EP1639613A1 - Micro-commutateur bistable a faible consommation - Google Patents
Micro-commutateur bistable a faible consommationInfo
- Publication number
- EP1639613A1 EP1639613A1 EP04767860A EP04767860A EP1639613A1 EP 1639613 A1 EP1639613 A1 EP 1639613A1 EP 04767860 A EP04767860 A EP 04767860A EP 04767860 A EP04767860 A EP 04767860A EP 1639613 A1 EP1639613 A1 EP 1639613A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- micro
- switch according
- microswitch
- contact
- conductive tracks
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims abstract description 26
- 239000004020 conductor Substances 0.000 claims abstract description 8
- 230000000694 effects Effects 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 7
- 239000004065 semiconductor Substances 0.000 claims description 5
- 230000006835 compression Effects 0.000 claims description 2
- 238000007906 compression Methods 0.000 claims description 2
- 238000005530 etching Methods 0.000 description 14
- 238000000151 deposition Methods 0.000 description 13
- 230000008021 deposition Effects 0.000 description 13
- 238000006073 displacement reaction Methods 0.000 description 10
- 230000008901 benefit Effects 0.000 description 8
- 238000010438 heat treatment Methods 0.000 description 8
- 239000010931 gold Substances 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 5
- 229910052737 gold Inorganic materials 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 238000001465 metallisation Methods 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 238000004377 microelectronic Methods 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 229910052681 coesite Inorganic materials 0.000 description 2
- 229910052906 cristobalite Inorganic materials 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- 229910052682 stishovite Inorganic materials 0.000 description 2
- 230000001629 suppression Effects 0.000 description 2
- 229910052905 tridymite Inorganic materials 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 241001428214 Polyides Species 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000002470 thermal conductor Substances 0.000 description 1
- 230000000930 thermomechanical effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0036—Switches making use of microelectromechanical systems [MEMS]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0036—Switches making use of microelectromechanical systems [MEMS]
- H01H2001/0042—Bistable switches, i.e. having two stable positions requiring only actuating energy for switching between them, e.g. with snap membrane or by permanent magnet
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H61/00—Electrothermal relays
- H01H2061/006—Micromechanical thermal relay
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H59/00—Electrostatic relays; Electro-adhesion relays
- H01H59/0009—Electrostatic relays; Electro-adhesion relays making use of micromechanics
Definitions
- the present invention relates to a bistable microswitch, with low consumption and with horizontal displacement.
- a micro-switch finds particular utility in the field of mobile telephony and in the space field.
- the RF components intended for these areas are subject to the following specifications: supply voltage lower than 5 volts, - insulation higher than 30 dB, - insertion losses lower than 0.3dB, - reliability corresponding to a number of cycles greater than 10 9 , - * surface less than 0.05 mm 2 , - lowest possible consumption.
- certain switches are used only once, to switch from one state to another state in the event of equipment failure for example.
- bistable switches which do not require a supply voltage once they have switched from one state to another.
- double switches which considerably simplify the matrixes of switches of the redundant circuits used in the case of critical functions. This type of application is found in particular in the space field (satellite antennas). These dual switches allow an input signal to be switched from one electronic circuit to another in the event of a fault. These are therefore switches which have the possibility of switching either a first set of two electrical tracks between them, or a second set of two electrical tracks.
- Double switches have the advantage of obtaining circuits comprising fewer components (for example 10 redundancy functions require 10 double switches instead of 20 single switches), which means among other things less reliability tests, less mounting, space saving and overall lower cost.
- micro-switches that is to say those relating to microelectronics
- they are used in signal routing, impedance tuning networks, gain adjustment of amplifiers, etc.
- the frequency bands of the signals to be switched can range from a few MHz to several tens of GHz.
- switches from microelectronics are used, which allow integration with the electronics of the circuits and which have a low manufacturing cost. In terms of performance, these components are however quite limited.
- silicon FET switches can switch high power signals at low frequencies, but not at high frequencies.
- MEMS Metal Semiconductor Field Effect Transistor
- MEMS switches have the following characteristics: - low insertion losses (typically less than 0.3dB), significant isolation from MHz to millimeter (typically greater than -30dB), - no response non-linearity (IP3).
- ohmic contact the two RF tracks are contacted by a short circuit (metal-metal contact). This type of contact is suitable for both continuous signals and for high frequency signals (above 10 GHz).
- capacitive contact switch an air space is electromechanically adjusted to obtain a variation in capacity between the closed state and the open state.
- thermally actuated microswitches that can be described as conventional are not bistable. They offer the advantage of a low actuation voltage. They have several drawbacks: excessive consumption (especially in the case of mobile phone applications), low switching speed (due to thermal inertia) and the need for a supply voltage to maintain contact in closed position.
