EP0204631A2 - Halbleiterstrukturen mit Polysiloxan-Nivellierschichten - Google Patents

Halbleiterstrukturen mit Polysiloxan-Nivellierschichten Download PDF

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Publication number
EP0204631A2
EP0204631A2 EP86401172A EP86401172A EP0204631A2 EP 0204631 A2 EP0204631 A2 EP 0204631A2 EP 86401172 A EP86401172 A EP 86401172A EP 86401172 A EP86401172 A EP 86401172A EP 0204631 A2 EP0204631 A2 EP 0204631A2
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EP
European Patent Office
Prior art keywords
layer
metallization
leveling layer
topographical surface
polysiloxane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP86401172A
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English (en)
French (fr)
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EP0204631A3 (de
Inventor
Michael E. Thomas
Thomas R. Keyser
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Fairchild Semiconductor Corp
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Fairchild Semiconductor Corp
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Filing date
Publication date
Application filed by Fairchild Semiconductor Corp filed Critical Fairchild Semiconductor Corp
Publication of EP0204631A2 publication Critical patent/EP0204631A2/de
Publication of EP0204631A3 publication Critical patent/EP0204631A3/de
Withdrawn legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
    • H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
    • H01L21/02208—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
    • H01L21/02214—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen
    • H01L21/02216—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen the compound being a molecule comprising at least one silicon-oxygen bond and the compound having hydrogen or an organic group attached to the silicon or oxygen, e.g. a siloxane
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
    • H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
    • H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
    • H01L21/02337—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment treatment by exposure to a gas or vapour
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/76819—Smoothing of the dielectric
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76885—By forming conductive members before deposition of protective insulating material, e.g. pillars, studs
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
    • H01L23/5329—Insulating materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Definitions

