EP1655622A1 - Capteur - Google Patents
Capteur Download PDFInfo
- Publication number
- EP1655622A1 EP1655622A1 EP05023185A EP05023185A EP1655622A1 EP 1655622 A1 EP1655622 A1 EP 1655622A1 EP 05023185 A EP05023185 A EP 05023185A EP 05023185 A EP05023185 A EP 05023185A EP 1655622 A1 EP1655622 A1 EP 1655622A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- sensor
- delay
- stage
- contrast
- property
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005693 optoelectronics Effects 0.000 claims abstract description 22
- 230000008859 change Effects 0.000 claims abstract description 18
- 238000013213 extrapolation Methods 0.000 claims abstract description 5
- 238000001514 detection method Methods 0.000 claims description 15
- 238000004364 calculation method Methods 0.000 claims description 7
- 230000003111 delayed effect Effects 0.000 claims description 3
- 230000002123 temporal effect Effects 0.000 claims description 2
- 238000005520 cutting process Methods 0.000 description 17
- 239000003550 marker Substances 0.000 description 11
- 238000000034 method Methods 0.000 description 6
- 238000011156 evaluation Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 239000003086 colorant Substances 0.000 description 4
- 230000007704 transition Effects 0.000 description 4
- 230000008569 process Effects 0.000 description 3
- 238000005070 sampling Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001953 sensory effect Effects 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D5/00—Arrangements for operating and controlling machines or devices for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
- B26D5/20—Arrangements for operating and controlling machines or devices for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting with interrelated action between the cutting member and work feed
- B26D5/30—Arrangements for operating and controlling machines or devices for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting with interrelated action between the cutting member and work feed having the cutting member controlled by scanning a record carrier
- B26D5/34—Arrangements for operating and controlling machines or devices for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting with interrelated action between the cutting member and work feed having the cutting member controlled by scanning a record carrier scanning being effected by a photosensitive device
Definitions
- a high spatial resolution is desired, which means in concrete terms that should be recognized as accurately as possible, at which time a mark to be detected is located at a defined position in the field of view of the sensor.
- sensors are operated with the highest possible switching or sampling frequency, so that it is possible to check as often as possible per unit of time whether the marking to be detected is located at the named position.
- Said high switching or sampling frequency is limited by the respective available technology, so that in a corresponding manner, the achievable spatial resolution is limited.
- N consecutive comparison results are used to decide whether an indication signal is to be output, a signal delivery can only take place after the N comparisons have been carried out, which means that the marking then no longer exists locally X M0 , but already located at location X MN .
- X MN X NOT A WORD + ( N T s + T dead ) V M
- the time T tot represents thereby the sum of the times, which are needed for the processing of the detection signal and for the triggering of an indication signal.
- X MN X NOT A WORD + ( ( N + 1 ) T s + T dead ) V M
- the markers do not always move at a constant speed V M.
- the error in the position determination is therefore V Mmax ((N + 1) Ts + Ttot).
- N 3
- the mentioned error is then approximately 0.23 mm.
- the local jitter would be in this case according to the above explanations 0.05 mm, so that a total error of 0.28 mm could result, which is quite disturbing for certain applications.
- An object of the invention is to design a sensor of the type mentioned at the beginning such that errors in determining the location of a marking are minimized or even completely avoided, in particular without the need for a reduction of the cycle time Ts.
- This object is achieved in that a delay stage is provided for over the threshold value exceeded by the detection signal by a defined period T delay delayed application of the indicator level.
- the basis of the invention is therefore the surprisingly simple realization that in many cases it is in no way necessary to initiate a switching process or to issue an indication signal when a marker reaches the location X M0 in the field of vision of the sensor. Rather, it is often sufficient if a switching or indication signal is issued only when the marker reaches a defined location X Mdelay behind the sensor, wherein it is of course desirable to deliver the switching or indication signal exactly when the called place X Mdelay is achieved.
- a typical application example, to which the above statement applies is the cutting of paper webs in single sheets, in which a sensor is mounted in the region of a conveyor line in front of the cutting device, which is to recognize, for example, a periodically repeating mark on the paper web, then respectively to do a cut.
