EP2503346A3 - Circuit de réinitialisation ayant un seuil sélectionnable - Google Patents

Circuit de réinitialisation ayant un seuil sélectionnable Download PDF

Info

Publication number
EP2503346A3
EP2503346A3 EP12160380.7A EP12160380A EP2503346A3 EP 2503346 A3 EP2503346 A3 EP 2503346A3 EP 12160380 A EP12160380 A EP 12160380A EP 2503346 A3 EP2503346 A3 EP 2503346A3
Authority
EP
European Patent Office
Prior art keywords
voltage
circuit
threshold
fraction
reset
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP12160380.7A
Other languages
German (de)
English (en)
Other versions
EP2503346A2 (fr
EP2503346B1 (fr
Inventor
William E. Edwards
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP USA Inc
Original Assignee
Freescale Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Freescale Semiconductor Inc filed Critical Freescale Semiconductor Inc
Publication of EP2503346A2 publication Critical patent/EP2503346A2/fr
Publication of EP2503346A3 publication Critical patent/EP2503346A3/fr
Application granted granted Critical
Publication of EP2503346B1 publication Critical patent/EP2503346B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electronic Switches (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
EP12160380.7A 2011-03-24 2012-03-20 Circuit de réinitialisation ayant un seuil sélectionnable Active EP2503346B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US13/071,025 US8531194B2 (en) 2011-03-24 2011-03-24 Selectable threshold reset circuit

Related Parent Applications (2)

Application Number Title Priority Date Filing Date
US201113071025 Previously-Filed-Application 2011-03-24
US13/071,025 Previously-Filed-Application US8531194B2 (en) 2011-03-24 2011-03-24 Selectable threshold reset circuit

Publications (3)

Publication Number Publication Date
EP2503346A2 EP2503346A2 (fr) 2012-09-26
EP2503346A3 true EP2503346A3 (fr) 2013-11-20
EP2503346B1 EP2503346B1 (fr) 2020-08-05

Family

ID=46027568

Family Applications (1)

Application Number Title Priority Date Filing Date
EP12160380.7A Active EP2503346B1 (fr) 2011-03-24 2012-03-20 Circuit de réinitialisation ayant un seuil sélectionnable

Country Status (4)

Country Link
US (1) US8531194B2 (fr)
EP (1) EP2503346B1 (fr)
JP (1) JP6095199B2 (fr)
CN (1) CN102692596B (fr)

