EP2194646B1 - Verfahren zur Verbesserung der Rauschcharakteristiken von einem volldigitalen Phasenregelkreis (ADPLL) und einem relativen ADPLL - Google Patents
Verfahren zur Verbesserung der Rauschcharakteristiken von einem volldigitalen Phasenregelkreis (ADPLL) und einem relativen ADPLL Download PDFInfo
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- EP2194646B1 EP2194646B1 EP09177501A EP09177501A EP2194646B1 EP 2194646 B1 EP2194646 B1 EP 2194646B1 EP 09177501 A EP09177501 A EP 09177501A EP 09177501 A EP09177501 A EP 09177501A EP 2194646 B1 EP2194646 B1 EP 2194646B1
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- 238000000034 method Methods 0.000 title claims description 23
- 238000001228 spectrum Methods 0.000 claims description 6
- 230000003321 amplification Effects 0.000 claims description 3
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 3
- 230000003111 delayed effect Effects 0.000 claims 3
- 230000000694 effects Effects 0.000 description 16
- 238000013139 quantization Methods 0.000 description 16
- 229920000729 poly(L-lysine) polymer Polymers 0.000 description 6
- 230000006870 function Effects 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 230000009467 reduction Effects 0.000 description 4
- 230000001934 delay Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000010354 integration Effects 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 230000002123 temporal effect Effects 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000012482 calibration solution Substances 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/099—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop
- H03L7/0991—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop the oscillator being a digital oscillator, e.g. composed of a fixed oscillator followed by a variable frequency divider
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L2207/00—Indexing scheme relating to automatic control of frequency or phase and to synchronisation
- H03L2207/50—All digital phase-locked loop
Definitions
- This invention relates to phase locked loops and more particularly to a method of improving noise characteristics of an all-digital phase locked loop and a relative all-digital phase locked loop.
- ADPLLs all-digital PLLs
- DCO digitally controlled oscillator
- TDC time-to-digital converter
- ADPLLs offer wide programmability, easy technology scaling, and environmental robustness, while maintaining the same input-output behavior as analog PLLs.
- the "dividerless" architecture is most attractive, because it avoids the need for a critical multimodulus divider by integrating the functions of PFD-CP/dividers (Phase Frequency Detector - Charge Pump) from a classic analog synthesizer into the TDC.
- PFD-CP/dividers Phase Frequency Detector - Charge Pump
- Fref represents the reference clock
- Fout the ADPLL output signal.
- the Frequency Control Word (FCW) defines the desired ratio between Fout and Fref.
- the TDC generates a digital word RDCO that represents the DCO output phase, and the word RR represents the reference phase.
- the divider, Phase Frequency Detector (PFD) and Charge Pump (CP) are all replaced by the TDC, which must provide a measurement of how the oscillator phase differs from the reference one.
- the TDC computes the ratio between Fout and Fref
- an integrator INTEGRATOR converts the frequency error ⁇ into a phase information, that exactly corresponds to the phase difference between the output signal and the reference signal (except for a constant phase offset arising from integration).
- a low-pass digital filter DIGITAL LPF extracts the low-pass part of the output of the integrator, that is used to control the DCO.
- the TDC depicted in FIG. 1 may be substantially composed of a simple clocked-resettable integer counter INTEGER COUNTER, characterized by a resolution equal to a whole DCO period. Significantly better ADPLL performance can be achieved if a fractional counter FRACTIONAL COUNTER is used in conjunction with it, to improve the TDC resolution whilst keeping the same dynamic range of the integer counter, as shown in FIG. 3 .
- the digital output C F [n] of the fractional counter is derived by the block 1-z -1 and is added to the output C I [n] of the integer counter to generate the digital word Fout/Fref.
- the fractional counter is used to compute the residual time distance between two reference edges after integer counting, as illustrated in the time diagram of FIG. 4 .
- the time interval Integer Count represents the result of integer counting operation (C I [n]), i.e. the number of DCO periods (periods of the continuous-time oscillating signal Fout) between two reference edges.
