EP1234221A1 - Circuit destine a produire une tension de reference avec economie de courant - Google Patents

Circuit destine a produire une tension de reference avec economie de courant

Info

Publication number
EP1234221A1
EP1234221A1 EP00972615A EP00972615A EP1234221A1 EP 1234221 A1 EP1234221 A1 EP 1234221A1 EP 00972615 A EP00972615 A EP 00972615A EP 00972615 A EP00972615 A EP 00972615A EP 1234221 A1 EP1234221 A1 EP 1234221A1
Authority
EP
European Patent Office
Prior art keywords
voltage
circuit arrangement
arrangement according
output voltage
voltage divider
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP00972615A
Other languages
German (de)
English (en)
Inventor
Peter Mahrla
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Publication of EP1234221A1 publication Critical patent/EP1234221A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/575—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices characterised by the feedback circuit

Definitions

  • the invention relates to a circuit arrangement for power-saving reference voltage generation according to claim 1.
  • band gap references are often used in monolithic circuits, which generate a constant reference voltage from a fluctuating voltage supply. However, bandgap references themselves require a supply current of over 10 ⁇ A. Voltage regulators also usually have a bandgap reference in order to generate a regulated supply voltage from a fluctuating voltage.
  • the invention has for its object to provide a circuit arrangement for power-saving reference voltage generation, which requires only a low supply current.
  • the invention relates to a circuit arrangement for power-saving reference voltage generation, wherein a programmable voltage source generates an output voltage.
  • the output voltage is compared with a reference voltage at predetermined times.
  • at least one signal is derived by means of a calibration device and is fed to a control device; the The control device programs the voltage source in such a way that the output voltage corresponds as closely as possible to the reference voltage.
  • the actual regulated output voltage is generated by the programmable voltage source.
  • a reference voltage source with a high current requirement is only required at the specified times when the output voltage is compared with the reference voltage.
  • a reference voltage source is simulated, so to speak, by means of the programmable voltage source, with the advantage that the programmable voltage source can be designed to be very energy-saving.
  • the advantage of this method is therefore essentially that the reference voltage is only required at certain points in time and as a result a reference voltage source does not have to be operated continuously. For example, a band gap reference, which provides the reference voltage, is only switched on at the specified times and switched off again in the meantime. This method considerably lowers the current requirement, in particular when the programmable voltage source is recalibrated only at relatively large time intervals.
  • the programmable voltage source is preferably designed as a programmable voltage divider that is provided by a
  • the current consumption of the programmable voltage source can be significantly reduced, in particular by high resistance values of the voltage divider.
  • Another advantage is the simple construction of the voltage divider and the voltage source that feeds the voltage divider. If high resistance values are used for the voltage divider, not only is the power consumption reduced, but also the feeding voltage source is less stressed.
  • the voltage divider preferably has a plurality of resistors connected in series and individual resistors of the voltage divider are each by means of a switch bridged.
  • This embodiment is advantageously very simple to implement in terms of circuitry.
  • the voltage divider can also be implemented as a parallel connection of resistors.
  • this embodiment requires a larger area in the case of an integrated circuit in the semiconductor and integration technologies currently available.
  • the values of the resistors are preferably graded in such a way that the values of resistors connected in series differ by a factor of two and each resistance value is a multiple of a predetermined resistance value. This enables a finely graduated characteristic curve of the voltages programmable with the voltage divider to be achieved. In addition, especially in integrated circuit technology, relationships between resistors can be realized more precisely than absolute values.
  • the control device programs the voltage divider preferably by closing or opening individual switches.
  • the switches are preferably in the form of MOSFET transistors
  • Enrichment type executed. This embodiment facilitates integration of the method with other circuits, in particular in a monolithic CMOS circuit.
  • MOSFET transistors have been used as switches in digital technology due to their good switching characteristics and their low
  • Load path resistance has proven itself and is therefore also well suited for almost resistance-free bridging of individual resistors of the voltage divider.
  • Enrichment-type MOSFET transistors in particular are suitable as switches, since these transistors only start to conduct from a certain control voltage and thus block reliably at a control voltage of 0 V and slightly above.
  • the control device preferably stores the programming of the voltage divider digitally.
  • Digital storage of the programmed setting of the voltage divider is very simple, in particular in integrated circuit tion technology can be implemented and, on the other hand, it is more reliable than, for example, analog storage, which is lossy and in which adequate long-term stability, for example over several weeks, can hardly be achieved, in particular due to leakage currents.
  • the control device is particularly preferably designed as a digital counter with an up and down counting function.
  • a large number of digital counters are available, are easy to implement and can be constructed in a very energy-saving manner, in particular in CMOS technology.
