EP1094390A1 - Procédé et dispositif de test du fonctionnement d'une unité électronique par simulation et installation de test d'unité à embarquer sur un matériel ferroviaire ou un véhicule électrique - Google Patents
Procédé et dispositif de test du fonctionnement d'une unité électronique par simulation et installation de test d'unité à embarquer sur un matériel ferroviaire ou un véhicule électrique Download PDFInfo
- Publication number
- EP1094390A1 EP1094390A1 EP00402227A EP00402227A EP1094390A1 EP 1094390 A1 EP1094390 A1 EP 1094390A1 EP 00402227 A EP00402227 A EP 00402227A EP 00402227 A EP00402227 A EP 00402227A EP 1094390 A1 EP1094390 A1 EP 1094390A1
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- EP
- European Patent Office
- Prior art keywords
- signals
- unit
- microprocessor
- simulation
- logic circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B60—VEHICLES IN GENERAL
- B60L—PROPULSION OF ELECTRICALLY-PROPELLED VEHICLES; SUPPLYING ELECTRIC POWER FOR AUXILIARY EQUIPMENT OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRODYNAMIC BRAKE SYSTEMS FOR VEHICLES IN GENERAL; MAGNETIC SUSPENSION OR LEVITATION FOR VEHICLES; MONITORING OPERATING VARIABLES OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRIC SAFETY DEVICES FOR ELECTRICALLY-PROPELLED VEHICLES
- B60L2200/00—Type of vehicles
- B60L2200/26—Rail vehicles
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
- Y02T10/00—Road transport of goods or passengers
- Y02T10/60—Other road transportation technologies with climate change mitigation effect
- Y02T10/72—Electric energy management in electromobility
Definitions
- the invention relates to a method and a device for functional test of an electronic unit by simulation.
- the invention also relates to a test installation electronic units to be loaded on railway equipment or an electric vehicle.
- Such a control unit being a complex material
- a test bench comprising a simulator capable of generating supplied simulation signals as input to the unit and to analyze the control signals generated by such a unit.
- a simulator works in real time and simulates, for example, the engine, the brakes or the inertia of a railcar, as well as the state of rails or other external parameters.
- One type of simulator is used for the functional test of different electronic units, the operation of the simulator being adapted by programming according to the type and use of the unit.
- Such a simulator includes one or several microprocessors intended to process transmitted signals by the unit in order to send it new signals of simulation.
- Such a simulator is of the hardware in the type. loop "or" hardware in the simulation loop ".
- the simulation programs work with a cycle time of the order of a few tens of microseconds, this cycle time being much greater at the desired precision, of the order of a micro-second for the electronic unit.
- the microprocessor or calculator works "blind" for several tens of micro-seconds before generating a new signal simulation.
- interrupting frequently microprocessor operation for example all microseconds, to acquire a new signal value emitted by the unit, but this would significantly disturb the operation of the computer which could no longer manage the many values acquired.
- such a solution is not technically usable in the case where seeks precision of the order of a microsecond.
- the invention relates to a method which consists of processing, as and when they are issued, certain output signals from the electronic unit, by means of at least one programmable logic circuit, to store parameter values corresponding to these processed signals and to have the simulator microprocessor access these values parameters stored at a frequency compatible with its operating speed.
- the programmable logic circuit allows to acquire with great speed, that is to say in real time, the output signals generated by the unit, which can be GTO or IGBT circuit control orders, while the simulator microprocessor is running perform calculation operations. At the end of these calculation operations, i.e. for example after a 10 millisecond period, the microprocessor can then acquire the values processed by the programmable logic circuit during this period, these values being stored in a buffer memory. So the positioning over time and the value of the signals emitted by the electronic unit can be known precisely without disrupting operation of the simulator microprocessor.
- the invention also relates to a device for to implement the method as previously described and, more specifically, a device that includes a simulator comprising at least one microprocessor and capable of addressing to the unit of input and receive simulation signals this in response to output signals.