- the time interval Fractional Count (indicated in gray) is the result of the fractional counter computation (C F [n]), i.e. a measurement of the time distance between each reference edge and the last DCO edge.
- the residual time distance between two reference edges can be computed as C F [n]+(1-C F [n-1]), i.e. 1+(1-z -1 )C F [n], as shown in FIG. 3 (where the constant contribution is not highlighted).
- in band spurious tones [4] is clearly visible in FIG. 6 , at frequencies of about 10 6 Hz and 2 ⁇ 10 6 Hz.
- the amplitude of these tones is reduced by 30dB in the reported figure compared to the real value, due to the use of a 1kHz resolution bandwidth for the measurement [4].
- the document EP 1956714 discloses a TDC converter comprising a fully integrated circuit for adding stochastic noise. This document discloses also a method for adding a stochastic noise in a TDC converter destined to calculate the phase difference between a first signal FDCO varying faster than a second reference signal Fref.
- this is done by adding a dither signal to the digital word generated by the time-to-digital converter.
- a second dither signal generated as an inverted and amplified replica of the first dither signal is added to the digital word generated by the time-to-digital converter, in order to compensate noise introduced by delaying the reference clock or the oscillating signal by a time determined in function of the level of the first dither signal.
- variations of the digital word are measured in function of variations of the delay time in respect to a reference delay time and a look-up table is filled with the measured variations and the corresponding variations of the delay time.
- a method of generating a digital feedback word of an ADPLL and a relative feedback circuit for an ADPLL and a relative ADPLL are also disclosed.
- FIG. 5 A first embodiment aimed to cancel the spurious tones introduced at the output due to the finite resolution of the TDC (quantization) is depicted in FIG. 5 .
- the signal (a) is obtained with an integer counter alone, the signals (b) with an integer counter and an infinite resolution fractional counter, the signals (c) with an integer counter and a 4-level fractional counter.
- the finite resolution causes the ⁇ [n] signal to have periodic information, that produces spurs at the synthesizer output.
- the output C F [n] is corrupted by a dither signal such that the quantization error becomes randomized.
- a dither signal with a small amplitude, for example of about one quantization step of the TDC, either as a variable analog delay element immediately before the TDC on the reference path ( FIG. 6 ) or on the DCO path (Fout in FIG. 6 ), or in a second embodiment (not depicted) as a digital signal added to the TDC output Fout/Fref.
- a shaped dither signal is preferably used to avoid a negative impact to the in-band noise. More particularly, a dither signal whose energy increases with frequency is preferably used, such that the in-band contribution is negligible and the low-pass nature of the loop counteracts the higher noise power out of band. Independently on whether the spectral density of the dither signal is white or highpass shaped, a multi-level dither is more effective than a two-level dither.
- a multi-level dither can be done by using a programmable delay element (or any alternative means for phase programmability) with a fine delay granularity. Mismatches in the extra delay element itself do not negatively affect performances.
- the novel technique of this disclosure removes spurs due to temporal quantization inherent in the TDC, while requiring minimal hardware modifications to a TDC-based ADPLL.
- By placing a variable delay element before the TDC and providing a properly shaped dither signal, as shown in FIG. 7 minimal impact to in-band noise performance is achieved.
- a pseudorandom dither signal generated by a LFSR Linear Feedback Shift Register
- LFSR Linear Feedback Shift Register
- the novel technique of this disclosure increases the amplitude of the dither signal and uses a multi-level dither sequence and so allows reduction of spurs due to non-linearity of the TDC to below the in-band noise floor, trading for an increase of the in-band noise power.
- Another improvement consists in compensating the undesired effect of the voluntarily injected dither, that is the effect of increasing the in-band noise floor.
- the input dither is a pseudorandom sequence, it is always possible to predict the resulting injected phase error and thus to compensate it, as shown in FIG. 9 .
- the gain ⁇ relating the analog delays to the digital compensation signal is a high-resolution word, and thus can be precisely controlled.
