EP2503346A3 - Circuit de réinitialisation ayant un seuil sélectionnable - Google Patents
Circuit de réinitialisation ayant un seuil sélectionnable Download PDFInfo
- Publication number
- EP2503346A3 EP2503346A3 EP12160380.7A EP12160380A EP2503346A3 EP 2503346 A3 EP2503346 A3 EP 2503346A3 EP 12160380 A EP12160380 A EP 12160380A EP 2503346 A3 EP2503346 A3 EP 2503346A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- voltage
- circuit
- threshold
- fraction
- reset
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electronic Switches (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/071,025 US8531194B2 (en) | 2011-03-24 | 2011-03-24 | Selectable threshold reset circuit |
Related Parent Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US201113071025 Previously-Filed-Application | 2011-03-24 | ||
US13/071,025 Previously-Filed-Application US8531194B2 (en) | 2011-03-24 | 2011-03-24 | Selectable threshold reset circuit |
Publications (3)
Publication Number | Publication Date |
---|---|
EP2503346A2 EP2503346A2 (fr) | 2012-09-26 |
EP2503346A3 true EP2503346A3 (fr) | 2013-11-20 |
EP2503346B1 EP2503346B1 (fr) | 2020-08-05 |
Family
ID=46027568
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP12160380.7A Active EP2503346B1 (fr) | 2011-03-24 | 2012-03-20 | Circuit de réinitialisation ayant un seuil sélectionnable |
Country Status (4)
Country | Link |
---|---|
US (1) | US8531194B2 (fr) |
EP (1) | EP2503346B1 (fr) |
JP (1) | JP6095199B2 (fr) |
CN (1) | CN102692596B (fr) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
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US9086434B1 (en) * | 2011-12-06 | 2015-07-21 | Altera Corporation | Methods and systems for voltage reference power detection |
US10284073B2 (en) * | 2012-04-25 | 2019-05-07 | Hamilton Sundstrand Corporation | Power supply built-in testing |
US9013202B2 (en) * | 2012-05-23 | 2015-04-21 | International Business Machines Corporation | Testing structure and method of using the testing structure |
US8742805B2 (en) * | 2012-07-26 | 2014-06-03 | Samsung Electro-Mechanics Co., Ltd. | Power on reset device and power on reset method |
US8928372B2 (en) | 2013-03-08 | 2015-01-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Multiple power domain electronic device and related method |
TW201504648A (zh) * | 2013-07-25 | 2015-02-01 | Terminus Technology Inc | 利用僅既有的功能腳位實現通信介面的晶片 |
US9506979B2 (en) | 2014-04-02 | 2016-11-29 | Freescale Semiconductor, Inc. | Test mode entry interlock |
US9606563B2 (en) * | 2014-04-08 | 2017-03-28 | Texas Instruments Deutschland Gmbh | Bandgap reference voltage failure detection |
US9377804B2 (en) * | 2014-04-10 | 2016-06-28 | Qualcomm Incorporated | Switchable package capacitor for charge conservation and series resistance |
US9312850B2 (en) | 2014-08-20 | 2016-04-12 | Freescale Semiconductor, Inc. | Testable power-on-reset circuit |
US9634653B2 (en) * | 2014-12-11 | 2017-04-25 | Texas Instruments Incorporated | Method and apparatus for a brown out detector |
CN104490478A (zh) * | 2015-01-09 | 2015-04-08 | 王小楠 | 医用射线定位薄膜及定位便捷的病变处拍照方法 |
DE102015215331A1 (de) | 2015-08-11 | 2017-02-16 | Continental Teves Ag & Co. Ohg | Elektronische Steuerungseinheit |
DE112016003662A5 (de) * | 2015-08-11 | 2018-06-14 | Continental Teves Ag & Co. Ohg | Vorrichtung zum Messen einer Messgröße |
