EP1212629A1 - Prüfgerät zum gleichzeitigen testen mehrerer integrierter schaltkreise - Google Patents
Prüfgerät zum gleichzeitigen testen mehrerer integrierter schaltkreiseInfo
- Publication number
- EP1212629A1 EP1212629A1 EP00959345A EP00959345A EP1212629A1 EP 1212629 A1 EP1212629 A1 EP 1212629A1 EP 00959345 A EP00959345 A EP 00959345A EP 00959345 A EP00959345 A EP 00959345A EP 1212629 A1 EP1212629 A1 EP 1212629A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- memory
- pattern generator
- bit
- word
- bit stream
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US386946 | 1999-08-31 | ||
US09/386,946 US6363510B1 (en) | 1999-08-31 | 1999-08-31 | Electronic system for testing chips having a selectable number of pattern generators that concurrently broadcast different bit streams to selectable sets of chip driver circuits |
PCT/US2000/023216 WO2001016613A1 (en) | 1999-08-31 | 2000-08-23 | Tester for concurrently testing multiple chips |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1212629A1 true EP1212629A1 (de) | 2002-06-12 |
EP1212629B1 EP1212629B1 (de) | 2004-11-17 |
Family
ID=23527768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00959345A Expired - Lifetime EP1212629B1 (de) | 1999-08-31 | 2000-08-23 | Prüfgerät zum gleichzeitigen testen mehrerer integrierter schaltkreise |
Country Status (5)
Country | Link |
---|---|
US (1) | US6363510B1 (de) |
EP (1) | EP1212629B1 (de) |
JP (1) | JP3827575B2 (de) |
DE (1) | DE60015991T2 (de) |
WO (1) | WO2001016613A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110806539A (zh) * | 2019-11-26 | 2020-02-18 | 深圳赛意法微电子有限公司 | 一种继电器与驱动芯片的检测器 |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6651203B1 (en) * | 1999-05-17 | 2003-11-18 | Infineon Technologies Ag | On chip programmable data pattern generator for semiconductor memories |
US6502051B1 (en) * | 2000-03-16 | 2002-12-31 | Sun Microsystems, Inc. | Method and apparatus for optimizing testing sequences for electronic equipment |
TWI278778B (en) * | 2002-05-06 | 2007-04-11 | Nextest Systems Corp | Apparatus for testing semiconductor devices and method for use therewith |
US7080283B1 (en) * | 2002-10-15 | 2006-07-18 | Tensilica, Inc. | Simultaneous real-time trace and debug for multiple processing core systems on a chip |
US6941232B2 (en) * | 2003-01-28 | 2005-09-06 | Texas Instruments Incorporated | Method and apparatus for performing multi-site integrated circuit device testing |
US6910162B2 (en) * | 2003-05-12 | 2005-06-21 | Kingston Technology Corp. | Memory-module burn-in system with removable pattern-generator boards separated from heat chamber by backplane |
DE10324080B4 (de) | 2003-05-27 | 2006-03-23 | Infineon Technologies Ag | Verfahren zum Testen von zu testenden Schaltungseinheiten in einer Testvorrichtung |
DE10326317B4 (de) * | 2003-06-11 | 2007-05-10 | Infineon Technologies Ag | Testsystem zum Testen von integrierten Bausteinen |
US7613184B2 (en) * | 2003-11-07 | 2009-11-03 | Alcatel Lucent | Method and apparatus for performing scalable selective backpressure in packet-switched networks using internal tags |
US7181661B2 (en) * | 2004-02-04 | 2007-02-20 | International Business Machines Corporation | Method and system for broadcasting data to multiple tap controllers |
US20060125504A1 (en) * | 2004-12-10 | 2006-06-15 | Systems On Silicon Manufacturing Company Pte. Ltd. | Printed circuit board for burn-in testing |
KR100660640B1 (ko) * | 2005-08-18 | 2006-12-21 | 삼성전자주식회사 | 웨이퍼 자동선별 테스트를 위한 데이터 기입 장치 및 방법 |
JP2007101395A (ja) * | 2005-10-05 | 2007-04-19 | Sony Corp | 回路装置の検査装置、検査方法及び製造方法 |
US7765450B2 (en) * | 2005-10-20 | 2010-07-27 | Jon Udell | Methods for distribution of test generation programs |
US7478298B2 (en) * | 2006-01-26 | 2009-01-13 | Honeywell International Inc. | Method and system for backplane testing using generic boundary-scan units |
US7511525B2 (en) * | 2006-01-26 | 2009-03-31 | Honeywell International Inc. | Boundary-scan system architecture for remote environmental testing |
US7523368B2 (en) * | 2006-01-26 | 2009-04-21 | Honeywell International Inc. | Diagnostics unit using boundary scan techniques for vehicles |
US8516305B2 (en) * | 2010-09-01 | 2013-08-20 | Advanced Micro Devices, Inc. | Power dissipation test method and device therefor |
CN115037419B (zh) * | 2022-08-11 | 2023-01-31 | 德州鲲程电子科技有限公司 | 用于芯片测试过程中的不定长编码数据串行传输的方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4928278A (en) * | 1987-08-10 | 1990-05-22 | Nippon Telegraph And Telephone Corporation | IC test system |
DE4028819A1 (de) * | 1990-09-11 | 1992-03-12 | Siemens Ag | Schaltungsanordnung zum testen eines halbleiterspeichers mittels paralleltests mit verschiedenen testbitmustern |
US5390129A (en) * | 1992-07-06 | 1995-02-14 | Motay Electronics, Inc. | Universal burn-in driver system and method therefor |
KR970010656B1 (ko) * | 1992-09-01 | 1997-06-30 | 마쯔시다 덴기 산교 가부시끼가이샤 | 반도체 테스트 장치, 반도체 테스트 회로칩 및 프로브 카드 |
US5504670A (en) * | 1993-03-31 | 1996-04-02 | Intel Corporation | Method and apparatus for allocating resources in a multiprocessor system |
EP0642083A1 (de) * | 1993-09-04 | 1995-03-08 | International Business Machines Corporation | Prüfschaltkreis und Verfahren zum Prüfen von Chipverbindungen |
-
1999
- 1999-08-31 US US09/386,946 patent/US6363510B1/en not_active Expired - Fee Related
-
2000
- 2000-08-23 DE DE60015991T patent/DE60015991T2/de not_active Expired - Fee Related
- 2000-08-23 JP JP2001520117A patent/JP3827575B2/ja not_active Expired - Fee Related
- 2000-08-23 EP EP00959345A patent/EP1212629B1/de not_active Expired - Lifetime
- 2000-08-23 WO PCT/US2000/023216 patent/WO2001016613A1/en active IP Right Grant
Non-Patent Citations (1)
Title |
---|
See references of WO0116613A1 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110806539A (zh) * | 2019-11-26 | 2020-02-18 | 深圳赛意法微电子有限公司 | 一种继电器与驱动芯片的检测器 |
Also Published As
Publication number | Publication date |
---|---|
US6363510B1 (en) | 2002-03-26 |
JP3827575B2 (ja) | 2006-09-27 |
JP2003508758A (ja) | 2003-03-04 |
EP1212629B1 (de) | 2004-11-17 |
DE60015991T2 (de) | 2005-11-03 |
WO2001016613A1 (en) | 2001-03-08 |
DE60015991D1 (de) | 2004-12-23 |
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KR19980032311A (ko) | 자동 시험 장치(ate) 테스터의 아날로그 채널에서의 펄스 발생 | |
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