EP1193958A1 - Metallische Prüfung einer Teilnehmerschleife mit Sprach- und digitalen Teilnehmerleitungdiensten - Google Patents

Metallische Prüfung einer Teilnehmerschleife mit Sprach- und digitalen Teilnehmerleitungdiensten Download PDF

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Publication number
EP1193958A1
EP1193958A1 EP01303329A EP01303329A EP1193958A1 EP 1193958 A1 EP1193958 A1 EP 1193958A1 EP 01303329 A EP01303329 A EP 01303329A EP 01303329 A EP01303329 A EP 01303329A EP 1193958 A1 EP1193958 A1 EP 1193958A1
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EP
European Patent Office
Prior art keywords
line card
voice
dsl
metallic
subscriber loop
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP01303329A
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English (en)
French (fr)
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EP1193958B1 (de
Inventor
Carl Robert Posthuma
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Nokia of America Corp
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Lucent Technologies Inc
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Publication date
Application filed by Lucent Technologies Inc filed Critical Lucent Technologies Inc
Publication of EP1193958A1 publication Critical patent/EP1193958A1/de
Application granted granted Critical
Publication of EP1193958B1 publication Critical patent/EP1193958B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/302—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs
    • H04M3/303—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs and using PCM multiplexers, e.g. pair gain systems
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/005—Interface circuits for subscriber lines
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/005—Interface circuits for subscriber lines
    • H04M3/007—Access interface units for simultaneous transmission of speech and data, e.g. digital subscriber line [DSL] access interface units
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/2209—Arrangements for supervision, monitoring or testing for lines also used for data transmission