  • the digital counter is preferably clocked by a counting clock, the counting pulses of which correspond to the predetermined times for comparing the output voltage.
  • the times for comparing the output voltage with the reference voltage are preferably predetermined as a function of fluctuations or changes in the output voltage. In the case of fluctuations with a short time interval, a calibration must be carried out correspondingly more frequently than with fluctuations with a large time interval.
  • a control element is particularly preferably connected downstream of the voltage divider and is controlled by the voltage divider in such a way that the control element regulates the current flow when the output voltage of the voltage divider drops below a predetermined voltage.
  • the control element is preferably designed as an n-channel MOSFET transistor of the enhancement type in the source circuit or, for example, in BICMOS technology as an npn bipolar transistor in the emitter-follower circuit. This prevents, on the one hand, the voltage divider from being loaded by an excessively high output current and, on the other hand, that buffer capacitors are discharged, in particular when the supply voltage drops, via resistors in the circuit.
  • a positive temperature coefficient of the control element is preferably compensated for by diodes connected in the voltage divider.
  • FIG. 1 shows a block diagram of a first exemplary embodiment of the circuit arrangement according to the invention
  • Figure 2 shows a second embodiment of the circuit arrangement according to the invention in CMOS technology.
  • a voltage source 35 feeds a programmable voltage divider which has four resistors 30 to 33 connected in series. Like the connection of the voltage source, the base point of the voltage divider is connected to a reference potential GND of 0 V.
  • the values of the four resistors 30 to 33 of the voltage divider are graded as follows: resistor 30 is 2-RO, resistor 31 is 4-RO and resistor 32 is 8-RO. This results in a finely graduated characteristic of the programmable voltage divider.
  • Resistors 30 to 32 can each be bridged with a switch 20 or 21 or 22 connected in parallel.
  • the voltage divider can be programmed via switches 20 to 22.
  • the switches 20 to 22 are opened or closed by a control device 10 by a control signal 40 or 41 or 42, respectively.
  • the output voltage U can be set at point 401 of the voltage divider.
  • the output voltage U is buffered via a capacitor 34 against the reference potential GND.
  • the point 401 is connected via a further switch 23 to a calibration device 11 which, when the switch 23 is closed, measures the voltage at the feed point of the voltage divider and compares it with a reference voltage.
  • a calibration pulse 44 closes the switch 23 and also activates the control device 10 for programming the voltage divider.
  • the calibration device 11 regulates the control device 10 via a control signal 43, which in turn programs the voltage divider in such a way that the voltage at point 401 corresponds as far as possible to the reference voltage.
  • the voltage divider is programmed so that the voltage at point 401 corresponds to half the reference voltage. This depends on the control regulation installed in the calibration device 11.
  • a voltage source 304 feeds a programmable voltage divider at a feed point 402.
  • the voltage divider comprises four resistors 36 to 39 connected in series, a diode 300 which is polarized in the direction of flow and connected in series to the four resistors 36 to 39, and a fifth resistor 301 connected in series.
  • the base point of the voltage divider is at a reference potential GND connected by 0 V.
  • the load path of a p-channel MOSFET transistor 24 or 25 or 26 of the enhancement type is connected in parallel with three resistors 36 to 38.
  • the transistors 24 to 26 are each controlled by a Bit2 signal 48 or Bil signal 49 or BitO signal 400.
  • the Bit2 signal 48, Bitl signal 49 and BitO signal 400 are each a digital output signal from a digital counter 12, which programs the voltage divider.
  • the digital counter 12 is an up / down counter. The counting direction is set by an up-count signal 45 and a down-count signal 46. Like the voltage divider, the digital counter 12 is fed by the voltage source 304.
  • the calibration device 14 is supplied with current via the MOSFET transistor 27.
  • the calibration device 14 has a voltage reference 15, which is supplied by the voltage at the feed point 402 of the voltage divider via the transistor 27.
  • the output voltage of the voltage reference 15 feeds a voltage divider having three resistors 306 to 308 connected in series, the base of which is connected to the reference potential GND.
  • a voltage at two center points of the voltage divider 403 and 404 is supplied to the inverted input of a comparator 309 and the non-inverted input of a comparator 310, respectively.
  • the comparators compare the supplied voltages with the output voltage U of the entire circuit.
  • the down count signal 46 is then present at the output of the comparator 309 and the up count signal 45 is present at the output of the comparator 310.
  • the transistor 27 and the digital counter 12 are activated by a calibration pulse 47.
  • the calibration pulse 47 is supplied by an inverter 305, which makes the edges of the calibration pulse steep.
  • an n-channel MOSFET transistor 28 of the enhancement type is provided, which is controlled by a voltage at the p-terminal of the diode 300 and, when the output voltage U drops, reduces the internal resistance of the N-channel MOSFET and so far counteracts the drop in output voltage.
  • the diode 300 partially compensates for a positive temperature coefficient of the n-channel MOSFET transistor 28.
  • a calibration pulse causes the transistor 27 to close. This supplies the calibration device 14.
  • the voltage at the supply point of the voltage divider changes accordingly.
  • a power-on reset generator 13 resets the digital counter 12 to an initial state in the event of a power failure and when the supply voltage is switched on again.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Control Of Electrical Variables (AREA)