- the simulator includes at least one programmable logic circuit capable of receive at least some of the output signals generated by unity, this logic circuit being able to generate, in time real, parameter values corresponding to the signals it receives and stores these values, the microprocessor being able to acquire these stored values.
- the programmable logic circuit allows to capture, in real time, the orders or signals of output sent by the electronic unit during a cycle of work of the microprocessor, the microprocessor using the accumulated values, for example in a buffer, at each of its work cycles.
- the electronic unit 1 shown in Figure 1 is planned to be on board, for example on a power train train, to control a traction motor. She understands a microprocessor 2 capable of generating control signals or output signals S, depending on input signals E delivered by measuring systems or electronic units of master controls.
- unit 1 Before its installation in the powerplant considered, unit 1 is connected to a simulator 11 by means of two bundles 12 and 13 of electrical conductors. More precisely, the beam 12 connects the output of the simulator 11 to the input of unit 1 while the beam 13 connects the output from unit 1 to the simulator 11 input (s). 12 therefore makes it possible to convey simulation signals E in unit 1 input while beam 13 allows convey, to simulator 11, output signals S of generated by unit 1 and which constitute ordering of equipment on board the powerplant.
- Simulator 11 includes a program that runs on a microprocessor 14, for example of the DSP (Digital Signal) type Processor) with a cycle time of the order of a few tens of micro-seconds and which is capable of generating the simulation signals E.
- These simulation signals can represent low voltage relay status signals, signals emitted by current or voltage sensors, such as as incremental sensors, or setpoints generated by one or more master and transmitted electronic units by a computer network.
- the microprocessor can be connected to a console 15 for its programming and control, from same as for displaying the test result. A relationship electric 16 is provided for this purpose.
- the output signals S generated by the unit 1 are broken down into fast signals S 1 , relatively slow signals S 2 and analog signals S 3 .
- Relatively slow signals are command whose positioning over time must be known with an accuracy of around a millisecond, which is compatible with the cycle time of microprocessor 14. These signals can therefore be transmitted directly to the microprocessor 14 which acquires their value once per cycle time, that is to say every few tens of micro-seconds.
- the signals S 3 are transmitted to an analog / digital converter 17 (ADC) which transmits a corresponding digital signal S ' 3 to the microprocessor 14.
- ADC analog / digital converter 17
- the signals S 1 are liable to evolve several times during a period ⁇ T of a few tens of micro-seconds and their instants of evolution or switching must be known with precision. These signals S 1 may for example be signals for controlling GTO or IGBT circuits or for relays.
- a signal S 1 can take the logic values 0 or 1 and its evolution during a period ⁇ T can be characterized by its switching instants t 1 , t 2 , t 3 , t 4 and t 5 .
- Each signal S 1 is transmitted to an input of a programmable logic circuit 18 of the FPGA type which is capable of detecting the instants t 1 to t 5 during a period ⁇ T, as well as the directions of variation of the signal Si at during this period.
- the circuit 18 reacts with very high precision to the variations of the signal S 1 because it is a circuit made up of AND, OR logic gates and flip-flops, which can have a cycle time less than a microsecond.
- the values detected by the circuit 18 are transmitted, possibly after logic processing, to a buffer memory 19 to which the microprocessor 14 can access the end of each of its working periods, that is to say every few tens of micro-seconds, to know the evolution of each signal S 1 during the period considered.
- the values stored in the memory 19 can be the references of the instants t 1 to t 5 during the period ⁇ T considered, or the total value ⁇ 1 of the signal S 1 during this period, which corresponds to the duration during which the signal S 1 had a value equal to 1.
- the value transmitted to the memory 19 can also be the average M 1 of the value of the signal S 1 during the period ⁇ T or any other value representative of the evolution of the signal S 1 during this period.
- the value transmitted in S ′ 1 to the microprocessor 14 as representative of the signal S 1 can change as a function of the programming of the circuit 18. In fact, depending on the nature of the parameter S 1 , the type of the unit 1 and its operating configuration , the value to be transmitted to the microprocessor 14 may be different.
