EP2363877A1 - Verfahren zur chemischen Analyse - Google Patents

Verfahren zur chemischen Analyse Download PDF

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Publication number
EP2363877A1
EP2363877A1 EP10405080A EP10405080A EP2363877A1 EP 2363877 A1 EP2363877 A1 EP 2363877A1 EP 10405080 A EP10405080 A EP 10405080A EP 10405080 A EP10405080 A EP 10405080A EP 2363877 A1 EP2363877 A1 EP 2363877A1
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EP
European Patent Office
Prior art keywords
ionization
ions
group
methods
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
EP10405080A
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English (en)
French (fr)
Inventor
Marc Gonin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tofwerk AG
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Tofwerk AG
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Publication date
Application filed by Tofwerk AG filed Critical Tofwerk AG
Publication of EP2363877A1 publication Critical patent/EP2363877A1/de
Ceased legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/107—Arrangements for using several ion sources
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
EP10405080A 2010-03-02 2010-04-19 Verfahren zur chemischen Analyse Ceased EP2363877A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH2712010 2010-03-02

Publications (1)

Publication Number Publication Date
EP2363877A1 true EP2363877A1 (de) 2011-09-07

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Family Applications (1)

Application Number Title Priority Date Filing Date
EP10405080A Ceased EP2363877A1 (de) 2010-03-02 2010-04-19 Verfahren zur chemischen Analyse

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EP (1) EP2363877A1 (de)

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014118122A3 (en) * 2013-01-30 2014-12-04 Carl Zeiss Smt Gmbh Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
WO2014114803A3 (en) * 2013-01-28 2015-02-19 Westfälische Wilhelms-Universität Münster Parallel elemental and molecular mass spectrometry analysis with laser ablation sampling
CN105632877A (zh) * 2014-10-28 2016-06-01 中国科学院大连化学物理研究所 一种基于单光子电离和电子轰击电离的双离子源四极杆质谱仪
WO2016149658A1 (en) * 2015-03-16 2016-09-22 Sri International Ruggedized advanced identification mass spectrometer
WO2018050962A1 (en) * 2016-09-19 2018-03-22 Karsa Oy An ionization device
GB2556074A (en) * 2016-11-17 2018-05-23 Micromass Ltd Axial atmospheric pressure photo-ionization imaging source and inlet device
CN109841491A (zh) * 2017-11-27 2019-06-04 中国科学院大连化学物理研究所 一种光电离和化学电离组合离子源
DE102018106412A1 (de) * 2018-03-20 2019-09-26 Helmholtz-Zentrum Dresden - Rossendorf E.V. Teilchenspektrometer und Teilchenspektrometrieverfahren
WO2019217541A1 (en) * 2018-05-11 2019-11-14 Leco Corporation Two-stage ion source comprising closed and open ion volumes
CN110854009A (zh) * 2019-11-13 2020-02-28 上海裕达实业有限公司 宽范围质量测量离子源的质谱装置及其质谱方法
CN111199862A (zh) * 2018-11-20 2020-05-26 中国科学院大连化学物理研究所 一种毛细管微区电离源
CN111834195A (zh) * 2019-04-16 2020-10-27 广州禾信仪器股份有限公司 复合离子源及其使用方法和质谱仪
CN112133623A (zh) * 2020-09-14 2020-12-25 聚光科技(杭州)股份有限公司 VOCs走航监测装置
US10896814B2 (en) 2016-09-19 2021-01-19 Karsa Oy Ionization device
EP3817029A1 (de) * 2019-10-30 2021-05-05 Tofwerk AG Verfahren und vorrichtung zur massenanalyse einer ersten probe
CN114166927A (zh) * 2021-12-23 2022-03-11 上海裕达实业有限公司 检测多组分样品的质谱装置检测方法

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6469297B1 (en) 1999-04-15 2002-10-22 Hitachi, Ltd. Mass analysis apparatus and method for mass analysis
WO2005031306A2 (en) * 2003-09-24 2005-04-07 Syagen Technology Multiple ion sources involving atmospheric pressure photoionization
US20050247871A1 (en) * 2002-07-18 2005-11-10 Bryden Wayne A Combined chemical/biological agent detection system and method utilizing mass spectrometry
US20060091308A1 (en) * 2004-11-02 2006-05-04 Boyle James G Method and apparatus for multiplexing plural ion beams to a mass spectrometer
US7294830B2 (en) 2002-01-03 2007-11-13 Indiana University Research And Technology Corporation Simultaneous acquisition of chemical information
WO2008037073A1 (en) * 2006-09-25 2008-04-03 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Division Multiple sample sources for use with mass spectrometers, and apparatus, devices, and methods therefor
JP2008249694A (ja) * 2007-03-02 2008-10-16 Hitachi High-Technologies Corp 質量分析装置、質量分析用データ処理装置およびデータ処理方法
EP2112679A2 (de) * 2008-04-25 2009-10-28 Shimadzu Corporation Verfahren zum Verarbeiten von Massenanalysedaten und Massenspektrometer

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6469297B1 (en) 1999-04-15 2002-10-22 Hitachi, Ltd. Mass analysis apparatus and method for mass analysis
US7294830B2 (en) 2002-01-03 2007-11-13 Indiana University Research And Technology Corporation Simultaneous acquisition of chemical information
US20050247871A1 (en) * 2002-07-18 2005-11-10 Bryden Wayne A Combined chemical/biological agent detection system and method utilizing mass spectrometry
WO2005031306A2 (en) * 2003-09-24 2005-04-07 Syagen Technology Multiple ion sources involving atmospheric pressure photoionization
US20060091308A1 (en) * 2004-11-02 2006-05-04 Boyle James G Method and apparatus for multiplexing plural ion beams to a mass spectrometer
WO2008037073A1 (en) * 2006-09-25 2008-04-03 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Division Multiple sample sources for use with mass spectrometers, and apparatus, devices, and methods therefor
JP2008249694A (ja) * 2007-03-02 2008-10-16 Hitachi High-Technologies Corp 質量分析装置、質量分析用データ処理装置およびデータ処理方法
EP2112679A2 (de) * 2008-04-25 2009-10-28 Shimadzu Corporation Verfahren zum Verarbeiten von Massenanalysedaten und Massenspektrometer

