EP0688879A1 - High vacuum apparatus member and vacuum apparatus - Google Patents
High vacuum apparatus member and vacuum apparatus Download PDFInfo
- Publication number
- EP0688879A1 EP0688879A1 EP95107446A EP95107446A EP0688879A1 EP 0688879 A1 EP0688879 A1 EP 0688879A1 EP 95107446 A EP95107446 A EP 95107446A EP 95107446 A EP95107446 A EP 95107446A EP 0688879 A1 EP0688879 A1 EP 0688879A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- ppm
- vacuum
- vacuum apparatus
- oxygen
- purity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C9/00—Alloys based on copper
Definitions
- the invention relates to a material or to members to be used for the manufacture of high-vacuum appartuses such as power transmitter tubes, external anodes which also serve as vacuum containers for microwave tubes, vacuum deposition and sputtering apparatuses, klystrons, waveguides, acceleration cavity containers for accelerators, etc., from which hydrogen is easily removed by baking, as well as to a vacuum apparatus comprising such material or members.
- high-vacuum appartuses such as power transmitter tubes, external anodes which also serve as vacuum containers for microwave tubes, vacuum deposition and sputtering apparatuses, klystrons, waveguides, acceleration cavity containers for accelerators, etc., from which hydrogen is easily removed by baking, as well as to a vacuum apparatus comprising such material or members.
- materials or members for the manufacture of high-vacuum apparatuses have generally been made of high-purity oxygen-free copper which satisfies required excellent electrical conductivity and thermal conductivity and includes low residual gas for preventing reduction in the degreee of vacuum in a vacuum apparatus due to residual gas in the material from which the apparatus is made.
- Such low-residual-gas including high-purity oxygen-free copper is manufactured by degassing of normal oxygen-free copper in a reducing or vacuum atmosphere, or by addition of phophorus for deoxygenation.
- High-purity oxygen-free copper produced in this manner contains 3 ppm or less of oxygen and 0.2 to 0.5 ppm of hydrogen, and vacuum apparatuses made of such high-purity oxygen-fee copper are subjected to dehydrogenatoina by vacuum annealing, called "baking", before use to guard against reduction in the degree of vacuum in a vacuum apparatus due to an out-gas from the material of the apparatus in a high vacuum.
- the object of the present invention is to provide a high-purity copper alloy material suitable for high vacuum apparatuses which has after baking a reduced residual hydrogen content.
- the inventors have conducted research aimed at producing a material suitable as vacuum apparatus member made of a copper alloy from which hydrogen is easily removed by baking, conventionally high-purity oxygen-free copper, which does not lead to a reduced degree of vacuum due to out-gassing hydrogen when used in a high vacuum, as well as a vacuum apparatus comprising such a vacuum apparatus member, and have found that a copper alloy prepared by adding 1 to 15 ppm of zirconium (Zr) to normal high-purity oxygen-free copper allows easy removal of hydrogen by baking and has a very low level of out-gassing of residual hydrogen from the material in a high vacuum, thus preventing reduction in the degree of vacuum.
- Zr zirconium
- the present invention has been accomplished on the basis of this finding, and is characterized by being a material having a composition of high-purity oxygen-free copper with a purity of 99.99 wt% or greater, which contains 1 to 15 ppm of Zr and 3 ppm or less of oxygen; and vacuum apparatuses constructed with the aforementioned material having a composition of high-purity copper with a purity of 99.99 wt% or greater, which contains 1 to 15 ppm of Zr and 3 ppm or less of oxygen.
- the material of the present invention allows easy removal of hydrogen by baking when it contains 1 to 15 ppm of Zr because, since Zr is an element with a very strong affinity for oxygen, residual trace oxygen in the copper alloy combines preferentially with Zr and is not dissociated therefrom even by heating during baking. Therefor, the residual trace oxygen in the high-purity copper alloy does not trap hydrogen, and thus the hydrogen is easily removed during baking.
- a Zr content of less than 1 ppm is not preferred since this is insufficient for combining with the residual oxygen in the copper alloy, and conversely a Zr content of more than 15 ppm is not preferred since this reduces the hydrogen-removing effect during baking.
- the range of the Zr content is therefore established to be 1 to 15 ppm.
- a more preferred range of the Zr content is 3 to 10 ppm.
