 (de) 2012-03-29 2012-03-29 Schaltungsanordnung und Verfahren zum Testen eines Leuchtdiodenzweigs einer Schaltungsanordnung

Publications (2)

Publication Number Publication Date
EP2645529A1 true EP2645529A1 (fr) 2013-10-02
EP2645529B1 EP2645529B1 (fr) 2017-02-15

Family

ID=48040050

Family Applications (1)

Application Number Title Priority Date Filing Date
EP13161845.6A Active EP2645529B1 (fr) 2012-03-29 2013-03-29 Agencement de circuit et procédé de test d'une branche de diodes lumineuses d'un agencement de circuit

Country Status (2)

Country Link
EP (1) EP2645529B1 (fr)
AT (1) AT512751B1 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014122291A1 (fr) * 2013-02-11 2014-08-14 Weidmüller Interface GmbH & Co. KG Installation d'éclairage et procédé de détermination de l'état de fonctionnement d'une installation d'éclairage
RU2617148C1 (ru) * 2016-02-01 2017-04-21 Федеральное государственное бюджетное учреждение науки Научно-технологический центр микроэлектроники и субмикронных гетероструктур Российской академии наук (НТЦ микроэлектроники РАН) Способ тестирования светодиода

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102016206878A1 (de) * 2016-04-22 2017-10-26 Siemens Aktiengesellschaft Funktionsüberwachung von LED-Lichtzeichen
DE102021116149A1 (de) 2021-06-22 2022-12-22 H4X E.U. Stromversorgungsanordnung und leuchtensystem

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0793402A1 (fr) * 1996-02-28 1997-09-03 Valeo Electronique Circuit d'illumination à diodes électroluminescentes, notamment pour véhicules automobiles, feu de signalisation, et tableau de commande, l'incorporant
US20050242822A1 (en) * 2004-04-30 2005-11-03 Siemens Aktiengesellschaft Method and device for testing at least one LED strip
EP1839928A2 (fr) * 2006-03-29 2007-10-03 KOMPLED GmbH & Co. KG Dispositif d'éclairage pour véhicule
DE102006018575A1 (de) * 2006-04-21 2007-10-25 Tridonicatco Gmbh & Co. Kg Fehlererkennung von Leuchtdioden
WO2008061301A1 (fr) * 2006-11-20 2008-05-29 Lednium Technology Pty Limited Détecteur de défauts et procédé de détection de défauts pour éclairage
DE102009029930B3 (de) * 2009-06-19 2010-11-25 Heraeus Noblelight Gmbh Verfahren zur Erkennung eines Ausfalls zumindest einer LED
DE102011078441A1 (de) * 2010-06-30 2012-01-05 Denso Corporation Beleuchtungssteuervorrichtung mit Diagnose- und Warneigenschaft

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3450001B1 (ja) * 2002-11-21 2003-09-22 株式会社テクノローグ Ｌｅｄの劣化検査方法
DE10336973B4 (de) * 2003-08-12 2016-12-29 Hella Kgaa Hueck & Co. Verfahren zur Überwachung einer Leuchtdiode
US20050062481A1 (en) * 2003-09-19 2005-03-24 Thomas Vaughn Wayside LED signal for railroad and transit applications
US7800876B2 (en) * 2006-01-09 2010-09-21 Microsemi Corp. - Analog Mixed Signal Group Ltd. Fault detection mechanism for LED backlighting
KR101676440B1 (ko) * 2010-01-18 2016-11-16 삼성디스플레이 주식회사 백라이트 유닛, 이의 구동 방법 및 이상 검출 방법