- digitally cancelling the introduced dither using a digital feed-forward path achieves the same reduction of spurs due to both quantization and non-linearity without penalizing significantly the in-band noise power.
- a technique for an accurate estimation of the gain ⁇ used for compensation is used to make the in-band noise floor equal to that of an undithered ADPLL.
- a delay value of the additional variable delay element is chosen to be the "reference delay”.
- a different delay value to be calibrated against the "reference delay” is alternated for many samples with the "reference delay", as shown in FIG. 10 , for the simplified case of a short periodicity channel with a large number of TDC quantization levels.
- each sample is subtracted from the previous one for measuring the relative time difference between the delays in terms of TDC output values TDC OUT .
- the absolute values of the results are averaged, obtaining an accurate measurement of the relative time difference between the delays for various TDC output values.
- This preferred technique based on a digital estimation preferably executed at the start-up of the proposed ADPLL, relaxes analog precision requirements of the delay element of the embodiments disclosed hereinbefore.
- the most preferred embodiment of the proposed method is in practice a self-calibrating spur reduction method for ADPLLs with no impact to the in-band noise floor.
- the applied dither signal has a dynamic range equal to ⁇ 1 LSB of the fractional TDC ( ⁇ 8ps) and a step of 1ps (16 levels).
- the effect of white and 1 st order shaped dither on the ADPLL phase noise around the carrier is compared in FIG. 11 .
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Claims (6)
- Verfahren zur Verbesserung der Rauscheigenschaften eines volldigitalen Phasenregelkreises (Phase locked loop PLL), der ein Rückführungswort erzeugt, das ein zeitkontinuierliches oszillierendes Signal (Fout) repräsentiert, der einen Zeit-Digital-Wandler aufweist, in den das zeitkontinuierliche oszillierende Signal (Fout) und ein Referenzsignal (FrefTDC), welches eine Funktion eines Referenztakts (Fref) ist, eingegeben werden, wobei der Zeit-Digital-Wandler ein digitales Wort (TDCOUT) erzeugt, das entweder- das Verhältnis zwischen der Frequenz des zeitkontinuierlichen oszillierenden Signals (Fout) und der Frequenz des Referenzsignals (FrefTDC), oder- eine digital gesteuerte Oszillatorausgangsphase repräsentiert,wobei das Rückführungswort eine Funktion des digitalen Worts (TDCOUT) ist, wobei das Verfahren aufweist:Verschlechtern mindestens eines Elements der Gruppe, die aus dem Referenztakt (Fref), dem digitalen Wort (TDCOUT) und dem zeitkontinuierlichen oszillierenden Signal (Fout) besteht, mit einem Zittersignal,Erzeugen des Referenzsignals (FrefTDC), indem entweder der Referenztakt (Fref) um eine Zeit verzögert wird, die als Funktion des Pegels des Zittersignals bestimmt wird, oder in den Zeit-Digital-Wandler eine Kopie des zeitkontinuierlichen oszillierenden Signals (Fout) eingegeben wird, das um eine Zeit verzögert wird, die als Funktion des Pegels des Zittersignals bestimmt wird,dadurch gekennzeichnet, dass das Zittersignal eine pseudozufällige Abfolge ist, wobei das Verfahren ferner den Schritt des Erzeugens des Rückführungsworts durch Addieren des digitalen Worts (TDCOUT) zu einem zweiten Zittersignal, welches als eine invertierte und verstärkte Kopie des ersten Zittersignals erzeugt wird, verstärkt um einen Verstärkungsgewinn, aufweist.
- Verfahren nach Anspruch 1, wobei das Zittersignal aus einem Mehrpegeltyp besteht und/oder das Spektrum der Frequenzamplituden des Zittersignals in einem bestimmten Frequenzband verhältnismäßig klein ist und mit der Frequenz außerhalb des Durchlassbereichs zunimmt.