CN105141119B (zh) * | 2015-10-10 | 2018-01-05 | 上海灿瑞科技股份有限公司 | 一种上电清零和欠压锁定启动电路 |
KR20170071828A (ko) * | 2015-12-16 | 2017-06-26 | 에스케이하이닉스 주식회사 | 반도체 장치 및 이를 포함하는 테스트 시스템 |
JP2017143448A (ja) * | 2016-02-11 | 2017-08-17 | アルパイン株式会社 | リセット信号発生回路 |
DE102016202402A1 (de) | 2016-02-17 | 2017-08-17 | Continental Teves Ag & Co. Ohg | Sensor |
DE102016202403A1 (de) | 2016-02-17 | 2017-08-17 | Continental Teves Ag & Co. Ohg | Sensor |
US10228415B1 (en) * | 2016-09-27 | 2019-03-12 | Altera Corporation | Apparatus and method for security in an integrated circuit |
US10050618B1 (en) | 2017-04-13 | 2018-08-14 | Nxp Usa, Inc. | Reset management circuit and method therefor |
EP3451338B1 (fr) * | 2017-08-30 | 2020-10-07 | Nxp B.V. | Circuit indicateur prêt à l'alimentation |
US10620267B2 (en) * | 2017-09-20 | 2020-04-14 | Stmicroelectronics International N.V. | Circuitry for testing non-maskable voltage monitor for power management block |
US10317921B1 (en) * | 2018-04-13 | 2019-06-11 | Nxp Usa, Inc. | Effective clamping in power supplies |
JP6746659B2 (ja) * | 2018-11-09 | 2020-08-26 | 華邦電子股▲ふん▼有限公司Winbond Electronics Corp. | メモリデバイス及びその内蔵セルフテスト方法 |
US10979044B2 (en) * | 2019-03-14 | 2021-04-13 | Infineon Technologies Ag | Chip reset via communication interface terminals |
CN111157877B (zh) * | 2019-12-31 | 2022-04-15 | 西安翔腾微电子科技有限公司 | 一种关态负载断路检测电路 |
JP7413082B2 (ja) * | 2020-03-02 | 2024-01-15 | メイコーエンベデッドプロダクツ株式会社 | 監視電圧閾値切替回路、リセット監視システム、制御信号生成回路が行う処理方法及びプログラム |
CN111755035A (zh) * | 2020-06-03 | 2020-10-09 | 深圳金茂电子有限公司 | 一种电源芯片管理系统及方法 |
TWI764168B (zh) * | 2020-06-05 | 2022-05-11 | 大陸商北京集創北方科技股份有限公司 | 欠電壓檢測電路及利用其之控制器和電子設備 |
CN112986800B (zh) * | 2021-02-19 | 2024-04-09 | 宏晶微电子科技股份有限公司 | Por电路测试方法及装置 |
CN113315498B (zh) * | 2021-05-27 | 2022-08-23 | 北京中电华大电子设计有限责任公司 | 一种高精度por电路 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5912562A (en) * | 1997-02-04 | 1999-06-15 | Motorola Inc. | Quiescent current monitor circuit for wafer level integrated circuit testing |
US20030035328A1 (en) * | 2001-08-08 | 2003-02-20 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device shiftable to test mode in module as well as semiconductor memory module using the same |
EP1684157A1 (fr) * | 2004-09-29 | 2006-07-26 | Alstom S.p.A. | Circuit pour le contrôle de l'énergie électrique fournie aux circuits de traitement de données, notamment aux circuits de traitement de données à architecture redondante |
US7711971B1 (en) * | 2006-06-28 | 2010-05-04 | Linear Technology Corporation | Multi-input power supply supervisor |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5103113A (en) | 1990-06-13 | 1992-04-07 | Texas Instruments Incorporated | Driving circuit for providing a voltage boasted over the power supply voltage source as a driving signal |
US5115146A (en) | 1990-08-17 | 1992-05-19 | Sgs-Thomson Microelectronics, Inc. | Power-on reset circuit for controlling test mode entry |
US5181203A (en) | 1990-12-21 | 1993-01-19 | Vlsi Technology, Inc. | Testable power-on-reset circuit |
US5149987A (en) | 1991-08-19 | 1992-09-22 | Vlsi Technology, Inc. | Provision of circuit reset without a dedicated I/O pin |
JPH05259859A (ja) | 1992-02-28 | 1993-10-08 | Oki Lsi Tekunoroji Kansai:Kk | オート・クリヤー回路 |
US5394104A (en) | 1992-06-25 | 1995-02-28 | Xilinx, Inc. | Power-on reset circuit including dual sense amplifiers |