- the oxygen content of the vacuum apparatus member of the present invention is preferably up to 3 ppm.
- electrolytic copper with a purity of 99.99 wt% or greater is melted in a melting furnace under constant protection with CO + N2 gas, and the resulting molten metal is poured into a ladle while Zr is added to the flow of the molten metal for adjustement of the components to a prescribed composition.
- the apparatus shown in the drawings comprises a melting furnace 1, a spout 2, a tundish 3, an addition apparatus 4, a nozzle 5, a mold 6, a covering 7 of graphite particles and a sealing gas source 8 in order to produce an ingot 9.
- electrolytic copper with a purity of 99.99 wt% or greater was prepared and melted in the melting furnace 1 in a CO + N2 atmosphere.
- the resulting molten metal was passed through the spout 2 sealed with CO + N2 gas and transported to the tundish 3, and Zr was added from the addition apparatus 4 to the flowing molten metal before it reached the tundish 3.
- the surface of the molten metal in the tundish 3 was covered with a layer of graphite particles 7 to prevent its oxidation.
- the molten metal was then fed from the tundish 3 via the nozzle 5 to the mold 6 which was also sealed with CO + N2 gas, and an ingot 9 was obtained.
- Table 1 below shows the composition of the ingot obtained in this manner as detrmined by measurement of the Zr and oxygen contents. Specimens of 25 mm length, 25 mm width and 8 mm thickness were cut out from the ingot, and further lathed to prepare vacuum apparatus members of the present invention (1 to 10 of Table 1), vacuum apparatus members for comparison (1 to 3 of Table 1) and vacuum apparatus members of the conventional art (1 to 3 of Table 1), each having a diameter of 20 mm and a thickness of 4 mm.
- the vacuum apparatus material or members of the present invention 1 to 10, vacuum apparatus members for comparison 1 to 3 and vacuum apparatus members of the conventional art 1 to 3 were subjected to baking for one hour at a temperature of 500 °C in a vacuum atmosphere of 266 x 10 ⁇ 5 Pa (2 x 10 ⁇ 5 Torr) and these baked vacuum apparatus members of the present invention, vacuum apparatus members for comparison and vacuum apparatus members of the conventional art were further charged into an out-gas measuring apparatus to measure the out-gassing rate of hydrogen gas in a high-vacuum atmosphere of 133 x 10 ⁇ 10 Pa (1 x 10 ⁇ 10 Torr) while at a temperature of 500 °C.
- Table 1 The results are given in Table 1.
- a material for vacuum apparatus members according to the present invention offers easier removal of hydrogen during baking than vacuum apparatus members of the ceonventional art, and therefore it produces the excellent industrial effect of allowing the production of vacuum apparatuses with superior performance.
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacture And Refinement Of Metals (AREA)
Abstract
Description
- The invention relates to a material or to members to be used for the manufacture of high-vacuum appartuses such as power transmitter tubes, external anodes which also serve as vacuum containers for microwave tubes, vacuum deposition and sputtering apparatuses, klystrons, waveguides, acceleration cavity containers for accelerators, etc., from which hydrogen is easily removed by baking, as well as to a vacuum apparatus comprising such material or members.
- Conventionally, materials or members for the manufacture of high-vacuum apparatuses have generally been made of high-purity oxygen-free copper which satisfies required excellent electrical conductivity and thermal conductivity and includes low residual gas for preventing reduction in the degreee of vacuum in a vacuum apparatus due to residual gas in the material from which the apparatus is made. Such low-residual-gas including high-purity oxygen-free copper is manufactured by degassing of normal oxygen-free copper in a reducing or vacuum atmosphere, or by addition of phophorus for deoxygenation. High-purity oxygen-free copper produced in this manner contains 3 ppm or less of oxygen and 0.2 to 0.5 ppm of hydrogen, and vacuum apparatuses made of such high-purity oxygen-fee copper are subjected to dehydrogenatoina by vacuum annealing, called "baking", before use to guard against reduction in the degree of vacuum in a vacuum apparatus due to an out-gas from the material of the apparatus in a high vacuum.