- Electrostatic actuated microswitches that can be described as conventional are non-bistable. They offer the advantages of fast switching speed and generally simple technology. They present reliability problems, this point being particularly sensitive in the case of electrostatic switches with low actuation voltage (bonding of structures).
- Electromagnetic actuation microswitches that can be described as conventional are not bistable. They generally operate on the principle of the electromagnet and essentially use magnetic circuits based on iron and an excitation coil. They have several drawbacks. Their technology is complex (coil, magnetic material, permanent magnet in some cases, etc.). Their consumption is important. They also require a supply voltage to maintain the contact in the closed position. There are two configurations of contact displacement: vertical displacement and horizontal displacement. In the case of a vertical displacement, the displacement is made outside the plane of the RF tracks. The contact is made on the top or on the bottom of the tracks. This configuration has the advantage that the metallization of the contact pad is easy to perform
- This stiffness is conditioned by the final shape of the beam which depends on the topology of a sacrificial layer and which itself depends on the shape and the thickness of the tracks located below.
- This configuration is well suited to a double contact, by means of a symmetrical actuator.
- Metallization "gold" can be done in the very last technological stage. All the preceding steps can be compatible with the production of integrated circuits.
- the shape of the contact is determined during the photolithography step.
- the shape of the beam is determined during the photolithography step. Its stiffness is therefore well controlled.
- the metallization on the side is delicate. The contact resistance can therefore be poorly controlled. This configuration is unsuitable for electrostatic actuation because of the very small facing actuation surfaces.
- Another characteristic of the movement of the switches is the number of equilibrium states. The standard case is that where the actuator has only one state balance. This implies that one of the two switch states (switched or non-switched) requires a DC voltage supply to maintain the position. Stopping the excitation returns the switch to its equilibrium position.
- the bistable case is the case where the actuator has two distinct states of equilibrium. The advantage of this operating mode is that the two positions "closed” and "open” of the switch are stable and do not require power until one switches from one state to another.
- a bistable micro-switch with low consumption and with horizontal displacement.
- This microswitch is particularly well suited to the field of mobile telephony and to the space field.
- the subject of the invention is therefore a bistable MEMS microswitch made on a substrate and capable of electrically connecting the ends of at least two conductive tracks, comprising a beam suspended above the surface of the substrate, the beam being embedded in its two ends and being constrained in compression when it is in the non-deformed position, the beam having means forming electrical contact arranged to make a lateral connection with the ends of the two conductive tracks during a deformation of the beam in a horizontal direction by relative to the surface of the substrate, the microswitch having means actuating the beam to place it either in a first deformed position, corresponding to a first stable state, or in a second deformed position, corresponding to a second stable state and opposite to the first deformed position relative to the undeformed position , the means forming
- the microswitch can be a double microswitch.
- the first deformed position corresponds to the connection of the ends of two first conductive tracks
- the second deformed position corresponds to the connection of the ends of two second conductive tracks.
- It can be a simple micro switch.
- the first deformed position corresponds to the connection of the ends of two conductive tracks
- the second deformed position corresponds to an absence of connection.
- the beam is made of dielectric or semiconductor material and the means forming electrical contact are formed of an electrically conductive pad and integral with the beam.
- the means for actuating the beam may include thermal actuators using a bimetal effect. Each thermal actuator can then comprise a block of thermal conductive material in intimate contact with an electrical resistance.
- the means for actuating the beam may include means for applying forces electrostatic. They can include thermal actuators using a bimetallic strip effect and means for implementing electrostatic forces.
- the beam is made of electrically conductive material.
- the beam actuation means can then include means for implementing electrostatic forces.
- the means forming an electrical contact may have a shape allowing it to be embedded between the ends of the conductive tracks to be connected. In this case, the ends of the conductive tracks can have a flexibility allowing to follow the shape of the means forming electrical contact during a connection.
- the microswitch can also include means forming a relaxation spring for at least one of the embedded ends of the beam.
- the means forming electrical contact can be means ensuring ohmic contact or means ensuring capacitive contact.
- FIG. 1 is a top view of a first variant of double microswitch according to the present invention
- - Figure 2 shows the microswitch of Figure 1 in a first stable operating state
- - Figure 3 shows the microswitch of Figure 1 in a second stable operating state
- - Figure 4 is a view of above of a second variant of double microswitch according to the present invention
- - Figure 5 is a top view of a third variant of double microswitch according to the present invention
- - Figure 6 is a top view of a simple micro-switch according to the present invention
- - Figure 7 is a top view of a fourth variant of a double micro-switch according to the present invention
- - Figure 8 is a top view of a fifth variant of double micro-switch according to the present invention
- FIG. 1 is a top view of a first variant of a double micro-switch according to the first invention.
- the microswitch is produced on a substrate 1 of which only a part is represented for the sake of simplification.
- This microswitch is a double switch. It is intended to make a connection either between the ends 12 and 13 of the conductive tracks 2 and 3, or between the ends 14 and 15 of the conductive tracks 4 and 5.