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0793402A1 (fr) * 1996-02-28 1997-09-03 Valeo Electronique Circuit d'illumination à diodes électroluminescentes, notamment pour véhicules automobiles, feu de signalisation, et tableau de commande, l'incorporant
US20050242822A1 (en) * 2004-04-30 2005-11-03 Siemens Aktiengesellschaft Method and device for testing at least one LED strip
EP1839928A2 (fr) * 2006-03-29 2007-10-03 KOMPLED GmbH & Co. KG Dispositif d'éclairage pour véhicule
DE102006018575A1 (de) * 2006-04-21 2007-10-25 Tridonicatco Gmbh & Co. Kg Fehlererkennung von Leuchtdioden
WO2008061301A1 (fr) * 2006-11-20 2008-05-29 Lednium Technology Pty Limited Détecteur de défauts et procédé de détection de défauts pour éclairage
DE102009029930B3 (de) * 2009-06-19 2010-11-25 Heraeus Noblelight Gmbh Verfahren zur Erkennung eines Ausfalls zumindest einer LED
DE102011078441A1 (de) * 2010-06-30 2012-01-05 Denso Corporation Beleuchtungssteuervorrichtung mit Diagnose- und Warneigenschaft

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014122291A1 (fr) * 2013-02-11 2014-08-14 Weidmüller Interface GmbH & Co. KG Installation d'éclairage et procédé de détermination de l'état de fonctionnement d'une installation d'éclairage
RU2617148C1 (ru) * 2016-02-01 2017-04-21 Федеральное государственное бюджетное учреждение науки Научно-технологический центр микроэлектроники и субмикронных гетероструктур Российской академии наук (НТЦ микроэлектроники РАН) Способ тестирования светодиода

Also Published As

Publication number Publication date
EP2645529B1 (fr) 2017-02-15
AT512751B1 (de) 2015-03-15
AT512751A1 (de) 2013-10-15

Similar Documents

Publication Publication Date Title
DE102010002707B4 (de) Fehlererkennung für eine Serienschaltung von Leuchtdioden
DE112014002911B4 (de) LED-Treiber mit umfassendem Fehlerschutz
DE102012107766B4 (de) Fehlererkennung für eine Serienschaltung elektrischer Lasten
EP2645529B1 (fr) Agencement de circuit et procédé de test d'une branche de diodes lumineuses d'un agencement de circuit
DE102015008110B4 (de) Verfahren zur Überwachung mindestens zweier unterschiedlich langer LED-Ketten
EP3631976B1 (fr) Procédé servant à identifier un contact défectueux dans une installation photovoltaïque
DE102015116943A1 (de) Detektion eines einzelnen LED-Fehlers in einer LED-Kette
WO2017136864A1 (fr) Procédé et dispositif ict de contrôle de modules d'un dispositif d'éclairage qui contiennent au moins deux led
DE102013013950A1 (de) Verfahren, Messanordnung und Messgerät zur Bestimmung von lsolationswiderständen von Einzelzellen einer Hochvoltbatterie
DE202010016782U1 (de) Spannungsanzeigevorrichtung
DE102020132666B3 (de) Vorrichtung und Verfahren zur sicherheitsrelevanten Erfassung des Spannungsabfalls über ein Leuchtmittel in einem Fahrzeug
EP2866526A1 (fr) Circuit à DEL et procédé de fonctionnement d'un circuit à DEL
DE1538609C3 (de) Transistorisierte Schaltungsanordnung zum automatischen Prüfen gedruckter Leitungszüge
DE102013219490A1 (de) Verfahren und Vorrichtung zum Lokalisieren eines Lichtbogens in einem Strompfad einer Fotovoltaikanlage
DE112007000397T5 (de) Messvorrichtung und Messverfahren
DE102013107699A1 (de) Spannungsbegrenzer
DE102011105550B4 (de) Treiberanordnung, Beleuchtungsanordnung und Verfahren zur Detektion eines Fehlerzustandes einer Leuchteinheit
WO2019091824A1 (fr) Système d'accumulateur à batterie
EP1986935B1 (fr) Dispositif de contrôle d'une platine électrotechnique avec une piste conductrice
DE102012004944B4 (de) Verfahren zum Überprüfen der Funktion von elektrischen Anschlüssen eines analogen oder digitalen Schaltkreises
DE102020008118A1 (de) Verfahren zur sicherheitsrelevanten Erfassung des Spannungsabfalls über ein Leuchtmittel in einem Fahrzeug
DE102013223478A1 (de) Vorrichtung zum Ansteuern einer Last
DE102015017315B3 (de) Verfahren zur Überwachung mindestens zweier LED-Ketten mit LEDs unterschiedlicher Flussspannungen
WO2015192911A1 (fr) Procédé de détermination du nombre d'étages de semi-conducteurs intacts
DE102014207348A1 (de) Elektrische schaltung