- However, even with dehydrogenation by baking prior to use of vacuum apparatuses manufactured using the aforementioned high-purity oxygen-free copper, certain problems result, since hydrogen contained in the high-purity oxygen-free copper is trapped by residual oxygen because of its strong affinity thereto, thus rendering the dehydrogenation more difficult. Consequently, when vacuum apparatuses manufactured using high-purity oxygen-free copper containing such oxygen-trapped hydrogen are used in a high vacuum, the residual hydrogen is gradually released and causes a reduction in the degree of vacuum.
- The object of the present invention is to provide a high-purity copper alloy material suitable for high vacuum apparatuses which has after baking a reduced residual hydrogen content.
- This object is solved in accordance with the present invention by a high-purity copper material having the features of
claim 1. Preferred applications of such material are subject matter ofclaims 3 to 5. - The inventors have conducted research aimed at producing a material suitable as vacuum apparatus member made of a copper alloy from which hydrogen is easily removed by baking, conventionally high-purity oxygen-free copper, which does not lead to a reduced degree of vacuum due to out-gassing hydrogen when used in a high vacuum, as well as a vacuum apparatus comprising such a vacuum apparatus member, and have found that a copper alloy prepared by adding 1 to 15 ppm of zirconium (Zr) to normal high-purity oxygen-free copper allows easy removal of hydrogen by baking and has a very low level of out-gassing of residual hydrogen from the material in a high vacuum, thus preventing reduction in the degree of vacuum.
- The present invention has been accomplished on the basis of this finding, and is characterized by being a material having a composition of high-purity oxygen-free copper with a purity of 99.99 wt% or greater, which contains 1 to 15 ppm of Zr and 3 ppm or less of oxygen; and vacuum apparatuses constructed with the aforementioned material having a composition of high-purity copper with a purity of 99.99 wt% or greater, which contains 1 to 15 ppm of Zr and 3 ppm or less of oxygen.
- The material of the present invention allows easy removal of hydrogen by baking when it contains 1 to 15 ppm of Zr because, since Zr is an element with a very strong affinity for oxygen, residual trace oxygen in the copper alloy combines preferentially with Zr and is not dissociated therefrom even by heating during baking. Therefor, the residual trace oxygen in the high-purity copper alloy does not trap hydrogen, and thus the hydrogen is easily removed during baking.
- However, a Zr content of less than 1 ppm is not preferred since this is insufficient for combining with the residual oxygen in the copper alloy, and conversely a Zr content of more than 15 ppm is not preferred since this reduces the hydrogen-removing effect during baking. The range of the Zr content is therefore established to be 1 to 15 ppm. A more preferred range of the Zr content is 3 to 10 ppm.
- Since up to 3 ppm of oxygen in the copper alloy may combine with Zr in the above-mentioned range of 1 to 15 ppm, the oxygen content of the vacuum apparatus member of the present invention is preferably up to 3 ppm.
- To manufacture vacuum apparatus members containing 1 to 15 ppm of Zr and 3 ppm or less of oxygen according to the present invention, first, electrolytic copper with a purity of 99.99 wt% or greater is melted in a melting furnace under constant protection with CO + N₂ gas, and the resulting molten metal is poured into a ladle while Zr is added to the flow of the molten metal for adjustement of the components to a prescribed composition.
- The vacuum apparatus material of the present invention and a method of prodcuing it will now be explained in further detail by way of the following example and the attached drawings which is a schematic view of an apparatus for producing the vacuum apparatus material according to the present invention.
- The apparatus shown in the drawings comprises a
melting furnace 1, aspout 2, a tundish 3, anaddition apparatus 4, anozzle 5, a mold 6, a covering 7 of graphite particles and asealing gas source 8 in order to produce aningot 9. - First, electrolytic copper with a purity of 99.99 wt% or greater was prepared and melted in the
melting furnace 1 in a CO + N₂ atmosphere. The resulting molten metal was passed through thespout 2 sealed with CO + N₂ gas and transported to the tundish 3, and Zr was added from theaddition apparatus 4 to the flowing molten metal before it reached the tundish 3. The surface of the molten metal in the tundish 3 was covered with a layer ofgraphite particles 7 to prevent its oxidation. The molten metal was then fed from the tundish 3 via thenozzle 5 to the mold 6 which was also sealed with CO + N₂ gas, and aningot 9 was obtained. - Table 1 below shows the composition of the ingot obtained in this manner as detrmined by measurement of the Zr and oxygen contents. Specimens of 25 mm length, 25 mm width and 8 mm thickness were cut out from the ingot, and further lathed to prepare vacuum apparatus members of the present invention (1 to 10 of Table 1), vacuum apparatus members for comparison (1 to 3 of Table 1) and vacuum apparatus members of the conventional art (1 to 3 of Table 1), each having a diameter of 20 mm and a thickness of 4 mm.