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US9086434B1 (en) * 2011-12-06 2015-07-21 Altera Corporation Methods and systems for voltage reference power detection
US10284073B2 (en) * 2012-04-25 2019-05-07 Hamilton Sundstrand Corporation Power supply built-in testing
US9013202B2 (en) * 2012-05-23 2015-04-21 International Business Machines Corporation Testing structure and method of using the testing structure
US8742805B2 (en) * 2012-07-26 2014-06-03 Samsung Electro-Mechanics Co., Ltd. Power on reset device and power on reset method
US8928372B2 (en) 2013-03-08 2015-01-06 Taiwan Semiconductor Manufacturing Company, Ltd. Multiple power domain electronic device and related method
TW201504648A (zh) * 2013-07-25 2015-02-01 Terminus Technology Inc 利用僅既有的功能腳位實現通信介面的晶片
US9506979B2 (en) 2014-04-02 2016-11-29 Freescale Semiconductor, Inc. Test mode entry interlock
US9606563B2 (en) * 2014-04-08 2017-03-28 Texas Instruments Deutschland Gmbh Bandgap reference voltage failure detection
US9377804B2 (en) * 2014-04-10 2016-06-28 Qualcomm Incorporated Switchable package capacitor for charge conservation and series resistance
US9312850B2 (en) 2014-08-20 2016-04-12 Freescale Semiconductor, Inc. Testable power-on-reset circuit
US9634653B2 (en) * 2014-12-11 2017-04-25 Texas Instruments Incorporated Method and apparatus for a brown out detector
CN104490478A (zh) * 2015-01-09 2015-04-08 王小楠 医用射线定位薄膜及定位便捷的病变处拍照方法
DE102015215331A1 (de) 2015-08-11 2017-02-16 Continental Teves Ag & Co. Ohg Elektronische Steuerungseinheit
DE112016003662A5 (de) * 2015-08-11 2018-06-14 Continental Teves Ag & Co. Ohg Vorrichtung zum Messen einer Messgröße
CN105141119B (zh) * 2015-10-10 2018-01-05 上海灿瑞科技股份有限公司 一种上电清零和欠压锁定启动电路
KR20170071828A (ko) * 2015-12-16 2017-06-26 에스케이하이닉스 주식회사 반도체 장치 및 이를 포함하는 테스트 시스템
JP2017143448A (ja) * 2016-02-11 2017-08-17 アルパイン株式会社 リセット信号発生回路
DE102016202402A1 (de) 2016-02-17 2017-08-17 Continental Teves Ag & Co. Ohg Sensor
DE102016202403A1 (de) 2016-02-17 2017-08-17 Continental Teves Ag & Co. Ohg Sensor
US10228415B1 (en) * 2016-09-27 2019-03-12 Altera Corporation Apparatus and method for security in an integrated circuit
US10050618B1 (en) 2017-04-13 2018-08-14 Nxp Usa, Inc. Reset management circuit and method therefor
EP3451338B1 (fr) * 2017-08-30 2020-10-07 Nxp B.V. Circuit indicateur prêt à l'alimentation
US10620267B2 (en) * 2017-09-20 2020-04-14 Stmicroelectronics International N.V. Circuitry for testing non-maskable voltage monitor for power management block
US10317921B1 (en) * 2018-04-13 2019-06-11 Nxp Usa, Inc. Effective clamping in power supplies
JP6746659B2 (ja) * 2018-11-09 2020-08-26 華邦電子股▲ふん▼有限公司Ｗｉｎｂｏｎｄ Ｅｌｅｃｔｒｏｎｉｃｓ Ｃｏｒｐ． メモリデバイス及びその内蔵セルフテスト方法
US10979044B2 (en) * 2019-03-14 2021-04-13 Infineon Technologies Ag Chip reset via communication interface terminals
CN111157877B (zh) * 2019-12-31 2022-04-15 西安翔腾微电子科技有限公司 一种关态负载断路检测电路
JP7413082B2 (ja) * 2020-03-02 2024-01-15 メイコーエンベデッドプロダクツ株式会社 監視電圧閾値切替回路、リセット監視システム、制御信号生成回路が行う処理方法及びプログラム
CN111755035A (zh) * 2020-06-03 2020-10-09 深圳金茂电子有限公司 一种电源芯片管理系统及方法
TWI764168B (zh) * 2020-06-05 2022-05-11 大陸商北京集創北方科技股份有限公司 欠電壓檢測電路及利用其之控制器和電子設備
CN112986800B (zh) * 2021-02-19 2024-04-09 宏晶微电子科技股份有限公司 Por电路测试方法及装置
CN113315498B (zh) * 2021-05-27 2022-08-23 北京中电华大电子设计有限责任公司 一种高精度por电路

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5912562A (en) * 1997-02-04 1999-06-15 Motorola Inc. Quiescent current monitor circuit for wafer level integrated circuit testing
US20030035328A1 (en) * 2001-08-08 2003-02-20 Mitsubishi Denki Kabushiki Kaisha Semiconductor memory device shiftable to test mode in module as well as semiconductor memory module using the same
EP1684157A1 (fr) * 2004-09-29 2006-07-26 Alstom S.p.A. Circuit pour le contrôle de l'énergie électrique fournie aux circuits de traitement de données, notamment aux circuits de traitement de données à architecture redondante
US7711971B1 (en) * 2006-06-28 2010-05-04 Linear Technology Corporation Multi-input power supply supervisor