- the detection signal to be evaluated according to the invention can be of different nature. Preferred is the use of a contrast signal, but alternatively, e.g. also get a distance signal used. It would also be possible, for example, to use capacitive or inductive sensors, which ultimately supply capacitance or induction signals as detection signals.
- a unit for determining the contrast change rate is provided.
- This unit can be designed such that the calculation of the contrast rate of change takes place on the basis of a plurality of contrast values occurring at specific times, the respective times being within a defined relative time reference to one another stand. In this way, it can be determined how much the contrast changes, for example, within a defined period lying between two times, which ultimately corresponds to the contrast change rate.
- This contrast rate of change is usually directly proportional to the speed at which a marker moves forward, so that the speed of the marker or the speed of conveyance can be deduced from the contrast rate of change.
- this time interval T delay is preferably calculated inter alia from the previously determined contrast change rate.
- an extrapolation unit is provided for calculating the contrast profile from the contrast change rate and absolute contrast values.
- an extrapolation unit is provided for calculating the contrast profile from the contrast change rate and absolute contrast values.
- the time interval T delay can be calculated with a temporal resolution which corresponds to the clock frequency of a microprocessor performing the calculation.
- these clock frequencies usually are very high, so a very accurate calculation of the time T delay and, accordingly, the location X Mdelay is possible.
- the comparison stage provided according to the invention, the indicator stage and the delay stage can be implemented by at least one microprocessor.
- This microprocessor can also take over the tasks of the unit for determining the contrast change rate, the unit for calculating the period T delay and / or the extrapolation unit for calculating the contrast profile, as required. This ultimately means that all stages and units mentioned above can basically be implemented with a single microprocessor if necessary.
- the optoelectronic sensor can be designed as a contrast scanner, which can illuminate the markings to be recognized with different transmission colors.
- the transmission color can then be changed or adjusted in such a way that a maximum contrast value results in each case.
- a specific, typical for a mark contrast profile for the successive transmission colors are determined, after which it can be checked in real operation, if the respective detected marker has a corresponding profile. In this way, it can be determined whether the detected mark is actually a mark which is of the same type as the mark taught during the teaching phase.
- the uniqueness of the marker recognition can be increased.
- the optoelectronic sensor can be designed to detect such properties of a conveyed in the conveying direction A web, especially paper web, which are not provided on the track specifically for their detection by the sensor and on the other hand repeated at successive units.
- a web especially paper web
- the optoelectronic sensor can be designed to detect such properties of a conveyed in the conveying direction A web, especially paper web, which are not provided on the track specifically for their detection by the sensor and on the other hand repeated at successive units.
- Fig. 1 shows a portion of an elongated web 2, which consists of paper and is transported in the conveying direction A.
- the paper web 2 consists of mutually adjacent, mutually identical units 4.
- the transition between two adjoining units 4 is each marked with a mark 6, which may for example be designed in the form of a different from the background of the paper web 2 imprint.
- an optoelectronic sensor 8 is arranged, which is designed as a contrast sensor and which can illuminate the paper web 2 with different colors.
- a cutting device 10 is provided, by means of which the paper web 2 can be cut perpendicular to the conveying direction A along the markers 6 in separate units 4 or in single sheets.
- the optoelectronic sensor 8 and the cutting device 10 are coupled via data and control lines to an evaluation unit 12, which may be embodied, for example, as a microprocessor which receives and processes data from the optoelectronic sensor 8 and is furthermore capable of controlling the optoelectronic sensor 8 and the cutting device 10.
- an evaluation unit 12 which may be embodied, for example, as a microprocessor which receives and processes data from the optoelectronic sensor 8 and is furthermore capable of controlling the optoelectronic sensor 8 and the cutting device 10.
- the optoelectronic sensor 8 can detect a mark 6 when it is at location X T0 .