- the micro-switch of FIG. 1 comprises a beam 6 of dielectric material or semiconductor. It is located in the plane of the conductive tracks. The beam is embedded at its two ends in raised parts of the substrate 1.
- the beam shown is of rectangular section. It supports on its face directed towards tracks 2 and 3 (that is to say on one of its sides) actuators 20 and 30 and, on its face directed towards tracks 4 and 5 (that is to say on its other side), actuators 40 and 50.
- the actuators are located near the embedding zones of the beam.
- Each actuator consists of a block that is a good thermal conductor and an electrical resistance.
- the actuator 20 comprises a block 21 with which a resistor 22 is associated. The same applies to the other actuators.
- the beam is preferably made of dielectric or semiconductor material with a low coefficient of thermal expansion.
- the blocks of the thermal actuators are preferably made of metallic material with a high coefficient of thermal expansion to obtain a bimetallic strip effect at high efficiency.
- the displacement of the beam being done in the horizontal direction (the plane of the figure), the actuators are placed on the sides of the beam and in the vicinity of the embedments, always with a view to thermomechanical efficiency.
- the beam 6 also supports, in the central part and on its flanks, an electrical contact pad 7, intended to ensure an electrical connection of the ohmic type between the ends 12 and 13 of the tracks 2 and 3, and an electrical contact pad 8 between the ends 14 and 15 of tracks 4 and 5.
- a first set of actuators makes it possible to tilt the beam 6 in a position corresponding to one of its two stable states.
- FIG. 2 represents.
- the actuators 40 and 50 which induce a bimetallic strip effect in the beam 6, the latter deforms to place itself in a first stable state shown in the figure.
- the electrical contact pad 7 provides a connection between the ends 12 and 13 of the conductive tracks 2 and 3.
- the supplies of the electrical resistances of the actuators 40 and 50 are interrupted and the beam remains in this first stable state.
- the electrical contact pad 8 provides a connection between the ends 14 and 15 of the conductive tracks 4 and 5.
- the power supplies of the electrical resistors actuators 20 and 30 are interrupted and the beam remains in this second stable state.
- the electrical resistances of the actuators are preferably made of a conductive material having a high resistivity.
- the conductive tracks and the contact pads are preferably made of gold for its good electrical properties and its reliability over time, in particular with regard to oxidation.
- the recesses of the beam can be either rigid (simple recessing), or more or less flexible by varying the configuration of the recesses, for example by adding relaxation springs. Being able to play on flexibility of the beam makes it possible to control the stresses in the beam both initially (intrinsic stresses) that to pass from a stable state to the other (passage by a state of buckling). This has the advantage of limiting the risks of rupture of the beam but also of allowing a limitation of the consumption of the micro-switch (lowering of the switching temperature of the micro-switch).
- the beam may exhibit stress relaxation only at one of its embedded ends or at both of its ends.
- FIG. 4 is a top view of a second variant of a double microswitch according to the present invention, the two ends of the beam of which have a stress relieving recess.
- the variant embodiment of FIG. 4 comprises the same elements as the variant embodiment of FIG. 2 with the exception of the embedding of the ends of the beam.
- the substrate 1 has stress release slots 111 perpendicular to the axis of the beam.
- the slots 111 provide a certain flexibility to the part of the substrate located between them and the beam.
- the microswitch is shown in its initial position, before it is put into service.
- FIG. 5 is a top view of a third variant of a double micro-switch according to the present invention.
- This microswitch uses bimetal effect actuators and has electrostatic assistance. It is shown in its initial position, before it is put into service. We recognize the substrate 201, tracks
- the microswitch of FIG. 5 further comprises electrodes allowing the application of electrostatic forces. These electrodes are distributed on the beam and on the substrate.
- the beam 206 supports on a first side electrodes 261 and 262 and, on a second side, electrodes 263 and 264. These electrodes are located between the thermal actuators and the electrical contact pads.
- the substrate 201 supports electrodes 271 to 274 opposite each electrode supported by the beam 206.
- the electrode 271 has a part opposite the electrode 261, this part not being visible in the figure, and a part intended at its electrical connection, this part being visible in the figure. The same goes for electrodes 272, 273 and 274 relative to the electrodes
- the electrodes 271 to 274 have a shape which corresponds to the shape of the deformed beam. This makes it possible to limit the actuation or holding voltages (variable gap electrodes).
- the microswitch can be put in a first stable state, for example that corresponding to the connection of the conductive tracks 202 and 203 by the contact pad 207, by means of the thermal actuators 240 and 250 which are only put into service to obtain the first stable state.
- the application of a voltage between the electrodes 261 and 271 on the one hand and between the electrodes 262 and 272 on the other hand ensures a reduction in the contact resistance between the pad 207 and the tracks 202 and 203.