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

AX Request for extension of the european patent

Extension state: BA ME

17P Request for examination filed

Effective date: 20140402

RBV Designated contracting states (corrected)

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

INTG Intention to grant announced

Effective date: 20160324

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAJ Information related to disapproval of communication of intention to grant by the applicant or resumption of examination proceedings by the epo deleted

Free format text: ORIGINAL CODE: EPIDOSDIGR1

GRAL Information related to payment of fee for publishing/printing deleted

Free format text: ORIGINAL CODE: EPIDOSDIGR3

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

INTC Intention to grant announced (deleted)
INTG Intention to grant announced

Effective date: 20160824

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

REG Reference to a national code

Ref country code: CH

Ref legal event code: EP

Ref country code: GB

Ref legal event code: FG4D

Free format text: NOT ENGLISH

REG Reference to a national code

Ref country code: IE

Ref legal event code: FG4D

Free format text: LANGUAGE OF EP DOCUMENT: GERMAN

REG Reference to a national code

Ref country code: AT

Ref legal event code: REF

Ref document number: 868391

Country of ref document: AT

Kind code of ref document: T

Effective date: 20170315

REG Reference to a national code

Ref country code: DE

Ref legal event code: R096

Ref document number: 502013006354

Country of ref document: DE

REG Reference to a national code

Ref country code: NL

Ref legal event code: MP

Effective date: 20170215

REG Reference to a national code

Ref country code: LT

Ref legal event code: MG4D

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: HR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: NO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170515

Ref country code: FI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: PT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170615

Ref country code: NL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: ES

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: LV

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: RS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: BG

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170515

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: CZ

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: RO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: EE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: IT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

REG Reference to a national code

Ref country code: CH

Ref legal event code: PL

REG Reference to a national code

Ref country code: DE

Ref legal event code: R097

Ref document number: 502013006354

Country of ref document: DE

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: MC

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: DK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: SM

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: PL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

REG Reference to a national code

Ref country code: IE

Ref legal event code: MM4A

REG Reference to a national code

Ref country code: FR

Ref legal event code: ST

Effective date: 20171130

26N No opposition filed

Effective date: 20171116

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20170515

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20170329

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20170418

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: LI

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20170331

Ref country code: CH

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20170331

Ref country code: IE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20170329

REG Reference to a national code

Ref country code: BE

Ref legal event code: MM

Effective date: 20170331

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20170515

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: BE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20170331

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: MT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: HU

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT; INVALID AB INITIO

Effective date: 20130329

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CY

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20170215

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: MK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: TR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: AL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170215

Ref country code: IS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20170615

P01 Opt-out of the competence of the unified patent court (upc) registered

Effective date: 20230514

REG Reference to a national code

Ref country code: DE

Ref legal event code: R081

Ref document number: 502013006354

Country of ref document: DE

Owner name: DIN - DIETMAR NOCKER FACILITYMANAGEMENT GMBH &, AT

Free format text: FORMER OWNER: DIN - DIETMAR NOCKER FACILITYMANAGEMENT GMBH, LINZ, AT

REG Reference to a national code

Ref country code: AT

Ref legal event code: PC

Ref document number: 868391

Country of ref document: AT

Kind code of ref document: T

Owner name: DIN-DIETMAR NOCKER FACILITYMANAGEMENT GMBH & C, AT

Effective date: 20240122

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: AT

Payment date: 20240318

Year of fee payment: 12

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20240321

Year of fee payment: 12