- Verfahren nach Anspruch 1, das ferner die Schritte aufweist:Messen von Variationen des digitalen Worts (TDCOUT) als Funktion von Variationen der Verzögerungszeit bezüglich einer Referenzverzögerungszeit und Ausfüllen einer Nachschlagtabelle mit den gemessenen Variationen und den entsprechenden Variationen der Verzögerungszeit;Erzeugen des ersten Zittersignals als ein pseudozufälliges Signal;Minimieren des Innenbandrauschens durch Einstellen des Verstärkungsgewinns, um Variationen des digitalen Worts (TDCOUT) infolge von Variationen der Verzögerungszeit gemäß der in der Nachschlagtabelle gespeicherten Werte zu kompensieren.
- Verfahren zum Erzeugen eines digitalen Rückführungsworts eines volldigitalen Phasenregelkreises, das ein Rückführungswort, das ein zeitkontinuierliches oszillierendes Signal (Fout) repräsentiert, durch einen Zeit-Digital-Wandler erzeugt, in den das zeitkontinuierliche oszillierende Signal (Fout) und ein Referenzsignal (FrefTDC), das eine Funktion eines Referenztakts (Fref) ist, eingegeben werden, indem mit dem Zeit-Digital-Wandler ein digitales Wort (TDCOUT) erzeugt wird, das entweder- das Verhältnis zwischen der Frequenz des zeitkontinuierlichen oszillierenden Signals (Fout) und der Frequenz des Referenzsignals (FrefTDC), oder- ihre gegenseitige Phasendifferenz repräsentiert,wobei das Rückführungswort eine Funktion des digitalen Worts (TDCOUT) ist, dadurch gekennzeichnet, dass das Verfahren den Schritt zur Verbesserung der Rauscheigenschaften des volldigitalen Phasenregelkreises durch Ausführen des Verfahrens nach einem der Ansprüche 1 bis 3 aufweist.
- Rückführungsschaltung für einen volldigitalen Phasenregelkreis, der ein Rückführungswort erzeugt, das ein zeitkontinuierliches oszillierendes Signal (Fout) repräsentiert, und einen Zeit-Digital-Wandler aufweist, in den das zeitkontinuierliche oszillierende Signal (Fout) und ein Referenzsignal (FrefTDC), das eine Funktion eines Referenztakts (Fref) ist, eingegeben werden, wobei der Zeit-Digital-Wandler eingerichtet ist, ein digitales Wort (TDCOUT) zu erzeugen, das entweder- das Verhältnis zwischen der Frequenz des zeitkontinuierlichen oszillierenden Signals (Fout) und der Frequenz des Referenzsignals (FrefTDC), oder- ihre gegenseitige Phasendifferenz repräsentiert,wobei das Rückführungswort eine Funktion des digitalen Worts (TDCOUT) ist, dadurch gekennzeichnet, dass die Rückführungsschaltung ferner aufweist:eine Verzögerungsschaltung, in die entweder der Referenztakt (Fref) oder das zeitkontinuierliche oszillierende Signal (Fout) eingegeben werden, die durch ein Zittersignal gesteuert wird und entweder eingerichtet ist, das Referenzsignal (FrefTDC) als eine Kopie des Referenztakts (Fref), die um eine Zeit verzögert ist, die durch den Pegel des Zittersignals bestimmt wird, zu erzeugen, oder eingerichtet ist, in den Zeit-Digital-Wandler eine Kopie des zeitkontinuierlichen oszillierenden Signals (Fout), die um eine Zeit verzögert ist, die durch den Pegel des Zittersignals bestimmt wird, einzugeben, wobei im letztgenannten Fall das Referenzsignal (FrefTDC) eine Kopie des Referenztakts (Fref) ist;dadurch gekennzeichnet, dass sie ferner aufweist:einen invertierenden Verstärker, in den das Zittersignal eingegeben wird und der eingerichtet ist, ein zweites Zittersignal als eine verstärkte Kopie des ersten Zittersignals zu erzeugen;einen Addierer, der eingerichtet ist, das Rückführungswort als die Summe des digitalen Worts (TDCOUT) und des zweiten Zittersignals zu erzeugen.