- the micro- switch can be put in the second stable state by means of actuators 220 and 230 which are put into service only to obtain the switching from the first stable state to the second stable state.
- the application of a voltage between the electrodes 263 and 273 on the one hand and between the electrodes 264 and 274 on the other hand ensures a reduction in the contact resistance between the pad
- FIG. 6 is a top view of a simple micro-switch according to the present invention.
- This micro-switch uses bimetal effect actuators, without electrostatic assistance. It is shown in its initial position, before being put into service. We recognize the substrate 301, tracks 302 and 303 to be connected by the contact pad 307 during a tilting of the beam 306 in a first stable state, the second stable state corresponds to an absence of connection. Actuators 320, 330 and 340, 350 are also recognized.
- FIG. 7 is a top view of a fourth variant of double microswitch according to the present invention. This microswitch only uses actuators with an electrostatic effect. It is shown in its initial position, before it is put into service. We recognize the substrate 401, tracks
- the microswitch of FIG. 7 includes electrodes allowing the application of electrostatic forces. These electrodes are distributed on the beam and the substrate.
- the beam 406 supports on a first side electrodes 461 and 462 and, on a second side, electrodes 463 and 464. These electrodes are located on each side of the electrical contact pads 407 and 408.
- the substrate 401 supports electrodes 471 to 474 opposite each electrode supported by the beam 406.
- the electrode 471 has a part opposite the electrode 461, this part not being visible in the figure, and a part intended for its electrical connection, this part being visible in the figure. The same is true for electrodes 472, 473 and 474 with respect to electrodes 462, 463 and 464 respectively.
- the microswitch can be put in a first stable state, for example that corresponding to the connection of the conductive tracks 402 and 403 by the contact pad 407, by applying a voltage between the electrodes 461 and 471 on the one hand and between the electrodes 462 and 472 on the other hand. Once the beam has switched to its first stable state, the applied voltage can be removed or reduced so as to reduce the contact resistance between the pad 407 and the tracks 402 and 403.
- FIG. 8 is a top view of a fifth variant of a double micro-switch according to the present invention. This fifth variant is an optimized version of the previous variant. The same references as in the previous line have been kept to designate the same elements.
- FIG. 9 is a top view of a sixth variant of a double micro-switch according to the present invention. It is shown in its initial position before it is put into service.
- the beam 506 is in this variant a metal beam, for example aluminum, supporting on its flanks the contact pads 507 and 508.
- the tilting of the beam in a first stable state for example that corresponding to the connection of the conductive tracks 502 and 503 is obtained by applying a tilting voltage between the beam 506 serving as an electrode and the electrodes 571 and 572.
- the applied voltage can be eliminated or reduced so as to reduce the contact resistance between pad 507 and tracks 502 and 503.
- the microswitch can be put in the second stable state by applying a voltage between the beam 506 and the electrodes 573 and 574 (and suppression of the voltage of electrostatic assistance of maintenance in the first stable state if this assistance was used).
- the applied tension can be eliminated or reduced as before.
- the electrostatic actuation has been optimized by the shape given to the electrodes 571 to 574.
- FIG. 10 is a top view of a double microswitch corresponding to the first variant but provided with optimized contacts .
- the microswitch is shown in its initial position before it is put into service.
- the same references as in FIG. 1 have been kept to designate the same elements.
- the ends 12 ', 13', 14 ', and 15' of the conductive tracks 2, 3, 4 and 5 respectively have been optimized to ensure better electrical contact with the contact pads 7 'and 8' .
- the contact pads 7 'and 8' have a wider shape at their base (that is to say near the beam) than at their top. They can thus be more easily fitted between the ends 12 ', 13' and 14 ', 15' which are themselves provided with a mounting leave.
- the ends of the conductive tracks can also be slightly flexible to match the shape of the contact pad and thus ensure better electrical contact.
- the microswitch according to the present invention has the following advantages. Its operation requires low consumption due to the bi-stability.
- the thermal actuator variants have a high actuation efficiency. Their switching time is low since it is not necessary to go very high in temperature to tilt the beam. They also have low tilting voltage when electrostatic actuators are associated with thermal actuators. This is due to: - the use of the thermal bimetal effect; the use of heating resistors integrated on the beam and located on
- the bi-stability presented by the microswitch is perfectly controlled for two reasons.
- the first reason is that bi-stability is obtained by the fact that the beam must be under compressive stress. This constraint is brought about by the constituent materials of the switch (shape, thickness). If the beam is designed to be perfectly symmetrical, and if the realization of each of the two sets of actuators is made during the same deposit, the constraint can only be perfectly symmetrical (same shape, same thickness and symmetry of the actuators). We are therefore in the presence of a device capable of not favoring a stable state over another which would be less stable.
- the microswitch according to the invention can advantageously be produced on a silicon substrate.
- the embedding part and the beam can be made of Si 3 N, SiO 2 or polycrystalline silicon.