- the circuit 18 functions as a "asynchronous sampler" for microprocessor 14 and allows interrogation of certain outputs of unit 1 in real time, while the operation of the microprocessor 14 is not disturbed and that the computing power required for the microprocessor 14 is not too large.
- This embodiment differs from the previous one essentially in that the input signals E of unit 1 are divided into fast signals E 1 , into relatively slow signals E 2 and into analog signals E 3 .
- the signals E 2 are generated directly by the microprocessor 14 at the end of each operating cycle and transmitted to the unit 1.
- the signals E 3 are generated by a digital analog converter (DAC) 27 from digital signals E ' 3 supplied by the microprocessor 14.
- DAC digital analog converter
- the fast signals E 1 are generated by a second programmable logic circuit 28, of the type of circuit 18 and which is associated with a buffer memory 29.
- the microprocessor 14 sends to the memory 29 signals E ′ 1 representative of the different values that the signals E 1 must take during the following period ⁇ T. From these values, and while the microprocessor 14 calculates the following values and is not in communication with the unit 1 or the memory 29, the circuit 28 generates the signals E 1 of simulation of the unit 1. In in other words, the circuit 28 makes it possible to simulate, with great precision over time, the variations of the signals E 1 during a period ⁇ T during which the microprocessor 14 is dedicated to the calculation operations.
- circuit 28 can generate pulses simulating an incremental speed sensor which, in the reality can be a succession of niches with a period of the order of a few micro-seconds.
- the circuits 18 and 28 are directly connected by a link 38 which allows direct transmission of certain signals S 1 from the circuit 18 to the circuit 28, these signals being processed by the circuits 18 and 28 for generating certain output signals E 1 without intervention by the microprocessor 14.
- Circuits 18 and 28 are represented as two entities separated in Figure 3. It is possible and advantageous to integrate into a single electronic circuit.
- the one or more programmable logic circuits 18 or 28 can be configured, for example by means of the console 15 to which they are connected by links 20 and 30, depending on the type unit 1 to be checked and / or its subsequent environment, for example of the type of railway material on which it must be shipped.
- FPGA type circuits are advantageous economically because such circuits are fast, well technologically controlled, therefore reliable, and of a affordable cost.
- the invention makes it possible to simulate, in real time, faults, such as a short circuit in one of the arms of an inverter high voltage and check, in real time the chronology control pulses generated by a unit 1 for the simulated power semiconductors such as circuits GTO or IGBT.
- the minimum ignition time or the minimum non-ignition time can be effectively checked.
- the invention has been represented with a single FPGA circuit at the input and, in the embodiment of FIG. 3, a single FPGA output circuit.
- a single FPGA circuit at the input and, in the embodiment of FIG. 3, a single FPGA output circuit.
- several such circuits can be used, input and / or output, depending on the nature of the signals to be processed.
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
- Electric Propulsion And Braking For Vehicles (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Testing And Monitoring For Control Systems (AREA)
Abstract
Description
- Les valeurs de paramètre stockées sont représentatives des instants de commutation de signaux logiques générés par l'unité. En particulier, ces valeurs peuvent être une image des instants de commutation, de la durée pendant laquelle une variable logique a une valeur prédéterminée et/ou de la moyenne de la valeur d'une variable logique sur une période prédéterminée. Ainsi, en fonction du type de variable contrôlée par le simulateur, celui-ci peut acquérir en une fois et rapidement, des informations représentatives des différentes valeurs instantanées des signaux au cours de la période considérée.