Definitions

  • This invention relates to the field of telephone subscriber loops that provide high speed data service and voice service, and, more particularly, to metallic testing of such loops.
  • DSL Digital Subscriber Line
  • ADSL asymmetrical DSL
  • SDSL symmetrical DSL
  • XDSL symmetrical DSL
  • Many XDSL technologies provide high speed data service over the current tip-ring pairs by encoding high speed data signals into frequency ranges well above the frequency range that carries both plain old telephone service (“POTS”) or integrated services digital network (ISDN) service.
  • POTS plain old telephone service
  • ISDN integrated services digital network
  • FIG. 1 a current metallic test system is illustrated in the context of metallic testing of a subscriber loop 5.
  • Subscriber loop 5 subscribes to both voice and DSL services.
  • a voice switch 12 and a digital subscriber line access multiplexer (DSLAM) 14, which provide voice and data service for subscriber loop 5, respectively.
  • Voice switch 12 is connected to subscriber loop 5 by line card 16 as is known in the art.
  • Line card 16 includes processing unit 18 which sends and receives analog signals over subscriber loop 5 and processes the signals to/from pulse code modulated (PCM) data, as used in the switching network as is known in the art.
  • DSLAM 14 includes a line card 20 which sends and receives data from loop 5 to and from the data network via transceiver 22.
  • Voice switch 12 and, more specifically, processing unit 18 supports analog signals in the 0 - 4 kHz band over subscriber loop 5.
  • DSLAM 14, and more specifically transceiver 22 on line card 20 supports signals in the 32 - 1,100 kHz range over subscriber loop 5.
  • splitter 24 is provided in order to filter unwanted characteristics from the subscriber loop 5 for processing at processor 18 on voice line card 16 and DSL line card 20.
  • splitter 24 includes low-pass filter 26, which attenuates the high voltage of DSL and generally filters out the high frequency DSL signal.
  • the DC component of signals on subscriber loop 5 are filtered by a capacitor 28 on line card 20 and a further capacitor 30 in splitter 24.
  • voice switches include a voice switch metallic test unit 32 that tests loop 5 for various faults.
  • Metallic test unit 32 is connected to line card 16 via metallic test bus 34.
  • Metallic test bus 34 is connected through a set of relays 36 comprising a normally closed relay 38 and a normally open relay 40. This set of relays 30 is reversed when voice switch metallic test unit 32 tests loop 5 to protect the circuitry of processing unit 18 on line card 16.
  • DSLAM 14 includes DSLAM metallic test unit 42 which is connected to line card 20 via metallic test bus 44 to relays 46 including normally closed relay 48 and normally opened relay 50.
  • splitter 24 In order to effect a usable path through splitter 24 for either metallic test unit 32 or 42, several additional components must be included in splitter 24. For example, in order to test loop 5 from voice switch metallic unit 32, a signature 52 must be present in order to alert voice switch metallic unit 32 of the voltage loss that will occur because of the presence of splitter 24. If signature 52 were not present, then any estimates of broken cable etc. would be incorrect.
  • a detector 54 needs to be added to splitter 24 in order to detect whether the voice path is currently in use.
  • An additional detector 56 is needed to detect signals from DSLAM metallic test unit 42 which will inform processor 58 that metallic test unit 42 is going to test loop 5. When this occurs, processor 58 closes normally open relay 60 and opens normally closed relay 62 in order to permit testing from DSLAM metallic test unit 42 without interfering with line card 16 on voice switch 12. All of these additional units not only are costly but also require a power supply 64 in order to operate. All of these units also then need to be diagnosed, fused, maintained, alarmed, etc. as is known in the art.
  • Voice services are provided by a voice switch and DSL services are provided by a digital subscriber line access multiplexer (DSLAM); each of which includes a metallic test unit.
  • a voice line card in the voice switch has a connection to a first metallic test bus connected to the voice switch metallic test unit via a first set of relays configured to connect the metallic test bus to the subscriber loop and to disconnect the subscriber loop from voice on the line card when testing is performed.
  • a DSL line in the DSLAM card has a connection to a second metallic test bus, which is connected between the DSLAM metallic test unit and the subscriber loop.
  • a second set of relays control the connection of the metallic test bus to the subscriber loop.
  • the voice switch metallic test system is configured to send signals to control the second set of relays to disconnect the DSL line card and to provide metallic tests over the entire wireline spectrum (DC to light).
  • the DSL metallic test unit connected to the second metallic test bus is configured to send signals to control the first set of relays to disconnect the DSL line card and to provide metallic tests from DC to light.
  • a determination is made whether there is traffic on either the voice line or the DSL line prior to metallic testing.
  • the metallic test may then be run and then, for example, a timer may cause the relays to reset to their original state.
  • a detector on each of the line cards may receive out-of-band signaling from the metallic test units and cause the relays to operate.
  • FIG. 2 is a block diagram of a system that effects metallic testing of a subscriber loop from both a voice switch 200 and a digital subscriber line access multiplexer (DSLAM) also called a DSL switch 202.
  • DSL-ready POTS line card 204 is connected to the switching core of voice switch 200 through a pulse code modulated (PCM) connection 206.
  • PCM pulse code modulated
  • DSL-ready POTS line card 204 is also connected to the voice switch 200 metallic test unit 208 via metallic test bus 210.
  • plain old telephone service (POTS) also includes integrated services digital network (ISDN) service. Both POTS and ISDN use the same low frequency band and perform metallic testing in a similar, and in some cases, identical manner.
  • ISDN integrated services digital network
  • a DSL-ready line card as described herein is more fully described in U.S. Patent Application No. 09/650,050 filed August 28, 2000, which is incorporated herein by reference.
  • the embodiment of the line card described herein is exemplary; it is within the ability of one skilled in the art to modify this embodiment to meet the needs of different line card configurations without departing from the scope of the claims.
  • DSL-ready line card 204 comprises four main components. According to this exemplary embodiment, DSL-ready line card 204 comprises a compensating digital signal processor 212, a CODEC or digital/analog, analog/digital converter 214 and a battery feed 216. In addition, a second-order, low-pass filter is included 218. For a more complete description of the functionality of POTS line card 204, see, U.S. Patent Application 09/650,050, incorporated by reference above.
  • each pair 220 and 222 comprises a normally closed relay 224 that normally connects tip-ring pair 22 to low-pass filter 218, and a normally open relay 226. These relays are controlled by a processor 228. When a metallic test is performed, processor 228 causes relays 224 to open and relays 226 to close, thus connecting voice switch metallic test unit 208 to tip-ring pair 22 via metallic test bus 210 (and removing the components 212, 214, 216 and 218 from the metallic test bus and loop where voltages and signals are present that could damage sensitive circuits).
  • XDSL line card 240 likewise sends and receives signals on tip-ring pair 22.
  • XDSL line card 240 includes a DC blocking and low frequency filter shown as capacitors 242.
  • Transceiver 244 sends and receives data over tip-ring pair 22 and sends and receives data from the data network over line 246 to the data network.
  • XDSL line card 240 also includes two pair of relays 250 and 252 comprising normally closed relays 254 and normally open relays 256.
  • processor 256 causes relays 250 and 252 to open relays 254 and close relays 256 thus connecting DSLAM metallic test unit 258 to tip-ring pair 22 via metallic test bus 260.
  • detectors 262 and 264 (shown in phantom) detect when either of the metallic units 208, 258 is testing as will be described further below in connection with FIGs. 3 and 4.
  • FIG. 3 a flowchart is shown for control of DSLAM metallic unit 258 testing tip-ring pair 22. Processing starts in oval 300 and proceeds to action box 305 wherein processor 256 causes relay pairs 250 and 252 to open normally closed relay 254 and close normally opened relay 256, thus disconnecting transceiver 244 from tip-ring pair 22. This action also connects DSLAM metallic test unit 258 to tip-ring pair 22 via metallic test bus 260. Processing then moves to decision diamond 310 where a determination is made whether there is activity in the voice frequency. This step may be accomplished by sending a signal from DSLAM metallic test unit 258 over metallic test bus 260 across tip-ring pair 22 to either a detector 262 or to CODEC 214 via low-pass filter 218 and feed 216.
  • the signal is, in this exemplary embodiment, a 10 - 16 kHz AC signal (between the voice and the XDSL band). Other frequency AC or DC signals may also be used.
  • the AC signal is received and processor 228 notified that the DSLAM metallic test unit 258 wants to test loop 22. This signal is detected either by detector 262, CODEC 214 or feed 216. Processor 228 then queries CODEC 214 to determine if speech is currently being processed. Alternatively, detector 262 or even DSLAM metallic test unit 258 may determine whether there is energy on tip-ring pair 22 in the voice frequency range that is above a predetermined threshold. A response is sent back to DSLAM metallic test unit 258 from detector 262 or CODEC 214 via tip-ring pair 22 and metallic bus 260. If there is activity in the voice then metallic testing is deferred until the activity has cleared.
  • a test message is sent to the voice line card 320. Again, this test message may be in the band between voice and DSL band, i.e., an AC signal in the 10 - 16 kHz range. Either detector 262 (if present), CODEC 214 or feed 216 informs processor 228 of the presence of this signal. Processor 228 causes relays 220 and 222 to open normally closed relays 224 and close normally opened relays 226 as in step 330. Processing moves to action box 340 where a timer is set in processor 228. Alternatively, no timer need be set if there is a detector 262. In action box 350 DSLAM metallic test unit 258 can test tip-ring pair from "DC to light".
  • FIG. 4 a flowchart of testing from voice switch metallic test unit 208 is shown. This flowchart is very similar to the one shown in FIG. 3. Processing starts in oval 400 and proceeds to action box 405 wherein processor 228 causes relay pairs 220 and 222 to open normally closed relay 224 and close normally open relays 226, thus disconnecting low-pass filter 218, and the other circuits on DSL-ready line card 204 from tip-ring pair 22. Further, this action connects voice switch metallic test unit 208 to the loop (tip-ring pair) 22 via metallic test bus 210. Processing then moves to decision diamond 410 where a determination is made whether there is activity in the DSL. This step may be accomplished by sending a signal across tip-ring pair 22 either to detector 264 or to transceiver 244.
  • Processor 256 queries transceiver 244 to determine if DSL activity is present (anything other than idle code, in this exemplary embodiment) or, alternatively, detector 264 can determine if there is energy above a predetermined threshold on tip-ring pair 22 in the DSL frequency range. A response is sent back to voice switch metallic test unit 208. If there is activity in the DSL band then processing waits until the activity has cleared. Alternatively, voice switch metallic test unit 208 could determine whether DSL traffic is present on loop 22.
  • a test message is sent to the DSL line card 240. Again, this test message may be an AC signal in the 10 - 16 kHz range. Either detector 264 or transceiver 244 informs processor 256 of the presence of this signal. Processor 256 causes relays 250 and 252 to open normally closed relays 254 and close normally opened relays 256 as in step 430. Processing moves to action box 440 where a timer is set in processor 256 (if the timer is present). Alternatively, no timer need be set if there is a detector 264. In action box 450 voice switch metallic test unit 208 can test tip-ring from "DC to light".