- the conductive tracks, the contact pads, the electrodes, the thermal actuators can be made of gold, aluminum or copper, nickel, materials which can be deposited under vacuum or electrochemically (electrolysis, autocatalytic deposition).
- the heating resistors can be made of TaN, TiN or Ti.
- a method for producing an ohmic microswitch with thermal actuation on a silicon substrate may comprise the following steps: - deposition of an oxide layer 1 ⁇ m thick by PECVD on the substrate, - lithography and etching of a cavity in order to obtain embedding, - deposit of a polyide layer 1 ⁇ m thick, serving as a sacrificial layer, - dry planarization or chemical-mechanical polishing (CMP) of the sacrificial layer, deposition of a layer of SiO 2 3 ⁇ m thick, - etching of this layer of Si0 to obtain openings for the actuators, the contact pads and the conductive tracks, - deposition of an aluminum layer 3 ⁇ m thick, - planarization by CMP of the aluminum layer until the layer of Si0 2 is revealed, - deposition of a layer of Si0 2 0.15 ⁇ m thick, deposit of a layer of TiN 0.2 ⁇ m thick, - litho-etching of the heating resist
- a method for producing a thermally actuated micro-switch on a silicon substrate can comprise the following steps: - deposition of an oxide layer 1 ⁇ m thick by PECVD on the substrate, - lithography by etching of a cavity in order to obtain embedding, - deposition of a layer of polyimide 1 ⁇ m thick, serving as a sacrificial layer, - dry planarization or chemical mechanical polishing (CMP) of the sacrificial layer, deposition of a layer of Si0 2 3 ⁇ m thick, - etching of this layer of SiO 2 to obtain openings for the actuators, - deposition of a layer of aluminum 3 ⁇ m thick , - planarization by CMP of the actuators, - deposition of a TiN layer 0.2 ⁇ m thick, - litho-etching of the heating resistors in the TiN layer, - deposition of a Si0 2 layer of 0, 2 ⁇ m thick, -
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Micromachines (AREA)
- Thermally Actuated Switches (AREA)
- Liquid Crystal (AREA)
- Polymers With Sulfur, Phosphorus Or Metals In The Main Chain (AREA)
- Polyesters Or Polycarbonates (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0350278A FR2857153B1 (fr) | 2003-07-01 | 2003-07-01 | Micro-commutateur bistable a faible consommation. |
PCT/FR2004/050298 WO2005006364A1 (fr) | 2003-07-01 | 2004-06-30 | Micro-commutateur bistable a faible consommation |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1639613A1 true EP1639613A1 (fr) | 2006-03-29 |
EP1639613B1 EP1639613B1 (fr) | 2007-08-08 |
Family
ID=33523072
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP04767860A Expired - Lifetime EP1639613B1 (fr) | 2003-07-01 | 2004-06-30 | Micro-commutateur bistable a faible consommation |
Country Status (7)
Country | Link |
---|---|
US (1) | US7489228B2 (fr) |
EP (1) | EP1639613B1 (fr) |
JP (1) | JP4464397B2 (fr) |
AT (1) | ATE369612T1 (fr) |
DE (1) | DE602004008075T2 (fr) |
FR (1) | FR2857153B1 (fr) |
WO (1) | WO2005006364A1 (fr) |
Families Citing this family (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8928967B2 (en) | 1998-04-08 | 2015-01-06 | Qualcomm Mems Technologies, Inc. | Method and device for modulating light |
WO1999052006A2 (fr) | 1998-04-08 | 1999-10-14 | Etalon, Inc. | Modulation interferometrique de rayonnement |
WO2003007049A1 (fr) | 1999-10-05 | 2003-01-23 | Iridigm Display Corporation | Mems et structures photoniques |
FR2865724A1 (fr) * | 2004-02-04 | 2005-08-05 | St Microelectronics Sa | Microsysteme electromecanique pouvant basculer entre deux positions stables |
US20050269688A1 (en) * | 2004-06-03 | 2005-12-08 | Lior Shiv | Microelectromechanical systems (MEMS) devices integrated in a hermetically sealed package |
US8008736B2 (en) | 2004-09-27 | 2011-08-30 | Qualcomm Mems Technologies, Inc. | Analog interferometric modulator device |
US7289259B2 (en) | 2004-09-27 | 2007-10-30 | Idc, Llc | Conductive bus structure for interferometric modulator array |
US7944599B2 (en) | 2004-09-27 | 2011-05-17 | Qualcomm Mems Technologies, Inc. | Electromechanical device with optical function separated from mechanical and electrical function |
US7372613B2 (en) | 2004-09-27 | 2008-05-13 | Idc, Llc | Method and device for multistate interferometric light modulation |
US7719500B2 (en) | 2004-09-27 | 2010-05-18 | Qualcomm Mems Technologies, Inc. | Reflective display pixels arranged in non-rectangular arrays |
US7893919B2 (en) | 2004-09-27 | 2011-02-22 | Qualcomm Mems Technologies, Inc. | Display region architectures |
US7724993B2 (en) * | 2004-09-27 | 2010-05-25 | Qualcomm Mems Technologies, Inc. | MEMS switches with deforming membranes |