- Volldigitaler Phasenregelkreis, der eine Rückführungsschaltung, wie in Anspruch 5 definiert, aufweist.
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JP2010034618A (ja) * | 2008-07-24 | 2010-02-12 | Sony Corp | Pll回路、無線端末装置およびpll回路の制御方法 |
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US8548111B2 (en) | 2010-09-30 | 2013-10-01 | ST-Ericsson-SA | Sampler circuit |
US8395428B2 (en) | 2010-09-30 | 2013-03-12 | St-Ericsson Sa | Reference clock sampling digital PLL |
US8749280B2 (en) * | 2011-10-17 | 2014-06-10 | Mediatek Inc. | Frequency synthesizer and associated method |
US8669890B2 (en) * | 2012-01-20 | 2014-03-11 | Mediatek Inc. | Method and apparatus of estimating/calibrating TDC mismatch |
EP2796945A1 (de) * | 2013-04-24 | 2014-10-29 | Asahi Kasei Microdevices Corporation | Zeit-Digital-Umwandlung mit Analog-Dithering |
US10305493B2 (en) * | 2014-10-22 | 2019-05-28 | Sony Semiconductor Solutions Corporation | Phase-locked loop and frequency synthesizer |
EP3119000B1 (de) * | 2015-07-17 | 2018-03-28 | Stichting IMEC Nederland | Komplett digitaler phasenregelkreis |
EP3190704B1 (de) * | 2016-01-06 | 2018-08-01 | Nxp B.V. | Digitale phasenregelkreise |
US10715157B2 (en) | 2016-03-31 | 2020-07-14 | Apple Inc. | Methods and mobile communication devices for performing spur relocation for phase-locked loops |
EP3249817B1 (de) | 2016-05-25 | 2018-12-26 | IMEC vzw | Dtc-basierter phasenregelkreis und verfahren zum betreiben des dtc-basierten phasenregelkreises |
JP6572251B2 (ja) | 2017-03-17 | 2019-09-04 | 株式会社東芝 | 時間計測回路および距離計測装置 |
US11245403B2 (en) * | 2017-07-17 | 2022-02-08 | Intel Corporation | Method and a system for calibrating a phase nonlinearity of a digital-to-time converter |
US10516401B2 (en) * | 2018-03-09 | 2019-12-24 | Texas Instruments Incorporated | Wobble reduction in an integer mode digital phase locked loop |
JP2019161442A (ja) | 2018-03-13 | 2019-09-19 | 株式会社東芝 | Tdc回路及びpll回路 |
JP2021027496A (ja) * | 2019-08-07 | 2021-02-22 | セイコーエプソン株式会社 | 回路装置、物理量測定装置、電子機器及び移動体 |
CN110784212B (zh) * | 2019-11-18 | 2020-06-30 | 华南理工大学 | 一种锁相环的频率锁定方法及电路 |
JP2022176788A (ja) * | 2021-05-17 | 2022-11-30 | 北陽電機株式会社 | Tdc装置、測距装置および補正方法 |
JP2022176789A (ja) * | 2021-05-17 | 2022-11-30 | 北陽電機株式会社 | Tdc装置、測距装置および測距方法 |
US11658666B1 (en) * | 2022-03-30 | 2023-05-23 | Nxp B.V. | Fractional-N ADPLL with reference dithering |
CN115421367B (zh) * | 2022-08-10 | 2024-02-27 | 麦斯塔微电子(深圳)有限公司 | 校准方法及系统 |
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US7205924B2 (en) * | 2004-11-18 | 2007-04-17 | Texas Instruments Incorporated | Circuit for high-resolution phase detection in a digital RF processor |
US7498890B2 (en) * | 2005-10-19 | 2009-03-03 | Texas Instruments Incorporated | Continuous reversible gear shifting mechanism |
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JP2008060895A (ja) * | 2006-08-31 | 2008-03-13 | Nec Electronics Corp | 位相同期回路 |
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US7940099B2 (en) | 2011-05-10 |
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