- the cutting blade of the cutting device 10 performs its cut at the location X Mdelay , wherein X Mdelay is arranged in the conveying direction A behind X M0 . Since the paper web 2 can be transported only with a limited speed V M , it is clear that a certain time elapses until a mark 6 located below the optoelectronic sensor 8 has been transported from the location X M0 so far away from it until the next mark 6 arrives at location X M0 .
- This time is available to the evaluation unit 12 to calculate when a mark 6 recognized at the location X M0 will be located exactly at the location X Mdelay so that a cutting operation can then be carried out at the latter location exactly when the previously optoelectronic Sensor 8 detected mark 6 located at location X Mdelay .
- the optoelectronic sensor 8 supplies a contrast signal S whose time profile is shown in FIG. 2 as a solid line.
- a marker 6 enters the field of view of the optoelectronic sensor 8
- this contrast signal increases.
- the evaluation unit 12 is checked periodically with a cycle time Ts, whether the currently present Contrast value is below or above a predetermined threshold S th1 .
- the threshold value S th1 is not yet reached at time T 0 .
- the threshold value S th1 has already been exceeded. Specifically, there is a contrast value S 1 at this time T 1 .
- N 3 values of the contrast signal S are ultimately included in the evaluation, it is checked at the times T 2 and T 3 whether the threshold value S th1 is also exceeded at these times.
- the times T 0 , T 1 , T 2 and T 3 are each spaced apart by the cycle time Ts.
- T delay ( S th 2 - S 3 ) / V M
- the threshold value S th2 was previously determined in the context of a teach process so that it would be reached by the extrapolated waveform at constant Konstra personal ceremoniess- or conveying speed V M , if the first detected at time T 1 marker 6 exactly at location X. Mdelay is located. Consequently, it can be assumed according to the invention that at time T 3 + T delay a marking 6 detected for the first time by the optoelectronic sensor 8 at time T 1 is located exactly below cutting device 10 at location X Mdelay , so that a cut is made at that time can, which runs exactly along the mark 6.
- the location X Mdelay could also be constantly located anywhere between the location X M0 and the cutter 10. In this case, a delay time would then have to be set for the cutting process, which corresponds to the time required for the marking 6 to be transported from the location X Mdelay to the cutting device 10.
- the sensor could simply be displaced along the conveying path as long as the conveying direction is constant at a constant conveying speed until the cuts are carried out exactly at the markings 6.
- a significant advantage of the method described is that in the calculation of the time at which a mark 6 reaches the location X Mdelay , ultimately independent of the concrete present conveyor speed V M.
- conveying speed V M is namely the difference between S th2 and S 3 correspondingly smaller because at time T 3 the contrast signal has already risen to a higher value. Accordingly, the value for T delay becomes larger.
- the conveying speed V M is low, the difference between S th2 and S 3 becomes greater, so that T delay ultimately becomes smaller.
- time delay T delay can be calculated virtually arbitrarily with the described method, since in this calculation it is not bound to the cycle time Ts with respect to the maximum achievable accuracy and since the total time span between T 0 and T 3 + T delay is available. As a result, the Ortjitter the overall arrangement is substantially reduced.