- Il consiste à adresser certains au moins des signaux générés par le microprocesseur à au moins un second circuit logique programmable et à adresser à l'unité électronique des signaux de simulation générés par ce second circuit logique programmable, alors que le microprocesseur n'est pas en communication avec l'unité. En d'autres termes, les ordres générés par le microprocesseur sont délivrés à l'unité électronique par le second circuit logique programmable pendant une période dans lequel le microprocesseur est occupé, par exemple pour le calcul des prochains paramètres de commande. Grâce à cet aspect de l'invention, il est possible de commander l'unité avec des signaux émis avec une très grande précision, de l'ordre de la micro-seconde, ce qui est représentatif de certains capteurs, tels qu'un capteur de vitesse incrémental, qui peut détecter la position d'encoches sur un disque avec une précision largement inférieure à quelques dizaines de micro-secondes.
- Au moins un second circuit logique programmable du simulateur est apte à adresser, en temps réel, des signaux de simulation à l'unité, à partir de signaux de consigne préalablement émis par le microprocesseur. Grâce à cet aspect de l'invention, le découplage entre le fonctionnement du programme du microprocesseur, avec un temps de cycle de l'ordre de quelques dizaines de micro-secondes, et celui de l'unité, qui doit pouvoir réagir, avec une précision de l'ordre de la micro-seconde, voire moins en fonction des évolutions technologiques, à des signaux émis à n'importe quel instant, est utilisé à la fois en entrée et en sortie de l'unité électronique. Dans ce cas, les premier et second circuits logiques précités sont avantageusement réalisés physiquement dans un même circuit électronique.
- Le ou les circuits logiques programmables est ou sont de type FPGA (Field Programmable Gate Array - Réseau de Portes Programmables par l'utilisateur). Un circuit FPGA est, comme un microprocesseur, un composant programmable par logiciel. L'utilisation de ce type de composant rapide, en association avec un processeur programmable, permet de concevoir des simulateurs de processus en temps réel génériques, adaptables à tout type de processus, c'est-à-dire à tout type d'unités électroniques et à leurs conditions d'utilisation.
- Le simulateur comprend en outre un convertisseur analogique/numérique, permettant de transmettre au microprocesseur des signaux numériques représentatifs de signaux analogiques générés par l'unité, et/ou un convertisseur numérique analogique, permettant de transmettre à l'unité des signaux analogiques de simulation à partir de signaux numériques générés par le microprocesseur.
- Le ou les circuits logiques sont programmés en fonction du type et/ou de l'utilisation prévue de l'unité. L'invention concerne enfin une installation de test d'unités électroniques, à embarquer sur un matériel ferroviaire ou un véhicule électrique, tel qu'un bus ou analogue, qui comprend au moins un dispositif tel que précédemment décrit. Une telle installation fonctionne de façon précise et peut être configurée en fonction des unités électroniques à contrôler et de leur environnement, par exemple du type de matériel sur lequel elles doivent être embarquées, tel qu'un train, un train à grande vitesse, un tramway, un bus, etc...
- la figure 1 est une représentation schématique de principe d'un dispositif de test du fonctionnement d'une unité électronique conforme à l'invention ;
- la figure 2 est une représentation schématique de principe de l'évolution des valeurs d'un paramètre généré par l'unité électronique de la figure 1 sur une période ΔT et
- la figure 3 est une représentation analogue à la figure 1 pour un dispositif conforme à un second mode de réalisation de l'invention.
Claims (11)
- Procédé de test du fonctionnement d'une unité électronique (1) par simulation, ladite unité étant apte à générer des signaux logiques (S) à des instants spécifiques alors que la simulation est réalisée par un simulateur (11) équipé d'au moins un microprocesseur (14), ledit simulateur adressant à ladite unité des signaux de simulation en entrée (E) et recevant de celle-ci des signaux de sortie (S) en réaction, caractérisé en ce qu'il consiste à traiter, au fur et à mesure de leur émission, certains signaux de sortie (S1) de ladite unité au moyen d'au moins un circuit logique programmable (18), à stocker des valeurs (t1 - t5, Σ1, M1) de paramètres correspondant auxdits signaux traités et à faire accéder ledit microprocesseur (14) auxdites valeurs de paramètres stockées, à une fréquence compatible avec sa vitesse de fonctionnement.