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US5103113A (en) 1990-06-13 1992-04-07 Texas Instruments Incorporated Driving circuit for providing a voltage boasted over the power supply voltage source as a driving signal
US5115146A (en) 1990-08-17 1992-05-19 Sgs-Thomson Microelectronics, Inc. Power-on reset circuit for controlling test mode entry
US5181203A (en) 1990-12-21 1993-01-19 Vlsi Technology, Inc. Testable power-on-reset circuit
US5149987A (en) 1991-08-19 1992-09-22 Vlsi Technology, Inc. Provision of circuit reset without a dedicated I/O pin
JPH05259859A (ja) 1992-02-28 1993-10-08 Oki Lsi Tekunoroji Kansai:Kk オート・クリヤー回路
US5394104A (en) 1992-06-25 1995-02-28 Xilinx, Inc. Power-on reset circuit including dual sense amplifiers
US5450417A (en) 1993-10-26 1995-09-12 Texas Instruments Incorporated Circuit for testing power-on-reset circuitry
US5991887A (en) 1996-02-28 1999-11-23 Dallas Semiconductor Corporation Low power wake up circuitry, with internal power down of the wake up circuitry itself
JPH10105255A (ja) * 1996-09-25 1998-04-24 Toshiba Microelectron Corp 低電圧検知回路
JPH10207580A (ja) * 1997-01-17 1998-08-07 Hitachi Ltd パワーオンリセット発生回路および半導体集積回路並びにｉｃカード
JP3288249B2 (ja) 1997-03-31 2002-06-04 東芝マイクロエレクトロニクス株式会社 パワーオンリセット回路
US6073263A (en) 1997-10-29 2000-06-06 Credence Systems Corporation Parallel processing pattern generation system for an integrated circuit tester
US6188257B1 (en) 1999-02-01 2001-02-13 Vlsi Technology, Inc. Power-on-reset logic with secure power down capability
US6618312B2 (en) 2001-05-04 2003-09-09 Texas Instruments Incorporated Method and device for providing a multiple phase power on reset
US7057427B2 (en) 2004-07-15 2006-06-06 Freescale Semiconductor, Inc Power on reset circuit
US7142024B2 (en) 2004-11-01 2006-11-28 Stmicroelectronics, Inc. Power on reset circuit
US7265595B1 (en) 2006-03-03 2007-09-04 Cypress Semiconductor Corporation Stochastic reset circuit
US7710105B2 (en) 2006-03-14 2010-05-04 Atmel Corporation Circuit reset testing methods
US7519486B2 (en) 2006-03-31 2009-04-14 Atmel Corporation Method and apparatus to test the power-on-reset trip point of an integrated circuit
US7589568B2 (en) * 2007-05-04 2009-09-15 Microchip Technology Incorporated Variable power and response time brown-out-reset circuit
JP4268655B1 (ja) * 2007-11-19 2009-05-27 シャープ株式会社 パワーオンリセット回路及びコンビ型ｉｃカード
JP5133804B2 (ja) * 2008-07-18 2013-01-30 ルネサスエレクトロニクス株式会社 リセット信号生成回路
CN101980445B (zh) * 2010-11-16 2012-08-08 成都国腾电子技术股份有限公司 高可靠零功耗复位电路

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5912562A (en) * 1997-02-04 1999-06-15 Motorola Inc. Quiescent current monitor circuit for wafer level integrated circuit testing
US20030035328A1 (en) * 2001-08-08 2003-02-20 Mitsubishi Denki Kabushiki Kaisha Semiconductor memory device shiftable to test mode in module as well as semiconductor memory module using the same
EP1684157A1 (fr) * 2004-09-29 2006-07-26 Alstom S.p.A. Circuit pour le contrôle de l'énergie électrique fournie aux circuits de traitement de données, notamment aux circuits de traitement de données à architecture redondante
US7711971B1 (en) * 2006-06-28 2010-05-04 Linear Technology Corporation Multi-input power supply supervisor

Also Published As

Publication number Publication date
CN102692596B (zh) 2016-12-14
JP2012205310A (ja) 2012-10-22
CN102692596A (zh) 2012-09-26
US8531194B2 (en) 2013-09-10
US20120242380A1 (en) 2012-09-27
EP2503346A2 (fr) 2012-09-26
JP6095199B2 (ja) 2017-03-15
EP2503346B1 (fr) 2020-08-05

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