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
BUCKNALL M ET AL: "Practical quantitative biomedical applications of MALDI-TOF mass spectrometry", JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROME, ELSEVIER SCIENCE INC, US, vol. 13, no. 9, 1 September 2002 (2002-09-01), pages 1015 - 1027, XP004381302, ISSN: 1044-0305, DOI: 10.1016/S1044-0305(02)00426-9 *

Cited By (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014114803A3 (en) * 2013-01-28 2015-02-19 Westfälische Wilhelms-Universität Münster Parallel elemental and molecular mass spectrometry analysis with laser ablation sampling
US9412574B2 (en) 2013-01-28 2016-08-09 Westfaelische Wilhelms-Universitaet Muenster Parallel elemental and molecular mass spectrometry analysis with laser ablation sampling
US10903060B2 (en) 2013-01-30 2021-01-26 Leybold Gmbh Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
TWI651532B (zh) * 2013-01-30 2019-02-21 德商卡爾蔡司Ｓｍｔ有限公司 氣體混合物之質譜檢測方法以及用於其之質譜儀
WO2014118122A3 (en) * 2013-01-30 2014-12-04 Carl Zeiss Smt Gmbh Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
CN105632877A (zh) * 2014-10-28 2016-06-01 中国科学院大连化学物理研究所 一种基于单光子电离和电子轰击电离的双离子源四极杆质谱仪
WO2016149658A1 (en) * 2015-03-16 2016-09-22 Sri International Ruggedized advanced identification mass spectrometer
US9589776B2 (en) 2015-03-16 2017-03-07 Sri International Ruggedized advanced identification mass spectrometer
WO2018050962A1 (en) * 2016-09-19 2018-03-22 Karsa Oy An ionization device
US10896814B2 (en) 2016-09-19 2021-01-19 Karsa Oy Ionization device
CN108701579A (zh) * 2016-09-19 2018-10-23 卡尔萨公司 电离装置
GB2556074A (en) * 2016-11-17 2018-05-23 Micromass Ltd Axial atmospheric pressure photo-ionization imaging source and inlet device
US11127576B2 (en) 2016-11-17 2021-09-21 Micromass Uk Limited Axial atmospheric pressure photo-ionization imaging source and inlet device
CN109841491A (zh) * 2017-11-27 2019-06-04 中国科学院大连化学物理研究所 一种光电离和化学电离组合离子源
DE102018106412B4 (de) 2018-03-20 2024-03-07 Helmholtz-Zentrum Dresden - Rossendorf E. V. Teilchenspektrometer und Teilchenspektrometrieverfahren
DE102018106412A1 (de) * 2018-03-20 2019-09-26 Helmholtz-Zentrum Dresden - Rossendorf E.V. Teilchenspektrometer und Teilchenspektrometrieverfahren
JP7204019B2 (ja) 2018-05-11 2023-01-13 レコ コーポレイション イオン源及び質量分析計
DE112019002405B4 (de) 2018-05-11 2023-02-23 Leco Corporation Zweistufige Ionenquelle, geschlossene und offene Ionenvolumen aufweisend
US11328919B2 (en) * 2018-05-11 2022-05-10 Leco Corporation Two-stage ion source comprising closed and open ion volumes
JP2022058557A (ja) * 2018-05-11 2022-04-12 レコ コーポレイション イオン源及び質量分析計
JP2022058545A (ja) * 2018-05-11 2022-04-12 レコ コーポレイション イオン源及び質量分析計
WO2019217541A1 (en) * 2018-05-11 2019-11-14 Leco Corporation Two-stage ion source comprising closed and open ion volumes
JP2021521605A (ja) * 2018-05-11 2021-08-26 レコ コーポレイションＬｅｃｏ Ｃｏｒｐｏｒａｔｉｏｎ 閉鎖型イオン体積及び開放型イオン体積を備える２段イオン源
CN111199862A (zh) * 2018-11-20 2020-05-26 中国科学院大连化学物理研究所 一种毛细管微区电离源
CN111199862B (zh) * 2018-11-20 2021-04-27 中国科学院大连化学物理研究所 一种毛细管微区电离源
CN111834195A (zh) * 2019-04-16 2020-10-27 广州禾信仪器股份有限公司 复合离子源及其使用方法和质谱仪
WO2021083894A1 (en) * 2019-10-30 2021-05-06 Tofwerk Ag Method and apparatus for mass analysing a first sample
EP3817029A1 (de) * 2019-10-30 2021-05-05 Tofwerk AG Verfahren und vorrichtung zur massenanalyse einer ersten probe
CN110854009A (zh) * 2019-11-13 2020-02-28 上海裕达实业有限公司 宽范围质量测量离子源的质谱装置及其质谱方法
CN112133623A (zh) * 2020-09-14 2020-12-25 聚光科技(杭州)股份有限公司 VOCs走航监测装置
CN112133623B (zh) * 2020-09-14 2023-05-23 聚光科技(杭州)股份有限公司 VOCs走航监测装置
CN114166927A (zh) * 2021-12-23 2022-03-11 上海裕达实业有限公司 检测多组分样品的质谱装置检测方法

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