- Procédé selon la revendication 1, caractérisé en ce que lesdites valeurs de paramètres sont représentatives des instants de commutation (t1 - t5) de signaux logiques (S1) générés par ladite unité.
- Procédé selon la revendication 2, caractérisé en ce que lesdites valeurs de paramètres sont une image desdits instants de commutation (t1 - t5), de la durée (Σ1) pendant laquelle une variable logique a une valeur prédéterminée et/ou de la moyenne (M1) de la valeur d'une variable logique sur une période prédéterminée.
- Procédé selon l'une des revendications 1 à 3, caractérisé en ce qu'il consiste à adresser certains au moins des signaux (E'1) générés par ledit microprocesseur (14) à au moins un second circuit logique programmable (28) et à adresser à ladite unité (1) des signaux de simulation (E1) générés par ledit second circuit logique programmable alors que ledit microprocesseur n'est pas en communication avec ladite unité.
- Dispositif de test du fonctionnement d'une unité électronique (1) par simulation, ladite unité étant apte à générer des signaux logiques (S) à des instants spécifiques, ledit dispositif incluant un simulateur (11) qui comprend au moins un microprocesseur (14) et qui est apte à adresser à ladite unité des signaux de simulation en entrée (E) et à recevoir de celle-ci des signaux de sortie (S) en réaction, caractérisé en ce que ledit simulateur comprend au moins un circuit logique programmable (18) apte à recevoir certains au moins (S1) desdits signaux de sortie, ledit circuit logique étant apte à générer, en temps réel, des valeurs (t1-t5, Σ1, M1) de paramètres correspondant aux signaux (S1) qu'il reçoit et à stocker lesdites valeurs de paramètres, ledit microprocesseur (14) étant apte à acquérir lesdites valeurs de paramètres stockées.
- Dispositif selon la revendication 5, caractérisé en ce que ledit simulateur (11) comprend au moins un second circuit logique programmable (28) apte à adresser, en temps réel, des signaux de simulation (E1) à ladite unité, à partir de signaux de consigne (E'1) préalablement émis par ledit microprocesseur (14).
- Dispositif selon la revendication 6, caractérisé en ce que ledit circuit logique programmable (18) apte à recevoir certains signaux de sortie (S1) et ledit second circuit logique programmable (28) apte à adresser des signaux de simulation (E1) à ladite unité (1) sont réalisés dans un même circuit électronique.
- Dispositif selon l'une des revendications 5 à 7, caractérisé en ce que ledit ou lesdits circuits logiques programmables (18, 28) est ou sont de type FPGA (Field Programmable Gate Array - Réseau de Portes Programmables par l'utilisateur.
- Dispositif selon l'une des revendications 5 à 8, caractérisé en ce que ledit simulateur (11) comprend en outre un convertisseur analogique/numérique (17), permettant de transmettre audit microprocesseur (14) des signaux numériques (S'3) représentatifs de signaux analogiques (S3) générés par ladite unité (1), et/ou un convertisseur numérique/analogique (27), permettant de transmettre à ladite unité (1) des signaux analogiques de simulation (E3) à partir de signaux numériques (E'3) générés par ledit microprocesseur.
- Dispositif selon l'une des revendications 5 à 9, caractérisé en ce que ledit ou lesdits circuits logiques (18, 28) sont programmés en fonction du type et/ou de l'utilisateur prévue de ladite unité (1).