  • This invention relates to methods for processing semiconductor devices and more particularly to a method for forming a substantially planar polysiloxane passivation layer over a stepped topographical surface on a semiconductor device.
  • one class of organic polymers which has been employed as a dielectric layer between metallic interconnect layers is the polyimide group, with successive polyimide layers being applied as the dielectric film between such metallic layers.
  • metal bumps were grown on metal contacts of underlying interconnect layer in order to make electrical connections to a subsequent overlying interconnect layer.
  • a thick polyimide layer was then applied over the interconnect layer and the bumps which had been grown thereon.
  • the applied polyimide layer was etched back with an oxygen plasma until the metal bumps were cleared of organic material.
  • a metal layer was then deposited over these bumps and an interconnect pattern was defined therein to form the overlying interconnect layer which electrically,, contacted the underlying interconnect layer through the metal bumps. This process was successively applied to yield a multiple interconnect structure.
  • Another class of materials which has been used comprises spin-on glass or silicates which have been placed on wafers and used at high temperatures to inject dopants into the wafers.
  • spin-on glass or silicates which have been placed on wafers and used at high temperatures to inject dopants into the wafers.
  • very thin films e.g. on the order of 2,0000
  • thicker films as would be necessary for topographical leveling appear to fail due to the stresses generated by contraction during curing.
  • the polyimide and silicate films have found slow acceptance as dielectric leveling layers for semiconductor structures.
  • Another object of the invention is to provide a dielectric leveling layer which exhibits stability in high temperature semiconductor applications.
  • Yet another object of the invention is to provide a leveling layer which has high electrical breakdown strengths, good adherence to silicon, silicon dioxide, and metal surfaces, and which can be readily etched using dry processing similar to silicon dioxide.
  • a further object of the present invention is to provide a material which is an effective moisture permeation barrier.
  • Still another object of the present invention is to provide a thick dielectric layer which does not undergo cracking during high temperature curing.
  • the topographical surface comprises an electrical interconnect layer.
  • the topography comprises a conformal layer of glass coating disposed on the electrical interconnect layer.
  • the structure can possess a plurality of stepped topographical surfaces with each of the surfaces having a respective leveling layer of polysiloxane material disposed thereon.
  • the leveling layer is preferably applied to the topographical surface by spin coating a polysiloxane solution thereon to a thickness of from about 0.1 micron to about 2.0 microns. After leveling layer application and curing thereof, patterns can be defined in photoresist placed over said layer. Vias can be opened through the layer to the underlying topography using either a dry etching plasma or wet chemical etchant.
  • a second layer of metallization can then be deposited on the leveling layer and into the vias, and a subsequent leveling layer deposited on said second metallization layer.
  • a plurality of layers can be achieved.
  • Polysiloxanes of the general formula [R 2 SiO] n wherein R is chosen from the group consisting of CH 3 and C 6 H, are preferred for formulation of the leveling layer.
  • a semiconductor structure 10 comprising a silicon wafer 12 having a stepped topographical surface 14 formed by topographical features 16.
  • the features 16 can be formed of materials such as metal, oxide or silicon.
  • the features 16 could be part of a metallic interconnect layer formed on the wafer 12.
  • a polysiloxane dielectric leveling layer 18 is formed over the topographical surface 14 as follows.
  • a silicone resin solution consisting of about ten to forty percent solid by weight, is prepared. It is preferred that the solution comprise about 25% solid to 75% solvent by weight. It is also preferred that the solid be any of the family of silicone resins such as General Electric Company type SR 240 or SR 224 insulating varnish and that the solvent be toluene or butanol.
  • the solution is then applied to the topographical surface 14 of the wafer 12. The wafer is then spun at about 5000 rpm for approximately 30 seconds to remove excess liquid, leaving a semi-dry dielectric layer 18 having a substantially planar upper surface 19 and a thickness of about 1.2 to 1.3 microns.
  • the thickness of layer 18 be substantially equal to approximately 1.2 microns.
  • the structure 10 then undergoes a pre-bake cure in air at an intermediate temperature between about 90°C and about 300°C, preferably 270°C, for about one hour. This pre-bake cure is performed to insure removal of most of the solvent originally present in the polysiloxane solution.
  • the structure 10 Upon completion of the pre-bake cure, the structure 10 is heated for about one hour at a temperature between about 400°C and 500°C in an oxygen, nitrogen or hydrogen-bearing environment to crosslink the polysiloxane and oxidize the upper surface 19 of the leveling layer 18. Note that oxidation will still occur in a nitrogen or hydrogen environment due to the presence of residual oxygen which is present in most atmospheric alloy processes.
  • This high temperature cure enhances the adhesion of oxide forming metals, such as aluminum, for example, which can be deposited subsequently onto the substantially level upper surface 19 of the layer 18. In this regard, it is believed that the oxidized top surface is similar to silicon dioxide which is known to strongly adhere with oxide-forming metals.
  • the oxidized surface once formed also retards rapid oxygen diffusion at moderate temperatures around 450°C, thereby protecting the underlying bulk of the layer 18 from progressive oxidation and subsequent degradation of the alkyl substituents in the polysiloxane.
  • the structure 10 is quite stable.
  • vias may be formed in the dielectric layer 18 as follows. Referring to Figure 2, a layer of photoresist 20 is formed on the substantially planar upper surface 19 of the dielectric layer 18 in accordance with known techniques. The photoresist layer 20 is exposed to a predetermined via pattern, in accordance with known techniques.
  • Via holes are then etched through the dielectric layer 18 utilizing, for example either a dry etching plasma, preferably C 2 F 6 /CHF 3 in a ratio of approximately two parts to one for times preferably between one and six minutes at a power of approximately 800 watts, or a wet chemical etchant in order to form via holes 22 therein, as shown in Figure 2.
  • the via holes are formed through the dielectric layer 18 to expose contact areas at the appropriate locations in the metal interconnect layer 16. After the via holes 22 have been opened through the dielectric layer 18, the remaining photoresist layer 20 is removed from the upper surface 19 of the dielectric layer 18.
  • Figure 3 illustrates a second metallization layer 24 deposited over the leveling layer 18 after the photoresist 20 has been stripped away.
  • the metal of the second metallization layer 24 enters the exposed via holes 22 to make contact with the first layer metal 16.
  • a second leveling layer can be deposited on the second metallization layer 24, and a third metallization layer can be deposited thereon in the same manner as that for said second metallization layer.
  • a plurality of respective layers can be built as desired.
  • a semiconductor structure 40 can have a substantially conformal glass layer 42 applied to the metallization layer 16 prior to application of the leveling layer 18.
  • the leveling layer 18 is then applied over the glass layer 42 in accordance with the procedure described above.
  • via holes 44 can be opened through the leveling layer 18 and conformed glass layer 42 in accordance with conventional photolithographic etching techniques. It should be noted that one of the advantages of the formation of the leveling layer 18 in accordance with the present invention is that the layer 18 and the glass layer 42 can be etched using the same etchant.
  • the photoresist layer 20 is removed from the upper surface 19 of the dielectric layer 18 and a second metallization layer 46 can then be deposited over the leveling layer 18 as shown in Figure 6.
  • a second metallization layer 46 can then be deposited over the leveling layer 18 as shown in Figure 6.
  • the metal of the second metallization layer 46 enters the exposed vias 44 to make contact with the first metal layer 16 at the predefined locations.
  • a second leveling layer or a second conformal glass and subsequent leveling layer can be deposited on the second metallization layer 46, and a third metallization layer can then be deposited thereover in the same manner as that for the second metallization layer. Consequently, a plurality of respective layers can be built as desired.
  • FIG. 7 Another alternate preferred embodiment is shown in Figure 7 wherein via posts 72 are formed at pre-determined locations on a pre-determined pattern of interconnects 74 disposed on a substrate 76.
  • a planarized film of polysiloxane material 78 is then formed over the via posts 72 and interconnect pattern 74 in accordance with the method described hereinabove.
  • the planarized upper surface of the polysiloxane film layer 78 is then etched back to expose the top of the via posts 72.
  • a layer of an electrically conductive material is then formed over the planarized etched back surface of the polysiloxane film 78 and the exposed upper surfaces of the via posts 72.
  • This metal layer 80 is then etched to form the pre-determined interconnect pattern. Additional layers of interconnects can be formed by repeating this procedure.
  • the present invention permits the use of a fluorine u ased plasma which has minimal effect on the photoresist material used to generate via holes.
  • a fluorine u ased plasma which has minimal effect on the photoresist material used to generate via holes.
  • organic materials such as polyimides, for which oxygen plasma etchants must be employed. These oxygen plasma etchants react with the photoresist material thereby severely limiting the usefulness thereof.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Laminated Bodies (AREA)
EP86401172A 1985-06-04 1986-06-03 Halbleiterstrukturen mit Polysiloxan-Nivellierschichten Withdrawn EP0204631A3 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US74097885A 1985-06-04 1985-06-04
US740978 2003-12-19

