EP0656544A3 - Technik und Verfahren für asynchrones Abfrage design - Google Patents

Technik und Verfahren für asynchrones Abfrage design Download PDF

Info

Publication number
EP0656544A3
EP0656544A3 EP94117928A EP94117928A EP0656544A3 EP 0656544 A3 EP0656544 A3 EP 0656544A3 EP 94117928 A EP94117928 A EP 94117928A EP 94117928 A EP94117928 A EP 94117928A EP 0656544 A3 EP0656544 A3 EP 0656544A3
Authority
EP
European Patent Office
Prior art keywords
latch
technique
scan design
scannable
asynchronous
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP94117928A
Other languages
English (en)
French (fr)
Other versions
EP0656544A2 (de
Inventor
Steven D. Millman
Thomas J. Balph
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Publication of EP0656544A2 publication Critical patent/EP0656544A2/de
Publication of EP0656544A3 publication Critical patent/EP0656544A3/de
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
EP94117928A 1993-11-29 1994-11-14 Technik und Verfahren für asynchrones Abfrage design Withdrawn EP0656544A3 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/158,557 US5406216A (en) 1993-11-29 1993-11-29 Technique and method for asynchronous scan design
US158557 1999-10-08

Publications (2)

Publication Number Publication Date
EP0656544A2 EP0656544A2 (de) 1995-06-07
EP0656544A3 true EP0656544A3 (de) 1998-07-29

Family

ID=22568678

Family Applications (1)

Application Number Title Priority Date Filing Date
EP94117928A Withdrawn EP0656544A3 (de) 1993-11-29 1994-11-14 Technik und Verfahren für asynchrones Abfrage design

Country Status (3)

Country Link
US (1) US5406216A (de)
EP (1) EP0656544A3 (de)
JP (1) JPH07202645A (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5513123A (en) * 1994-06-30 1996-04-30 Nec Usa, Inc. Non-scan design-for-testability of RT-level data paths
US5574731A (en) * 1995-02-22 1996-11-12 National Semiconductor Corporation Set/reset scan flip-flops
WO1997021107A1 (en) * 1995-12-05 1997-06-12 Atg Technology, Inc. Partial scan logic
US5958077A (en) * 1995-12-27 1999-09-28 Nec Usa, Inc. Method for testing asynchronous circuits
JP3758285B2 (ja) * 1997-03-17 2006-03-22 ソニー株式会社 遅延回路およびそれを用いた発振回路
US5951702A (en) * 1997-04-04 1999-09-14 S3 Incorporated RAM-like test structure superimposed over rows of macrocells with added differential pass transistors in a CPU
US5983377A (en) * 1997-11-17 1999-11-09 Ncr Corporation System and circuit for ASIC pin fault testing
US6128758A (en) * 1998-05-20 2000-10-03 National Semiconductor Corporation Modular re-useable bus architecture
US6300809B1 (en) * 2000-07-14 2001-10-09 International Business Machines Corporation Double-edge-triggered flip-flop providing two data transitions per clock cycle
ATE359524T1 (de) * 2000-09-11 2007-05-15 Freescale Semiconductor Inc Prüfbare analog/digitalschnittstelleschaltung
US6573775B2 (en) 2001-10-30 2003-06-03 Integrated Device Technology, Inc. Integrated circuit flip-flops that utilize master and slave latched sense amplifiers
US6700425B1 (en) 2001-10-30 2004-03-02 Integrated Device Technology, Inc. Multi-phase clock generators that utilize differential signals to achieve reduced setup and hold times
KR20050012820A (ko) * 2002-06-21 2005-02-02 코닌클리즈케 필립스 일렉트로닉스 엔.브이. 전자 회로 및 전자 회로 테스트 방법
JP4265934B2 (ja) * 2003-06-06 2009-05-20 シャープ株式会社 スキャンパス回路およびそれを備える論理回路ならびに集積回路のテスト方法
JP4274457B2 (ja) * 2003-06-27 2009-06-10 インターナショナル・ビジネス・マシーンズ・コーポレーション トランスペアレントラッチ回路
JP4281648B2 (ja) * 2004-08-04 2009-06-17 セイコーエプソン株式会社 印刷装置
US7680474B2 (en) * 2005-10-04 2010-03-16 Hypres Inc. Superconducting digital mixer
US7667500B1 (en) * 2006-11-14 2010-02-23 Xilinx, Inc. Glitch-suppressor circuits and methods
US7890826B2 (en) * 2006-12-11 2011-02-15 Oracle America, Inc. Method and apparatus for test of asynchronous pipelines
FR2961043B1 (fr) * 2010-06-04 2012-07-20 St Microelectronics Sa Registre a double front et son controle a partir d'une horloge
WO2011158500A1 (ja) * 2010-06-17 2011-12-22 国立大学法人 奈良先端科学技術大学院大学 スキャン非同期記憶素子およびそれを備えた半導体集積回路ならびにその設計方法およびテストパターン生成方法
JP2014158176A (ja) * 2013-02-15 2014-08-28 Renesas Electronics Corp 半導体装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6029680A (ja) * 1983-07-27 1985-02-15 Toshiba Corp Ｃｍｏｓ論理回路の試験方法
GB2218816A (en) * 1988-05-19 1989-11-22 Plessey Co Plc Testing integrated circuits

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4506165A (en) * 1982-06-30 1985-03-19 At&T Bell Laboratories Noise rejection Set-Reset Flip-Flop circuitry
JP2945103B2 (ja) * 1990-05-15 1999-09-06 株式会社リコー テスト用スキャン回路装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6029680A (ja) * 1983-07-27 1985-02-15 Toshiba Corp Ｃｍｏｓ論理回路の試験方法
GB2218816A (en) * 1988-05-19 1989-11-22 Plessey Co Plc Testing integrated circuits

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
MAUNDER: "IEEE Standard Test Access Port and Boundary-Scan Architecture", 21 May 1990, INSTITUTE OF ELECTRICAL AND ELECTRONIC ENGINEERS, NEW YORK, USA, XP002026236, 11491 *
PATENT ABSTRACTS OF JAPAN vol. 9, no. 151 (P - 367) 26 June 1985 (1985-06-26) *

Also Published As

Publication number Publication date
EP0656544A2 (de) 1995-06-07
JPH07202645A (ja) 1995-08-04
US5406216A (en) 1995-04-11

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