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  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
EP01303329A 2000-09-29 2001-04-09 Metallische Prüfung einer Teilnehmerschleife mit Sprach- und digitalen Teilnehmerleitungdiensten Expired - Lifetime EP1193958B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/675,884 US6496566B1 (en) 2000-09-29 2000-09-29 Metallic testing of a subscriber loop that provides both voice and digital subscriber line services
US675884 2000-09-29

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EP1193958A1 true EP1193958A1 (de) 2002-04-03
EP1193958B1 EP1193958B1 (de) 2004-01-07

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US (1) US6496566B1 (de)
EP (1) EP1193958B1 (de)
JP (1) JP3905733B2 (de)
CN (1) CN1204714C (de)
CA (1) CA2357565C (de)
DE (1) DE60101709T2 (de)

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WO2002047429A1 (en) * 2000-11-06 2002-06-13 Adc Telecommunications, Inc. Access panel for line sharing adsl/pots splitter applications
DE10137219C1 (de) * 2001-07-30 2003-04-03 Siemens Ag Elektronisches Wählsystem und Verfahren zur Präqualifikation von Teilnehmeranschlussleitungen
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WO2004032563A3 (en) * 2002-10-03 2004-05-27 Tyco Electronics Raychem Sa Metallic test access for xdsl connectors
WO2004032563A2 (en) * 2002-10-03 2004-04-15 Tyco Electronics Raychem Sa Metallic test access for xdsl connectors
CN1330165C (zh) * 2002-12-24 2007-08-01 中兴通讯股份有限公司 一种数字用户环路抓线测试装置
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DE60101709T2 (de) 2004-12-02
CA2357565C (en) 2004-08-17
DE60101709D1 (de) 2004-02-12
JP2002247192A (ja) 2002-08-30
CN1204714C (zh) 2005-06-01
CN1348280A (zh) 2002-05-08
EP1193958B1 (de) 2004-01-07
US6496566B1 (en) 2002-12-17
JP3905733B2 (ja) 2007-04-18
CA2357565A1 (en) 2002-03-29

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