EP1492129A4 - Dispositif d'agrandissement d'image de rayons x - Google Patents

Dispositif d'agrandissement d'image de rayons x

Info

Publication number
EP1492129A4
EP1492129A4 EP03712806A EP03712806A EP1492129A4 EP 1492129 A4 EP1492129 A4 EP 1492129A4 EP 03712806 A EP03712806 A EP 03712806A EP 03712806 A EP03712806 A EP 03712806A EP 1492129 A4 EP1492129 A4 EP 1492129A4
Authority
EP
European Patent Office
Prior art keywords
ray image
magnifying device
image magnifying
ray
magnifying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP03712806A
Other languages
German (de)
English (en)
Other versions
EP1492129A1 (fr
Inventor
Akira Ohba
Masaru Sugiyama
Shinobu Onoda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of EP1492129A1 publication Critical patent/EP1492129A1/fr
Publication of EP1492129A4 publication Critical patent/EP1492129A4/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K7/00—Gamma- or X-ray microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
EP03712806A 2002-03-22 2003-03-20 Dispositif d'agrandissement d'image de rayons x Withdrawn EP1492129A4 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2002080947A JP4220170B2 (ja) 2002-03-22 2002-03-22 Ｘ線像拡大装置
JP2002080947 2002-03-22
PCT/JP2003/003452 WO2003081605A1 (fr) 2002-03-22 2003-03-20 Dispositif d'agrandissement d'image de rayons x

Publications (2)

Publication Number Publication Date
EP1492129A1 EP1492129A1 (fr) 2004-12-29
EP1492129A4 true EP1492129A4 (fr) 2007-12-05

Family

ID=28449102

Family Applications (1)

Application Number Title Priority Date Filing Date
EP03712806A Withdrawn EP1492129A4 (fr) 2002-03-22 2003-03-20 Dispositif d'agrandissement d'image de rayons x

Country Status (5)

Country Link
US (1) US20050226372A1 (fr)
EP (1) EP1492129A4 (fr)
JP (1) JP4220170B2 (fr)
AU (1) AU2003221187A1 (fr)
WO (1) WO2003081605A1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3907121B2 (ja) * 2004-02-26 2007-04-18 株式会社リガク Ｘ線分析装置およびｘ線分析装置用通路装置
JP4785177B2 (ja) * 2005-06-09 2011-10-05 浜松ホトニクス株式会社 Ｘ線顕微鏡及び顕微鏡
CN104515785B (zh) * 2014-12-22 2018-07-27 北京师范大学 纳米成像系统
CN104502375B (zh) * 2014-12-22 2018-07-06 北京师范大学 准单色光成像系统
JP6586778B2 (ja) * 2015-05-28 2019-10-09 株式会社ニコン Ｘ線装置および構造物の製造方法
JP6632852B2 (ja) * 2015-10-06 2020-01-22 浜松ホトニクス株式会社 Ｘ線撮像装置及びｘ線撮像方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04265900A (ja) * 1991-02-21 1992-09-22 Nikon Corp 結像型軟ｘ線顕微鏡装置
JPH09251100A (ja) * 1996-03-15 1997-09-22 Olympus Optical Co Ltd 軟ｘ線顕微鏡
WO2000072330A1 (fr) * 1999-05-24 2000-11-30 Jmar Research, Inc. Nanotomographie parallele a rayons x
WO2001008162A1 (fr) * 1999-07-22 2001-02-01 The Regents Of The University Of California Systeme optique a rayons x dupliques a haute efficacite et procede de fabrication

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2759106A (en) * 1951-05-25 1956-08-14 Wolter Hans Optical image-forming mirror system providing for grazing incidence of rays
US3821556A (en) * 1972-02-15 1974-06-28 Nasa Three mirror glancing incidence system for x ray telescope
JPH0631887B2 (ja) * 1988-04-28 1994-04-27 株式会社東芝 Ｘ線ミラー及びその製造方法
JPH0631888B2 (ja) * 1988-05-27 1994-04-27 株式会社東芝 Ｘ線ミラーの製造方法及びその装置
JPH0225737A (ja) * 1988-07-15 1990-01-29 Hitachi Ltd 表面分析方法および装置
JP2883122B2 (ja) * 1989-10-20 1999-04-19 オリンパス光学工業株式会社 Ｘ線顕微鏡
DE4027285A1 (de) * 1990-08-29 1992-03-05 Zeiss Carl Fa Roentgenmikroskop
JPH04328500A (ja) * 1991-04-26 1992-11-17 Olympus Optical Co Ltd コンデンサ
US5432831A (en) * 1992-09-10 1995-07-11 Olympus Optical Co., Ltd. Vacuum optical system
US5434901A (en) * 1992-12-07 1995-07-18 Olympus Optical Co., Ltd. Soft X-ray microscope
US5450463A (en) * 1992-12-25 1995-09-12 Olympus Optical Co., Ltd. X-ray microscope
JP3357164B2 (ja) * 1994-03-04 2002-12-16 浜松ホトニクス株式会社 放射線像拡大観察装置
JPH09500453A (ja) * 1994-05-11 1997-01-14 ザ・リージェンツ・オブ・ザ・ユニバーシティ・オブ・コロラド 球面ミラーかすめ入射ｘ線光学系
JPH09178900A (ja) * 1995-12-27 1997-07-11 Olympus Optical Co Ltd Ｘ線観察装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04265900A (ja) * 1991-02-21 1992-09-22 Nikon Corp 結像型軟ｘ線顕微鏡装置
JPH09251100A (ja) * 1996-03-15 1997-09-22 Olympus Optical Co Ltd 軟ｘ線顕微鏡
WO2000072330A1 (fr) * 1999-05-24 2000-11-30 Jmar Research, Inc. Nanotomographie parallele a rayons x
WO2001008162A1 (fr) * 1999-07-22 2001-02-01 The Regents Of The University Of California Systeme optique a rayons x dupliques a haute efficacite et procede de fabrication

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO03081605A1 *

Also Published As

Publication number Publication date
US20050226372A1 (en) 2005-10-13
WO2003081605A1 (fr) 2003-10-02
JP2003279693A (ja) 2003-10-02
JP4220170B2 (ja) 2009-02-04
EP1492129A1 (fr) 2004-12-29
AU2003221187A1 (en) 2003-10-08

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Legal Events

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PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

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17P Request for examination filed

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AX Request for extension of the european patent

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Effective date: 20071107

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