- Installation de test d'unités électroniques à embarquer sur un matériel ferroviaire ou un véhicule électrique, caractérisée en ce qu'elle comprend au moins un dispositif (11 - 23) selon l'une des revendications 5 à 10.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9911034A FR2797958B1 (fr) | 1999-08-31 | 1999-08-31 | Procede et dispositif de test du fonctionnement d'une unite electronique par simulation et installation de test d'unite a embarquer sur un materiel ferroviaire ou un vehicule electrique |
FR9911034 | 1999-08-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1094390A1 true EP1094390A1 (fr) | 2001-04-25 |
EP1094390B1 EP1094390B1 (fr) | 2003-05-14 |
Family
ID=9549511
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00402227A Expired - Lifetime EP1094390B1 (fr) | 1999-08-31 | 2000-08-04 | Procédé et dispositif de test du fonctionnement d'une unité électronique par simulation et installation de test d'unité à embarquer sur un matériel ferroviaire ou un véhicule électrique |
Country Status (12)
Country | Link |
---|---|
US (1) | US7177789B1 (fr) |
EP (1) | EP1094390B1 (fr) |
JP (1) | JP2001154724A (fr) |
AT (1) | ATE240555T1 (fr) |
AU (1) | AU761669B2 (fr) |
CA (1) | CA2316937C (fr) |
DE (1) | DE60002648T2 (fr) |
DK (1) | DK1094390T3 (fr) |
ES (1) | ES2194688T3 (fr) |
FR (1) | FR2797958B1 (fr) |
HK (1) | HK1039184A1 (fr) |
PT (1) | PT1094390E (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103645723A (zh) * | 2013-12-23 | 2014-03-19 | 中国北车集团大连机车研究所有限公司 | 机车牵引控制单元硬件平台 |
CN104792547A (zh) * | 2015-04-30 | 2015-07-22 | 大连楼兰科技股份有限公司 | 一种辅助测试obd设备的系统及方法 |
Families Citing this family (13)
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EP1390246B1 (fr) * | 2001-05-08 | 2018-08-15 | Siemens Industry, Inc. | Systeme de surveillance d'etat |
US8849642B2 (en) * | 2004-12-14 | 2014-09-30 | The Mathworks, Inc. | Signal definitions or descriptions in graphical modeling environments |
JP4645242B2 (ja) * | 2005-03-14 | 2011-03-09 | 富士ゼロックス株式会社 | 質問応答システム、およびデータ検索方法、並びにコンピュータ・プログラム |
JP2008175617A (ja) * | 2007-01-17 | 2008-07-31 | Mitsubishi Electric Corp | 試験装置 |
JP4657229B2 (ja) * | 2007-03-01 | 2011-03-23 | 富士通テン株式会社 | シミュレーション装置 |
JP4663689B2 (ja) * | 2007-06-27 | 2011-04-06 | 富士通テン株式会社 | シミュレーション装置及び方法 |
EP2191120B1 (fr) * | 2007-08-16 | 2016-02-10 | Volvo Lastvagnar AB | Procédé pour ajuster les paramètres de commande d'un dispositif de commande embarqué dans un véhicule automobile |
DE102011113024B4 (de) * | 2011-09-09 | 2013-04-11 | Knorr-Bremse Systeme für Schienenfahrzeuge GmbH | Werkzeug zur Bremsanlagenentwicklung für Schienenfahrzeuge |
CN103605356B (zh) * | 2013-11-18 | 2016-07-06 | 上海工程技术大学 | 一种纯电动车驱动控制器的耐久性测试装置 |
CN104897385B (zh) * | 2015-06-03 | 2018-05-08 | 宿迁学院 | 电子油门踏板专用测试电路系统 |
CN105182850A (zh) * | 2015-09-08 | 2015-12-23 | 苏州宏展信息科技有限公司 | 一种基于电源控制器的发动机转速模拟器 |
DE102016203676A1 (de) | 2016-03-07 | 2017-09-07 | Siemens Aktiengesellschaft | Transporteinheit mit zumindest einer Anlage |
EP3726394A1 (fr) * | 2019-04-17 | 2020-10-21 | Volkswagen Aktiengesellschaft | Système sur puce reconfigurable |
Citations (1)
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EP0859238A2 (fr) * | 1997-02-14 | 1998-08-19 | Schlumberger Industries Limited | Système de test pour systèmes de gestion des moteurs |