Abstract

L'invention concerne un circuit destiné à produire une tension de référence avec économie de courant. Selon l'invention, une source de tension programmable produit une tension de sortie, qui est comparée à des instants prédéfinis à une tension de référence. En fonction de la comparaison, au moins un signal est déduit au moyen d'un dispositif de calibrage, puis transmis à un dispositif de commande. Ce dispositif de commande programme la source de tension de manière que la tension de sortie corresponde le plus exactement possible à la tension de référence.
EP00972615A 1999-09-30 2000-09-28 Circuit destine a produire une tension de reference avec economie de courant Withdrawn EP1234221A1 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19947115 1999-09-30
DE19947115A DE19947115C2 (de) 1999-09-30 1999-09-30 Schaltungsanordnung zur stromsparenden Referenzspannungserzeugung
PCT/DE2000/003466 WO2001023973A1 (fr) 1999-09-30 2000-09-28 Circuit destine a produire une tension de reference avec economie de courant

Publications (1)

Publication Number Publication Date
EP1234221A1 true EP1234221A1 (fr) 2002-08-28

Family

ID=7924014

Family Applications (1)

Application Number Title Priority Date Filing Date
EP00972615A Withdrawn EP1234221A1 (fr) 1999-09-30 2000-09-28 Circuit destine a produire une tension de reference avec economie de courant

Country Status (6)

Country Link
US (1) US6492864B2 (fr)
EP (1) EP1234221A1 (fr)
JP (1) JP2003510712A (fr)
CN (1) CN1384929A (fr)
DE (1) DE19947115C2 (fr)
WO (1) WO2001023973A1 (fr)

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JP4557342B2 (ja) * 2000-01-13 2010-10-06 富士通セミコンダクター株式会社 半導体装置
JP3868756B2 (ja) * 2001-04-10 2007-01-17 シャープ株式会社 半導体装置の内部電源電圧発生回路
ITRM20010521A1 (it) * 2001-08-30 2003-02-28 Micron Technology Inc Sorgente di bassa tensione di riferimento ad inseguimento a potenza ultra bassa.
JP3807321B2 (ja) 2002-02-08 2006-08-09 セイコーエプソン株式会社 基準電圧発生回路、表示駆動回路、表示装置及び基準電圧発生方法
DE10212360B9 (de) * 2002-03-20 2007-05-31 Minebea Co., Ltd. Schaltkreis zum Erzeugen einer einstellbaren Ausgangskennlinie
DE10218097B4 (de) 2002-04-23 2004-02-26 Infineon Technologies Ag Schaltungsanordnung zur Spannungsregelung
DE10219347A1 (de) * 2002-04-30 2003-11-20 Infineon Technologies Ag Schaltungsanordnung zur Bereitstellung eines Referenzsignals
US6815998B1 (en) * 2002-10-22 2004-11-09 Xilinx, Inc. Adjustable-ratio global read-back voltage generator
KR100645059B1 (ko) * 2004-11-04 2006-11-10 삼성전자주식회사 정밀한 전압 조정을 수행하는 트리밍 회로 및 이를 구비한반도체 메모리 장치
US7212043B2 (en) * 2005-03-11 2007-05-01 Broadcom Corporation Line regulator with high bandwidth (BW) and high power supply rejection ration (PSRR) and wide range of output current
US7557550B2 (en) * 2005-06-30 2009-07-07 Silicon Laboratories Inc. Supply regulator using an output voltage and a stored energy source to generate a reference signal
JP4108695B2 (ja) 2005-07-15 2008-06-25 三菱電機株式会社 車載電子制御装置
KR100703885B1 (ko) * 2005-07-18 2007-04-06 삼성전자주식회사 외부 공급 전압으로부터 적응적으로 내부 전압을 발생하는장치 및 그 방법
CN101093400B (zh) * 2006-06-19 2011-07-06 群联电子股份有限公司 可程序的侦测调整器
US7741900B1 (en) * 2006-11-02 2010-06-22 Marvell International Ltd. Bias setting device
CN102084312B (zh) * 2008-07-03 2014-07-30 圣戈本陶瓷及塑料股份有限公司 用于探测器的有源分压器
US7902904B2 (en) * 2008-12-09 2011-03-08 Lsi Corporation Bias circuit scheme for improved reliability in high voltage supply with low voltage device
US8279549B2 (en) * 2009-04-29 2012-10-02 Texas Instruments Incorporated System and method for setting bias for MR head
KR101014982B1 (ko) * 2009-05-29 2011-02-16 주식회사 하이닉스반도체 전압 발생부를 구비한 반도체 장치
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US9559682B2 (en) * 2015-01-12 2017-01-31 Infineon Technologies Ag Protected switching element
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Also Published As

Publication number Publication date
JP2003510712A (ja) 2003-03-18
CN1384929A (zh) 2002-12-11
WO2001023973A1 (fr) 2001-04-05
US20020130710A1 (en) 2002-09-19
DE19947115A1 (de) 2001-06-21
US6492864B2 (en) 2002-12-10
DE19947115C2 (de) 2002-01-03

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