- The vacuum apparatus material or members of the
present invention 1 to 10, vacuum apparatus members forcomparison 1 to 3 and vacuum apparatus members of theconventional art 1 to 3 were subjected to baking for one hour at a temperature of 500 °C in a vacuum atmosphere of 266 x 10⁻⁵ Pa (2 x 10⁻⁵ Torr) and these baked vacuum apparatus members of the present invention, vacuum apparatus members for comparison and vacuum apparatus members of the conventional art were further charged into an out-gas measuring apparatus to measure the out-gassing rate of hydrogen gas in a high-vacuum atmosphere of 133 x 10⁻¹⁰ Pa (1 x 10⁻¹⁰ Torr) while at a temperature of 500 °C. The results are given in Table 1.TABLE 1 Vacuum apparatus member Composition Out-gassing rate (Torr·1/sec.·cm²) Electrolytic copper purity (%) Zr (ppm) Oxygen (ppm) P (ppm) Present invention 1 99.998 3 1.8 - 1.33 x 10⁻¹¹ 2 99.998 4 2.0 - 2.17 x 10⁻¹¹ 3 99.998 3 1.7 - 2.34 x 10⁻¹¹ 4 99.998 1 0.7 - 6.75 x 10⁻¹² 5 99.998 7 1.8 - 8.98 x 10⁻¹² 6 99.998 12 2.0 - 1.10 x 10⁻¹¹ 7 99.998 14 2.7 - 2.14 x 10⁻¹¹ 8 99.998 6 1.2 - 9.77 x 10⁻¹² 9 99.998 11 1.5 - 7.29 x 10⁻¹² 10 99.998 10 2.0 - 1.01 x 10⁻¹¹ Comparison 1 99.998 7 5.0 * - 6.21 x 10⁻¹⁰ 2 99.998 0.6 * 1.8 - 2.70 x 10⁻¹⁰ 3 99.998 18 * 1.2 - 8.29 x 10⁻¹¹ Conventional Art 1 99.998 - 2.0 3.1 1.26 x 10⁻¹⁰ 2 99.998 - 1.5 2.8 8.92 x 10⁻¹¹ 3 99.998 - 2.5 - 1.94 x 10⁻¹⁰ (Values marked with * are outside the range of the invention) - The results shown in Table 1 demonstrate that the vacuum apparatus members of the present invention which contained 1 to 15 ppm of Zr and 3 ppm or less of oxygen all had lower values for the out-gassing rate of hydrogen gas in comparison with the vacuum apparatus members of the conventional art which did not contain Zr, and hence the hydrogen gas was more easily removed during the baking. In contrast, it was shown that the removal of hydrogen gas during baking was somewhat difficult in the case of the vacuum apparatus members for comparison 1-2 which were outside the ranges of 1 to 15 ppm of Zr and 3 ppm or less of oxygen. Also, as observed in the case of the vacuum apparatus member for
comparison 3, a Zr content exceeding 15 ppm is not preferred as this causes more difficult removal of hydrogen gas during baking. - As explained above, a material for vacuum apparatus members according to the present invention offers easier removal of hydrogen during baking than vacuum apparatus members of the ceonventional art, and therefore it produces the excellent industrial effect of allowing the production of vacuum apparatuses with superior performance.
Claims (5)
- High vacuum apparatus member comprising of high-purity copper material, having a purity of 99.99 wt% or higher and containing prior to annealing (baking) hydrogen and 3 ppm or less of oxygen,
characterized in that
the material contains for easy dehydrogention by annealing (baking) 1 to 15 ppm Zr. - Material of claim 1, characterized in that it contains 3 to 10 ppm Zr.
- Use of he high-purity copper material of claim 1 or 2 for constructing high vacuum apparatuses.
- Use of the high-purity copper material of claim 1 or 2 for constructing external anodes, which also serve as vacuum container, suitable for microwave tubes, etc.