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US4385278A (en) * | 1981-05-26 | 1983-05-24 | Auto-Equip, Inc. | Testing apparatus for an electronic ignition system for an internal combustion engine |
US4777618A (en) * | 1984-07-19 | 1988-10-11 | Nippondenso Co., Ltd. | Method of storing, indicating or producing signals and apparatus for recording or producing signals |
JP3594366B2 (ja) * | 1995-06-30 | 2004-11-24 | 三菱自動車工業株式会社 | エンジンの燃料噴射時期制御装置 |
US5808921A (en) * | 1996-01-12 | 1998-09-15 | Hughes Aircraft Company | Interface emulation system and method for applications utilizing embedded processors |
US6269020B1 (en) * | 1998-02-26 | 2001-07-31 | Altera Corporation | FIFO configuration cell |
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1999
- 1999-08-31 FR FR9911034A patent/FR2797958B1/fr not_active Expired - Fee Related
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2000
- 2000-08-04 PT PT00402227T patent/PT1094390E/pt unknown
- 2000-08-04 DK DK00402227T patent/DK1094390T3/da active
- 2000-08-04 EP EP00402227A patent/EP1094390B1/fr not_active Expired - Lifetime
- 2000-08-04 DE DE60002648T patent/DE60002648T2/de not_active Expired - Lifetime
- 2000-08-04 ES ES00402227T patent/ES2194688T3/es not_active Expired - Lifetime
- 2000-08-04 AT AT00402227T patent/ATE240555T1/de not_active IP Right Cessation
- 2000-08-29 AU AU53696/00A patent/AU761669B2/en not_active Ceased
- 2000-08-29 CA CA002316937A patent/CA2316937C/fr not_active Expired - Fee Related
- 2000-08-29 JP JP2000258420A patent/JP2001154724A/ja active Pending
- 2000-08-30 US US09/650,726 patent/US7177789B1/en not_active Expired - Fee Related
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2001
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EP0859238A2 (fr) * | 1997-02-14 | 1998-08-19 | Schlumberger Industries Limited | Système de test pour systèmes de gestion des moteurs |
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HANSELMANN H: "REAL-TIME SIMULATION REPLACES TEST DRIVES", TEST AND MEASUREMENT WORLD. (INC. ELECTRONICS TEST ),US,CAHNERS PUBLISHING, DENVER, vol. 16, no. 3, 15 February 1996 (1996-02-15), pages 35 - 36,38,40, XP000559454, ISSN: 0744-1657 * |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103645723A (zh) * | 2013-12-23 | 2014-03-19 | 中国北车集团大连机车研究所有限公司 | 机车牵引控制单元硬件平台 |
CN103645723B (zh) * | 2013-12-23 | 2016-01-27 | 中国北车集团大连机车研究所有限公司 | 机车牵引控制单元硬件平台 |
CN104792547A (zh) * | 2015-04-30 | 2015-07-22 | 大连楼兰科技股份有限公司 | 一种辅助测试obd设备的系统及方法 |
CN104792547B (zh) * | 2015-04-30 | 2017-06-13 | 大连楼兰科技股份有限公司 | 一种辅助测试obd设备的系统及方法 |
Also Published As
Publication number | Publication date |
---|---|
EP1094390B1 (fr) | 2003-05-14 |
PT1094390E (pt) | 2003-08-29 |
FR2797958B1 (fr) | 2001-10-26 |
DK1094390T3 (da) | 2003-09-15 |
AU761669B2 (en) | 2003-06-05 |
ATE240555T1 (de) | 2003-05-15 |
US7177789B1 (en) | 2007-02-13 |
DE60002648D1 (de) | 2003-06-18 |
FR2797958A1 (fr) | 2001-03-02 |
CA2316937A1 (fr) | 2001-02-28 |
HK1039184A1 (en) | 2002-04-12 |
ES2194688T3 (es) | 2003-12-01 |
JP2001154724A (ja) | 2001-06-08 |
AU5369600A (en) | 2001-03-08 |
CA2316937C (fr) | 2009-02-10 |
DE60002648T2 (de) | 2004-03-04 |
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