US7936497B2 (en) | 2004-09-27 | 2011-05-03 | Qualcomm Mems Technologies, Inc. | MEMS device having deformable membrane characterized by mechanical persistence |
US7446927B2 (en) * | 2004-09-27 | 2008-11-04 | Idc, Llc | MEMS switch with set and latch electrodes |
US7420725B2 (en) | 2004-09-27 | 2008-09-02 | Idc, Llc | Device having a conductive light absorbing mask and method for fabricating same |
US7283030B2 (en) * | 2004-11-22 | 2007-10-16 | Eastman Kodak Company | Doubly-anchored thermal actuator having varying flexural rigidity |
US7339454B1 (en) * | 2005-04-11 | 2008-03-04 | Sandia Corporation | Tensile-stressed microelectromechanical apparatus and microelectromechanical relay formed therefrom |
US7916980B2 (en) | 2006-01-13 | 2011-03-29 | Qualcomm Mems Technologies, Inc. | Interconnect structure for MEMS device |
US7649671B2 (en) | 2006-06-01 | 2010-01-19 | Qualcomm Mems Technologies, Inc. | Analog interferometric modulator device with electrostatic actuation and release |
US7835061B2 (en) | 2006-06-28 | 2010-11-16 | Qualcomm Mems Technologies, Inc. | Support structures for free-standing electromechanical devices |
US7527998B2 (en) | 2006-06-30 | 2009-05-05 | Qualcomm Mems Technologies, Inc. | Method of manufacturing MEMS devices providing air gap control |
US7684106B2 (en) | 2006-11-02 | 2010-03-23 | Qualcomm Mems Technologies, Inc. | Compatible MEMS switch architecture |
US7724417B2 (en) * | 2006-12-19 | 2010-05-25 | Qualcomm Mems Technologies, Inc. | MEMS switches with deforming membranes |
FR2911448B1 (fr) * | 2007-01-16 | 2009-07-10 | St Microelectronics Sa | Resonateur acoustique en volume a frequence de resonance reglable et utilisation d'un tel resonateur dans le domaine de la telephonie |
US7719752B2 (en) | 2007-05-11 | 2010-05-18 | Qualcomm Mems Technologies, Inc. | MEMS structures, methods of fabricating MEMS components on separate substrates and assembly of same |
US8022896B2 (en) * | 2007-08-08 | 2011-09-20 | Qualcomm Mems Technologies, Inc. | ESD protection for MEMS display panels |
JP2009077479A (ja) * | 2007-09-19 | 2009-04-09 | Japan Radio Co Ltd | 無線スイッチ制御装置 |
US20090146773A1 (en) * | 2007-12-07 | 2009-06-11 | Honeywell International Inc. | Lateral snap acting mems micro switch |
US7642135B2 (en) * | 2007-12-17 | 2010-01-05 | Skyworks Solutions, Inc. | Thermal mechanical flip chip die bonding |
US8232858B1 (en) * | 2008-02-20 | 2012-07-31 | Sandia Corporation | Microelectromechanical (MEM) thermal actuator |
US7944604B2 (en) | 2008-03-07 | 2011-05-17 | Qualcomm Mems Technologies, Inc. | Interferometric modulator in transmission mode |
DE102009018744A1 (de) | 2009-04-27 | 2010-10-28 | Stock E.K. Bernd | Vorrichtung zur mechanischen Fixierung von Gegenständen |
US8427792B2 (en) | 2009-05-29 | 2013-04-23 | General Electric Company | Method and system to enhance reliability of switch array |
US8582254B2 (en) | 2009-05-29 | 2013-11-12 | General Electric Company | Switching array having circuitry to adjust a temporal distribution of a gating signal applied to the array |
JP5263203B2 (ja) * | 2010-03-12 | 2013-08-14 | オムロン株式会社 | 静電リレー |
US8339787B2 (en) * | 2010-09-08 | 2012-12-25 | Apple Inc. | Heat valve for thermal management in a mobile communications device |
CN102142338A (zh) * | 2010-12-16 | 2011-08-03 | 上海交通大学 | 面内运动的多向多通道多稳态微机电开关 |
US9134527B2 (en) | 2011-04-04 | 2015-09-15 | Qualcomm Mems Technologies, Inc. | Pixel via and methods of forming the same |
US8963159B2 (en) | 2011-04-04 | 2015-02-24 | Qualcomm Mems Technologies, Inc. | Pixel via and methods of forming the same |
US8659816B2 (en) | 2011-04-25 | 2014-02-25 | Qualcomm Mems Technologies, Inc. | Mechanical layer and methods of making the same |
FR2984008B1 (fr) * | 2011-12-13 | 2014-01-10 | Commissariat Energie Atomique | Dispositif electronique |
FR2990320B1 (fr) | 2012-05-07 | 2014-06-06 | Commissariat Energie Atomique | Haut-parleur digital a performance amelioree |
ITTO20120691A1 (it) * | 2012-08-01 | 2014-02-02 | Milano Politecnico | Sensore d'urto con meccanismo bistabile e metodo per il rilevamento di urti |
FR3012671B1 (fr) * | 2013-10-29 | 2015-11-13 | St Microelectronics Rousset | Dispositif mecanique integre a mouvement vertical |
US10643810B2 (en) | 2015-08-20 | 2020-05-05 | Northeastern University | Zero power plasmonic microelectromechanical device |
KR101968644B1 (ko) * | 2018-05-15 | 2019-08-13 | 울산과학기술원 | 3d 프린팅으로 제조되는 트위스트 유형의 쌍안정성 구조체 및 이의 용도 |
KR101968650B1 (ko) * | 2018-05-15 | 2019-04-12 | 울산과학기술원 | 3d 프린팅으로 제조되는 회전 가능한 쌍안정성 구조체 및 이의 용도 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5619061A (en) * | 1993-07-27 | 1997-04-08 | Texas Instruments Incorporated | Micromechanical microwave switching |
