EP0203388A3 - Oberflächenbeschaffenheitsfeststellungs-Lichtabtastvorrichtung mit einem Lichtkonzentrator - Google Patents

Oberflächenbeschaffenheitsfeststellungs-Lichtabtastvorrichtung mit einem Lichtkonzentrator Download PDF

Info

Publication number
EP0203388A3
EP0203388A3 EP86105765A EP86105765A EP0203388A3 EP 0203388 A3 EP0203388 A3 EP 0203388A3 EP 86105765 A EP86105765 A EP 86105765A EP 86105765 A EP86105765 A EP 86105765A EP 0203388 A3 EP0203388 A3 EP 0203388A3
Authority
EP
European Patent Office
Prior art keywords
light
scan device
concentrator
exit surface
surface quality
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
EP86105765A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP0203388A2 (de
Inventor
Klaus Dipl.-Ing. Dabelstein
Christian Dipl.-Phys. Skrobol
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Erwin Sick GmbH Optik Elektronik
Original Assignee
Erwin Sick GmbH Optik Elektronik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Erwin Sick GmbH Optik Elektronik filed Critical Erwin Sick GmbH Optik Elektronik
Publication of EP0203388A2 publication Critical patent/EP0203388A2/de
Publication of EP0203388A3 publication Critical patent/EP0203388A3/de
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Lenses (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
EP86105765A 1985-05-24 1986-04-25 Oberflächenbeschaffenheitsfeststellungs-Lichtabtastvorrichtung mit einem Lichtkonzentrator Ceased EP0203388A3 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3518832 1985-05-24
DE19853518832 DE3518832A1 (de) 1985-05-24 1985-05-24 Oberflaechenbeschaffenheitsfeststellungs-lichtabtastvorrichtung mit einem lichtkonzentrator

Publications (2)

Publication Number Publication Date
EP0203388A2 EP0203388A2 (de) 1986-12-03
EP0203388A3 true EP0203388A3 (de) 1989-01-18

Family

ID=6271629

Family Applications (1)

Application Number Title Priority Date Filing Date
EP86105765A Ceased EP0203388A3 (de) 1985-05-24 1986-04-25 Oberflächenbeschaffenheitsfeststellungs-Lichtabtastvorrichtung mit einem Lichtkonzentrator

Country Status (4)

Country Link
US (1) US4693601A (enrdf_load_stackoverflow)
EP (1) EP0203388A3 (enrdf_load_stackoverflow)
JP (1) JPS61272640A (enrdf_load_stackoverflow)
DE (1) DE3518832A1 (enrdf_load_stackoverflow)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3742527A1 (de) * 1987-07-21 1989-06-22 Mannesmann Ag Fotoelektronische fuehl- oder messeinrichtung
US4815858A (en) * 1987-10-09 1989-03-28 The United States Of America As Represented By The Secretary Of The Navy Reflectometers
US4930872A (en) * 1988-12-06 1990-06-05 Convery Joseph J Imaging with combined alignment fixturing, illumination and imaging optics
US5058982A (en) * 1989-06-21 1991-10-22 Orbot Systems Ltd. Illumination system and inspection apparatus including same
US5448364A (en) * 1993-03-22 1995-09-05 Estek Corporation Particle detection system with reflective line-to-spot collector
US5727108A (en) * 1996-09-30 1998-03-10 Troy Investments, Inc. High efficiency compound parabolic concentrators and optical fiber powered spot luminaire
AU7786998A (en) * 1998-06-16 2000-01-05 Orbotech Ltd. Illuminator for inspecting substantially flat surfaces
IL131284A (en) 1999-08-05 2003-05-29 Orbotech Ltd Illumination for inspecting surfaces of articles
GB2429764A (en) * 2005-08-30 2007-03-07 Imp College Innovations Ltd A scanning device using a first optical system with a first focal length and a second optical system with a second focal length
JP2009532668A (ja) * 2006-03-30 2009-09-10 オーボテック リミテッド 連続する角度範囲に渡って選択可能な照明を利用する検査システム

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE707745C (de) * 1936-10-22 1941-07-02 Siemens & Halske Akt Ges Photometrische Einrichtung zur lichtelektrischen Untersuchung von Loechern
US3845297A (en) * 1972-01-28 1974-10-29 Hitachi Electronics Light receiver
US4378159A (en) * 1981-03-30 1983-03-29 Tencor Instruments Scanning contaminant and defect detector
EP0075766A1 (de) * 1981-09-30 1983-04-06 Roche Diagnostics GmbH Vorrichtung zur reflexionsphotometrischen Messung
EP0123929A2 (de) * 1983-04-22 1984-11-07 Erwin Sick GmbH Optik-Elektronik Fehlerfeststellungsvorrichtung

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE886531C (de) * 1943-05-27 1953-08-13 Emil Busch A G Optische Ind Verfahren zur optischen Bestimmung von Oberflaechenrauhigkeiten und Vorrichtung zur Durchfuehrung des Verfahrens
FR1569752A (enrdf_load_stackoverflow) * 1968-03-13 1969-06-06
DE2256736C3 (de) * 1972-11-18 1979-01-25 Ibm Deutschland Gmbh, 7000 Stuttgart Meßanordnung zur automatischen Prüfung der Oberflächenbeschaffenheit und Ebenheit einer Werkstückoberfläche
US4095905A (en) * 1975-08-20 1978-06-20 Hitachi, Ltd. Surface-defect detecting device
DE2727927C3 (de) * 1977-06-21 1980-01-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur getrennten Erfassung von Lichtstrahlen

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE707745C (de) * 1936-10-22 1941-07-02 Siemens & Halske Akt Ges Photometrische Einrichtung zur lichtelektrischen Untersuchung von Loechern
US3845297A (en) * 1972-01-28 1974-10-29 Hitachi Electronics Light receiver
US4378159A (en) * 1981-03-30 1983-03-29 Tencor Instruments Scanning contaminant and defect detector
EP0075766A1 (de) * 1981-09-30 1983-04-06 Roche Diagnostics GmbH Vorrichtung zur reflexionsphotometrischen Messung
EP0123929A2 (de) * 1983-04-22 1984-11-07 Erwin Sick GmbH Optik-Elektronik Fehlerfeststellungsvorrichtung

Also Published As

Publication number Publication date
US4693601A (en) 1987-09-15
EP0203388A2 (de) 1986-12-03
JPS61272640A (ja) 1986-12-02
DE3518832A1 (de) 1986-11-27
DE3518832C2 (enrdf_load_stackoverflow) 1989-09-28
JPH0471458B2 (enrdf_load_stackoverflow) 1992-11-13

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Inventor name: DABELSTEIN, KLAUS, DIPL.-ING.

Inventor name: SKROBOL, CHRISTIAN, DIPL.-PHYS.