US5450417A (en) | 1993-10-26 | 1995-09-12 | Texas Instruments Incorporated | Circuit for testing power-on-reset circuitry |
US5991887A (en) | 1996-02-28 | 1999-11-23 | Dallas Semiconductor Corporation | Low power wake up circuitry, with internal power down of the wake up circuitry itself |
JPH10105255A (ja) * | 1996-09-25 | 1998-04-24 | Toshiba Microelectron Corp | 低電圧検知回路 |
JPH10207580A (ja) * | 1997-01-17 | 1998-08-07 | Hitachi Ltd | パワーオンリセット発生回路および半導体集積回路並びにicカード |
JP3288249B2 (ja) | 1997-03-31 | 2002-06-04 | 東芝マイクロエレクトロニクス株式会社 | パワーオンリセット回路 |
US6073263A (en) | 1997-10-29 | 2000-06-06 | Credence Systems Corporation | Parallel processing pattern generation system for an integrated circuit tester |
US6188257B1 (en) | 1999-02-01 | 2001-02-13 | Vlsi Technology, Inc. | Power-on-reset logic with secure power down capability |
US6618312B2 (en) | 2001-05-04 | 2003-09-09 | Texas Instruments Incorporated | Method and device for providing a multiple phase power on reset |
US7057427B2 (en) | 2004-07-15 | 2006-06-06 | Freescale Semiconductor, Inc | Power on reset circuit |
US7142024B2 (en) | 2004-11-01 | 2006-11-28 | Stmicroelectronics, Inc. | Power on reset circuit |
US7265595B1 (en) | 2006-03-03 | 2007-09-04 | Cypress Semiconductor Corporation | Stochastic reset circuit |
US7710105B2 (en) | 2006-03-14 | 2010-05-04 | Atmel Corporation | Circuit reset testing methods |
US7519486B2 (en) | 2006-03-31 | 2009-04-14 | Atmel Corporation | Method and apparatus to test the power-on-reset trip point of an integrated circuit |
US7589568B2 (en) * | 2007-05-04 | 2009-09-15 | Microchip Technology Incorporated | Variable power and response time brown-out-reset circuit |
JP4268655B1 (ja) * | 2007-11-19 | 2009-05-27 | シャープ株式会社 | パワーオンリセット回路及びコンビ型icカード |
JP5133804B2 (ja) * | 2008-07-18 | 2013-01-30 | ルネサスエレクトロニクス株式会社 | リセット信号生成回路 |
CN101980445B (zh) * | 2010-11-16 | 2012-08-08 | 成都国腾电子技术股份有限公司 | 高可靠零功耗复位电路 |
-
2011
- 2011-03-24 US US13/071,025 patent/US8531194B2/en active Active
-
2012
- 2012-03-20 EP EP12160380.7A patent/EP2503346B1/fr active Active
- 2012-03-23 CN CN201210079180.8A patent/CN102692596B/zh active Active
- 2012-03-23 JP JP2012067874A patent/JP6095199B2/ja active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5912562A (en) * | 1997-02-04 | 1999-06-15 | Motorola Inc. | Quiescent current monitor circuit for wafer level integrated circuit testing |
US20030035328A1 (en) * | 2001-08-08 | 2003-02-20 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device shiftable to test mode in module as well as semiconductor memory module using the same |
EP1684157A1 (fr) * | 2004-09-29 | 2006-07-26 | Alstom S.p.A. | Circuit pour le contrôle de l'énergie électrique fournie aux circuits de traitement de données, notamment aux circuits de traitement de données à architecture redondante |
US7711971B1 (en) * | 2006-06-28 | 2010-05-04 | Linear Technology Corporation | Multi-input power supply supervisor |
Also Published As
Publication number | Publication date |
---|---|
CN102692596B (zh) | 2016-12-14 |
JP2012205310A (ja) | 2012-10-22 |
CN102692596A (zh) | 2012-09-26 |
US8531194B2 (en) | 2013-09-10 |
US20120242380A1 (en) | 2012-09-27 |
EP2503346A2 (fr) | 2012-09-26 |
JP6095199B2 (ja) | 2017-03-15 |
EP2503346B1 (fr) | 2020-08-05 |
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