US5536963A (en) * | 1994-05-11 | 1996-07-16 | Regents Of The University Of Minnesota | Microdevice with ferroelectric for sensing or applying a force |
FR2772512B1 (fr) * | 1997-12-16 | 2004-04-16 | Commissariat Energie Atomique | Microsysteme a element deformable sous l'effet d'un actionneur thermique |
US6188301B1 (en) * | 1998-11-13 | 2001-02-13 | General Electric Company | Switching structure and method of fabrication |
DE19937811C2 (de) * | 1999-08-11 | 2001-07-26 | Bosch Gmbh Robert | Relais, insbesondere Mikro Relais zum Schalen eines Stromkreises |
US6239685B1 (en) * | 1999-10-14 | 2001-05-29 | International Business Machines Corporation | Bistable micromechanical switches |
FR2818795B1 (fr) * | 2000-12-27 | 2003-12-05 | Commissariat Energie Atomique | Micro-dispositif a actionneur thermique |
US6911891B2 (en) * | 2001-01-19 | 2005-06-28 | Massachusetts Institute Of Technology | Bistable actuation techniques, mechanisms, and applications |
SE0101183D0 (sv) * | 2001-04-02 | 2001-04-02 | Ericsson Telefon Ab L M | Micro electromechanical switches |
JP2005500655A (ja) * | 2001-08-20 | 2005-01-06 | ハネウェル・インターナショナル・インコーポレーテッド | スナップアクション式熱スイッチ |
US6621392B1 (en) * | 2002-04-25 | 2003-09-16 | International Business Machines Corporation | Micro electromechanical switch having self-aligned spacers |
JP3969228B2 (ja) * | 2002-07-19 | 2007-09-05 | 松下電工株式会社 | 機械的変形量検出センサ及びそれを用いた加速度センサ、圧力センサ |
US7283030B2 (en) * | 2004-11-22 | 2007-10-16 | Eastman Kodak Company | Doubly-anchored thermal actuator having varying flexural rigidity |
-
2003
- 2003-07-01 FR FR0350278A patent/FR2857153B1/fr not_active Expired - Fee Related
-
2004
- 2004-06-30 AT AT04767860T patent/ATE369612T1/de not_active IP Right Cessation
- 2004-06-30 EP EP04767860A patent/EP1639613B1/fr not_active Expired - Lifetime
- 2004-06-30 WO PCT/FR2004/050298 patent/WO2005006364A1/fr active IP Right Grant
- 2004-06-30 DE DE602004008075T patent/DE602004008075T2/de not_active Expired - Lifetime
- 2004-06-30 JP JP2006516357A patent/JP4464397B2/ja not_active Expired - Lifetime
- 2004-06-30 US US10/561,948 patent/US7489228B2/en active Active
Non-Patent Citations (1)
Title |
---|
See references of WO2005006364A1 * |
Also Published As
Publication number | Publication date |
---|---|
JP2007516560A (ja) | 2007-06-21 |
DE602004008075T2 (de) | 2008-05-15 |
ATE369612T1 (de) | 2007-08-15 |
US20060152328A1 (en) | 2006-07-13 |
WO2005006364A1 (fr) | 2005-01-20 |
DE602004008075D1 (de) | 2007-09-20 |
FR2857153B1 (fr) | 2005-08-26 |
FR2857153A1 (fr) | 2005-01-07 |
EP1639613B1 (fr) | 2007-08-08 |
JP4464397B2 (ja) | 2010-05-19 |
US7489228B2 (en) | 2009-02-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1639613B1 (fr) | Micro-commutateur bistable a faible consommation | |
EP1562207B1 (fr) | Microsystème électromécanique pouvant basculer entre deux positions stables | |
CA2381081C (fr) | Procede de fixation de plaquette double | |
EP3577683B1 (fr) | Structure pour application radiofréquence | |
EP1743349B1 (fr) | Microcommutateur a faible tension d"actionnement et faible consommation | |
EP1220256A1 (fr) | Micro-dispositif à actionneur thermique | |
EP1543535B1 (fr) | Procédé de réalisation des microcommutateurs a actuation electrostatique a faible temps de reponse et a commutation de puissance | |
EP1438728B1 (fr) | Micro-condensateur variable (mems) a fort rapport et faible tension d'actionnement | |
EP1565921B1 (fr) | Micro-commutateur electrostatique pour composant a faible tension d'actionnement | |
US20090085432A1 (en) | Self-poling piezoelectric mems device | |
EP3410449B1 (fr) | Dispositif magnetique integre a inductance variable et procede de realisation d'un tel dispositif | |
EP1565922B1 (fr) | Micro-commutateur electrostatique pour composant a faible tension d'actionnement | |
EP1570504B1 (fr) | Commutateur micro-mecanique et procede de realisation | |
WO2003069645A1 (fr) | Procede de fabrication d'un micro-composant du type micro-interrupteur | |
EP2960955A1 (fr) | Dispositif de connexion electrique comportant des elements de connexion a position commandable | |
EP2603448B1 (fr) | Microsystemes electromecaniques a gaps d'air | |
FR2880730A1 (fr) | Microsysteme utilisant un microactionneur magnetique a aimant permanent. | |
FR3022691A1 (fr) | Dispositif capacitif commandable integre | |
FR3087007A1 (fr) | Dispositif de detection pyroelectrique a membrane rigide | |
FR2742224A1 (fr) | Capteur a base de silicium et procede de fabrication |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20051213 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR |
|
DAX | Request for extension of the european patent (deleted) | ||
RAP1 | Party data changed (applicant data changed or rights of an application transferred) |
Owner name: COMMISSARIAT A L'ENERGIE ATOMIQUE |