Publications (2)

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EP0204631A2 true EP0204631A2 (de) 1986-12-10
EP0204631A3 EP0204631A3 (de) 1987-05-20

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0360992A2 (de) * 1988-09-29 1990-04-04 STMicroelectronics S.r.l. Verfahren zum Herstellen einer dielektrischen Schicht

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2338839A1 (de) * 1972-07-31 1974-02-21 Rhone Poulenc Sa Verfahren zur verbesserung des haftvermoegens von ueberzuegen aus photoresistpolymeren an oberflaechen von anorganischen oxyden
GB2101149A (en) * 1981-04-14 1983-01-12 Hitachi Chemical Co Ltd Process for producing polyamide acid silicon type intermediate and polyimide silicon copolymer resin
EP0076656A2 (de) * 1981-10-03 1983-04-13 Japan Synthetic Rubber Co., Ltd. In Lösungsmitteln lösliche Organopolysilsesquioxane, Verfahren zu ihrer Herstellung, Zusammensetzungen und Halbleitervorrichtungen, die diese verwenden
GB2125423A (en) * 1982-08-13 1984-03-07 Western Electric Co Polymeric films for electronic circuits
EP0123560A2 (de) * 1983-04-25 1984-10-31 Kabushiki Kaisha Toshiba Verfahren zur Formung einer eingeebneten Schicht

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2338839A1 (de) * 1972-07-31 1974-02-21 Rhone Poulenc Sa Verfahren zur verbesserung des haftvermoegens von ueberzuegen aus photoresistpolymeren an oberflaechen von anorganischen oxyden
GB2101149A (en) * 1981-04-14 1983-01-12 Hitachi Chemical Co Ltd Process for producing polyamide acid silicon type intermediate and polyimide silicon copolymer resin
EP0076656A2 (de) * 1981-10-03 1983-04-13 Japan Synthetic Rubber Co., Ltd. In Lösungsmitteln lösliche Organopolysilsesquioxane, Verfahren zu ihrer Herstellung, Zusammensetzungen und Halbleitervorrichtungen, die diese verwenden
GB2125423A (en) * 1982-08-13 1984-03-07 Western Electric Co Polymeric films for electronic circuits
EP0123560A2 (de) * 1983-04-25 1984-10-31 Kabushiki Kaisha Toshiba Verfahren zur Formung einer eingeebneten Schicht

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
THIN SOLID FILMS, vol. 120, no 1, October 1984, pages 37-45, Lausanne, CH; printed Elsevier Sequoia, NL; Y. SEGUI et al.: "Electrical properties of plasma-deposited polysiloxane and metal/plasma polysiloxane/GaAs structures" *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0360992A2 (de) * 1988-09-29 1990-04-04 STMicroelectronics S.r.l. Verfahren zum Herstellen einer dielektrischen Schicht
EP0360992A3 (en) * 1988-09-29 1990-08-29 Sgs-Thomson Microelectronics S.R.L. A dielectric layer of first interconnection for electronic semiconductor devices

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EP0204631A3 (de) 1987-05-20

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