- Use of the high-purity copper material of claim 1 or 2 for constructing acceleration cavity containers for accelerators.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16059694A JPH083664A (en) | 1994-06-20 | 1994-06-20 | Member for vacuum device and vacuum device |
JP160596/94 | 1994-06-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0688879A1 true EP0688879A1 (en) | 1995-12-27 |
EP0688879B1 EP0688879B1 (en) | 1998-02-04 |
Family
ID=15718373
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP19950107446 Expired - Lifetime EP0688879B1 (en) | 1994-06-20 | 1995-05-17 | High vacuum apparatus member and vacuum apparatus |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0688879B1 (en) |
JP (1) | JPH083664A (en) |
DE (1) | DE69501569T2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007040822B4 (en) * | 2006-08-30 | 2013-08-14 | Mitsubishi Electric Corp. | Copper alloy and process for its production |
US10494712B2 (en) | 2015-05-21 | 2019-12-03 | Jx Nippon Mining & Metals Corporation | Copper alloy sputtering target and method for manufacturing same |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7131376B2 (en) * | 2018-12-27 | 2022-09-06 | 三菱マテリアル株式会社 | Copper material for sputtering targets |
CN113290217B (en) * | 2021-05-28 | 2022-09-23 | 金川集团股份有限公司 | Vacuum continuous casting process of high-purity oxygen-free copper rod |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62207834A (en) * | 1986-03-10 | 1987-09-12 | Nippon Mining Co Ltd | Copper material for use in high-vacuum atmosphere |
JPS62243727A (en) * | 1986-04-16 | 1987-10-24 | Hitachi Cable Ltd | Rolled copper foil for printed circuit board |
US4717436A (en) * | 1985-03-27 | 1988-01-05 | Mitsubishi Kinzoku Kabushiki Kaisha | Wire for bonding a semiconductor device |
JPS63312934A (en) * | 1987-06-16 | 1988-12-21 | Hitachi Cable Ltd | Lead frame material for semiconductor |
EP0296596A1 (en) * | 1987-06-25 | 1988-12-28 | The Furukawa Electric Co., Ltd. | Fine copper wire for electronic instruments and method of manufacturing the same |
US5077005A (en) * | 1989-03-06 | 1991-12-31 | Nippon Mining Co., Ltd. | High-conductivity copper alloys with excellent workability and heat resistance |
-
1994
- 1994-06-20 JP JP16059694A patent/JPH083664A/en not_active Withdrawn
-
1995
- 1995-05-17 DE DE1995601569 patent/DE69501569T2/en not_active Expired - Fee Related
- 1995-05-17 EP EP19950107446 patent/EP0688879B1/en not_active Expired - Lifetime
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4717436A (en) * | 1985-03-27 | 1988-01-05 | Mitsubishi Kinzoku Kabushiki Kaisha | Wire for bonding a semiconductor device |
JPS62207834A (en) * | 1986-03-10 | 1987-09-12 | Nippon Mining Co Ltd | Copper material for use in high-vacuum atmosphere |
JPS62243727A (en) * | 1986-04-16 | 1987-10-24 | Hitachi Cable Ltd | Rolled copper foil for printed circuit board |
JPS63312934A (en) * | 1987-06-16 | 1988-12-21 | Hitachi Cable Ltd | Lead frame material for semiconductor |
EP0296596A1 (en) * | 1987-06-25 | 1988-12-28 | The Furukawa Electric Co., Ltd. | Fine copper wire for electronic instruments and method of manufacturing the same |
US5077005A (en) * | 1989-03-06 | 1991-12-31 | Nippon Mining Co., Ltd. | High-conductivity copper alloys with excellent workability and heat resistance |
Non-Patent Citations (5)
Title |
---|
HELENIUS,A.,KOLEHMAINEN,M., RAJAINMAKI,H.: "Current and Future Uses of Oxygen-Free Copper", METALL, vol. 44, no. 11, pages 1067 - 1070 * |
PATENT ABSTRACTS OF JAPAN vol. 12, no. 122 (C - 488) 15 April 1988 (1988-04-15) * |
PATENT ABSTRACTS OF JAPAN vol. 12, no. 70 (C - 479) 4 March 1988 (1988-03-04) * |
PATENT ABSTRACTS OF JAPAN vol. 13, no. 156 (C - 585) 14 April 1989 (1989-04-14) * |
RAJAINMAKI,H., KOLEHMAINEN,M.,HELENIUS,A.: "The Production and Application of Oxygen-Free Copper", JOURNAL OF METALS, vol. 45, no. 3, pages 68 - 70 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007040822B4 (en) * | 2006-08-30 | 2013-08-14 | Mitsubishi Electric Corp. | Copper alloy and process for its production |