|
GRAP | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOSNIGR1 |
|
RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: ROBERT, PHILIPPE |
|
GRAS | Grant fee paid |
Free format text: ORIGINAL CODE: EPIDOSNIGR3 |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
AK | Designated contracting states |
Kind code of ref document: B1 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: FG4D Free format text: NOT ENGLISH |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: EP |
|
REG | Reference to a national code |
Ref country code: IE Ref legal event code: FG4D Free format text: LANGUAGE OF EP DOCUMENT: FRENCH |
|
REF | Corresponds to: |
Ref document number: 602004008075 Country of ref document: DE Date of ref document: 20070920 Kind code of ref document: P |
|
GBT | Gb: translation of ep patent filed (gb section 77(6)(a)/1977) |
Effective date: 20071024 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: ES Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20071119 Ref country code: NL Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 Ref country code: BG Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20071108 Ref country code: FI Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 |
|
NLV1 | Nl: lapsed or annulled due to failure to fulfill the requirements of art. 29p and 29m of the patents act | ||
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: AT Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 Ref country code: PL Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 |
|
REG | Reference to a national code |
Ref country code: IE Ref legal event code: FD4D |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GR Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20071109 Ref country code: DK Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: IE Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 Ref country code: CZ Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 Ref country code: PT Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20080108 Ref country code: SK Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 |
|
PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: RO Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 Ref country code: SE Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20071108 |
|
26N | No opposition filed |
Effective date: 20080509 |
|
BERE | Be: lapsed |
Owner name: COMMISSARIAT A L'ENERGIE ATOMIQUE Effective date: 20080630 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: MC Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20080630 |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: PL |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: BE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20080630 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: EE Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: CH Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20080630 Ref country code: SI Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 Ref country code: LI Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20080630 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: CY Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: LU Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20080630 Ref country code: HU Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20080209 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: TR Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20070808 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: IT Payment date: 20120626 Year of fee payment: 9 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: IT Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20130630 |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: PLFP Year of fee payment: 13 |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: PLFP Year of fee payment: 14 |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: PLFP Year of fee payment: 15 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 20230623 Year of fee payment: 20 Ref country code: DE Payment date: 20230620 Year of fee payment: 20 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 20230622 Year of fee payment: 20 |
|
REG | Reference to a national code |
Ref country code: DE Ref legal event code: R071 Ref document number: 602004008075 Country of ref document: DE |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GB Free format text: LAPSE BECAUSE OF EXPIRATION OF PROTECTION Effective date: 20240629 |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: PE20 Expiry date: 20240629 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GB Free format text: LAPSE BECAUSE OF EXPIRATION OF PROTECTION Effective date: 20240629 |