Landscapes
- Life Sciences & Earth Sciences (AREA)
- Forests & Forestry (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Measuring Fluid Pressure (AREA)
- Controlling Sheets Or Webs (AREA)
- Gyroscopes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004052450A DE102004052450A1 (de) | 2004-10-28 | 2004-10-28 | Sensor |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1655622A1 true EP1655622A1 (fr) | 2006-05-10 |
EP1655622B1 EP1655622B1 (fr) | 2008-08-13 |
Family
ID=35478881
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP05023185A Active EP1655622B1 (fr) | 2004-10-28 | 2005-10-24 | Capteur |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1655622B1 (fr) |
AT (1) | ATE404892T1 (fr) |
DE (2) | DE102004052450A1 (fr) |
DK (1) | DK1655622T3 (fr) |
ES (1) | ES2311189T3 (fr) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2258552A3 (fr) * | 2009-06-04 | 2012-09-26 | Baumer Innotec AG | Dispositif de détection d'un marquage sur un objet plat et procédé correspondant ainsi que dispositif destiné à la séparation de sections d'un objet plat |
EP2868449A1 (fr) * | 2013-10-30 | 2015-05-06 | Graphtec Corp. | Appareil de détection de segments de ligne et support de stockage stockant un programme de commande |
EP2940488A1 (fr) * | 2014-04-30 | 2015-11-04 | Sick Ag | Appareil et procédé pour la détection par moyen optique d'un objet |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3786265A (en) * | 1973-02-02 | 1974-01-15 | Lindly Company Inc | Apparatus for detecting defects in continuous traveling material |
DE3222753A1 (de) * | 1982-02-15 | 1983-08-25 | Schweizerische Aluminium AG, 3965 Chippis | Verfahren und vorrichtung zur oberflaechenkontrolle eines werkstoffes |
DE3331982A1 (de) * | 1983-09-05 | 1985-03-21 | Siemens AG, 1000 Berlin und 8000 München | Vorrichtung fuer druckeinrichtungen zum automatischen, listenweisen trennen von faltpapier |
EP0715165A1 (fr) * | 1994-11-29 | 1996-06-05 | Zellweger Luwa Ag | Méthode et dispositif pour déterminer des caractéristiques de corps allongés |
US5992973A (en) * | 1998-10-20 | 1999-11-30 | Eastman Kodak Company | Ink jet printing registered color images |
-
2004
- 2004-10-28 DE DE102004052450A patent/DE102004052450A1/de not_active Withdrawn
-
2005
- 2005-10-24 DK DK05023185T patent/DK1655622T3/da active
- 2005-10-24 DE DE502005005005T patent/DE502005005005D1/de active Active
- 2005-10-24 AT AT05023185T patent/ATE404892T1/de active
- 2005-10-24 ES ES05023185T patent/ES2311189T3/es active Active
- 2005-10-24 EP EP05023185A patent/EP1655622B1/fr active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3786265A (en) * | 1973-02-02 | 1974-01-15 | Lindly Company Inc | Apparatus for detecting defects in continuous traveling material |
DE3222753A1 (de) * | 1982-02-15 | 1983-08-25 | Schweizerische Aluminium AG, 3965 Chippis | Verfahren und vorrichtung zur oberflaechenkontrolle eines werkstoffes |
DE3331982A1 (de) * | 1983-09-05 | 1985-03-21 | Siemens AG, 1000 Berlin und 8000 München | Vorrichtung fuer druckeinrichtungen zum automatischen, listenweisen trennen von faltpapier |
EP0715165A1 (fr) * | 1994-11-29 | 1996-06-05 | Zellweger Luwa Ag | Méthode et dispositif pour déterminer des caractéristiques de corps allongés |
US5992973A (en) * | 1998-10-20 | 1999-11-30 | Eastman Kodak Company | Ink jet printing registered color images |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2258552A3 (fr) * | 2009-06-04 | 2012-09-26 | Baumer Innotec AG | Dispositif de détection d'un marquage sur un objet plat et procédé correspondant ainsi que dispositif destiné à la séparation de sections d'un objet plat |
EP2868449A1 (fr) * | 2013-10-30 | 2015-05-06 | Graphtec Corp. | Appareil de détection de segments de ligne et support de stockage stockant un programme de commande |
US9574998B2 (en) | 2013-10-30 | 2017-02-21 | Graphtec Corporation | Line segment detection apparatus, and storage medium storing control program |
EP2940488A1 (fr) * | 2014-04-30 | 2015-11-04 | Sick Ag | Appareil et procédé pour la détection par moyen optique d'un objet |
Also Published As
Publication number | Publication date |
---|---|
EP1655622B1 (fr) | 2008-08-13 |
ATE404892T1 (de) | 2008-08-15 |
DE502005005005D1 (de) | 2008-09-25 |
ES2311189T3 (es) | 2009-02-01 |
DE102004052450A1 (de) | 2006-05-04 |
DK1655622T3 (da) | 2008-09-15 |
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