US10494712B2 (en) | 2015-05-21 | 2019-12-03 | Jx Nippon Mining & Metals Corporation | Copper alloy sputtering target and method for manufacturing same |
Also Published As
Publication number | Publication date |
---|---|
EP0688879B1 (en) | 1998-02-04 |
DE69501569D1 (en) | 1998-03-12 |
JPH083664A (en) | 1996-01-09 |
DE69501569T2 (en) | 1998-06-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP2494084B1 (en) | Zr-BASED AMORPHOUS ALLOY AND PREPARING METHOD THEREOF | |
US3072982A (en) | Method of producing sound and homogeneous ingots | |
EP0345045A1 (en) | Method of making tungsten-titanium sputtering targets | |
US3565602A (en) | Method of producing an alloy from high melting temperature reactive metals | |
IT9020673A1 (en) | METHOD FOR FORMING SINTERED PRODUCTS | |
CN112725658B (en) | Preparation method of titanium-aluminum alloy target | |
EP1146979B1 (en) | Method of producing a silicon/aluminium sputtering target | |
US3548915A (en) | New procedure for chill casting beryllium composite | |
KR950703668A (en) | HIGH MELTING POINT METALLIC SILICIDE TARGET AND METHOD FOR PRODUCING THE SAME, HIGH MELTING POINT METALLIC SILICIDE FILM AND SEMICOMDUCTOR DEVICE | |
CN114752814B (en) | Heavy rare earth zinc alloy, method for producing same, use thereof, and use of tungsten-containing container | |
US5116589A (en) | High density hexagonal boron nitride prepared by hot isostatic pressing in refractory metal containers | |
EP0688879A1 (en) | High vacuum apparatus member and vacuum apparatus | |
CN115216637A (en) | Preparation method of alloy ingot for precise kovar alloy foil | |
JP2016128605A (en) | Melting method for alloys | |
CN110777263A (en) | Fusion casting preparation method of low-oxygen pure silver melt material | |
EP3279366B1 (en) | Cu-ga alloy sputtering target and method of manufacturing cu-ga alloy sputtering target | |
JPH0554208B2 (en) | ||
JPH0647579A (en) | Active ag brazing filler metal | |
EP0401595B1 (en) | Sintered electric contact material for vacuum switch tube and process for manufacturing the same | |
JPH0729446A (en) | Manufacture of electrode for vacuum interrupter | |
US3676114A (en) | Improvement in the process relating to alloys containing platinum group metals | |
JPS6353252B2 (en) | ||
JPS6345339A (en) | Copper alloy for high electrical conduction having low softening temperature | |
JP3251779B2 (en) | Manufacturing method of contact material for vacuum valve | |
EP0261670B1 (en) | Highly corrosion-resistant amorphous alloy |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): DE FR GB |
|
17P | Request for examination filed |
Effective date: 19960529 |
|
17Q | First examination report despatched |
Effective date: 19961120 |
|
GRAG | Despatch of communication of intention to grant |
Free format text: ORIGINAL CODE: EPIDOS AGRA |
|
GRAG | Despatch of communication of intention to grant |
Free format text: ORIGINAL CODE: EPIDOS AGRA |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
RAP1 | Party data changed (applicant data changed or rights of an application transferred) |
Owner name: MITSUBISHI MATERIALS CORPORATION |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
AK | Designated contracting states |
Kind code of ref document: B1 Designated state(s): DE FR GB |
|
REF | Corresponds to: |
Ref document number: 69501569 Country of ref document: DE Date of ref document: 19980312 |
|
ET | Fr: translation filed | ||
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 19980525 Year of fee payment: 4 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 19980713 Year of fee payment: 4 |
|
PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |
|
26N | No opposition filed | ||
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GB Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 19990517 |
|
GBPC | Gb: european patent ceased through non-payment of renewal fee |
Effective date: 19990517 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FR Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20000131 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: DE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20000301 |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: ST |